Journal of Research of the National Institute of Standards and Technology 1994: Vol 99 Index

13 Pages·1994·3.1 MB·English

Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Subject Index to Volume 99
Numbers in parenthesis in italic type after the page number are the issue numbers
No. 1 January-February
No. 2. March-April
No. 3 May-June
No. 4 July-August
No. 5 September—October
. 6 November—December
central hot-water-supply
ceramic polymers
absolute abundances
charge coupled devices
absolute measurement
charge injection devices
absorbed dose
chemical vapor deposition (CVD)
advanced materials
communications network
aerosol mass concentrations
composites
aerosol size distributions
computer assurance
aggregate excess
computer integrated manufacturing
aggregate excess distribution
computer security
agile manufacturing
concrete degradation
agriculture
conductance
alternative refrigerants
conical extremes
angle blocks
constitutive equations
annual maximum
convective barrier
antenna measurements
appliance
correlation-induced
artificial neural networks
spectral shifts
asymptotic joint distribution
corrosion
atomic weights
corrosion probability
autocollimator
coverage factor
cryogenic blackbodies
cryogenic radiomeier
backscattered electron ete Sey
Baldrige Award
Bayesian forecasting
beam addition method
data administration
data management
deconvolution algorithms
delamination
breakdown of dissipationless state dependence function
broadband diamond
brominated/chlorinated ethanes diffusion theory
Brownian walks digital voltmeter
dimensional measurement
dimensional tolerances
displacement damage
calibration distribution functions
calibration system distribution models
calorimeter dynamic amplification
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
169(2)
grinding 89(1)
earthquake Gumbel distribution 327(4), 391(4), 413(4)
electrical metrology
electrical reference standards
electrical substitution radiometry
electrolytic conductivity
hardware
ellipsometry
heat defect
enterprise integration
high strength steel
environment
hindcast
equivalent uniformly distributed load
histograms
ethenes
hydraulic pressure
exchangeability
extremal index
extreme event
information security
extreme live load
information system security
extreme response
infrared spectroscopy
extreme value analysis
Integrated Services Digital
extreme value distributions
Network (ISDN)
337(4), 413(4), 421(4), 445(4)
intercomparison
extreme value statistics 321(4), 485(4)
interferometer
extreme value theory 399(4)
irradiance
extreme values 313(4), 563(4)
isotope abundances
extreme wave heights
isotope ratio mass spectrometry
extreme wind speed
isotope reference materials
failure analysis
failure in bending
failure origin Jack-up platforms
failure stress
failure time
far field
fault tolerance
field emission lattice spacing
finite element analysis length metrology
finite element stress level excursions
flood frequency analysis linearity
377(4), 555(4) localized corrosion
DE citstsateinecsnsedsewesneaseesaees 377(4) long-tailed distributions
fracture low-sidelobe antennas
machining
Gaussian noises 377(4) magnetic field
generalized Pareto manufacturing
distribution 313(4), 399(4), 555(4) mapping
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Markov chain model 391(4) pressure
material clocks primary standards
mathematical modeling propanes
maximally exposed individual
maximum bedrock velocity public responsibility
maximum ground acceleration
maximum pit depth
measurement uncertainty
method of maximum likelihood
quality in research and development 673(5)
microbiology
quantized Hall resistance
microdosimetry
quantized voltage states
MIL-STD-462
quantum Hall effect 227(3), 757(6)
modulation spectroscopy
multivariate
multivariate extreme statistics
radiance
radiance temperature
radiated emissions
noise power
radiometer
noise standard
radiometry
noise temperature
267(3 ), 281(3), 283(3)
non-Gaussian waveloads
Raman scattering
nonlinear oscillators
Raman spectroscopy
nonlinear viscoelasticity performance
random fields
nonlinear wave response
random loading
nonmetallic inclusion
rate of convergence
normal sequences
reference material
null-balanced
reference temperature
refractive index
regular variation
relative atomic masses
optical coherence theory .. 267(3), 281(3), 283(3) resistance calibration
optical microscopy resistance standard
optical radiation detectors
353(4), 555(4), 765(6)
satellite imagery
satellite microelectronics
particulate matter 10 pm scaling analysis
path integral solution scanning electron microscope
peaks over threshold screened room
Penning trap secondary electron
photoluminescence silicon
piston gauge silicon photodiode
pitting corrosion 321(4), 495(4) silicon tetrafluoride
planar near field 143(2)
point process 543(4), 555(4)
Poisson random measures
polishing
polygons
potassium chloride spectroscopy
spherical dipole
standard radiator
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Standard Reference Material (SRM) 191(2)
standards 93(1 ), 255(3), 287(3), 687(5)
statistics of extreme values 345(4), 399(4)
Stein-Chen method x-ray diffraction 1(1), 285(3)
x-ray spectrometer 1(7), 25(3)
system equation
systems integration
tail-index estimator
technology transfer
telecommunications
temperature scales
thermal conductivity
thermal diffusivity
thermal expansion
thermai noise
thermistor
total power radiometer
transition probability matrix
trivariate extreme value distributions
two-dimensional electron gas
ultraviolet (UV) 765(6 )
uncertainty 19(7), 65(7), 191(2)
upper bound value
UV instrumentation
UV standards
wave heights
wave statistics
waveguide-below-cutoff attenuator
Weibull analysis
Weibull distribution
Weibull hazard function
Weibull risk-of-rupture function
399(4), 413(4)
Wolf shifts 267(3), 281(3), 283(3)
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Author Index to Volume 99
Numbers in parenthesis in italic type after the volume number are the issue numbers
No. 1 January-February
No. 2 March-April
No. 3 May-June
No. 4 July-August
No. 5 September—October
No. 6 November—December
Microelectronics. Marshall, P. W., Dale, C. J., and
Burke, E. A. 99(4), 485 (1994).
