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NASA Technical Reports Server (NTRS) 19970026584: Magneto-Hydrodynamic Damping of Convection During Vertical Bridgman-Stockbarger Growth of HgCdTe PDF

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Preview NASA Technical Reports Server (NTRS) 19970026584: Magneto-Hydrodynamic Damping of Convection During Vertical Bridgman-Stockbarger Growth of HgCdTe

NASA-TM-112524 Reprinted from ,/C -{( }_ "J& ..... JOURNOAFLC TAL GROWTH J,._urnal of Crystal Growth 167(1996) 478-487 Magneto-hydrodynamic damping of convection during vertical Bridgman-Stockbarger growth of HgCdTe D.A. Watring *, S.L. Lehoczky Space Sciences L_d_oratoCv, NASA Marshall Space Flight Center. Huntsville. Alabama 35812, USA Received 3April 1995; accepted 26 January 1996 ELSEVIER Journal of Crystal Growth EDITORIAL BOARD M, SCHIEBER (Principal Editor) R.S. FEIGELSON D.TJ. HURLE Dept. Mater. SCL. School Appl. Sci. &Technol. Ctr. Materials Res,, 105 McCulk_gh Bldg, H.H. Wills Phys. Lab.. Univ. Bristol Hebrew University, Jerusalem 9[904, Israel Stanford Univ., Stanford, CA 94305-4045, USA Tyndall Avenue Telefax: +972-2-666 804 Telefax: +1-415-723 3044 Bristol BS8 1TL, UK R. KERN T. NISHINAGA G.B. STRINGFELLOW CRMC 2,CN'RS, Campus Luminy, Case 913 DepL Electron. Eng., Univ. of Tokyo Dept. Mater. Sci.. 304 EMRO. Univ. of Utah F-13288 Marseille Codex 9,France 7-3- I.Hongo. Bunkyo-ku. Tokyo I13.Japan Salt Lake City, UT 84112. USA Telefax: +33-91-418 916 Telefax: +8I-3-5684-3974 Telefax: +1-801-581 4816 ASSOCIATE EDITORS A, BARONNET (Ind_.strial, Biological. Molecular Crystals) T, HIBIYA (Orides. Melt Thermophysical Properties, F.ROSENBERGER (Protein Crystallization, CRMC:, CNRS, Campus Luminy, Case 913 Microgravity) Fluid Dynamics) F-13288 Marseille Cedex 9,France Fundamental Res. Labs., NEC CORPORATION Center for Microgravity and Materials Research Telefax: +33-91-418 916 34. Miyukigaoka, Tsukuba 305, Japan Univ. Alabama. Huntsville, AL 35899, USA Telefax: +81-298-566 136 Telefax: +1-205-895 6791 K.W. BENZ (Mwrogravity, EJectronic Materials} Kristallographisches Inst., Universitat H. KOMATSU (Proteins Molecular Crystallization. R.W. ROUSSEAU (Solution Growth. Hebelstr. 25, D-79t04 Freiburg, Germany Growth from Solations) Industrial Crystallization) Telefax: +49-761-203 4369 Inst. Mater. Res., Tohoku Univ. School of Chem. Eng.. Georgia Inst. ofTechnol. Katahim 2-1 -I, Sendal 980. Japan Atlanta, GA 30332-01130, USA A.A. CHERNOV (Kinetics ofCrystallizalion, Telefa_: +81-22-215 2011 T¢lefax: +t-404-894 2866 Protein Crystallization) Inst. Crystallography, Acad. of Sciences T,F. KUECH (Thin Films and Electronic K. SATO (BitNrystalli_ation and Loninskii Prosp., Moscow 117333, Russian Fed. and Optical Devices) Organic Crystals) Telefax: +7-095-135 1011 Dept. Chem. Eng.. Univ. Wisconsin-Madison Fac. Appl. Biol. Sci., Hiroshima Univ. Madison. WI 53706, USA Higashi-Hirushima 724, Japan A.Y. CHO (Molecular Beam Epita-ry) Tetefax: +1-608-265 3782 Telefax: +81-824-227 062 Room IC-323, AT&T Bell Laboratories Murray Hill, NJ 07974-2070. USA A. McPHERSON (Protein Growth) L.F. SCHNEEMEYER (Superconductivity. Telefax: +1-908-582 2043 Dept. Biochemistry, Univ. of California Oxides. Novel Materials) Riverside, CA 92521, USA Room IA-363, AT&T Bell Labs. B. 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NAKAJIMA (Liquid and Vapor Phase Epita-_l G. VAN TENDELOO (Electron Microscopy, New Port Beach. CA 92658-8908. USA Integrated Mater. Lab., FuJitsu Labs. Ltd. Fullerenes, Superconductivio,) Telefax: +I-714-759 2868 Morinosato-Wakamiya 10-1, Atsugi 243-01, Japan University of Antwerp, RUCA Telefax: +81-462-48 3473 Groenenborgerlaan 171, B-2020 Antwerp, Belgium M.E. GLICKSMAN (Solidification) Tetefax: +32-3-2180 217 School of Eng.. Mater. Eng. Depc.. Rensselaer PoLytechnic H. OHNO (EpDary) Inst., Troy. NY 12180-3590, USA Research Inst. ofElectrical Commun. A.F. WITT (Semiconductor Crystals) Telefax: +1-518-276 8554 Tohoku Univ.. Sendal 980 77, Japan Dept.of Metalh & Mater. Sci., Massachusetts Telefax: +81-22-217 5553 Inst. of TechnoL, Cambridge, MA 02139. USA M.A.G, HALLIWELL (X-ray Diffraction ) Telefax: +1_17-253 5827 Philips Analytical X-ray, Lelyweg t K. PLOOG (Molecular Beam Epita.v/) 7602 EA Almelo, The Netherlands