Table Of Content

NON-CRYSTALLINE SOLIDS ELSEVIER Journal of Non-Crystalline Solids 262 (2000) 291-292 www.elsevier.com/locate/jnoncrysol Author Index Akai, T., Temperature dependence of Li formation of nanostructure of silica NMR linewidth in glasses: relation gels during drying 2 (2000) 155 between short-range ionic motion Durrant, S.F., see Wang, J 2 (2000) 216 observed by NMR and long range Fourcade, J.O., see Aldon, | 2 (2000) 2 ionic transport observed by electri- cal conductivity 2 (2000) 2 Gan, F., see Chen, H. 2 (2000) 282 Aldon, L., P.E. Lippens, J.C. Jumas. Garnier, A., see Rogez, J 2? (2000) i J. Olivier Fourcade, H. Bemelmans Ghobarkar, H., see Rogez, J 2 (2000) 177 and G. Langouche, Molecular Gilani, A.H., see Khattak, G.D. 2 (2000) 66 structure of ternary Ge-As-Te Gupta, P.K., D. Inniss, C.R. Kurkjian glasses studied by Mossbauer spec- and Q. Zhong, Nanoscale roughness troscopy 2 (2000)2 of oxide glass surfaces 2 (2000) 200 Angermann, T., see Héche, T (2000) 1 Hafidi Alaoui, A., see Dieudonné, Ph 2 (2000) 155 Avramov, I., Pressure dependence of Hayakawa, S. and L.L. Hench, AMI viscosity of glassforming melts (2000) study on infra-red spectra of silica Balkenende, A.R.. see Koenderink, clusters modified by fluorine 2 (2000) 264 G.H. 2 (2000) Hench, L.L., see Hayakawa, S 2 (2000) 264 Bauer, C., R. Richert, R. BOhmer and Héche, T. and T. Angermann, Cross- I. Christensen, Dynamic thermal sectional TEM investigation of tin- expansivity near the glass transition (2000)2 )y implanted SiO, glass 2 (2000) 114 Bemelmans, H., see Aldon, L (2000) 244 Inniss, D., see Gupta, P.K 2 (2000) 200 Bian, X., see Zhang, L. 2 (2000) 169 Iyetomi, H., P. Vashishta and R.K. Ka- Bohmer, R., see Bauer, C 2 (2000) 276 lia, Incipient phase separation in Ag/ Bratu, I., see Culea, E. 2 (2000) 28 Ge/Se glasses: clustering of Ag Brzesowsky, R.H., see Koenderink, atoms (2000) G.H. (2000) sO Buechele, A.C., see McKeown, D.A 2 (2000) Jin, J., S. Sakida, T. Yoko and M. No- Burns, A.E., M. Royle and S.W. Mar- gami, The local structure of Sm- tin, Infrared spectroscopy of Agl doped aluminosilicate glasses _pre- doped Ag»S+B,S; fast ion conduct- pared by sol-gel method 2 (2000) 183 ing thioborate glasses (2000)2 Jumas, J.C., see Aldon, L (2000) 244 Chen, H., C. Zhu, B. Yu, H. Lu and F. Kalia, R.K., see Iyetomi, H (2000) 135 Gan, Preparation and optical prop- Kendziora, C.A., see McKeown, D.A. (2000) 126 erties of Cul microcrystallite-doped Khattak, G.D., M.A. Salim, L.E. Wen- borosilicate glasses 2 (2000) ger and A.H. Gilani, X-ray photo- Christensen, T., see Bauer, C (2000) 2 electron spectroscopy (XPS) and Cortes, R., see Mastelaro, V.R. 2 (2000) magnetic susceptibility studies of Culea, E. and I. Bratu, Structural and copper—vanadium phosphate glasses 2 (2000) 66 magnetic behaviour of some borate Kityk, I.V., see Plucinski, K. (2000) 143 glasses containing dysprosium ions 2 (2000)2 Knauth, P., see Rogez, J. 2 (2000) 177 Koenderink, G.H., R.H. Brzesowsky de Moraes, M.A.B., see Wang, J (2000) 2 and