Modeling and Simulation in Manufacturing and Defense Acquisition PDF
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Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html i ald, ne gin he orie retai ginal paper book, not from tmatting, however, cannot bative version for attribution. Miond DMeelaiAfnnegcun qafsauenc idsSt iuSytrisiomitnengum laasntidon e oric forhorit om thpecifie aut en recomposed from XML files created frs, heading styles, and other typesetting-se the print version of this publication as th ComBfDoomria vir2tidt1se isoeotn noC Mnoe nnMa tnEuoPurndyafgea tiMlchnitnweuageran iryaunisnnfg agdt cao aStn uSndirmud iE ncuPncglheag aystininssoidecn eaA rEli cnnSqghcu aiDiensneictcseiieomgsnnents eks National Research Council bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic NATIONWALas RhiEnSgAtoRn,C DH. CC.OUNCIL Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html ii ald, ne gin he orie retai NOTINCaEt:i oTnhael pArocjaedcet mthya tP irs etshse 2s1u0b1je Ccto onfs tthitius trieopno Art vweansu aep, pNr.oWve.d W bya sthhien Ggtoovne,r nDiCng 2 B0o4a1r8d of the ginal paper book, not from tmatting, however, cannot bative version for attribution. 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All rights reserved. en recos, headie the pri eks bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html iii ald, ne gin he orie retai ginal paper book, not from tmatting, however, cannot bative version for attribution. sTohcei eNtayt ioofn dails Aticnagdueimshye do fs Schcioelnacress e ins gaa pgreivda itne, sncoinenprtoiffiict, asneldf -epnegrpineteueartiinngg om the oripecific fore authorit ruthesseee Cfaorocrn htgh, rede egsdse inicnear t1ae8ld 6w t3oe, l tfthaheree fA.u Urctaphdoeenrma tnhyce eh aaousft hasco mireiatnync deoa fat tneh dteh tcaehtc ahrrentqoeurlo igrgeryas n aittne tddo t taood tivht iebsiyer een recomposed from XML files created frks, heading styles, and other typesetting-sse the print version of this publication as th tATcosrEnaATheehcuehhnlcslehabeteeegap sreid cf dioItetNrentseeanntvide,msaornsse e eeitntidomybrrisin fioita oi nno ucpelnltfigfn ogrht tag eiye tu Eetalose s s orflniA Nnv sdoaomfgego cegrafiMr e ina nteasnenmitdesdpoe nmeeo evobdnegerfmieneiaidri scnntrsnsliuhyis gno.teAn,ce .gr oIoee sasct Nfrn ht t aw sehiia Eads.soneart ceniDi gnasofnmig iu eerenganid.tnysan ne oewWt tleedao nriAriebfa fomtirirll hcnce mSiiga sg nsAtcahdoho egipneev.eeua rdmde WwnrsoN r c ciytgnainuaehen smr otcls,a 1 if efi,hoema9 tsinannSns7tssstaai cd 0 .ac plbai a TdeabrAirl nmilmepehys cccsame heaietio rnhedNddsaagdei. eetl aasn ltmnNittteeini rtlrzmoya a so1eon tt.oeifsi9ar oefDo g l6tn tt nSahAhi4rann. cee,la c g iiB AuaneNzs dnnrnaducauedacta ptiimcteedioneiesrooenyr tnmnttiM hhhoooaayeeefrfll. bau as brese of Sciences to secure the services of eminent members of appropriate n of the original work hnal; line lengths, word dentally inserted. 