PauI-Drude-lnst. fur Festk6rperelektronik A. ZANGWILL (Theory (Epitavcy)) Hausvogteiplatz 5-7. D-10117 Berlin. Germany School of Physics. Georgia Inst. of Technol. Telefa_t: +49-30-203 77201 Atlanta. GA 30332. USA Telefax: +1-404-894 9958 Scope ofthe Journal Subscription Information 1996 Experimental and theoretical contributions a_ invited in the following fields: Theory of Volumes 158-169 of Journal of Crystal Growth (ISSN 0022-0248) are scheduled for nucleation and growth, molecular kinetics and transport phenomena, crystallization in publication. (Frequency: semimonthly.) Prices are available from the publishers upon viscous media such as polymers and glasses. Crystal growth of metals, minerals, semi- request. Subscriptions are accepted on a prepaid basis only. Issues are sent by SAL conductors, magnetics, inorganic, organic and biological substances in bulk or as thin (Surface Air Lifted) mail wherever this service is available. Airmail rates are available films. Apparatus, instrumentation and techniques for crystal growth, and purification upon request. Please address all enquiries regarding orders and subscriptions to: methods. Characterization of single crystals by physical and chemical methods. Elsevier Science B.V,, Order Fulfilment Depanmem Abstracted/Indexed in: P.O. Box 21I, 1000 AE Amsterdam, The Netherlands Tel: +31 20485 3642; Fax: +31 20 485 3598 Aluminium Industry Abstracts; Chemical Abstracts; Current Contents: Physical, Chemical and Earth Sciences; El Compendex Plus: Engineered Materials Abstracts; Claims for issues not received should be made within six months of our p_blication Engineering Indent; INSPEC; Metals Abstracts; Physics Briefs. (mailing) date. US mailing notice -Journal ofCrystal Growth (ISSN 0022-0248) ispublished semimonthly byElsevier Science B.V., Molenwerf I,P.O. Box 21I, 1000 AE Amsterdam. The Netherlands. Annual subscription price inthe USA isUS $6535 (valid inNorth, Central and South America only}, including air speed deLlver_. Periodicals postage paid at Jamaica NY 11431. hkS postmasters: Send address changes to Journal of Crystal Growth, Publications Expediting, Inc.. 200 Meacham A_enue. Elmont NY 11003. Airfreight and mailing in the USA b_ Publications Expediting. (_ The paper used inthis publication meets the requirements ofANSI/NISO Z39.48-1902 (Permanence of Paper} PRINTED INTHE NETttERLANDS North-Holland, an imprint of Elsevier Science ......... CRYSTAL GROWTH ELSEVIER Journal of Crystal Growth 167(1996) 478-487 Magneto-hydrodynamic damping of convection during vertical Bridgman-Stockbarger growth of HgCdTe D.A. Watring *, S.L. Lehoczky Space S_iem'es LrtboratoO', NASA Marshall Space Flight Center, Huntxcille. Alabama 35812. USA Received 3April 1995; accepted 26January 1996 Abstract In order to quantify the effects of convection on segregation, HgosCdoxTe crystals were grown by the vertical Bridgman-Stockbarger method in the presence of an applied axial magnetic field of 50 kG. The influence of convection, by magneto-hydrodynamic damping, on mass transfer in the melt and segregation at the solid-liquid interface was investigated by measuring the axial and radial compositional variations in the grown samples. The reduction of convective mixing in the melt through the application of the magnetic field is found to decrease radial segregation to the diffusion-limited regime. It was also found that the suppression of the convective cell near the solid-liquid interface results in an increase in the slope of the diffusion-controlled solute boundary layer, which can lead to constitutional supercooling. 1. Introduction magnetic fields of 1300 and 1750 G were sufficient to suppress turbulence in the melt. This eliminated For nearly four decades, the usefulness of applied the temperature fluctuations which caused melting magnetic fields in crystal growth from the melt has and resolidification of the growth interface and an been recognized. The fundamental basis for the inter- associated fluctuation in the dopant concentration in action between magnetic fields and convection was the crystal grown in zero field. first discussed in Refs. [1-5]. The basic mechanism Temperature and solutal gradients in the melt for the interaction of an applied magnetic field and a during growth almost always