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Nanoscale Devices Nanoscale Devices Physics, Modeling, and Their Application Edited by Brajesh Kumar Kaushik CRC Press Taylor & Francis Group 6000 Broken Sound Parkway NW, Suite 300 Boca Raton, FL 33487-2742 © 2019 by Taylor & Francis Group, LLC CRC Press is an imprint of Taylor & Francis Group, an Informa business No claim to original U.S. Government works Printed on acid-free paper International Standard Book Number-13: 978-1-138-06034-0 (Hardback) This book contains information obtained from authentic and highly regarded sources. Reasonable efforts have been made to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not been obtained. If any copyright material has not been acknowledged please write and let us know so we may rectify in any future reprint. Except as permitted under U.S. Copyright Law, no part of this book may be reprinted, reproduced, transmitted, or utilized in any form by any electronic, mechanical, or other means, now known or hereafter invented, including photocopying, microfilming, and recording, or in any information storage or retrieval system, without written permission from the publishers. For permission to photocopy or use material electronically from this work, please access www.copyright.com (http://www. copyright.com/) or contact the Copyright Clearance Center, Inc. (CCC), 222 Rosewood Drive, Danvers, MA 01923, 978-750- 8400. CCC is a not-for-profit organization that provides licenses and registration for a variety of users. For organizations that have been granted a photocopy license by the CCC, a separate system of payment has been arranged. Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation without intent to infringe. Library of Congress Cataloging‑in‑Publication Data Names: Kaushik, Brajesh Kumar, editor. Title: Nanoscale devices : physics, modeling, and their application / [edited by] Brajesh Kumar Kaushik. Description: Boca Raton : Taylor & Francis, a CRC title, part of the Taylor & Francis imprint, a member of the Taylor & Francis Group, the academic division of T&F Informa, plc, 2019. | Includes bibliographical references and index. Identifiers: LCCN 2018026865| ISBN 9781138060340 (hardback : acid-free paper) | ISBN 9781315163116 (ebook) Subjects: LCSH: Nanoelectronics. | Nanoelectromechanical systems. | Nanotechnology. Classification: LCC TK7874.84 .N3835 2019 | DDC 621.381--dc23 LC record available at https://lccn.loc.gov/2018026865 Visit the Taylor & Francis Web site at http://www.taylorandfrancis.com and the CRC Press Web site at http://www.crcpress.com To my Father, Late Mr. Jai Prakash Kaushik, and my Mother, Mrs. Karuna Kaushik, for their affection and untiring efforts in my upbringing. Also dedicated to my wife, Supriya, and our loving son, Partha Kaushik. Life has been really enjoyable because of the efforts of all my friends and students. Dedicated to all of them. Brajesh Kumar Kaushik Contents Preface ..............................................................................................................................................ix Acknowledgment ........................................................................................................................xiii Editor...............................................................................................................................................xv Contributors ................................................................................................................................xvii Section I Nanoscale Transistors 1. Simulation of Nanoscale Transistors from Quantum and Multiphysics Perspective ...............................................................................................................................3 Zhipeng Dong, Wenchao Chen, Wen-Yan Yin, and Jing Guo 2. Variability in Nanoscale Technology and EδDC MOS Transistor .............................25 Sarmista Sengupta and Soumya Pandit 3. Effect of Ground Plane and Strained Silicon on Nanoscale FET Devices................51 Saurabh Chaudhury and Avtar Singh Section II Novel MOSFET Structures 4. U-Shaped Gate Trench Metal Oxide Semiconductor Field Effect Transistor: Structures and Characteristics ...........................................................................................69 Deepshikha Bharti and Aminul Islam 5. Operational Characteristics of Vertically Diffused Metal Oxide Semiconductor Field Effect Transistor .............................................................................91 Deepshikha Bharti and Aminul Islam 6. Modeling of Double-Gate MOSFETs .............................................................................109 D. Nirmal and J. Ajayan Section III Modeling of Tunnel FETs 7. TFETs for Analog Applications .......................................................................................127 Marcio Dalla Valle Martino, Paula Ghedini Der Agopian, Joao Antonio Martino, Eddy Simoen, and Cor Claeys 8. Dual Metal–Double Gate Doping-Less TFET: Design and Investigations ............159 Ramandeep Kaur, Rohit Dhiman, and Rajeevan Chandel vii viii Contents Section IV Graphene and Carbon Nanotube Transistors and Applications 9. Modeling of Graphene Plasmonic Terahertz Devices ................................................175 Neetu Joshi and Nagendra P. Pathak 10. Analysis of CNTFET for SRAM Cell Design ...............................................................205 Shashi