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Introduction to Microlithography. Theory, Materials, and Processing PDF

364 Pages·1983·6.16 MB·English
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1 0 w0 Introduction 9.f 1 2 0 to Microlithography 3- 8 9 1 k- b 1/ 2 0 1 0. 1 oi: d 3 | 8 9 1 3, y a M e: at D n o ati c bli u P 1 0 0 w 9.f 1 2 0 3- 8 9 1 k- b 1/ 2 0 1 0. 1 oi: d 3 | 8 9 1 3, y a M e: at D n o ati c bli u P Introduction to Microlithography Theory, Materials, and Processing L. F. Thompson, EDITOR Bell Laboratories C. G. Willson, EDITOR 1 0 0 w IBM Research Laboratory 9.f 1 2 M. J. Bowden, EDITOR 0 3- 8 9 Bell Laboratories 1 k- b 1/ 2 0 1 0. Based on a workshop 1 oi: d 3 | sponsored by the ACS Division 8 9 1 3, y of Organic Coatings a M e: Dat and Plastics Chemistry n o ati c at the 185th Meeting of the bli u P American Chemical Society, Seattle, Washington, March 20-25, 1983 219 ACS SYMPOSIUM SERIES AMERICAN CHEMICAL SOCIETY WASHINGTON, D. C. 1983 Library of Congress Cataloging in Publication Data Introduction to microlithography. (ACS symposium series, ISSN 0097-6156; 219) Includes bibliographies and index. Contents: An introduction to lithography/L. F. 01 Thompson—The lithographic process—the physics/ w0 L. F. Thompson and M. J. Bowden—Organic resist 9.f materials—theory and chemistry/C. Grant Willson— 1 [etc.] 2 0 3- 1. Photolithography—Congresses. 2. Photoresists— 98 Congresses. bk-1 C.I .G Trahnotm, p1s9o3n9,- L arry. FII.I,. 1B94o4w-d en, .M IuIr.r aWe ilJls.o nS.,, 1/ 1943- . IV. American Chemical Society. Division 2 10 of Organic Coatings and Plastics Chemistry. V. Amer 0. ican Chemical Society. National Meeting (185th: 1 oi: 1983: Seattle, Wash.) VI. Series. 3 | d TISRB9N40 0.I5-874 12-0717958-35 686.2'315 83-5968 8 9 1 3, y a M e: at D n o cati Copyright © 1983 ubli American Chemical Society P All Rights Reserved. The appearance of the code at the bottom of the first page of each article in this volume indicates the copyright owner's consent that reprographic copies of the article may be made for personal or internal use or for the personal or internal use of specific clients. This consent is given on the condition, however, that the copier pay the stated per copy fee through the Copyright Clearance Center, Inc. for copying beyond that permitted by Sections 107 or 108 of the U.S. Copyright Law. This consent does not extend to copying or transmission by any means—graphic or electronic—for any other purpose, such as for general distribution, for advertising or promotional purposes, for creating new collective work, for resale, or for information storage and retrieval systems. The copying fee for each chapter is indicated in the code at the bottom of the first page of the chapter. The citation of trade names and/or names of manufacturers in this publication is not to be construed as an endorsement or as approval by ACS of the commercial products or services referenced herein; nor should the mere reference herein to any drawing, specification, chemical process, or other data be regarded as a license or as a conveyance of any right or permission, to the holder, reader, or any other person or corporation, to manufacture, repro duce, use, or sell any patented invention or copyrighted work that may in any way be related thereto. PRINTED IN THE UNITED STATES OF AMERICA. ACS Symposium Series 1 0 0 w M. Joan Comstock, Series Editor 9.f 1 2 0 3- 8 9 1 k- b 1/ Advisory Board 2 0 1 10. David L. Allara Robert Ory oi: d 3 | Robert Baker Geoffrey D. Parfitt 8 9 1 3, Donald D. Dollberg Theodore Provder y a M e: Brian M. Harney Charles N. Satterfield at D on W. Jeffrey Howe Dennis Schuetzle ati c bli Herbert D. Kaesz Davis L. Temple, Jr. u P Marvin Margoshes Charles S. Tuesday Donald E. Moreland C. Grant Willson 1 0 0 w 19.f FOREWORD 2 0 3- 8 9 k-1 The ACS SYMPOSIUM SERIES was founded in 1974 to provide b 1/ a medium for publishing symposia quickly in book form. The 2 10 format of the Series parallels that of the continuing ADVANCES 0. 1 IN CHEMISTRY SERBES except that in order to save time the oi: papers are not typeset but are reproduced as they are sub d 3 | mitted by the authors in camera-ready form. Papers are re 8 9 1 viewed under the supervision of the Editors with the assistance 3, y of the Series Advisory Board and are selected to maintain the a M integrity of the symposia; however, verbatim reproductions of e: at previously published papers are not accepted. Both reviews D n and reports of research are acceptable since symposia may o ati embrace both types of presentation. c bli u P PREFACE THE REMARKABLE PROGRESS in the miniaturization of electronic devices over the past three decades promises to continue for many years. At the heart of this revolution is the silicon integrated circuit (IC) whose com­ plexity and performance continue to increase, paving the way for continued innovation in solid state devices. The improvements in IC performance stem primarily from an ability to internally interconnect more and more active components (transistors, diodes, etc.) on a single "chip" of silicon. In 1965, 250 devices could be interconnected in the "monolithic integrated circuit" and in 1983 over 1,000,000 devices are routinely connected in a 1 0 0 single device. This improvement has come about largely through a decrease pr 9. in the size of the circuit elements. The size (area) of the chips has not 1 2 0 changed significantly over the years, whereas the size of each element has 3- 8 decreased from >20 μχη in 1963 to <2.0 ^m in 1983. 