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Inelastic Scattering: of X-Rays with Very High Energy Resolution PDF

119 Pages·1991·1.624 MB·English
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Springer Tracts in Modern Physics Volume 521 Editor: G. H6hler Associate Editor: E. A. Niekisch Editorial Board: S. Flfigge H. Haken J. Hamilton .W Paul J. Treusch Springer Tracts in Modern Physics semuloV 111-09 are listed on the back inside cover 211 Tests of the Standard Theory of Electroweak Interactions By C. Kiesling 1988.86 figs. X, 212 pages 311 Radiative Transfer in Nontransparent Dispersed Media By H. Reiss 1988.72 figs. X, 205 pages 411 Electronic tropsnarT in Hydrogenated Amorphous Semiconductors By H. Overhof and .P Thomas 1989.65 figs. XIV, 471 pages 511 Scattering of Thermal Energy Atoms from Disordered Surfaces By B. Poelsema and G. Comsa 1989.74 figs. VIII, 801 pages 611 Optical Solitonsin Fibers By A. Hasegawa 1989.22 figs. X, 75 pages 711 Determination of Hydrogen in Materials Nuclear Physics Methods By .P K. Khabibullaev and B. G. Skorodumov 1989.38 figs. X, 87pages 811 Mechanical Relaxation of Interstitials in Irradiated Metals By K.-H. Robrock 1990.67 figs. VIII, 106 pages 911 Rigorous Methods in Particle Physics Edited by S. Ciulli, E Scheck, and .W Thirring 1990.21 figs. X, 220 pages 120" Nuclear Pion Photoproduction By A. Nagl, .V Devanathan, and H. l)berall 1991.53 figs. VIII, 471 pages 121 Current-Induced Nonequilibrium Phenomena in Quasi-One-Dimensional Superconductors By R. Tidecks 1990. 109 figs. IX, 341 pages 122 Particle Induced Electron Emission I With contributions by M. R6sler, .W Brauer and J. Devooght, J.-C. Dehaes, A. Dubus, M. Cailler, J.-E Ganachaud 1991.64 figs. X, 130 pages 321 Particle Induced Electron Emission II With contributions by D. Hasselkamp and H. Rothard, K. O. Groeneveld, J. Kemmler and R Varga, H. Winter 1991.61 figs. X, Approx. 212 pages 421 Ionization Measurements in High Energy Physics By B. Sitar, G. I. Merson, .V A. Chechin, and Yu. A. Budagov 1991. 591 figs, X, Approx. 350 pages 521 Inelastic Scattering of X-Rays with Very High Energy Resolution By E. Burkel 1991.70 figs. XV, 211 pages t26 Cooperative Phenomena 1 By H. Dosch 1992.56 figs. XII, Approx. 150pages * denotes a volume which contains a Classified Index starting from Volume 36 Eberhard Burkel Inelastic Scattering of X-Rays with Very High Energy Resolution With 70 Figures galreV-regnirpS Berlin Heidelberg New York London Paris Tokyo Hong Kong Barcelona Budapest Dr. habil. Eberhard Burkel Sektion Physik der Ludwig-Maximilians-Universit~it Mtinchen Geschwister-Scholl-Platz 1, W-8000 Mtinchen 22, Fed. Rep. of Germany Manuscripts for publication should be addressed to: Gerhard H6hler Institut far Theoretische Kernphysik der Universit/it Karlsruhe, Posffach 69 80, W-7500 Karlsruhe 1, Fed. Rep. of Germany Proofs and all correspondence concerning papers in the process of publication should be addressed to Ernst A. Niekisch HaubourdinstraBe 6, W-5170 Jiilich 1, Fed. Rep. of Germany ISBN 3-540-54418-6 Springer-Verlag Berlin Heidelberg New York ISBN 0-387-54418-6 Springer-Verlag New York Berlin Heidelberg Library of Congress Cataloging-in-Publication Data. Burkel, Eberhard, 1952-. - Inelastic scatter- ing of x-rays with very high energy resolution / - Eberhard Burkel. - p. cm. -- (Springer tracts in modern physics ; .v 125). - Includes bibliographical references and index. - ISBN 0-387-54418-6 (alk. paper). - i. X-rays--Scattering. I. Title. II. Series: Springer tracts in modern physics; 125.QC1.S797voI. 521 QC482.$3 530s--dc20 539.7'222 91-31752 This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplica- tion of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer-Verlag. Violations are liable for prosecution under the German Copyright Law. (cid:14)9 Springer-Verlag Berlin Heidelberg 1991 Printed in Germany The use of general descriptive names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: Camera ready by author 57/3140-543210 - Printed on acid-free paper Preface X-rays are an established tool for investigations of condensed matter in solid state physics and crystallography. The standard analysis of the elastically scattered X-rays reveals the short and the long range order of atoms. It gives information on the structure of atoms as well as on their local displacements. In these