Anderson, C. W.
Critical Levels of Ozone Over the United
Kingdom: Mapping Aggregate Exceedances Over
Moderate to High Thresholds. Smith, R. L,
Anderson, C. W., and Fowler, D. 99(4), 353 (1994).
Cage, M. E.
The Aggregate Excess Measure of Severity of
Sources of Uncertainty in a DVM-Based Mea-
Extreme Events. Anderson, C. W. 99(4), 555
surement System for a Quantized Hall Resistance
(1994).
Standard. Lee, K. C., Cage, M. E., and Rowe, P. S.
The Measurement of Averages and Extremes of 99(3), 227 (1994).
Environmental Variables. Anderson, C. W., and
Spectroscopic Study of Quantized Breakdown
Turkman, K. F. 99(4), 563 (1994).
Voltage States of the Quantum Hall Effect. Lavine,
C. F., Cage, M. E., and Elmquist, R. E. 99(6), 757
Arif, M.
(1994).
Precision Comparison of the Lattice Parameters
of Silicon Monocrystals. Kessler, E. G., Henins, A., Castillo, E.
Deslattes, R. D., Nielsen, L., and Arif, M. 99(7), 1
Extreme Value Analysis of Wave Heights.
(1994).
Castillo, E., and Sarabia, J. M. 99(4), 445 (1994).
Erratum: Precision Comparison of the Lattice
Parameters of Silicon Monocrystals. Kessler, E. G., Chapman, R. E.
Henins, A., Deslattes, R. D., Nielsen, L., and Arif,
Quest for Excellence VI. Parrott, C., and
M. 99(3), 285 (1994).
Chapman, R. E. 99(5), 673 (1994).
Arvay, E.
Chen, H. M.
A de Method for the Absolute Determination of
Beamcon III, a Linearity Measurement Instru-
Conductivities of the Primary Standard KC! Solu-
ment for Optical Detectors. Thompson, A., and
tions from 0 °C to 50°C. Wu, Y. C., Koch, W. F.,
Chen, H. M. 99(6), 751 (1994).
Feng, D., Holland, L. A., Juhasz, E., Arvay, E., and
Tomek, A. 99(3), 241 (1994).
Cheng, E. D. H.
B Short-Record-Based Extreme Wind Simulation.
Cheng, E. D. H., and Chiu, A. N. L. 99(4), 391
Bruno, T. J. (1994).
Refractive Indices of Fluids Related to Alterna-
tive Refrigerants. Bruno, T. J., Wood, M. A., and Chiang, M. Y. M.
Hansen, B. N. 99(3), 263 (1994).
Identification of Failure Origin Through Testing
and the Weibull Risk-of-Rupture. Tesk, J. A.,
Burke, E. A.
Chiang, M. Y. M., Keeny, S. M., III, Tang, J., and
Extreme Value Theory Applications to Space Sato, Y. 99(4), 505 (1994).
Radiation Damage Assessment in _ Satellite
Volume 99, Number 6, November—December 1994
Journal of Research of the National Institute of Standards and Technology
Chiu, A. N. L. Domen, S. R.
