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Mathematical Models for Systems Reliability PDF

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MATHEMATICAL MODELS FOR SYSTEMS RELIABILITY © 2008 by Taylor & Francis Group, LLC C0822_FM.indd 1 3/31/08 12:03:36 PM MATHEMATICAL MODELS FOR SYSTEMS RELIABILITY Benjamin Epstein Ishay Weissman © 2008 by Taylor & Francis Group, LLC C0822_FM.indd 3 3/31/08 12:03:36 PM Chapman & Hall/CRC Taylor & Francis Group 6000 Broken Sound Parkway NW, Suite 300 Boca Raton, FL 33487-2742 © 2008 by Taylor & Francis Group, LLC Chapman & Hall/CRC is an imprint of Taylor & Francis Group, an Informa business No claim to original U.S. Government works Printed in the United States of America on acid-free paper 10 9 8 7 6 5 4 3 2 1 International Standard Book Number-13: 978-1-4200-8082-7 (Hardcover) This book contains information obtained from authentic and highly regarded sources Reason- able efforts have been made to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The Authors and Publishers have attempted to trace the copyright holders of all material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not been obtained. If any copyright material has not been acknowledged please write and let us know so we may rectify in any future reprint Except as permitted under U.S. Copyright Law, no part of this book may be reprinted, reproduced, transmitted, or utilized in any form by any electronic, mechanical, or other means, now known or hereafter invented, including photocopying, microfilming, and recording, or in any information storage or retrieval system, without written permission from the publishers. For permission to photocopy or use material electronically from this work, please access www. copyright.com (http://www.copyright.com/) or contact the Copyright Clearance Center, Inc. (CCC) 222 Rosewood Drive, Danvers, MA 01923, 978-750-8400. CCC is a not-for-profit organization that provides licenses and registration for a variety of users. For organizations that have been granted a photocopy license by the CCC, a separate system of payment has been arranged. Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation without intent to infringe. Library of Congress Cataloging-in-Publication Data Epstein, Benjamin, 1918- Mathematical models for systems reliability / Benjamin Epstein and Ishay Weissman. p. cm. “A CRC title.” Includes bibliographical references and index. ISBN 978-1-4200-8082-7 (alk. paper) 1. Reliability (Engineering)--Mathematics. 2. System failures (Engineering)--Mathematical models. I. Weissman, Ishay, 1940- II. Title. TA169.E67 2008 620’.00452015118--dc22 2008010874 Visit the Taylor & Francis Web site at http://www.taylorandfrancis.com and the CRC Press Web site at http://www.crcpress.com © 2008 by Taylor & Francis Group, LLC C0822_FM.indd 4 3/31/08 12:03:36 PM Dedicated to my wife Edna and my children Shoham, Tsachy and Rom IshayWeissman © 2008 by Taylor & Francis Group, LLC Preface ThisbookhasevolvedfromthelecturesofProfessorBenjamin(Ben)Epstein (1918–2004)attheTechnion—IsraelInstituteofTechnology.Throughouthis tenure at the Technion, from 1968 until his retirement in 1986, he designed andtaughttwocoursesonReliabilityTheory.One,whichheconsideredtobe fundamental in reliability considerations, was Mathematical Models for Sys- temsReliability.ThesecondcoursewasStatisticalMethodsinReliability.As thesetitlesindicate,althoughtherewassomeoverlapping,thefirstcoursecon- centrated on the mathematical probabilistic models while the second course