9 1 k- The three-dimensional circuit elements are fabricated by a series of b 21/ processes collectively known as "lithography". The pattern is first generated 0 0.1 in a polymeric film on a device "wafer" and this pattern is then transferred 1 oi: via etching, into the underlying thin film. The purpose of this book is to 3 | d review the theory, materials, and processes that are used in the lithographic 8 process. This book is intended to be a tutorial and not a comprehensive 9 1 3, review. Each chapter contains many references to which the reader can ay refer for more detail on any specific aspect of microlithography. M e: The authors are indebted to the Bell Laboratories Text Processing group, Dat especially T. I. Howard, J. Alder, and M. McCann. Special thanks also n o go to J. H. Bruning for his assistance with Chapter 2. ati c bli Pu L. F. THOMPSON Bell Telephone Laboratories Murray Hill, NJ 07974 C. G. WILLSON IBM Research Laboratories San Jose, CA 95193 M. J. BOWDEN Bell Telephone Laboratories Murray Hill, NJ 07974 February 18, 1983 ix 1 An Introduction to Lithography L. F. THOMPSON Bell Laboratories, Murray Hill, NJ 07974 1 0 0 h c 9. 1 2 3-0 1.1 Historical Perspective 2 8 9 1.1.a Solid State Devices 3 1 k- 1.1.b Lithography, the Art 7 b 1/ 1.2 Lithography Strategies 7 2 0 1 1.2.a Photolithography 9 0. 1 1.2.b X-ray Lithography 9 doi: 1.2.c Electron Beam Lithography 10 3 | 1.3 Resist Materials and Processes 10 8 9 1 3, y a M e: at D n o ati c bli u P 0097-6156/83/0219-0001$06.00/0 © 1983 American Chemical Society 2 INTRODUCTION TO MICROLITHOGRAPHY 1.1 Historical Perspective Soon after the invention of the point contact transistor over three decades ago, several important technological trends were rapidly established. First, a technology known as planar junction technology (1) was developed; the development of this technology permitted the construction of p-n junctions in a semiconductor material without the use of bulky, three-dimensional contact devices. Within a few years, silicon had become the dominant material for semiconductor fabrication, and photolithography was esta blished as the technique of choice in fabricating planar, silicon devices. Numerous volumes have been written about the chemistry and physics of semiconductor devices and of materials for semiconductor manufacturing (2-4). Much less information has been compiled concerning the processing 01 steps involved in semiconductor device fabrication, especially in the area of 0 h lithography. c 9. 1 Another important innovation in semiconductor devices was the 2 3-0 invention of the monolithic integrated circuit. This technology provides a 98 means for the internal interconnection of many solid-state and passive dev 1 k- ices into a working unit that performs complex, electronic functions and b 1/ allows the "density" of active devices to be increased many thousands of 2 0 1 times over that achievable with discrete or single transistor devices. The 0. 1 past two decades have seen an astronomical growth in the microelectronics oi: industry and associated technologies. The application of microelectronics d 3 | impacts technologies such as communications, computer science, medicine, 8 19 energy, and more recently, home entertainment. This revolution is going to 3, continue for the foreseeable future and will require continued advances in y Ma silicon technology. The realization of this new generation of devices must e: involve the development of new processing, fabrication, control, and Dat manufacturing technologies. n o The conventional way of achieving these goals has been to make dev cati ices smaller, this results in more active-circuits per unit area (5). Figure 1 ubli illustrates this trend, and it is the conviction of the author that this will con P tinue for at least two more decades. It is interesting to note that not only are we decreasing the size of the elements in an integrated circuit while increasing the number of active devices, but that the average cost per chip is also remaining essentially constant — that is the cost per function is decreas ing dramatically. This trend has required and will continue to require a greater understanding of device physics, device design, and lithography. Microcircuit fabrication requires the selective diffusion of tiny amounts of impurities into specific regions of the semiconductor substrate to produce the desired electrical characteristics of the circuit. These regions are defined by lithographic processes in which the desired pattern is first defined in a resist layer (usually a polymeric film which is spin-coated onto the substrate) and 1. THOMPSON Introduction to Lithography 3 10.0 8.0 1 Κ RAM CO I 6.0 16 Κ RAM Ο ι Lu Ν 4.0 (/) 64 Κ RAM Lu 1 0 * 3.0 h0 ι- 9.c < 1 LU 02 Ll 256 Κ RAM 3- 8 9 1 k- Έ 2.0 b 1/ 2 0 1 0. ^ 1.5 1 oi: d 3 | 1.0 JL J L 8 75 76 77 78 79 80 81 82 83 84 85 9 1 3, YEAR y a M e: Figure 1. Minimum feature size on a MOS random access memory device as Dat a function of the year the devices were first commercially available. n o ati c bli u P subsequently transferred, via techniques such as etching, ion implantation and/or diffusion, to the underlying substrate. This process is shown schematically in Figure 2. The purposes of this book are: (a) to review the lithographic strategies currently being used and under development, and (b) to emphasize in particular, the importance of resists and resist processing in achieving each individual lithographic technology goal. 1.1.a Solid State Devices. Many designs and strategies for device design and fabrication have intervened between the point contact transistor and the planar technology to which we alluded earlier, including grown junction transistors, alloyed junction transistors, and many variations of the planar technology. An understanding of the definition of integrated circuits, together with the details of the physics involved in their operation, is an

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