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Page some typographic jAowofwl ibtnhweterl. ntyNsa baattiyniood nbn Daoaltlr- h.aR WcAeascmdeaea dAmrce.hi meW Csi.ueoolsruf gn aacnriedl. cthhaei rImnsatnit aunted ovfic Me cehdaicirimnea.n D, rre.s Bpercutcivee Mly., Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html iv ald, ne gin he orie retai COMMITTEE ON MODELING AND SIMULATION ginal paper book, not from tmatting, however, cannot bative version for attribution. PEDJAEREMTINKEEI SRAS TENE...TCCCOLAOMEENSONMSTALSHREANOONAHUN,T ANE,FS CNa,CA saG,t ElCmJiRofMaoTChnrn nU IEsKni aRHtNo eIdorInTanpNskakSti tGitCi nuoFso tne AOmUa olNpn,Rf aiV vDTn 2ieyee r1c,Ans hRSintnCayoTo, c QAl VhoCpegiUrspEygtlIe,ii NSnerP,diI aTaN TsPaUehIdwyORe snYiYNacosr Lk,a bCohraaitrory, e oric forhorit Laurel, Maryland om thpecifie aut YMUA-RCYH IA HNON, HHOarRvaTrEd RU, nLivoecrkshiteye,d C Mamarbtirnid Agee,r oMnaasustaiccsh,u Fsoetrtts Worth, Texas mposed from XML files created frng styles, and other typesetting-snt version of this publication as th PJJMSCBPOARTAHEIHYUKARTAN AREDNLR LIREAELLC ETE.ERDKMP ,SD.S PU IJ KT LT.EPnDA..CT.iWKZOvRHTHeEUYRYIrIONs,L,G, i SFtTEEOLyLohR, El roeAdP,dRf SrM ,DoRW ,aC goUinetairmsdrsnareecinimia avnoCe re NingcOoorsihasnreif pitnf LtiUMio-yocaMr nnebeoaairlitofvllli r owoeALannratars ,oiubiU zMrtkoyyoner,,nci a evNLDateo,eo errTaasrinfeuirotb,scy l,oVsk, A orP,in nrlVi,bgt tMuiisnrqbgiiuaucinehrigriaqghua, enP, eNnenwsy Mlvaenxiiaco en recos, headie the pri eks bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html v ald, ne gin he orie retai BOARD ON MANUFACTURING AND ENGINEERING ginal paper book, not from tmatting, however, cannot bative version for attribution. JFPRO.AOPSMEBECTEEPhERLHaRTAi r G BEAO.AW.DEGIRRARE,NT TWH,i gS,, eaTRrnh dSaeiyc aBic ehNoneeatmiitnfii ogcCn ,C aDIolnor ELcmp.oa,Sp rbBaaIontGoriyyoa,Ntnn oS troe(inreae stBtt,li erAee,a ldcWb)hu,, aq sFMuhleoitrn.rq giduStoaeh,na Nsteaw, CMaelixfoicronia, om the oripecific fore authorit PRJAAICYUH LLA EBRE.GD, UE LRn.KiMvEeErGsRiGtAy, AoMDf iWl,a Acisruocgonin,r isInnin cS-.yM (srtieeltwmiraesud, k)I,ne eCc.i,n Cciunpnearttii,n Oo,h Cioalifornia mposed from XML files created frng styles, and other typesetting-snt version of this publication as th JMMJJAJJTAAOAOOLIAMMECECNFN LKMHOHEEI I SSSANMS.iWMcA HEShMBAHIMOiL .ZgRARMI aUTEFVEITnEC.E,ECEM THO,ELLH IAcCTk, O AGYJllAEatRSURUah,,A . rAoUXD,uN mMmTIn,Ka IDiaHIta,Evi ,siSoA e,NGrs rntSeansa,aac acantArlterhl ton A nFuCTUroesLreefnrebf-cn,tio ChtvtICsrenneI, roO Icro Mnrs.lf,p,iso o tiWoPtygcriro t yhau(aMr irttsCtgieelhoaaato iinonnnnrruf,pedg fAdo,Tt ao)rOerc,anl ctriStu,hnie toDrgngiinloont.lo,Cwnlg onD .ag,Sa tyVeyc,rit ieoCrgnnaic,mn eOisba,hr iiAodgnen Arbor, en recos, headie the pri eks bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html vi ald, ne gin he orie retai ginal paper book, not from tmatting, however, cannot bative version for attribution. e oric forhorit om thpecifie aut mposed from XML files created frng styles, and other typesetting-snt version of this publication as th en recos, headie the pri eks bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html PREFACE vii ald, ne gin ginal paper book, not from the orimatting, however, cannot be retaiative version for attribution. The goal of virtual analysis oPverr tehef alifce ecycle of a product or system—from om the oripecific fore authorit ic“sol unmscta etdpoet d, uwfosetr” ms—eaetikiso antos luaonsfetdy m aesov diatel iulsian dtgiio fafnin,c du alstri ctmoh uiatletatcattiiuonrn.e B toed faeoivrdee l iaonnp, yma mceanoptn,i tga slop etehxcepirfe intchdaiitntiuogrnse,, mposed from XML files created frng styles, and other typesetting-snt version of this publication as th dcderEroineerfeifnsefdvs ttehppaaeuhcatioosceeltTntnseei ivcaDhdsgditeleee a ).etmdn ,titp eNemeorSea ssi nantrsaeisrtgetkt omirtsxno ooen at efnqf g-n( dnogauo taetrlheef l pp