result in buoyancy- molten semiconductor involves the electrical currents driven convection. Frequently, this convective flow induced by the movement of a conductor in the is oscillatory [8] and gives rise to a fluctuating rate presence of a magnetic field. Early experiments by of crystal growth, which, in turn, produces a micro- Utech and Flemings [6,7] investigated the effects of a scopically non-uniform distribution of dopant in the magnetic field on tellurium-doped indium anti- crystal. The universal effect of an applied magnetic monide grown in a horizontal furnace by directional field is the damping of the convective turbulence in solidification. Their results indicated that vertical the melt, which produces a more homogenous dopant distribution [9-13]. The majority of the experimental studies with magnetic fields has been focused on the growth of "Corresponding author. GaAs, Si and Ge by the Czochralski growth process. 0022-0248/96/$15.00 Copyright ;t: 1996 Elsevier Science B.V. All rights reserved I'll S0022-0248196)00279-5 D.A. Watring, S.L Lehoc;kv / Journal O!Crystal Growth 167 (/996) 47S 4S7 47t) In these systems, small (2-5 kG) fields were applied 2. Experimental procedure to suppress turbulent convection. Limited work [6,12-16] has been conducted on the magnetic ef- 2.1. Sample prepa_ttion fects of crystal growth in a vertical Bridgman- Stockbarger configuration and out of these experi- The starting materials were triple-distilled instru- ments only two involved the II-VI compounds of ment grade Hg from Bethlehem Apparatus and six HgCdTe and HgZnTe. nines grade Cd and Te from Johnson Matlhey. The The Hg-based II-VI semiconductor compounds ampoules were made from 8 nnn ID X 12 mm OD are important for application of infrared detection commercial grade. T08, fused silica quartz. A ta- and imaging applications for a broad range of wave- pered section was lo.-med on the quartz ampoule to lengths from 0.8 #m to the far-infrared spectrum enhance the probability of single crystal growth. An beyond 30 /._m. The crystal growth of these Hg-based iriternal layer of graphite ,aas formed on the ampoule II-VI systems is characterized by a destabilizing as described in Rcf. [Ib] to prevent the adhesion of horizontal temperature gradient due to a difference in HgCdTe to the ampoule walls. The elemetlts `,`,crc the thermal conducti'+'ities of the melt and the crystal weighed out for Hg I ,Cd,Te (x= 0.2). loaded into at the growth interface in the presence of a contain- the ampoules and sealed off under a I('1 -i Torr ing crucible and the release of latent heat. Addition- vacuum. The Hg, sCd._,Te ingots were compourlded ally, a stabilizing vertical solutal gradient is pro- by a homogenization process that has been described duced by the rejection of the denser constituent in detail elsewhere [16]. The formed ingots were 14 (HgTe in the case of HgCdTe) into the melt. These crn long and wei,.zhed approximatel\' 47 <, phenomena, coupled with a large solutal-to-thermal expansion coefficient ratio ( fl<Q/fltAT.. = 100) and 2.2. Directional solidilh'ation growth xvstem a large thermal-to-solutal diffusion coefficient ratio (C_T/D k = 200), give rise to double diffusive con- vection during the growth of these binary semicon- The ingots were regro'+`,'n by' directional solidifica- ductors, where AT, is the radial temperature differ- tion in the presence of a stationary axially aligned ence, Co is the starting composition, /3< and /3t are, magnetic field as shown schematicall3 in Fig. la. respectively, the solutal and thermal expansion coef- The Bridgrnan-Stockbarger crystal growth systcn-i ficients and o_T and DL are the thermal and solutal consisted of five heated zones with the booster and diffusion coefficients, respectively. If this cold zone separated by, a 2 cm adiabatic zone. A 0.3 buoyancy-induced convection is large as compared cm thick heat extraction phlte was phiced bel,acen to the solidification velocity, it can interfere with the adiabatic zone and cold zone to produce high segregation near the solid-liquid interface resulting axial gradients. The ampoule ,,,+'as suflported by an in a non-homogenous crystal. It is believed that the inconel 625 cartridge assembly shown in Fig. Ib and reduction of convection should be