Short-Record-Based Extreme Wind Simulation. A Sealed Water Calorimeter for Measuring
Cheng, E. D. H., and Chiu, A. N. L. 99(4), 391 Absorbed Dose. Domen, S. R. 99(2), 121 (1994).
(1994).
Duncan, W. M.
Cole, K. D. Optical Characterization in Microelectronics
Manufacturing. Perkowitz, S., Seiler, D. G., and
Workshop on Standardization Needs in Biotech-
Duncan, W. M. 99(5), 605 (1994).
nology. Cole, K. D., Powell, L. J., and Eitel, G. L.
99(1), 93 (1994).
Duxbury, P. M.
Croarkin, M. C. Exact Solution to an Interacting Extreme-Value
Problem: The Pure-Flaw Model. Leath, P. L., and
Cryogenic Blackbody Calibrations at the
Duxbury, P. M. 99(4), 337 (1994).
National Institute of Standards and Technology
Low Background Infrared Calibration Facility.
E
Datla, R. U., Croarkin, M. C., and Parr, A. C.
99(1), 77 (1994). Ehrlich, C. D.
The Measurement and Uncertainty of a Calibra- An Intercomparison Between NPL (India) and
tion Standard for the Scanning Electron Micro- NIST (USA) Pressure Standards in the Hydraulic
scope. Fu, J., Croarkin, M. C., and Vorburger, T. Pressure Region up to 26 MPa. Sharma, J. K. N.,
V. 99(2), 191 (1994). Jain, K. K., Ehrlich, C. D., Houck, J. C., and Ward,
D. B. 99(6), 725 (1994).
Eitel, G. L.
Dale, C. J.
Workshop on Standardization Needs in Biotech-
Extreme Value Theory Applications to Space nology. Cole, K. D., Powell, L. J., and Eitel, G. L.
Radiation Damage Assessment in Satellite 99(1), 93 (1994).
Microelectronics. Marshall, P. W., Dale, C. J., and
Burke, E. A. 99(4), 485 (1994). Elmquist, R. E.
Spectroscopic Study of Quantized Breakdown
Datla, R. U.
Voltage States of the Quantum Hall Effect. Lavine,
Cryogenic Blackbody Calibrations at the C. F., Cage, M. E., and Elmquist, R. E. 99(6), 757
National Institute of Standards and Technology (1994).
Low Background Infrared Calibration Facility.
Datla, R. U., Croarkin, M. C., and Parr, A. C. Escalante-Sandoval, C. A.
99(7), 77 (1994).
A Trivariate Extreme Value Distribution Ap-
plied to Flood Frequency Analysis. Escalante-
De Biévre, P.
Sandoval, C. A., and Raynal-Villasenor, J. A.
New Values for Silicon Reference Materials, 99(4), 369 (1994).
Certified for Isotope Abundance Ratios. De
Biévre, P., Valkiers, S., and Peiser, H. S. 99(2), 201
(1994). Feldman, A.
Workshop on Characterizing Diamond Films III.
Deslattes, R. D.
Feldman, A., Holly, S., Klein, C. A., and Lu, G.
Precision Comparison of the Lattice Parameters 99(3), 287 (1994).
of Silicon Monocrystals. Kessler, E. G., Henins, A.,
Deslattes, R. D., Nielsen, L., and Arif, M. 99(/), 1 Feng, D.
(1994).
A de Method for the Absolute Determination of
Erratum: Precision Comparison of the Lattice Conductivities of the Primary Standard KCI Solu-
Parameters of Silicon Monocrystals. Kessler, E. G., tions from 0°C to 50°C. Wu, Y. C., Koch, W. F.,
Henins, A., Deslattes, R. D., Nielsen, L., and Arif, Feng, D., Holland, L. A., Juhasz, E., Arvay, E., and
M. 99(3), 285 (1994). Tomek, A. 99(3), 241 (1994).
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Fenimore, C. Ginley, R. A.
Three-Axis Coil Probe Dimensions and Uncer- The NIST 30 MHz Linear Measurement System.
tainties During Measurement of Magnetic Fields Jargon, J. A., Ginley, R. A., and Sutton, D. D.
from Appliances. Misakian, M., and Fenimore, C. 99(7), 19 (1994).
99(3), 247 (1994).
Gnedin, A. V.
Fenton, G. A.
Conical Extremes of a Multivariate Sample.
A Random Field Excursion Model of Salt In- Gnedin, A. V. 99(4), 511 (1994).
duced Concrete Delamination. Fenton, G. A.
99(4), 475 (1994). Grimm, K. R.
Planar Near-Field Measurements of Low-
Foley, J. T.