studies, the high intensity of the new generation of X-ray sources synchrotrons and storage rings - has opened fantastic new research areas. - In particular, scattering experiments with X-rays can be performed with reso- lutions in energy, space and time which were not thinkable before the advent of these sources. In general, textbooks on solid state physics dealing with lattice dynamics come to the conclusion that lattice vibrations cannot be resolved directly with X-rays. About 001 years after the discovery of X-rays it has now become pos- sible to achieve sufficiently high energy resolution for the direct observation of the small energy shifts of the photons due to the creation or annihilation of lattice vibrations in an inelastic scattering experiment. The aim of this review is to report on the recent progress in the field of inelastic scattering of X-rays with very high energy resolution, which is directly correlated with the development of the spectrometer INELAX. This instrument uses the backscattering technique (Bragg angles close to 09 ~ of X-rays at the storage ring DORIS at HASYLAB, DESY in Hamburg, and has recently yielded an energy resolution of 9 meV, which corresponds to a relative energy resolution of about 5 (cid:12)9 01 -r. After short historic comments and a comparison between different probes for inelastic investigations for condensed matter excitations, the basic princi- ples of the backscattering technique are described. The technical realization of the spectrometer INELAX is discussed in detail. Similar attempts of in- strumental set-ups undertaken in other laboratories are reported, too. The second half of the review covers the first applications of the inelastic scattering technique. The selection of the different examples aimed for a broad spectrum of problems in order to demonstrate the flexibility and power of this rapidly growing research field. The feasibility of the determination of phonon dispersion curves in single crystals is demonstrated on single crystals of beryllium and diamond. The results on the longitudinal and transverse modes from X-ray scattering are in excellent agreement with the results from thermal neutron scattering, the conventional method for measuring phonon dispersion curves. IV ecaferP The application of this new method to the field of biology is certainly a challenging aspect. The power of the technique is shown by the measurements of internal and external modes of vibrations in the crystallized amino acids alanine and glycine up to energy transfers of 005 meV. Collective excitations in liquids will be a dominating research area for inelastic X-ray scattering. First observations of the dispersion of such excita- tions in liquid lithium are discussed as well. The high energy resolution will certainly give new impulse to study the electronic excitations in solids and liquids, too. Measurements of such excita- tions in single crystals of lithium up to energy transfers of 5 eV, for instance, provide information on the dispersion of the so-called zone boundary collec- tive states. The final discussion considers the further applications of inelastic X-ray scattering that would become possible with continued technological improve- ments. Munich, August 1991 Eberhard Burkel Acknowlegements The author thanks J. Peisl and B. Dorner for fruitful discussions and encour- aging support and all members of the INELAX team for their productive collaboration over the years, especially Th. Illini for his enthusiasm in com- pleting the computer software. HASYLAB provided hospitality and technical assistance, which is highly appreciated. The support and hospitality of M. Bartunik and his group at the Max- Planck Institute at DESY is appreciated. The excellent collaboration with .S Lederle in the construction of instru- ment components was very productive. The instrument was built with the technical support of A. EbenbSck and his crew at the machine shop of the Sektion Physik of the University of Munich. Special thanks to them and to all who contributed to the success of INELAX. The author thanks .S Motz for drawing the figures of this review and he greatly appreciates the careful reading of the manuscript by G. Materlik, W. Sch/ilke, H. Sinn and by A. M. KShler whose encouragement is especially appreciated. This project is supported by the Bundesministerium f/it Forschung und Technologic under the project number 30 PE1 LMU .2 Contents Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1.1 X-ray Diffraction ......................... 