A.R. Balkenende, Effect of the Delord, P.. see Dieudonné, Ph. (2000) initial stages of leaching on the sur- Dieudonne, Ph., A. Hafidi Alaoui, face of alkaline earth sodium silicate P. Delord and J. Phalippou. Trans- glasses (2000) so 0022-3093/00/$ - see front matter © 2000 Elsevier Science B.V. All rights reserved. futhor Index see Gupta, P.K 262 (2000)2 dies on radiation-induced point defects in mixed oxide glasses. I. Spin Lan1ng 1e o t see Aldon,| 2 (2000) 244 centers in B,O; and alkali borate Lepr pert. V.J., see Molodetsky, I 2 (2000) 106 Leeqp u} eux, N., see Mastelaro, V.R 2 (2000) 191 glasses 262 (2000) 1 Shkrob, I.A., B.M. Tadjikov and A.D Li, H., see Zhang, | (2000) 169 Irifunac, Magnetic resonance stu- Lippens, P.E., see Aldon, I 2 (2000) 244 dies on radiation-induced point de- Lu, H., see Chen, H 2 (2000) 282 fects in mixed oxide glasses. II Lu, K., see Ye, F ? (2000) 228 Spin centers in alkali silicate glasses 262 (2000) Martin, S.W., see Burns, A.E 2000) 2 Stebbins, J.F. and Q. Zeng, Cation or- Mastelaro, V.R.. E.D. Zanotto, N. Le- dering at fluoride sites in silicate queux and R. Cortes, Relationship glasses: a high-resolution ““F NMR between short-range order and ease study 2 (2000) of nucleation in Na>sCa ,Si,;Oo, Ca- Swiatkowski, W.. Effect of different SiO, and PbSi0O, glasses 2 (2000) 191 sizes of subcritical nuclei on kinetics McKeown, D.A., 1.S. Muller, A.C. Bue- of transformation in the solid state 2 (2000) chele, I. Pegg and C.A. Kend- ziora, Structural characterization of Tadjikov, B.M.. see Shkrob. LA (2000) high-zirconia borosilicate glasses Tadjikov, B.M., see Shkrob, LA (2000) using Raman spectroscopy 2 (2000) Trifunac, A.D., see Shkrob, L.A 2 (2000) Mefleh, A., see Plucinski, K 2000) Trifunac, A.D., see Shkrob, I.A. (2000) Molodetsky, I., A. Navrotsky, M.J Vashishta, P., see Iyetomi, H (2000) Paskowitz, V.J. Leppert and S.H von der Gonna, G. and C. Riissel, Ther- Risbud, Energetics of X-ray-amor- modynamics of various polyvalent phous zirconia and the role of sur- elements in a 15Na,0 - 85SiO; glass face energy in its formation 2000) 106 melt 2 (2000) Muller, 1.S.. see McKeown, D.A (2000) 126 Wang, J.. S.F. Durrant and M.A.B. de Navrotsky A... see Molodetsky I 2 (2000) 106 Moraes, Deposition mechanisms Nogami, M., see Jin, J 2 (2000) 183 and properties of oxygenated carbon Paskowitz, M.J., see Molodetsky, | (2000) 106 nitride films from rf discharges of Pegg. I.L., see McKeown, D.A 2 (2000) 126 acetylene, nitrogen, oxygen and ar- Phalippou, J., see Dieudonne, Ph 2 (2000) 155 gon mixtures 2 (2000) 216 Plucinski, K., I.V. Kityk and A. Mefleh. Wang, W.., see Zhang. L. (2000) 169 Elliptically polarized light-induced Wenger, L.E., see Khattak. G.D (2000) 66 second harmonic generation in Wirbeleit, F.. A multi-variable analysis SiN,O 2 (2000) 143 of the influence of process para- Prentice, J.S.C The effect of surface meters on VHF PECVD deposition states at the SnO,/p-a-Si:H interface 2 (2000) 96 process for amorphous silicon (2000) 240 7 Wu, S., see Zhang, L 2 (2000) 169 Richert, R.. see Bauer, ¢ 2 (2000) 276 Wu, Y., see Zhang. 