concentratedonstatisticaldataanalysisandinferenceappliedtosystemsreli- ability. Epsteinwasoneofthepioneersindevelopingthetheoryofreliability.Hewas the first to advocate the use of the exponential distribution in life-testing and developed the relevant statistical methodology. Later on, when Sobel Milton joined Epstein’s Math Department in Wayne State, they published their joint workinasequenceofpapers.HereiswhatBarlowandProschansayintheir nowclassicalbook[3]: In1951EpsteinandSobelbeganworkinthefieldoflife-testingwhichwas toresultinalongstreamofimportantandextremelyinfluentialpapers.This workmarkedthebeginningofthewidespreadassumptionoftheexponential distributioninlife-testingresearch. Epstein’scontributionswereofficiallyrecognizedin1974,whentheAmerican SocietyforQualitydecoratedhimwiththeprestigiousShewhartMedal. Epstein’s lecture notes for Mathematical Models for Systems Reliability have neverbeenpublished.However,in1969theyweretyped,duplicatedandsold toTechnionstudentsbytheTechnionStudentAssociation.Soonenough,they were out of print, but luckily, five copies remained in the library, so students couldstilluse(orcopy)them.AfterEpstein’sretirementandoverthelasttwo decades,Itaughtthecourse,usingEpstein’snotes.Duringtheyears,Iadded some more topics, examples and problems, gave alternative proofs to some results,butthegeneralframeworkremainedEpstein’s.Inviewofthefactthat the Statistical Methods in Reliability course was no longer offered, I added a © 2008 by Taylor & Francis Group, LLC brief introduction to Statistical Estimation Theory, so that the students could relatetoestimationaspectsinreliabilityproblems(mainlyinChapters1–3and 6). Itismyconviction,thatthematerialpresentedinthisbookprovidesarigorous treatmentoftherequiredprobabilitybackgroundforunderstandingreliability theory.Therearemanycontemporarytextsavailableinthemarket,whichem- phasizeotheraspectsofreliability,asstatisticalmethods,life-testing,engineer- ing, reliability of electronic devices, mechanical devices, software reliability, etc.TheinterestedreaderisadvisedtoGoogletheproperkeywordstofindthe relevantliterature. Thebookcanserveasatextforaone-semestercourse.Itisassumedthatthe readersofthebookhavetakencoursesinCalculus,LinearAlgebraandProba- bilityTheory.KnowledgeofStatisticalEstimation,DifferentialEquationsand LaplaceTransformMethodsareadvantageous,thoughnotnecessary,sincethe basicfactsneededareincludedinthebook. ThePoissonprocessanditsassociatedprobabilitylawsareimportantinrelia- bilityconsiderationsandsoitisonlynaturalthatChapter1isdevotedtothis topic.InChapter2,anumberofstochasticmodelsareconsideredasaframe- work for discussing life length distributions. The fundamental concept of the hazard or force of mortality function is also introduced in this chapter. For- mal rules for computing the reliability of non-repairable systems possessing commonly occurring structures are given in Chapter 3. In Chapter 4 we dis- cussthestochasticbehaviorovertimeofone-unitrepairablesystemsandsuch measures of system effectiveness as point-availability, interval and long-run availabilityandintervalreliabilityareintroduced.TheconsiderationsofChap- ter 4 are extended to two-unit repairable systems in Chapter 5. In Chapter 6 weintroducethegeneralcontinuous-timeMarkovchains,purebirthanddeath processesandapplytheresultston-unitrepairablesystems.Weintroducethe transitionsandratesdiagramsandpresentseveralmethodsforcomputingthe transition probabilities matrix, including the use of computer software. First passage time problems are considered in Chapter 7 in the context of systems reliability. In Chapters 8 and 9 we show how techniques