oynesR2brltf seoo1 oe pirfDygssstarrht,moerote ei apmCdfotesrehrunsnec onet c nhthvse —ttt pe eivouCsor. owrD itoroToyhl duaeun ahsurtfMnt yeide cfocis on tsacitn rs,lenoto a' hesmtumsrrh i uyfMsC semap iy aconorpidsntimt dotugitdtefeerrhhm fmtielreit nie c iin wpngtvuafgtr ioenlaot eataehlsd dlnun de agudottd ,ihsocf no kiAerSta ne,ee Ml ilcamd bdmdqrue wo,yatuu tcodnl tiliMeie leasufdldrilte f,t&oii a- inopcc occtSgnorhynhto u secO ecavtrawl a niefifpanpdofda enicgaesl crldobS ,oepf siiif wolrrmt(naiioirDtcnissmiucntkregMeelegse,a,rs a :dSt.staa sih( nOone1tiadodnnd))t en recos, headie the pri wdeislli gsnu,p pteosrtti negn,h aanndce md adneufefnacsetu sryinsgte mprso acceqssu itseictihonno; l(o2g)i eidse tnhtaifty c sapne cbief iecn eambleerdg ibnyg eks advanced M&S capabilities; (3) relate these emerging technologies to long-term bau as brese DOD requirements; (4) assess ongoing efforts to develop advanced M&S epresentation of the original work he to the original; line lengths, word ve been accidentally inserted. Plea JActrmcaaeeuplaeclpcapnnp hoxprateeenemieb amPpronris2mrrl ldu,iieo0i tivemnsggix0anee oi 1 tAsnedDvBe st peesO )tairpo,dpn annDe edt dmonoc ru rnadie eesfn iivhnitatdxdcrhietlye e i eaAUtglnw, rya cot ).bu; iSovb. fon pym.erT(ri ir r5cvaemheno)tefgvemo imria nitrsiocpetidgimeeotunsesies mstee n., rs ftatm(achr,ilcB foniiatyaiftmdiitteel oo t rde bugnlameeenenrst rsuaan uimastvprtesoloieelhtefo ny irtients s c oxbafi ffatinperullyvl o een-seemdadafak xiriftece ltpniftledqtmiheeec l udredidheriats eesesstei vs esftt beoor decioooae nla ofmrrtnp m wcep-cra hsremoeabee ilekmianleaelnaervndinmtc t aduetiJh eintd suat hstdt tcnnr. eeeeyedMt evno ; e2ettmp&oem0laior ecS0nseepms0d nr mwg ab((aissebe(ennee6rnlrgdeeees)t s new digital rbreaks are truerrors may ha rMSAeupc&cophSme n imadnri eexanac sdq auCatiiss)o ,in tMiso.a n&On aSdnn tdhi niteto sb t raaassdisinsiosi concifuga s ittesas d ns dftaua ntnledocm tgieiosndnttiea covls fea lrtaoeanpasaks l,,y ettshshipese ,eic rco aimas lclmwyo niemtctlella uen saufisoof acndcusets uteardiianl noegddn. ut this PDF file: Thisetting files. Page some typographic udstsiusecd ouyTfs. shmieoo ncd oeomlfi nmsgyi tsatteneedm hssai mse niudgleianntietoiefnrii eindng s,m tewapnesur effo acrc otpunrrsoiigndrgee rsaesnd dt oa awsc aqbruedyi swoitniiddoe ntshper esacdo, psey sotfe mthiec Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html PREFACE viii ald, ne gin he orie retai otefc hsnyosltoegmys, o(2n) feonuhra nfcroenmtse:n t (1o)f einnhfoarnmceamtioenn t teocf hnmoolodgeyli ngin fraansdtr uscitmuruel,a ti(o3n) ginal paper book, not from tmatting, however, cannot bative version for attribution. besaimnincumdeqtiealuuudrnsPilpistiaenrnrittyitgigesio. rofe nuEnesT l,x.. ChpapReaarreeeosynrtc gi dreoort mnoem, (cs Cu4msesbh) tta ee oiincnar bobdd emeedt dhrreu eee snsa ttsdelruiipeuznsrselegty d a i n.kocviefmuon ll ptmvuoseroira mtdtlah eunellcti t nfhaegeand nneeagoarbenualsdsle l grysnos eivimefneodr urnel adamlmt lie oiancfnnt o ,u mmaifnacmo cadtdulueaenrlrmiiigtnnieigega-s s, caaaafnnnolddder e oric forhorit Committee on Modeling and Simulation Enhancements for 21st Century om thpecifie aut Manufacturing and Acquisition mposed from XML files created frng styles, and other typesetting-snt version of this publication as th en recos, headie the pri eks bau as brese n of the original work hnal; line lengths, word dentally inserted. Plea