Ion Beam Analysis: Fundamentals and Applications PDF
Preview Ion Beam Analysis: Fundamentals and Applications
Materials Science / Materials Processing Nastasi Mayer Wang "... a must-have ion beam analysis textbook or reference handbook … . It covers all aspects of ion beam fundamentals and important applications with tables, charts, and Ion Beam excellent examples." —Wei-Kan Chu, Research Director and Distinguished University Professor of Physics, The University of Houston "... immensely useful as a reference or textbook ..." —Floyd Del McDaniel, Professor of Physics and Materials Science & Engineering, Director of the Ion Beam Modification and Analysis Laboratory, University of North Texas Analysis "... brings together all the essential knowledge in a convenient, compact, and I up-to-date way." o —S.T. Picraux, Chief Scientist, Center for Integrated Nanotechnologies, Los Alamos National Laboratory n "An indispensable book for everyone, student or expert, dealing with ion beam analysis ... . Highly recommended." B —Andrzej Turos, Professor and Head of the Department of Microstructural Research, e University of Warsaw a Fundamentals and Applications ".. an important addition to the libraries of scientists and engineers who are already practitioners of these important techniques, but its main utility will be for students, in a m wide spectrum of fields, whose research could potentially benefit from IBA or those who are just starting to utilize IBA." —Barney L. Doyle, Distinguished Member of the Technical Staff, Sandia National A Laboratories n Ion Beam Analysis: Fundamentals and Applications explains the basic character- istics of ion beams as applied to the analysis of materials, as well as ion beam analysis a (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. l y Michael Nastasi (cid:127) Examines classical collision theory s (cid:127) Details the fundamentals of five specific ion beam analysis techniques (cid:127) Illustrates specific applications, including biomedicine and thin film analysis i James W. Mayer (cid:127) Provides examples of IBA in traditional and emerging research fields s engagements conducted by the authors Yongqiang Wang Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer simulation and data analysis in IBA. K12077 Ion Beam Analysis Ion Beam Analysis Fundamentals and Applications Michael Nastasi James W. Mayer Yongqiang Wang Boca Raton London New York CRC Press is an imprint of the Taylor & Francis Group, an informa business CRC Press Taylor & Francis Group 6000 Broken Sound Parkway NW, Suite 300 Boca Raton, FL 33487-2742 © 2015 by Taylor & Francis Group, LLC CRC Press is an imprint of Taylor & Francis Group, an Informa business No claim to original U.S. Government works Version Date: 20140514 International Standard Book Number-13: 978-1-4398-4639-1 (eBook - PDF) This book contains information obtained from authentic and highly regarded sources. Reasonable efforts have been made to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not been obtained. 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Visit the Taylor & Francis Web site at http://www.taylorandfrancis.com and the CRC Press Web site at http://www.crcpress.com Dedicated to the memory of Jim Mayer— innovator, educator, colleague, and friend Brief Contents Section i — Fundamentals chapter 1 Overview ..................................................................................................................................3 chapter 2 Kinematics ...............................................................................................................................9 chapter 3 Cross Section ......................................................................................................................25 chapter 4 Ion Stopping .......................................................................................................................39 chapter 5 Backscattering Spectrometry ..................................................................................57 chapter 6 Elastic Recoil Detection Analysis ............................................................................79 chapter 7 Nuclear Reaction Analysis.........................................................................................113 chapter 8 Particle-Induced X-Ray Emission Analysis .......................................................141 chapter 9 Ion Channeling ................................................................................................................171 Section ii — Applications chapter 10 Thin Film Depth Profiling ..........................................................................................197 Chris Jeynes and Richard L. Thompson chapter 11 Defects Measurements of a Crystalline Solid ...............................................221 Lin Shao vii viii Brief Contents chapter 12 Nuclear Energy Research Applications .............................................................241 Yongqiang Wang and Amit Misra chapter 13 Art and Archaeology Applications ......................................................................267 Thomas Calligaro and Jean-Claude Dran chapter 14 Biomedical Applications ...........................................................................................309 Harry J. Whitlow and Min-Qin Ren chapter 15 IBA Software .....................................................................................................................339 Nuno P. Barradas, Matej Mayer, Miguel A. Reis, and François Schiettekatte
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