2 (2000) 169 Risbud, S.H., see Molodetsky, | 2 (2000) 106 Rogez, J.. P. Knauth, A. Garnier, H Ye, F. and K. Lu, Crystallization ki- Ghobarkar and O. Schif, Determi- netics of Al-La—Ni amorphous alloy (2000)2 nation of the crystallization enthal- Yoko, T., see Jin, J (2000) pies of lithium ion conducting Yu, B., see Chen, H. (2000) alumino-silicate glasses 2 (2000) Royle, M., see Burns, A.f 2 (2000) 2 Zanotto, E.D., see Mastelaro, V.R. (2000) Riissel, C.. see von der Gonna, G 2 (2000) 2 Zeng. Q.. see Stebbins, J.F 2? (2000) Zhang, L., Y. Wu, X. Bian, H. Li, W. Sakida, S., see Jin, J 2 (2000) 183 Wang and S. Wu, Short-range and Salim, M.A., see Khattak, G.D 2 (2000) 66 medium-range order in liquid and Schaf, O.. see Rogez, J 2 (2000) 177 amorphous AloyFesCes alloys (2000) 169 Shkrob, I.A., B.M. Tadjikov and A.D Zhong, Q., see Gupta, P.K. 2 (2000) 200 Trifunac, Magnetic resonance stu- Zhu, C., see Chen, H. 2 (2000) 929 NON-CRYSTALLINE, SOLIDS ELSEVIER Journal of Non-Crystalline Solids 262 (2000) 293-294 www.elsevier.com/locate/jnoncrysol Subject Index Alkali Silicate Glasses Defects Electrochemical Properties, Melting 2 (2000) 2 Nuclear Magnetic Resonance, Radia- Nuclear Magnetic Resonance, Radia- tion Effects 262 (2000) tion Effects (2000) Differential Scanning Calorimetry Amorphous Semiconductors Glass Transition 2 (2000) 2 Computer Simulation, Photo Voltage. Drying Tin Oxide 2 (2000) 99 Silicon, Thin Films (2000) 2n( m Sol-Gel Processes, Structure 2 (2000) Electrochemical Properties Atomic Force Microscopy Alkali Silicate Glasses, Melting 2 (2000) Fracture, Surface Properties (2000) 200 Fluorides Borates Nuclear Magnetic Resonance, Structure 2 (2000) Infra-red Absorption 2 (2000) 25 Magnetic Properties. Rare Earth Ions 2 (2000) 2 Fracture tomic Force Microscopy, Surface Borosilicates Properties (2000) Raman Spectra, Structure, Zirconia 2 (2000) 126 Glass Transition Calorimetry (2000) 117076 Differential Scanning Calorimetry 2 (2000) ? Conductivity, Crystallization (2000) Infra-red Absorption Chalcogenide Glasses Borates 2 (2000) Mossbauer Effect. Structure 2 (2000) 244 Medium-Range Order, Silica 2 (2000) Chalcogenides lon Implantation Computer Simulation, Molecular Tin Oxide 2 (2000) Dynamics Simulation 2 (2000) Crystallization, Nucleation (2000) lonic Conductivity Nuclear Magnetic Resonance 2? (2000) 2 Chemical Durability Magnetic Properties Rutherford Backscattering, Secondary lon Mass Spectroscopy, Surface Borates, Rare Earth lons 2 (2000) 2 Phosphates, XPS (2000) Reactions (2000) Medium-Range Order Computer Simulation Crystallization, Metallic Glasses, X-ray Amorphous Semiconductors, Photo Voltage, Tin Oxide 2 (2000) Diffraction (2000) Infra-red Absorption, Silica 2 (2000) Chalcogenides. Molecular Dynamics Simulation 2 (2000) Melting Alkali Silicate Glasses, Electrochemical Conductivity 177 Properties 2 (2000) 2 Calorimetry, Crystallization 2 (2000) Metallic Glasses Crystallization Calorimetry, Conductivity 262 (2000) 177 Crystallization 2 (2000)2 2 Crystallization, Medium-Range Order, Chalcogenides, Nucleation 262 (2000) 162 X-ray Diffraction 2 (2000) 169 Medium-Range Order, Metallic Glasses, X-ray Diffraction 262 (2000) 169 Molecular Dynamics Simulation Metallic Glasses 262 (2000) 228 Chalcogenides, Computer Simulation 2 (2000) 135 0022-3093/00/S - see front matter © 2000 Elsevier Science B.V. All rights reserved. 