Sidelobe Antennas. Francis, M. H., Newell, A. C.,
A Theoretical Analysis of the Coherence- Grimm, K. R., Hoffman, J., and Schrank, H. E.
Induced Spectral Shift Experiments of Kandpal, 99(2), 143 (1994).
Vaishya, and Joshi. Foley, J. T., and Wang, M.
99(3), 267 (1994). Gu, G. Z.
Techniques Used to Determine Extreme Wave
Fowler, D.
Heights from the NESS Data Set. Maes, M. A., and
Critical Levels of Ozone Over the United Gu, G. Z. 99(4), 435 (1994).
Kingdom: Mapping Aggregate Exceedances Over
Moderate to High Thresholds. Smith, R. L,
Anderson, C. W., and Fowler, D. 99(4), 353 H
(1994).
Hansen, B. N.
Francis, M. H.
Refractive Indices of Fluids Related to Alterna-
Planar Near-Field Measurements of Low- tive Refrigerants. Bruno, T. J., Wood, M. A., and
Sidelobe Antennas. Francis, M. H., Newell, A. C., Hansen, B. N. 99(3), 263 (1994).
Grimm, K. R., Hoffman, J., and Schrank, H. E.
99(2), 143 (1994). Henins, A.
Precision Comparison of the Lattice Parameters
Fu, J.
of Silicon Monocrystals. Kessler, E. G., Henins, A.,
The Measurement and Uncertainty of a Calibra- Deslattes, R. D., Nielsen, L., and Arif, M. 99(7), 1
tion Standard for the Scanning Electron Micro- (1994).
scope. Fu, J., Croarkin, M. C., and Vorburger, T.
Erratum: Precision Comparison of the Lattice
V. 99(2), 191 (1994).
Parameters of Silicon Monocrystals. Kessler, E. G.,
Henins, A., Deslattes, R. D., Nielsen, L., and Arif,
G
M. 99(3), 285 (1994).
Gibson, C.
Hill, B. M.
Intercomparison of the ITS-90 Radiance
Temperature Scales of the National Physical Labo- Bayesian Forecasting of Extreme Values in an
ratory (U.K.) and the National Institute of Exchangeable Sequence. Hill, B. M. 99(4), 521
Standards and Technology. Machin, G., Johnson, (1994).
B. C., Gibson, C., and Rusby, R. L. 99(6), 731
(1994). Hobish, M. K.
Workshop on Critical Issues in Air Ultraviolet
Gilbert, D.
Metrology. Thompson, A., and Hobish, M. K.
16th National Computer Security Conference. 99(6), 765 (1994).
Gilbert, D. 9% 5), 681 (1994).
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Hoffman, J. Jain, K. K.
Planar Near-Field Measurements of Low-Side- An Intercomparison Between NPL (India) and
lobe Antennas. Francis, M. H., Newell, A. C., NIST (USA) Pressure Standards in the Hydraulic
Grimm, K. R., Hoffman, J., and Schrank, H. E. Pressure Region up to 26 MPa. Sharma, J. K. N.,
99(2), 143 (1994). Jain, K. K., Ehrlich, C. D., Houck, J. C., and Ward,
D. B. 99(6), 725 (1994).
Holland, L. A.
Jargon, J. A.
A dc Method for the Absolute Determination of
Conductivities of the Primary Standard KC! Solu- The NIST 30 MHz Linear Measurement System.
tions from 0 °C to 50°C. Wu, Y. C., Koch, W. F., Jargon, J. A., Ginley, R. A., and Sutton, D. D.
Feng, D., Holland, L. A., Juhasz, E., Arvay, E., and 99(7), 19 (1994).
Tomek, A. 99(3), 241 (1994).
Jensen, J. J.
Holly, S.
Dynamic Amplification of Jack-Up Platforms
Workshop on Characterizing Diamond Films III. Subjected to Non-Gaussian Wave Loads. Jensen, J.
Feldman, A., Holly, S., Klein, C. A., and Lu, G. J. 99(4), 455 (1994).
99(3), 287 (1994).
Johnson, B. C.
Hopke, P. K.
Intercomparison of the ITS-90 Radiance Tem-
Extreme Value Estimation Applied to Aerosol perature Scales of the National Physical Labora-
Size Distributions and Related Environmental tory (U.K.) and the National Institute of Standards
Problems. Hopke, P. K., and Paatero, P. 99(4), 361 and Technology. Machin, G., Johnson, B. C., Gib-
(1994). son, C., and Rusby, R. L. 99(6), 731 (1994).
