Material Characterization Techniques and Applications PDF
Preview Material Characterization Techniques and Applications
Progress in Optical Science and Photonics Euth Ortiz Ortega · Hamed Hosseinian · Ingrid Berenice Aguilar Meza · María José Rosales López · Andrea Rodríguez Vera · Samira Hosseini Material Characterization Techniques and Applications Progress in Optical Science and Photonics Volume 19 SeriesEditors JavidAtai,Sydney,NSW,Australia RongguangLiang,CollegeofOpticalSciences,UniversityofArizona,Tucson, AZ,USA U.S.Dinish,InstituteofBioengineeringandBioimaging,A*STAR,Singapore, Singapore The purpose of the series Progress in Optical Science and Photonics is to provide a forum to disseminate the latest research findings in various areas of Optics and its applications. The intended audience are physicists, electrical and electronic engineers, applied mathematicians, biomedical engineers, and advanced graduate students. Moreinformationaboutthisseriesathttps://link.springer.com/bookseries/10091 · · Euth Ortiz Ortega Hamed Hosseinian · Ingrid Berenice Aguilar Meza · María José Rosales López · Andrea Rodríguez Vera Samira Hosseini Material Characterization Techniques and Applications EuthOrtizOrtega HamedHosseinian SchoolofEngineeringandSciences SchoolofEngineeringandSciences TecnologicodeMonterrey TecnologicodeMonterrey Monterrey,Mexico Monterrey,Mexico IngridBereniceAguilarMeza MaríaJoséRosalesLópez SchoolofEngineeringandSciences SchoolofEngineeringandSciences TecnologicodeMonterrey TecnologicodeMonterrey Monterrey,Mexico Monterrey,Mexico AndreaRodríguezVera SamiraHosseini SchoolofEngineeringandSciences SchoolofEngineeringandSciences TecnologicodeMonterrey TecnologicodeMonterrey Monterrey,Mexico Monterrey,Mexico ISSN2363-5096 ISSN2363-510X (electronic) ProgressinOpticalScienceandPhotonics ISBN978-981-16-9568-1 ISBN978-981-16-9569-8 (eBook) https://doi.org/10.1007/978-981-16-9569-8 ©TheEditor(s)(ifapplicable)andTheAuthor(s),underexclusivelicensetoSpringerNature SingaporePteLtd.2022 Thisworkissubjecttocopyright.AllrightsaresolelyandexclusivelylicensedbythePublisher,whether thewholeorpartofthematerialisconcerned,specificallytherightsoftranslation,reprinting,reuse ofillustrations,recitation,broadcasting,reproductiononmicrofilmsorinanyotherphysicalway,and transmissionorinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilar ordissimilarmethodologynowknownorhereafterdeveloped. Theuseofgeneraldescriptivenames,registerednames,trademarks,servicemarks,etc.inthispublication doesnotimply,evenintheabsenceofaspecificstatement,thatsuchnamesareexemptfromtherelevant protectivelawsandregulationsandthereforefreeforgeneraluse. Thepublisher,theauthorsandtheeditorsaresafetoassumethattheadviceandinformationinthisbook arebelievedtobetrueandaccurateatthedateofpublication.Neitherthepublishernortheauthorsor theeditorsgiveawarranty,expressedorimplied,withrespecttothematerialcontainedhereinorforany errorsoromissionsthatmayhavebeenmade.Thepublisherremainsneutralwithregardtojurisdictional claimsinpublishedmapsandinstitutionalaffiliations. ThisSpringerimprintispublishedbytheregisteredcompanySpringerNatureSingaporePteLtd. The registered company address is: 152 Beach Road, #21-01/04 Gateway East, Singapore 189721, Singapore Tothetruespiritofscience, Andtoscientistswhoservebeyondthe notionsof“I”and“mine”. Preface Newlydevelopedmaterialsrequireathoroughcharacterizationofbulkandsurface propertiesforanyapplicationtheymayserve.Thematerialscharacterizationdomain involvesawidevarietyofcharacterizationtechniqueseachpromotingadifferentlevel of understanding of the materials, their features, and functions. The present book offersdetailedinformationaboutthecommonlyappliedcharacterizationtechniques inmaterialscience,theirbriefhistoryandorigins,theirmechanismofoperation,the advantagesanddisadvantages,theirapplications,andatroubleshootingsectionfor eachtechniquethataddressesthechallengesresearchersmayfacewhenworkingwith