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High-Power Radio Frequency Effects on Electronic Systems PDF

323 Pages·2020·8.761 MB·English
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High-Power Electromagnetic Effects on Electronic Systems For a complete listing of titles in the Artech House Electromagnetics Series, turn to the back of this book. High-Power Electromagnetic Effects on Electronic Systems D. V. Giri Richard Hoad Frank Sabath Library of Congress Cataloging-in-Publication Data A catalog record for this book is available from the U.S. Library of Congress. British Library Cataloguing in Publication Data A catalogue record for this book is available from the British Library. Cover design by John Gomes ISBN 13: 978-1-63081-588-2 © 2020 D. V. Giri, Richard Hoad, and Frank Sabath Artech House 685 Canton Street Norwood, MA 02062 All rights reserved. Printed and bound in the United States of America. No part of this book may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying, recording, or by any information storage and retrieval system, without permission in writing from the publisher. All terms mentioned in this book that are known to be trademarks or service marks have been appropriately capitalized. Artech House cannot attest to the accuracy of this information. Use of a term in this book should not be regarded as affecting the validity of any trademark or service mark. 10 9 8 7 6 5 4 3 2 1 Contents Foreword xi Acknowledgments xiii 1 Introduction 1 1.1 Reliance on Electronics 1 1.2 HPEM Environment Overview 1 1.3 HPEM Effects Overview 3 1.4 A Brief History of EM Interference and Effects 4 1.5 A Systems-of-Systems Hierarchy 5 1.5.1 Device 6 1.5.2 Circuit 6 1.5.3 Equipment 7 1.5.4 System 7 1.5.5 Network 7 1.5.6 Infrastructure 7 1.6 Summary 9 References 9 v vi High-Power Electromagnetic Effects on Electronic Systems Contents vii 2 HPEM Environments 11 2.1 Introduction 11 2.2 Lightning 15 2.2.1 Overview 15 2.2.2 Lightning-Radiated Environment 18 2.3 Nuclear EM Pulse 20 2.3.1 HEMP-Radiated Environment 22 2.3.2 HEMP-Conducted Environment 28 2.3.3 Open-Source Accounts of HEMP Disturbances 29 2.3.4 HEMP Environment Summary 30 2.4 High-Power RF Directed Energy Environments 31 2.4.1 The Status of HPRF DE Systems Today 32 2.5 Intentional EM Interference Environments 35 2.5.1 IEMI Technical Capability Groups 37 2.5.2 IEMI Environment Summary 40 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action 41 2.6 Classification of HPRF DE and IEMI Environments 45 2.6.1 Hypoband 46 2.6.2 Mesoband 48 2.6.3 Hyperband 51 2.7 Summary 54 References 54 3 HPEM Coupling and Interaction 63 3.1 EM Interaction Coupling Model 63 3.2 Topological Concept 67 3.3 Transfer Functions 70 3.3.1 Antenna Transfer Function 70 3.3.2 Free-Space Wave Propagation 73 3.3.3 Coupling/Radiation Efficiency 73 3.3.4 Diffusion Penetration 76 3.3.5 Aperture Penetration 80 3.3.6 Conducted Propagation 82 3.3.7 Galvanic, Capacitive, and Magnetic Coupling 82 vi High-Power Electromagnetic Effects on Electronic Systems Contents vii 3.3.8 Capacitive Coupling 83 3.3.9 Inductive Coupling 85 3.4 Field Variation Inside System Enclosure 86 3.5 Overall Response 86 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure 86 3.5.2 Coupling as a Function of HPEM Environment Type 87 References 89 4 Overview of HPEM Test Facilities and Techniques 91 4.1 Introduction 91 4.1.1 General Considerations for the Scenario 92 4.1.2 General Considerations for HPEM Environment Simulation 95 4.1.3 General Considerations of the SUT 96 4.1.4 Summary 98 4.2 Uncertainty in Effects Testing 98 4.3 HPEM Effects Test Methods and Facilities 99 4.3.1 HPEM-Radiated Testing 100 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation 103 4.3.3 Measuring the Radiated HPEM Environment 120 4.3.4 The Measurement Chain 121 4.3.5 HPEM Conducted Testing 124 4.3.6 Measuring the Conducted HPEM Environment 131 4.4 Exercising and Observing the SUT 131 4.5 Effects Data Presentation 133 4.6 Other Practical Considerations for HPEM Effects Testing 137 4.7 Summary 139 References 139 5 HPEM Effects Mechanisms 145 5.1 Introduction 145 viii High-Power Electromagnetic Effects on Electronic Systems Contents ix 5.2 Terminology 146 5.2.1 About This Chapter 147 5.3 Device and Circuit-Level Effects 148 5.3.1 Rectification 148 5.3.2 Noise 150 5.3.3 Interference or Jamming 150 5.3.4 Saturation 151 5.3.5 Shift in Operating Point 151 5.3.6 False Information 152 5.3.7 Transient Upset 152 5.3.8 Chaotic Effects 153 5.3.9 Damage and Destruction 154 5.3.10 Published Device and Circuit-Level Effects Data 157 5.4 Equipment, System, and Network-Level Effects 158 5.4.1 Summary of Equipment, System, and Network-Level Effects 168 5.5 HPEM Signal Indicators 169 5.5.1 Transient or Time-Domain Signal Indicators 170 5.5.2 Frequency-Domain Signal Indicators 175 5.5.3 Pulsed CW Signals 178 5.5.4 Use of Response Indicators 181 5.6 Impact of Signal Indicators on HPEM Effect Mechanisms 188 5.6.1 Effects of Pulse Repetition: Charging and Heating 188 5.6.2 Effects of Pulse Repetition: Thermal Damage 189 5.6.3 Effects of Pulse Repetition: Probability of Intercept 191 5.6.4 Effects of Spectral Density 193 5.7 Summary 202 References 203 6 Classification and Implications of HPEM Effects 209 6.1 Introduction 209 6.2 Classification of EM Effects 211 6.2.1 Effect Classification by Mechanism 211 6.2.2 Effect Classification by Duration 213 6.2.3 Effect Classification by Criticality 215 viii High-Power Electromagnetic Effects on Electronic Systems Contents ix 6.3 Conclusions 216 References 217 7 HPEM Protection Concepts and Methods 219 7.1 Introduction 219 7.2 Shielding Topology Protection Concept 220 7.2.1 Shielding Topology Modeling 221 7.2.2 Shielding Mechanisms 224 7.3 Conducted Protection Via Nonlinear Elements 233 7.3.1 Protection Using the Amplitude Reduction Approach 235 7.3.2 Summary of Analysis of Nonlinear Elements 263 7.4 HPEM Resilience and Detection 264 7.4.1 A Risk-Based Approach 266 7.4.2 A Resilience Approach 267 7.4.3 HPEM Detection 270 7.5 HPEM Standards 279 7.5.1 HPEM Standards Organization 279 7.6 Summary 280 References 281 8 Epilogue 287 References 291 Glossary 293 About the Authors 301 Index 305

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