advantageous in remained stationary during crystal grm`,'th. Translat- maintaining the solid-liquid interface shape required ing the furnace instead of the cartridge mininfized to minimize the crystal defect densities while mini- any movenaenl and vibrations ol+ the sample and mizing compositional variation trans'+,erse to the allowed the crystallization Io take place in the ho- crystal growth direction. nlogenous region of the nlagnelic field. The super- This paper focuses on the influence of the mag- conducting magnet is inanually set to the desired netic field on mass transfer in the melt and radial field strength (up to 50 kG) and is held constant segregation at the solid-liquid interface. We begin during the entire growth process. The therinal profile with a description of the charge crucible configura- was chosen in order to produce a gradient of approx- tion, followed by a brief discussion of the Bridg- imately 80°C/cm on the ampoule wall at the posi- man-Stockbarger growth system used for the experi- tion of 706_'C, the solidus ten-_pel'ature for the ments. Results of the axial and radial compositional steady-state growth [17]. The thernlal profile `,\as distributions with and without the presence of the translated at a relatively slow rate of 0.2 ttln/s in magnetic field are, then, described. order to avoid constitutional supercooling [I 8]. 480 D.A. Watring, S.L. Lehoczky / Journal of Crystal Growth 167 (1996) 478-487 2.3. Characterization For x values of 0.18 or larger, the radial mi- crodistribution of cadmium telluride was quantita- The effect of convection on segregation was de- tively determined from the transmission edge of the termined by measuring radial and axial composi- IR transmission spectrum. The details of this highly tional variations in the grown crystals. For this study, automated transmission-edge mapping technique are the average x values (x is the mole fraction of described in Ref. [22]. Briefly, the hardware consists CdTe) of wafers cut transverse to the growth direc- of a Fourier transform spectrometer specially tion were determined by high precision density de- equipped with a software controllable xy stage driven terminations and the values of the crystal lattice by stepper motors. The stage can position the sample constant published by Woolley and Ray [19] as throughout a 2.54 cm square in 50/zm steps. Spectra described in detail elsewhere [20,21]. are then analyzed to obtain the cut-on wavelength LHe Fill Port LN 2Fill Port 1 (a) LN 2Dewar Bridgman-Stockbarger Superconducting Growth System Magnet 1 (b) Alumina lower ampoule support Alumina upper ampoule support Cartridge / t Threaded interface Quartz ampoule uartz tube ! HgCdTe _ Thermocouple type K Fig. 1. (a) Schematic representation of the magnetic Bridgman-Stockbarger growth system. (b) Containment cartridge utilized for the magnetically stabilized growth of HgCdTe. D.A. Warring, S.L. Lehoczky / Journal of Co'stal Grou'th 167 (1996) 478 487 481 and the mole fractions of CdTe are calculated from positional profile never reaches a steady-state value. the compositional dependence of the energy bandgap. Therefore, improved radial segregation is gained at For those samples with a cadmium telluride content the expense of less uniform axial composition. If the of less than x = 0.18, the radial compositional varia- translation rate is increased, as in MCT-L6, shorter tions were determined by energy dispersive X-ray transients result in steady-state axial compositional spectroscopy analysis (EDX) using pseudo-binary distribution, but radial segregation increases by two solid solutions as standards [23]. orders of magnitude. These results are in qualitative agreement with the numerical calculations of Mo- takef [24,25]. His results indicate that radial segrega- 3. Results and discussions tion increases initially with decreasing Peclet mass transfer number reflecting the reduction in the mix- 3.1. Axial compositional distributions ing of the melt, which results in increased non-uni- formity of melt composition at the growth interface. Fig. 2 shows the limiting axial compositional This suggests that improved material compositional distributions for directional solidified HgCdTe. The uniformity requires sufficiently fast growth rates to two experimental