epresentatioe to the origive been acci s new digital rbreaks are truerrors may ha ut this PDF file: Thisetting files. Page some typographic Abotypeand Copyright © National Academy of Sciences. All rights reserved. Modeling and Simulation in Manufacturing and Defense Acquisition: Pathways to Success http://www.nap.edu/catalog/10425.html ACKNOWLEDGMENTS ix ald, ne gin ginal paper book, not from the orimatting, however, cannot be retaiative version for attribution. The Committee on MAodceklinng oanwd Sliemdulgatmione Ennhtasncements for 21st Century om the oripecific fore authorit MtAhneadinrru epfwraec,s teuUnrSitnaAgtiF oa,nn sdA tiAor ctFqhouer icscieot imoEnmle wictttoreouenl doic vl iekSre yt shttoee mtchosa unCrkse etnh oteef r f;to hlBilsoa wslktiurnidgsyh i:nn Madniav jiAodrnu naElimsg efiroliyr, mposed from XML files created frng styles, and other typesetting-snt version of this publication as th UMEMRJCSTNiitemaeenmotaclsaeirdi htelrutfe,e,ianol KdnlraDorIi c;ntnnol iOhoiTtgorWae;rgD n e;igaMy s ca Mrn,;Dhla OdtintekWai eIrforteSndeft l ii ics oHlKLcmltMtgeiioaoaatui;nrumael ml ldtnosaieCr s rtufo iy,M hfoC Dw,afanD occoeLsr QrtlfekrOouepe piucsrn,ofu i kCfasrnRtiyhaeycrMgat ,eee R i yeao;cUTU tedtLnEhiens .v;eMSecer denaoha.e L nainrnreAcr,T; oT t hiSiBClSenr oNae ctl ;geoncF haDyEprodtnoei hd ieoroEtlIec,laelnn lnnoereC iayLg gtnliKaR i iu anteoteneeIBesifesrncv,e pj eleseroetaitfih;Ulrrinor ltk,ecaW gurn mThdr;tiA e ,vahSaC LyAerentomrea no,rsBr vbemfpyi eo tUoo yyO reHSfrS a ioa'MttnACataroogil noFroofl O,y dndn,C L ;ane;pS o roDolReDodmicrrnuesi,aekcpg fttlhUhhea ioaaoenaenr.nnenrrseSyddnddess.; en recos, headie the pri ACoirr pFoorracteio An;e rJoanmauetsi cPalo iSnydsetxemters, CUe.nSt.e r;A Sirt evFeo rOcels oRne, sCeaorncchu rLreanbto Traetcohryn;o lEogllieens eks Purdy, U.S. Army Future Combat Systems Program Office; Ric Sylvester, Office bau as brese of the Deputy Under Secretary of Defense for Acquisition Reform; Steve Wall, epresentation of the original work he to the original; line lengths, word ve been accidentally inserted. Plea JCMIOptohneefofe ttorfe tr sdiNhprpcneioTTPeaeslar,rtcihh tainoiftiiiontioogsspivnd orn uaeae rnalctnslepshl; o dpRi eaeaomC onnieSnnrorddms di tsreme ptuianRehtLuoprttcaaec lrapharsneahboe ntd t oivriCbioyotarci eon aenldaZesutw luOooni snret ru tficixyenfprsitp,ilel ghp c,'tevs a oeoDtr in(N,rh te Nteipkaew sAfrnss Reesoet dS,atnCvd u LiAfsH infd'edsT ;b ey ) eaaSCy i tcRkp y c cMtkreasihoonEiptnei recJdokdid meolDireiaevstdo sne seiR n nd.cfMasWeee unanv aadrBwesiln, esn ejicoa owt drgfhMrcie ek tthClpihmom,co roedasoea melSecnCn lncemcti,o n idoCeilgfumtUenoot rmecarmleSle ensaeA.e tdn AgahTnF epeStph,.spi pier Rmr tl Dophiedcuvuaesialeetrfvat pedaietwonoir robcnssislnhyeeesl s new digital rbreaks are truerrors may ha apecsvoosimsidssemitb neltcehne eta,s n aaadnun dttdoh odreerrnssasp futao rnmneds ati hvntaehutnes cte hrsNiespR rtte Corpe otmihrntea mimnst eacuekodtisnyn f igincd shettahintretugi taepil.o u tnTboal hlpi esrsh otcaetoendncd ttra eetrnhpdteoss r iftnoo tfrae sogt hbrsiejtoe yucr etnoivdfv i itethawyes, ut this PDF file: Thisetting files. Page some typographic dpealritbiceirpaatitvioen pinro tchees sr.e vWieew woifs thh itso r ethpeo rtth:ank the following individuals for their Abotypeand Copyright © National Academy of Sciences. All rights reserved.
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