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Fundamentals and Applications of Ternary Diffusion. Proceedings of the International Symposium on Fundamentals and Applications of Ternary Diffusion, Hamilton, Ontario, Canada, August 27–28, 1990 PDF

204 Pages·1990·8.976 MB·English
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Preview Fundamentals and Applications of Ternary Diffusion. Proceedings of the International Symposium on Fundamentals and Applications of Ternary Diffusion, Hamilton, Ontario, Canada, August 27–28, 1990

Titles of Related Interest— Ashby ENGINEERING MATERIALS 1 Ashby ENGINEERING MATERIALS 2 Brook IMPACT OF NON-DESTRUCTIVE TESTING Koppel AUTOMATION IN MINING, MINERAL AND METAL PROCESSING 1989 R٧hle METAL-CERAMIC INTERFACES 1iiya METAL MATRIX COMPOSTTES Other CIM Proceedings Published by Pergamon Bergman FERROUS AND NON-FERROUS ALLOY PROCESSES Blckert REDUCTION AND CASTING OF ALUMINUM Bouchard PRODUCTION. RERNING, FABRICAnON AND RECYCUNG OF LIGHT METALS ChalMey TAILING AND EFFLUENT MANAGEMENT Closset PRODUCTION AND ELECTROLYSIS OF LIGHT METALS Dobby PROCESSING OF COMPLEX ORES Embury HIGH TEMPERATURE OXIDATION AND SULPHIDAHON PROCESSES Jaeck PRIMARY AND SECONDARY LEAD PROCESSING Jonas DIRECT ROLUNG AND HOT CHARGING OF STRAND CAST BILLETS Kachaniwaky IMPACT OF OXYSEN ON THE PRODUCTIVITY OF NON-FERROUS METALLURGICAL PROCESSES Lalt F WEINBERG INTERNATIONAL SYMPOSIUM ON SOLIDIFICATION PROCESSING Maemillan QUALITY AND PROCESS CONTROL IN REDUCTION AND CASTING OF ALUMINUM AND OTHER LIGHT METALS Mostaghaci PROCESSING OF CERAMIC AND METAL MATRIX COMPOSTTES Plumpton PRODUCTION AND PROCESSING OF ΠΝΕ PARnCLES Rigaud ADVANCES IN REFRACTORIES FOR THE METALLURGICAL INDUSTRIES RucMIe ACCELERATED COOUNG OF ROLLED STEEL Salter GOLD MEIΔLLURGY Thompson COMPUTER SOFTWARE IN CHEMICAL AND EXTRACTIVE METALLURGY IWIgge-Molecey MATERIALS HANDLING IN PYROMETALLURGY IWIgge-Mdecey PROCESS GAS HANDLING AND CLEANING lyson FRACTURE MECHANICS Wilkinson ADVANCED STRUCTURAL MATERIALS Related Journals (Frae MmpI* coptot avallabto upon raqueat) ACTA METALLURGICA CANADIAN METALLURGICAL QUARTERLY MATERIALS RESEARCH BULLETIN MINERALS ENGINEERING SCRIPTA METALLURGICA PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON FUNDAMENTALS AND APPLICATIONS OF TERNARY DIFFUSION HAMILTON, ONTARIO, CANADA, AUGUST 27-28, 1990 Fundamentals and Applications of Ternary Diffusion Editor G.R. Purdy Department of Materials Science and Engineering McMaster University Hamilton, Ontario, Canada Symposium organized by The Metallurgical Society of CIM 29th ANNUAL CONFERENCE OF METALLURGISTS OF CIM 29e CONFERENCE ANNUELLE DES MÉTALLURGISTES DE L'ICM Férgamon Press Member of Maxwell Macmillan Pfergamon Publishing Corporation New York Oxford Beijing Frankfurt Sao Paulo Sydney Tbkyo Toronto Pergamon Press Offices: U.S.A. Pergamon Press, Inc., Maxwell House, Fairvlew Park, Elmsford, New York 10523, U.S.A. U.K. Pergamon Press pic, Headlngton Hill Hall, Oxford 0X3 OBW, England PEOPLE'S REPUBLIC Pergamon Press, 0909 China World Tower, No. 1 Jian OF CHINA Quo Men Wai Avenue, Beijing 1000004, People's Republic of China FEDERAL REPUBLIC Pergamon Press GmbH, Hammerweg 6, OF GERMANY D-6242 Kronberg, Federal Republic of Germany BRAZIL Pergamon Editora Ltda. R٥a Ega de Queiros, 346 CEP 04011, Paraνso, Sao Paulo, Brazil AUSTRALIA Pergamon Press Australia Pty Ltd., RO. Box 544, Potts Point, NSW 2011, Australia JAPAN Pergamon Press, 8th Floor, Matsuoka Central Building, 1-7-1 Nishishinjuku, Shinjuku-ku, Tokyo 160, Japan CANADA Pergamon Press Canada Ltd., Suite 271, 253 College Street, Toronto, Ontario M5T1R5 Canada Copyright © 1990 Pergamon Press, Inc. All rights reserved. No part of this publication may be reproduced In a retrieval system or transmitted In any form or by any means: electronic, electrostatic, magnetic tape, mechanical, photocopying, recording or otherwise, without permission In writing from the publishers. Library of Congress Cataloging in Publication Data ISBN 0-08-040412-X Printing: 1 2 3 4 5 6 7 89 Year: 0 1 2 3 4 5 6 7 89 Printed In ttie United States of America The paper used in this publication meets the minimum require­ ments of American National Standard for Information Sciences- Permanence of Paper for Printed Library Materials, ANSI Ζ 39.48- 1984 Foreword In 1955, as a junior professor at McGill University and a summer employee of Alimiinium Labora­ tories in Kingston, Ontario, Jack Kirkaldy encountered the problems of diffusion and phase transfor­ mations in multicomponent alloys and as a physidst-cum-metallurgist decided to undertake a systematic ejqjerimental and theoretical study of the phenomena with a view to establishing a technological problan- solving capability. Upon joining McMaster University in 1957, he established a large and productive research group, focussing on aluminum and iron-carbon base solid alloys, but not excluding the full range of solid and liquid material manifestations. His synthesis, with D.J. Yoimg, appeared in 1987 as the definitive volume on multicomponent effects. Diffusion in the Condensed State. The present volume may be regarded as an appendix and update on that synthetic contribution. Taking a lead from Onsager's irreversible thermodynamic foundations, Kirkaldy, in 1958, recognized the importance of matrix methods in