curves [21], illustrate the effects of produce short initial transients and a simultaneous varying translation rates. The translation rates for reduction of radial segregation caused by convective ingots MCT-L6 and MCT-L7 were 0.310 and 0.068 effects. /zm/s, respectively. Solidification at the slower rate Fig. 3 shows the axial compositional distribution results in the build up of a much longer solute profiles for two crystals: curve MCT-D2 was ob- boundary layer. Hence, the stabilizing solutal forces tained for growth without a magnetic field and curve are expected to be less during the growth. This MCT-4 for growth with melt stabilization by a 50 reduced stabilizing force can lead to the increase of kG axial magnetic field. The theoretical curve based natural convective mixing, which results in a more on a one-dimensional diffusion equation is also uniform radial segregation. However, the axial corn- shown. 0.6 \ 0.5 MCT-LT, R =0.068 A, _ gm/_ f-_ 0.4 .... A-- MCT-L6, R= 0.310 \\ _ .am/see C9 N ,, "'\ _ -- Pfann's Equation .o 0.3 r_ I/ :_ 0.2 Crad =0.0008 y,/ 0.1 Crad =0'1500 _ _' I I I I I I I I I ' -- ' 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 Axial Dislance (cm) Fig. 2. Axial compositional limRs of directional solidification for HgCdTe. 482 I).A. I,_&ltrilt_Z, S.L. Leho('zky / Journal _[' Crystal Growth I(_7 (1996) 478-487 0.6 0.5 ] -- I-D Diffusion (Model) /t MCT-D2 nofield * MCT--4, 50kGfield 0.4 \ © IR,MCT-.4, 50kGfield _ 03 02 Ol 0 2 4 6 8 10 12 14 Axial Distance (em) Fig. 3. Comparison of the experimental axial compositional distribution to the one-dimensional diffusion model. no magnetic field applied magnetic field g,.[- ,'A 5 constitutionally supercooled t.z) ", region (from M. Flemings) Co Cd rich areas fonn due to Furnace temperature, TA, is larger homogeneous nucleation. These than meh temperature, TM. Stable Cd rich areas, being less dense than growth occurs. surrounding environment rise to top of ampoule. Where they remeh and remain until thc end of growth. This resuls in aCd rich band at end of boule. Fig. 4, Schematic representation of the c,,)n',,rectivc melt flows and solute botmdary layer configurations for directional solidification growth of Hg{'dTc v,ith and ',_ithout magnetic stabilization. D.A. Warring. S.L. Lehoc-ky/Jourmd ¢_fCowtal Growth 167 _1996) 47S 487 4_3 The curve for MCT-D2 indicates that, as ex- pected, during solidification in zero field the distribu- tion of CdTe undergoes an initial transient, then a steady-state region followed by a final transient. This compares well with the curve calculated from an exact numerical solution to the one-dimensional dif- fusion equation for an x = 0.2 alloy [26,27]. The rich precipitates Ihnl have risen Io lop ofboule curve for MCT-4 (50 kG field) shows a similar due toconsfilutional initial transient and steady-state section. However, a supercooling sharp increase in the CdTe content is observed near the last-to-freeze end just before the final transient. To ensure that this rise was not due to measurement error, IR compositional measurements were taken at various axial locations. There was excellent agree- ment between the two measurement techniques, see Fig. 3. This rise in CdTe content may be explained by constitutional supercooling ahead of the interface. Fig. 4, shows a schematic of the convective melt flows and solute boundary layer configurations for Fig. 5. Back-scatter micrograph of t_ quenched HgZnT¢ ingol the no-field and field cases. In the no-field case, a showing Zn-rich precipitates lll_tl have migrated to Ihe I(_l'_of the boule due Io Stokes illigratioi1 brought about b} cotlslitttlh+l_tl] region with intense convection (as compared to the supercooling [33]. growth rate) caused by radial thermal gradients is assumed to occur between a bulk of diffusion-con- trolled melt and the growth interface as proposed by of this phenomenon is demonstrated in Fig. 5. which Kim and Brown [28] to explain axial segregation illustrates a back-scattering electron micrograph of a patterns seen in HgCdTe crystal growth experiments quenched HgZnTe ingot grown by Lehoczky et al. by Szofran and Lehoczky [29]. Hence, the axial [33]. It clearly shows Zn-rich precipitates Ih;alh_tve temperature gradient in the melt is sufficient to avoid