294 Subject Index Mossbauer Effect Semiconductors Chalcogenide Glasses, Structure (2000) 2 Optical Properties, Quantum Wells (2000) 282 Nitrogen-Containing Glass Silica Thin Films 2 (2000) Infra-red Absorption, Medium-Range Order (2000) Nuclear Magnetic Resonance Alkali Silicate Glasses, Radiation Ef- Silicon fects (2000) Amorphous Semiconductors, Thin Defects, Radiation Effects (2000) Films 2 (2000) 2 Fluorides. Structure (2000) Sol-Gel Method Ionic Conductivity (2000) 2? Nuclear Magnetic Resonance, Rare Rare Earth lons, Sol-Gel Method, Earth Ions, Structure 2 (2000) 18 Structure (2000) Sol-Gel Processes Nucleation Drying, Structure 2 (2000) Chalcogenides, Crystallization 2 (2000) Structure, X-ray Absorption 2 (2000) Structure Borosilicates, Raman Spectra, Zirconia (2000) 126 Optical Properties Chalcogenide Glasses, Mossbauer Effect (2000) 244 Oxynitride Glasses, Surface Properties (2000) Drying, Sol-Gel Processes (2000) 155 Quantum Wells, Semiconductors (2000) Fluorides, Nuclear Magnetic Reso- Oxynitride Glasses nance (2000) Optical Properties, Surface Properties (2000) Nuclear Magnetic Resonance, Rare Earth Ions, Sol-Gel Method 2 (2000) 183 Phosphates Nucleation, X-ray Absorption 2 (2000) 19] Magnetic Properties, XPS 2 (2000) Surface Properties Photo Voltage Atomic Force Microscopy, Fracture 2 (2000) 200 Amorphous Semiconductors, Computer Optical Properties, Oxynitride Glasses (2000) 143 Simulation, Tin Oxide 2 (2000) Surface Reactions Pressure Effects Chemical Durability, Rutherford Back- \ ISCOSITY 2 (2000) 25 scattering, Secondary Ion Mass Spectroscopy 2 (2000) Quantum Welis Optical Properties, Semiconductors (2000) 282 Thin Films Amorphous Semiconductors, Silicon (2000) Radiation Effects Nitrogen-Containing Glass (2000) Alkali Silicate Glasses, Nuclear Mag- netic Resonance 2 (2000) Tin Oxide Defects, Nuclear Magnetic Resonance 2 (2000) Amorphous Semiconductors, Computer Simulation, Photo Voltage (2000) Raman Spectra lon Implantation 2 (2000) Borosilicates, Structure, Zirconia 2 (2000) Viscosity Rare Earth Ions Pressure Effects (2000) 2 Borates, Magnetic Properties (2000) 2 Nuclear Magnetic Resonance, Sol-Gel XPS Method, Structure (2000) Magnetic Properties, Phosphates (2000) Rutherford Backscattering X-ray Absorption Chemical Durability, Secondary Ion Nucleation, Structure (2000) Mass Spectroscopy. Surface Reac- X-ray Diffraction tions (2000) Crystallization, Medium-Range Order, Secondary lon Mass Spectroscopy Metallic Glasses 262 (2000) 169 Chemical Durability, Rutherford Back- Zirconia scattering, Surface Reactions 262 (2000) Borosilicates, Raman Spectra, Structure 262 (2000) 126