Houck, J. C. Juhasz, E.
An Intercomparison Between NPL (India) and A de Method for the Absolute Determination of
NIST (USA) Pressure Standards in the Hydraulic Conductivities of the Primary Standard KCI Solu-
Pressure Region up to 26 MPa. Sharma, J. K. N., tions from 0°C to 50°C. Wu, Y. C., Koch, W. F.,
Jain, K. K., Ehrlich, C. D., Houck, J. C., and Ward, Feng, D., Holland, L. A., Juhasz, E., Arvay, E., and
D. B. 99(6), 725 (1994). Tomek, A. 99(3), 241 (1994).
Hiisler, J. K
On the Convergence of the Number of Ex- Kanda, J.
ceedances of Nonstationary Normal Sequences.
Application of an Empirical Extreme Value Dis-
Hiisler, J., and Kratz, M. 99(4), 539 (1994).
tribution to Load Models. Kanda, J. 99(4), 413
(1994).
I
Kasahara, K.
Ippolito, L. M.
On the Requirements for a Reasonable Extreme
Compass °94, Ninth Annual Conference on Value Prediction of Maximum Pits on Hot-Water-
Computer Assurance. Ippolito, L. M., Wallace, D. Supply Copper Tubing. Komukai, S., and Kasa-
R., and Lennon, E. B. 99(6), 781 (1994). hara, K. 99(4), 321 (1994).
J Keeny, S. M., III.
Identification of Failure Origin Through Testing
Jahanmir, S.
and the Weibull Risk-of-Rupture. Tesk, J. A.,
International Conference on Machining of Chiang, M. Y. M., Keeny, S. M., III, Tang, J., and
Advanced Materials. Jahanmir, S. 99(1), 89 (1994). Sato, Y. 99(4), 505 (1994).
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
Kessler, E. G. Leath, P. L.
Precision Comparison of the Lattice Parameters Exact Solution to an Interacting Extreme-Value
of Silicon Monocrystals. Kessler, E. G., Henins, A., Problem: The Pure-Flaw Model. Leath, P. L., and
Deslattes, R. D., Nielsen, L., and Arif, M. 99(/), 1 Duxbury, P. M. 99(4), 337 (1994).
(1994).
LeeK., C .
Erratum: Precision Comparison of the Lattice
Parameters of Silicon Monocrystals. Kessler, E. G., Sources of Uncertainty in a DVM-Based Mea-
Henins, A., Deslattes, R. D., Nielsen, L., and Arif, surement System for a Quantized Hall Resistance
M. 99(3), 285 (1994). Standard. Lee, K. C., Cage, M. E., and Rowe, P. S.
99(3), 227 (1994).
Klein, C. A.
Lennon, E. B.
Workshop on Characterizing Diamond Films III.
Feldman, A., Holly, S., Klein, C. A., and Lu, G. North American Integrated Services Digital Net-
99(3), 287 (1994). work (ISDN) Users’ Forum (NIUF). Lennon, E. B.
99(6), 777 (1994).
Koch, W. F.
Compass 94, Ninth Annual Conference on
A de Method for the Absolute Determination of Computer Assurance. Ippolito, L. M., Wallace, D.
Conductivities of the Primary Standard KC! Solu- R., and Lennon, E. B. 99(6), 781 (1994).
tions from 0 °C to 50°C. Wu, Y. C., Koch, W. F.,
Feng, D., Holland, L. A., Juhasz, E., Arvay, E., and La, G.
Tomek, A. 99(3), 241 (1994).
Workshop on Characterizing Diamond Films III.
Feldman, A., Holly, S., Klein, C. A., and Lu, G.
Koepke, G.
99(3), 287 (1994).
Screened-Room Measurements on the NIST
Spherical-Dipole Standard Radiator. Koepke, G., M
and Randa J. 99(6), 737 (1994).
Macdonald, D. D.
Komukai, S.
Performance Comparison Between a Statistical
On the Requirements for a Reasonable Extreme Model, a Deterministic Model, and an Artificial
Value Prediction of Maximum Pits on Hot-Water- Neural Network Model for Predicting Damage
Supply Copper Tubing. Komukai, S., and Kasa- From Pitting Corrosion. Urquidi-Macdonald, M.,
hara, K. 99(4), 321 (1994). and Macdonald, D. D. 99(4), 495 (1994).
Kratz, M. Machin, G.