1 1.2 Probes for Inelastic Scattering with High Energy Resolution 2 1.3 The Use of Backscattering Geometry .............. 4 Basic Considerations . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1 Scattering Cross Section ..................... 7 2.1.1 Scattering Function .................... 8 2.1.2 Intrinsic Scattering Cross Section for Different Probes . 10 2.2 Instrumental Principle ...................... 13 2.3 Energy Resolution ........................ 14 2.3.1 Crystal Contribution ................... 14 2.3.2 Scattering Geometry and Crystal Optics ........ 17 2.4 Momentum Resolution ...................... 20 2.5 Focusing Elements ........................ 21 X-ray Sources ............................ 25 3.1 Conventional X-ray Generator .................. 25 3.2 Synchrotron Radiation ...................... 26 3.3 Insertion Devices ......................... 29 4 The INELAX Instrument ..................... 33 4.1 The Main Components ...................... 34 4.1.1 Premonochromator .................... 34 4.1.2 Monochromator ...................... 38 4.1.3 Analyzer .......................... 39 4.1.4 Overview of the Network of INELAX Instrumentation. 41 4.2 The Technique for Inelastic X-ray Measurements with INELAX ........................... 41 4.2.1 Energy Calibration .................... 41 4.2.2 Energy Transfer ...................... 43 4.2.3 Energy Resolution .................... 45 4.3 Experimental Parameters of INELAX .............. 48 X Contents Other Approaches to Inelastic X-ray Scattering ....... 51 5.1 Activities Using a Conventional Source ............. 51 5.2 Activities Using an Undulator .................. 54 6 Applications of Inelastic X-ray Scattering ........... 57 6.1 Phonons in Single Crystals .................... 57 6.1.1 Beryllium . . . . . . . . . . . . . . . . . . . . . . . . . 59 6.1.2 Diamond . . . . . . . . . . . . . . . . . . . . . . . . . . 61 6.1.3 High Temperature Superconductor ........... 64 6.2 Vibrational Excitations in Non-single-crystal Systems ..... 66 6.2.1 Polycrystalline Lithium .................. 67 6.2.2 Pyrolytic Graphite ......... ........... 69 6.2.3 Liquid Lithium ...................... 71 6.3 Molecular Vibrations in Amino Acids .............. 77 6.4 Investigations of Electronic Excitations ............. 82 7 The Future of the Technique ................... 91 7.1 Further Applications . . . . . . . . . . . . . . . . . . . . . . . 91 7.1.1 Elastic Scattering with High Energy Resolution .... 91 7.1.2 Inelastic Scattering Under High Pressure ........ 91 7.1.3 Anomalous Inelastic X-ray Scattering .......... 92 7.1.4 Inelastic Scattering with Polarization Analysis ..... 92 7.1.5 Inelastic Scattering Under Grazing Incidence ...... 94 7.2 The Next Generation of INELAX ................ 94 8 Final Remarks . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97 List of Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109 Abbreviations and Symbols lattice parameter a0 A mismatch factor; (5.1) A Thomson part of scattering amplitude; (7.5) b scattering length of nucleus B bulk modulus BCS Bardeen-Cooper- Schriefer theory c velocity of light oC calibration constant; (4.2) constants; (4.3) 1C ~ • . . ~ C4 elastic constants Cll : 44C C prefactor in scattering amplitude; (7.6) constant-Q scan scan with fixed momentum transfer constant-E scan scan with fixed energy transfer d, d; distance between two beams lattice spacing for (h k l) reflection dhkl D diameter of spherical crystal Dhor, Dyer horizontal and vertical beam sizes at monochromator ! t horizontal and vertical beam sizes at analyzer Dhor, Dyer DESY Deutsches Elektronen Synchrotron DORIS electron-positron storage ring at DESY, Hamburg 2~d solid angle element (da/dD)o intrinsic scattering cross section Thomson scattering cross section ( d6t / d~ )Th htuR)2gd/~cd( Rutherford scattering cross section 2d a / ( fwd2~d ) double differential scattering cross section; (2.1) e charge of electron eV electron Volt ed(q,j) normalized phonon eigenvector of mode j with phonon wavevector q for atom d initial and final polarization of the photon beam e ~i ef E energy transfer in the scattering process; (2.2)

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