migrated to the top of the boule due to Stokes constitutional supercooling due to the flatness of the migration resulting from constitutional supercooling. compositional profile and normal solidification pro- ceeds. In the case of growth in the presence of a 3.2. Ra_fial coml_ositioJud distribution,s" stabilizing magnetic field, the elimination or reduc- tion of convection allows for the build up of the 3.2.1. Radial segregation." initial trallsients diffusion-controlled solute boundary layer closer to Fig. 6 shows the radial compositional variations the solid-liquid interface. As the axial temperature for wafers 2.5 cm from the first-to-freeze portion of gradient is held constant, this stiffer solutal boundary ingots MCT-D2 (zero field) and MCT-4 (50 kG layer produces a region in the liquid ahead of the field) as determined by IR transmission-edge mea- interface that is at an actual temperature below its surements. The pattern of low Cd content al the equilibrium liquidus temperature. Accordingly, this center (high Hg content) and high Cd content along can lead to homogeneous nucleation of solid-phase the edge of wafer #2.2, prepared from the MCT-D2 particles, richer in Cd (higher x) than the bulk melt, ingot, is consistent with other results obtained prc_i- which float upwards because their densities are less ously in the absence of a magnetic field. As noted than those of the melts. This phenomenon of buoyant earlier, the vertical directional solidification of Hg- rising of solid particles, or Stokes migration, has based II-VI systems is characterized by double dif- been observed during vertical Bridgman-Stock- fusive convection and a concave (toward the solid) barger growth experiments of HgCdTe [30,31] and growth interface. Thus, the denser Hg-rich melt tends HgCdSe [32] and is consistent with the results from to accumulate at the center of the crucible resulting the growth of the MCT-4 ingot. Conclusive evidence in the radial compositional profile shown in Fig. 6a. 484 D.A. Watring, S.L Lehoczky / Journal of Crystal Growth 167 (1996) 478-487 Fig. 6b shows the radial profile for growth in the Briefly, they solved the species continuity equation presence of the stabilizing magnetic field. The order for the radial solute concentration in the solid crystal of magnitude improvement in radial homogeneity at the solid-liquid interface with the assumptions of clearly indicates that the magnetic field was effica- no convection in the liquid and that the solid-liquid cious in suppressing convective effects on segrega- interface could be represented by a Fourier series. tion. Fig. 6c shows the composition variation across Their work showed that in the limiting case, the the diameter of the two samples. Compositional vari- transverse segregation in the solid is proportional to ations in other wafers in the initial transient region the deviation of the interface from planarity, the show similar behavior. proportionality factor being just the product of the unperturbed concentration gradient and the distribu- 3.2.2. Radial segregation: steady-state region tion coefficient given by In an effort to quantify the effects of the magnetic ac/co = (k- I)(R/DL)a_', (3._) field on the radial segregation, the experimental re- sults were compared to the analysis of the lateral where AC is the difference in composition at the solute segregation associated with a curved solid- edge and center of the wafer, k is the equilibrium liquid interface during steady-state unidirectional so- segregation coefficient, R is the translation rate and lidification of a binary alloy as derived by Coriell A( is the interface deflection. These calculations are and Sekerka and described in detail in Ref. [34]. applicable for crystal growth in a stabilizing mag- 0,50 °°°l o.'° o.,o _ 0.20 O. 0.(1_ -__ 0.45 (¢) _MCT-4 (50 kG)_ 0.40 O ff 0.35 .o 0.30 O 0.25 0.20 ..................... '....... '................... iiiii -4 -3 -2 -1 0 1 2 3 Radial Position (mm) Fig. 6. Compositional profiles for (a) MCT-D2 (wafer #2.2) 2.5 cm from first to freeze, grown without a magnetic field, (b) MCT-4 (wafer #4) 2.5 cm from first to freeze, grown with a 50 kG stabilizing magnetic field and (c) comparision of radial profiles.

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