Bala and Mamta Khosla 11. Design of Ternary Logic Circuits Using CNFETs........................................................225 Chetan Vudadha and M. B. Srinivas Section V Modeling of Emerging Non-Silicon Transistors 12. Different Analytical Models for Organic Thin-Film Transistors: Overview and Outlook .........................................................................................................................257 W. Boukhili and R. Bourguiga 13. A Fundamental Overview of High Electron Mobility Transistor and Its Applications ...........................................................................................................275 D. Nirmal and J. Ajayan Section VI Emerging Nonvolatile Memory Devices and Applications 14. Spintronic-Based Memory and Logic Devices .............................................................301 Jyotirmoy Chatterjee, Pankaj Sethi, and Chandrasekhar Murapaka 15. Fundamentals, Modeling, and Application of Magnetic Tunnel Junctions...........337 Ramtin Zand, Arman Roohi, and Ronald F. DeMara 16. RRAM Devices: Underlying Physics, SPICE Modeling, and Circuit Applications .........................................................................................................................369 Firas Odai Hatem, T. Nandha Kumar, and Haider A. F. Almurib 17. Evaluation of Nanoscale Memristor Device for Analog and Digital Application ..........................................................................................................................393 Jeetendra Singh and Balwinder Raj Index .............................................................................................................................................425 Preface The pace of advances in nanoscale materials and devices has led to a gamut of develop- ments in the emerging areas of science and technology that has permeated to almost all applications. The rapid growth of the electronics industry can be attributed by and large to the continuous progress in nanotechnology driven by a relentless pursuit of innovation. With the new prospects from emerging nanomaterial and devices, a frontier challenge is to gain insight into their behavior and properties. The aim of this book is to integrate developments in the area of nanoelectronics devices and systems, evolving from a unify- ing set of principles and practices. This book is a collective effort of well-known pioneers and many leading researchers in the field of nanoelectronics, nanomaterials, plasmonics, and related areas, providing extraordinary breadth and depth of coverage. To comprehend this book, a basic knowledge of semiconductor physics is assumed. In 17 chapters, grouped under 6 subareas, the book eloquently covers the major advancements in the field of nano- electronics. The book presents an interdisciplinary perspective of nanoelectronics and can serve as a comprehensive reference for researchers and academicians working in the area of nanotechnology. The continuous miniaturization of transistors has been considered a primary reason behind the progress in the electronics industry. New approaches based on quantum mechanics and a multiphysics perspective are now required to accurately model these nanoscale transistors. The first section of this book provides a comprehensive overview of quantitative understanding of the operation of nanoscale transistors. It begins with an introduction to nanoscale transistors, their current state of development, and various challenges associated with commercialization of the technology. Chapter 1 of the book deals with the recent development in modeling and simulation of nanoscale transistors. A multiphysics approach has been used to capture the relevant physics at the atomic level while taking quantum effects into account. The major challenge to the present and next- generation nanoscale device is the variability that requires serious attention. Considering this fact, Chapter 2 discusses the major sources of variability in nanoscale devices and circuits. To increase the robustness of a design, the impact of process, voltage, and temper- ature variation has been modeled and analyzed using technology computer-aided design (TCAD) simulations. An epitaxial delta-doped channel (EδDC) MOS transistor is a prom- ising approach for extending the scalability of bulk metal oxide semiconductor (MOS) technology for low-power system-on-chip applications. The subsequent part of the chapter discusses the structure and characteristics of EδDC MOS transistors and compares them with a conventional MOS transistor. For nanoscale semiconductor field-effect transistor (FET) devices, several efforts have been made to reduce the short-channel effects (SCEs). For controlling short-channel effects, a ground plane can be formed in the silicon substrate underneath the buried oxide. Chapter 3 compiles the application of ground plane and strained engineering for high-performance silicon on insulator (SOI) FET devices. The first part introduces the concept of ground plane in SOI structures and the method of incorporation in fully depleted silicon on insulator (FDSOI) and fin field-effect transistor (FinFET) devices. The later part of the chapter dis- cusses the strained-silicon concept to boost the device performance through higher carrier mobility and reduced source/drain resistance. The chapter discusses the basic concepts for ix

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