On the Convergence of the Number of Ex- Intercomparison of the ITS-90 Radiance Tem-
ceedances of Nonstationary Normal Scquences. perature Scales of the National Physical Labora-
Hiisler, J., and Kratz, M. 99(4), 539 (1994). tory (U.K.) and the National Institute of Standards
and Technology. Machin, G., Johnson, B. C., Gib-
L son, C., and Rusby, R. L. 99(6), 731 (1994).
Lavine, C. F. Maes, M. A.
Spectroscopic Study of Quantized Breakdown Techniques Used to Determine Extreme Wave
Voltage States of the Quantum Hall Effect. Lavine, Heights from the NESS Data Set. Maes. M. A.,
C. F., Cage, M. E., and Elmquist, R. E. 99(6), 757 and Gu, G. Z. 99(4), 435 (1994).
(1994).
Marshall, P. W.
Laycock, P. J.
Extreme Value Theory Applications to Space
Applications of Extreme Value Theory in Corro- Radiation Damage Assessment in Satellite Mi-
sion Engineering. Scarf, P. A., and Laycock, P. J. croelectronics. Marshall, P. W., Dale, C. J., and
99(4), 313 (1994). Burke, E. A. 99(4), 485 (1994).
Volume 99, Number 6, November-December 1994
Journal of Research of the National Institute of Standards and Technology
McKenna, G. B. Erratum: Precision Comparison of the Lattice
Parameters of Silicon Monocrystals. Kessler, E. G.,
On the Physics Required for Prediction of Long
Henins, A., Deslattes, R. D., Nielsen, L., and Arif,
Term Performance of Polymers and Their Com-
M. 99(3), 285 (1994).
posites. McKenna, G. B. 99(2), 169 (1994).
O
Mielenz, K. D.
Ozaka, Y.
Reply to Professor Wolf's comments on my pa-
Seismic Risk Analysis Based on Strain Energy
per on Wolf shifts. Mielenz, K. D. 99(3), 283
Accumulation in Focal Regions. Suzuki, M., and
(1994).
Ozaka, Y. 99(4), 421 (1994).
Misakian, M.
P
Three-Axis Coil Probe Dimensions and Uncer-
Paatero, P.
tainties During Measurement of Magnetic Fields
from Appliances. Misakian, M., and Fenimore, C. Extreme Value Estimation Applied to Aerosol
99(3), 247 (1994). Size Distributions and Related Environmental
Problems. Hopke, P. K., and Paatero, P. 99(4), 361
Murakami, Y. (1994).
Inclusion Rating by Statistics of Extreme Values
Parr, A. C.
and Its Application to Fatigue Strength Prediction
and Quality Control of Materials. Murakami, Y. Cryogenic Blackbody Calibrations at the
99(4), 345 (1994). National Institute of Standards and Technology
Low Background Infrared Calibration Facility.
N Datla, R. U., Croarkin, M. C., and Parr, A. C.
99(1), 77 (1994).
Naess, A.
Parrott, C.
Prediction of Extreme Response of Nonlinear
Oscillators Subjected to Random Loading Using Quest for Excellence VI. Parrott, C., and Chap-
the Path Integral Solution Technique. Naess, A. man, R. E. 99(5), 673 (1994).
99(4), 465 (1994).
Peiser, H. S.
Nandagopalan, S.
New Values for Silicon Reference Materials,
On the Multivariate Extremal Index. Nandago- Certified for Isotope Abundance Ratios. De
palan, S. 99(4), 543 (1994). Biévre, P., Valkiers, S., and Peiser, H. S. 99(2), 201
(1994).
Newell, A. C.
Perkowitz, S.
Planar Near-Field Measurements of Low-Side-
lobe Antennas. Francis, M. H., Newell, A. C., Optical Characterization in Microelectronics
Grimm, K. R., Hoffman, J., and Schrank, H. E. Manufacturing. Perkowitz, S., Seiler, D. G., and
99(2), 143 (1994). Duncan, W. M. 99(5), 605 (1994).
Newton, J. Pinholster, G.
Data Administration Management Association Systems Integration Needs of U.S. Manufactur-
Symposium. Newton, J, 99(6), 775 (1994). ers. Stewart, S. L., and Pinholster, G. 99(5), 687
(1994).
Nielsen, L.
Postek, M. T.
Precision Comparison of the Lattice Parameters
of Silicon Monocrystals. Kessler, E. G., Henins, A., Critical Issues in Scanning Electron Microscope
Deslattes, R. D., Nielsen, L., and Arif, M. 99(/), 1 Metrology. Postek, M. T. 99(5), 641 (1994).
(1994).