Description:Content: Front Matter -- Fundamentals of Stress and Strain on the Nanoscale. Elastic Strain Relaxation: Thermodynamics and Kinetics / Frank Glas -- Fundamentals of Stress and Strain at the Nanoscale Level: Toward Nanoelasticity / Pierre Muller -- Onset of Plasticity in Crystalline Nanomaterials / Laurent Pizzagalli, Sandrine Brochard, Julien Godet -- Relaxations on the Nanoscale: An Atomistic View by Numerical Simulations / Christine Mottet -- Model Systems with Stress-Engineered Properties. Accommodation of Lattice Misfit in Semiconductor Heterostructure Nanowires / Volker Schmidt, Joerg V Wittemann -- Strained Silicon Nanodevices / Manfred Reiche, Oussama Moutanabbir, Jan Hoentschel, Angelika H̃hnel, Stefan Flachowsky, Ulrich G̲sele, Manfred Horstmann -- Stress-Driven Nanopatterning in Metallic Systems / Vincent Repain, Sylvie Rousset, Shobhana Narasimhan -- Semiconductor Templates for the Fabrication of Nano-Objects / Jo︠l Eymery, Laurence Masson, Houda Sahaf, Margrit Hanbucken -- Characterization Techniques of Measuring Stresses on the Nanoscale. Strain Analysis in Transmission Electron Microscopy: How Far can we go? / Anne Ponchet, Christophe Gatel, Christian Roucau, Marie-Još Casanove -- Determination of Elastic Strains Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Michael Krause, Matthias Petzold, Ralf B Wehrspohn -- X-Ray Diffraction Analysis of Elastic Strains at the Nanoscale / Olivier Thomas, Odile Robach, Sťphanie Escoubas, Jean-Šbastien Micha, Nicolas Vaxelaire, Olivier Perroud -- Diffuse X-Ray Scattering at Low-Dimensional Structures in the System SiGe/Si / Michael Hanke -- Direct Measurement of Elastic Displacement Modes by Grazing Incidence X-Ray Diffraction / Geoffroy Přvot -- Submicrometer-Scale Characterization of Solar Silicon by Raman Spectroscopy / Michael Becker, George Sarau, Silke Christiansen -- Strain-Induced Nonlinear Optics in Silicon / Clemens Schriever, Christian Bohley, Ralf B Wehrspohn -- Index.