thesetechniques,inadditiontothepossiblecausesandtherecommendedsolutions to counteract the errors. This book lends its focus to a profound understanding of thenatureofmaterialsincludinganalysesofmorphology,topography,mass,aswell as the characterization of elemental, structural, thermal, wettability, electrochem- ical,andchromatographypropertiesofsamples.Additionally,thebookfeaturesthe benefits of using characterization techniques simultaneously by covering some of thewidelyappliedcoupledanalyticalmethods. Monterrey,Mexico EuthOrtizOrtega HamedHosseinian IngridBereniceAguilarMeza MaríaJoséRosalesLópez AndreaRodríguezVera SamiraHosseini Acknowledgments Theauthorswouldliketoacknowledgethefinancialandtechnicalsupport ofWritingLab,InstitutefortheFutureofEducation(IFE),TecnologicodeMonterrey,Mexico. Additionally,theauthorswouldliketoexpresstheiramplegratitudefortherelentlessworkand supportofMichelleAlejandraEspinosa-HernandezandKatiaDonjuanineditingthefinaldraftof thebook. vii Contents 1 CharacterizationTechniquesforMorphologyAnalysis ............. 1 EuthOrtizOrtega,HamedHosseinian,MaríaJoséRosalesLópez, AndreaRodríguezVera,andSamiraHosseini 1.1 OpticalMicroscopyforMaterialCharacterization ............... 2 1.1.1 HistoryofOpticalMicroscopy ......................... 2 1.1.2 MechanismofOperationofOpticalMicroscopy .......... 5 1.1.3 AdvantagesandDisadvantagesofOpticalMicroscopy .... 11 1.1.4 ApplicationsofOpticalMicroscopy .................... 13 1.2 ScanningElectronMicroscopyforMaterialCharacterization ..... 19 1.2.1 HistoryofScanningElectronMicroscopy ............... 19 1.2.2 Mechanism of Operation of Scanning Electron Microscopy ......................................... 20 1.2.3 AdvantagesandDisadvantagesofScanningElectron Microscopy ......................................... 24 1.2.4 ApplicationsofScanningElectronMicroscopy ........... 25 1.3 Transmission Electron Microscopy for Material Characterization ............................................ 29 1.3.1 HistoryofTransmissionElectronMicroscopy ............ 29 1.3.2 MechanismofOperationofTransmissionElectron Microscopy ......................................... 31 1.3.3 Advantages and Disadvantages of Transmission ElectronMicroscopy ................................. 33 1.3.4 ApplicationsofTransmissionElectronMicroscopy ....... 35 1.4 TroubleshootingofMorphologyAnalysisTechniques ............ 37 References ..................................................... 41 2 CharacterizationTechniquesforMassSpectrometryAnalysis ...... 47 HamedHosseinian,EuthOrtizOrtega,MaríaJoséRosalesLópez, AndreaRodríguezVera,andSamiraHosseini 2.1 MassSpectrometryforMaterialCharacterization ............... 48 2.1.1 HistoryofMassSpectrometry ......................... 48 ix x Contents 2.1.2 MechanismofOperationofMassSpectrometry .......... 49 2.1.3 AdvantagesandDisadvantagesofMassSpectrometry ..... 52 2.1.4 ApplicationsofMassSpectrometry ..................... 52 2.2 Matrix-AssistedLaserDesorptionIonizationTime-of-Flight MassSpectrometryforMaterialCharacterization ............... 56 2.2.1 History of Matrix-Assisted Laser Desorption IonizationTime-of-FlightMassSpectrometry ............ 56 2.2.2 Mechanism of Operation of Matrix-Assisted LaserDesorptionIonizationTime-of-FlightMass Spectrometry ........................................ 58 2.2.3 AdvantagesandDisadvantagesofMatrix-Assisted LaserDesorptionIonizationTime-of-FlightMass Spectrometry ........................................ 60 2.2.4 ApplicationsofMatrix-AssistedLaserDesorption IonizationTime-of-FlightMassSpectrometry ............ 62 2.3 TroubleshootingofMassSpectrometryAnalysisTechniques ...... 64 References ..................................................... 67 3 CharacterizationTechniquesforTopographyAnalysis ............. 71 HamedHosseinian,EuthOrtizOrtega,MaríaJoséRosalesLópez, AndreaRodríguezVera,andSamiraHosseini 3.1 AtomicForceMicroscopyforMaterialCharacterization ......... 