involving the use of embeddedMarkovchains,semi-Markovprocesses,renewalprocesses,points ofregenerationandintegralequationscanbeappliedtoavarietyofreliability problems,includingpreventivemaintenance. IamextremelygratefultoMalkaEpsteinforherconstantencouragementand unflaggingfaithinthisproject.IwouldalsoliketothanktheTechnionatlarge, and the Faculty of Industrial Engineering and Management in particular, for havingprovidedsuchasupportiveandintellectuallystimulatingenvironment over the last three decades. Lillian Bluestein did a a superb job in typing the book,remainingconstantlycheerfulthroughout. © 2008 by Taylor & Francis Group, LLC Finally, and most importantly, I want to thank my wife and children for their continualloveandsupport,withoutwhichIdoubtthatIwouldhavefoundthe strengthtocompletethebook. IshayWeissman Haifa,Israel April2008 © 2008 by Taylor & Francis Group, LLC Contents 1 Preliminaries 1 1.1 ThePoissonprocessanddistribution 1 1.2 WaitingtimedistributionsforaPoissonprocess 6 1.3 Statisticalestimationtheory 8 1.3.1 Basicingredients 8 1.3.2 Methodsofestimation 9 1.3.3 Consistency 11 1.3.4 Sufficiency 12 1.3.5 Rao-Blackwellimprovedestimator 13 1.3.6 Completestatistic 14 1.3.7 Confidenceintervals 14 1.3.8 Orderstatistics 16 1.4 GeneratingaPoissonprocess 18 1.5 NonhomogeneousPoissonprocess 19 1.6 Threeimportantdiscretedistributions 22 1.7 Problemsandcomments 24 2 Statisticallifelengthdistributions 39 2.1 Stochasticlifelengthmodels 39 2.1.1 Constantriskparameters 39 2.1.2 Time-dependentriskparameters 41 2.1.3 Generalizations 42 © 2008 by Taylor & Francis Group, LLC 2.2 Modelsbasedonthehazardrate 45 2.2.1 IFRandDFR 48 2.3 Generalremarksonlargesystems 50 2.4 Problemsandcomments 53 3 Reliabilityofvariousarrangementsofunits 63 3.1 Seriesandparallelarrangements 63 3.1.1 Seriessystems 63 3.1.2 Parallelsystems 64 3.1.3 Thekoutofnsystem 66 3.2 Series-parallelandparallel-seriessystems 67 3.3 Variousarrangementsofswitches 70 3.3.1 Seriesarrangement 71 3.3.2 Parallelarrangement 72 3.3.3 Series-parallelarrangement 72 3.3.4 Parallel-seriesarrangement 72 3.3.5 Simplifications 73 3.3.6 Example 74 3.4 Standbyredundancy 76 3.5 Problemsandcomments 77 4 Reliabilityofaone-unitrepairablesystem 91 4.1 Exponentialtimestofailureandrepair 91 4.2 Generalizations 97 4.3 Problemsandcomments 98 5 Reliabilityofatwo-unitrepairablesystem 101 5.1 Steady-stateanalysis 101 5.2 Time-dependentanalysisviaLaplacetransform 105 5.2.1 Laplacetransformmethod 105 5.2.2 Anumericalexample 111 5.3 OnModel2(c) 113 5.4 ProblemsandComments 114 © 2008 by Taylor & Francis Group, LLC 6 Continuous-timeMarkovchains 117 6.1 Thegeneralcase 117 6.1.1 Definitionandnotation 117 6.1.2 Thetransitionprobabilities 119 6.1.3 ComputationofthematrixP(t) 120 6.1.4 Anumericalexample(continued) 122 6.1.5 Multiplicityofroots 126 6.1.6 Steady-stateanalysis 127 6.2 Reliabilityofthree-unitrepairablesystems 128 6.2.1 Steady-stateanalysis 128 6.3 Steady-stateresultsforthen-unitrepairablesystem 130 6.3.1 Example1—Case3(e) 131 6.3.2 Example2 131 6.3.3 Example3 131 6.3.4 Example4 132 6.4 Purebirthanddeathprocesses 133 6.4.1 Example1 133 6.4.2 Example2 133 6.4.3 Example3 134 6.4.4 Example4 134 6.5 Somestatisticalconsiderations 135 6.5.1 Estimatingtherates 136 6.5.2 Estimationinaparametricstructure 137 6.6 Problemsandcomments 138 7 Firstpassagetimeforsystemsreliability 143 7.1 Two-unitrepairablesystems 143 7.1.1 Case2(a)ofSection5.1 143 7.1.2 Case2(b)ofSection5.1 148 7.2 Repairablesystemswiththree(ormore)units 150 © 2008 by Taylor & Francis Group, LLC

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