72 3.1.1 HistoryofAtomicForceMicroscopy ................... 72 3.1.2 MechanismofOperationofAtomicForceMicroscopy .... 73 3.1.3 Advantages and Disadvantages of Atomic Force Microscopy ......................................... 75 3.1.4 ApplicationsofAtomicForceMicroscopy ............... 75 3.2 RamanSpectroscopyforMaterialCharacterization .............. 78 3.2.1 HistoryofRamanSpectroscopy ........................ 78 3.2.2 MechanismofOperationofRamanSpectroscopy ......... 79 3.2.3 Advantages and Disadvantages of Raman Spectroscopy ........................................ 82 3.2.4 ApplicationsofRamanSpectroscopy ................... 82 3.3 TroubleshootingofTopographyAnalysisTechniques ............ 84 References ..................................................... 88 4 Characterization Techniques forChemical andStructural Analyses ....................................................... 93 EuthOrtizOrtega,HamedHosseinian,MaríaJoséRosalesLópez, AndreaRodríguezVera,andSamiraHosseini 4.1 RamanSpectroscopyforMaterialCharacterization .............. 95 4.1.1 HistoryofRamanSpectroscopy ........................ 95 4.1.2 MechanismofOperationofRamanSpectroscopy ......... 96 4.1.3 Advantages and Disadvantages of Raman Spectroscopy ........................................ 98 4.1.4 ApplicationsofRamanSpectroscopy ................... 99 Contents xi 4.2 Fourier Transform Infrared Spectroscopy for Material Characterization ............................................ 100 4.2.1 HistoryofFourierTransformInfraredSpectroscopy ....... 100 4.2.2 Mechanism of Operation of Fourier Transform InfraredSpectroscopy ................................ 101 4.2.3 AdvantagesandDisadvantagesofFourierTransform InfraredSpectroscopy ................................ 103 4.2.4 Applications of Fourier Transform Infrared Spectroscopy ........................................ 104 4.3 Ultraviolet–Visible Spectroscopy for Material Characterization ............................................ 107 4.3.1 HistoryofUltraviolet–VisibleSpectroscopy ............. 107 4.3.2 Mechanism of Operation of Ultraviolet–Visible Spectroscopy ........................................ 109 4.3.3 AdvantagesandDisadvantagesofUltraviolet–Visible Spectroscopy ........................................ 110 4.3.4 ApplicationsofUltraviolet–VisibleSpectroscopy ......... 111 4.4 X-Ray Photoelectron Spectroscopy for Material Characterization ............................................ 114 4.4.1 HistoryofX-RayPhotoelectronSpectroscopy ............ 114 4.4.2 MechanismofOperationofX-RayPhotoelectron Spectroscopy ........................................ 115 4.4.3 Advantages and Disadvantages of X-Ray PhotoelectronSpectroscopy ........................... 116 4.4.4 ApplicationsofX-RayPhotoelectronSpectroscopy ....... 117 4.5 DiffuseReflectanceInfraredFourierTransformSpectroscopy forMaterialCharacterization ................................. 119 4.5.1 History of Diffuse Reflectance Infrared Fourier TransformSpectroscopy .............................. 119 4.5.2 Mechanism of Operation of Diffuse Reflectance InfraredFourierTransformSpectroscopy ................ 119 4.5.3 AdvantagesandDisadvantagesofDiffuseReflectance InfraredFourierTransformSpectroscopy ................ 122 4.5.4 ApplicationsofDiffuseReflectanceInfraredFourier TransformSpectroscopy .............................. 122 4.6 X-RayDiffractionforMaterialCharacterization ................ 124 4.6.1 HistoryofX-RayDiffraction .......................... 124 4.6.2 MechanismofOperationofX-RayDiffraction ........... 126 4.6.3 AdvantagesandDisadvantagesofX-RayDiffraction ...... 128 4.6.4 ApplicationsofX-RayDiffraction ...................... 129 4.7 NuclearMagneticResonanceforMaterialCharacterization ....... 132 4.7.1 HistoryofNuclearMagneticResonance ................. 132 4.7.2 Mechanism of Operation of Nuclear Magnetic Resonance .......................................... 133
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