generalizing binary theory to temary and higher order systems. Elements of this intelligence are to be found in the new contributions of Miller, Morral et al and "Kirkaldy et al, in this volume. Jack recognized early on that temary cross effects would often be weak, as for example in dilute solutions, so that pseudo-binary constmctions would be adequate for problem- solving. While establishing appropriate theoretical criteria, he also sought to discover material or ex­ perimental conditions where such cross-effects would be aihanced. Papers in the present volume co- authored with Young, Okongwu, Zou and Buchmayr expand this particular knowledge to a range of new material systems. There is a broad trend toward interaction enhancement at concentrations rich enough to produce phase transformations. Kirkaldy and co-workers have accordingly extensively studied the multicomponent- multiphase phenomena in both stable and unstable interface configurations. This work in Fe<:-X alloys has had an important technological impact through the successful marketing of Jack's software pack­ age pertaining to quality control and optimization in the heat treatment of alloy steels. The papers of Dayananda and Liu, Jan et al,, van Loo et al. Stringer, Brechet, Balasubramanian, Zou, Larson and Buchmayr bear directly on this problem area and exploit Jack's earlier contributions. In 1963-66, Lane and Kirkaldy demonstrated that the Kirkendall Effect associated with a vacancy diffii­ sion mechanism in solids produces a temary diffusion cross-effect through the drift velocity which can be comparable in magnitude to purely thermodynamic effects. In his present short contribution, he makes an explicit comparison of magnitudes and demonstrates that vacancy correlation effects on diffiision profiles are usually unimportant in close-packed materials. In early studies of unstable temary transformation interfaces. Jack recognized a close analogy with instabilities generated in cellular solidification of binary alloys in a temperature gradient. This has led him into a deep study of pattern formation based within the variational principles of irreversible ther­ modynamics and formal logic. While excluded from this volume, the elements are to be found in Chapter 13 of the above-mentioned 1987 volume and the Pergamon symposium volume "Advances in Phase Transformations", which was arranged to celebrate Jack's 60th birthday. With this volume, presented upon his retirement, we gratefully acknowledge Jack Kirkaldy's many contributions to, and intellec­ tual leadership in, üie field of temary diffusion over more than three decades. Gary Purdy Hamilton, Ontario August 1990 Impurity diffusion in a doubly-doped elemental semiconductor with pair formation D.J. Young School of Materials Science and Engineering, University of New South Wales, Kensington, N.S.W. 2033, Australia R.C. Dorward Kaiser Chemical and Aluminum Corp., Pleasanton, California, U,S.A, J.S. Kirkaldy Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada, L8S 4M1 Abstract The diffusion of substitutionally dissolved donors and acceptors has been described in terms of point defect movement and an irreversible thermodynamic treatment has been used to identify the interactions among the different diffusing species. The principal diffusive interactions for a donor species have been shown to be countercurrent donor-vacancy movement, countercurrent donor-solvent movement, countercurrent donor-acceptor movement and co-current donor-acceptor movement. The relative magnitude of kinetic coefficients can be calculated specifically from an absolute rate theory approach. This paper deals specifically with the common case of countercurrent donor-acceptor movement subject to the complication of donor-acceptor pair formation. This is incorporated into the kinetics using a linear expansion of the logarithm of the activity coefficient. A representative diffusion profile is given showing significant attractive segregation of the donor on a gradient of acceptor despite the extreme diluteness of the reactants. Introduction Diffusion against a concentration gradient in a ternary or higher order couple can occur for a variety of reasons including thermodynamic interactions, Onsager correlation cross-effects, vacancy winds and inhomogeneities, electrostatic neutraliza­ tion interactions in ionic solids (1) and electron-solute interactions in semiconductors (2). This paper deals with the exceptionally strong effect of an electrostatic pair reaction (1-3) as represented by combination of donor and acceptor dopants in a semi­ conductor (e.g. Si). At the very dilute concentrations involved thermodynamic solution and Onsager effects (1) are by contrast of no observational consequence. An elemental semiconductor such as silicon will in general contain a variety of defect types, including impurities. In describing the diffusion of tJhose impurities, it is necessary to take into account their chemical interactions with all other species in the solid. An appropriate methodology for calculating these effects is provided by irrever­ sible thermodynamics, which provides a phenomenological relationship between fiuxes and driving forces and interrelates the different species. For any system of Schottky and (or) Frenkel defects we adopt the notation of Kroger and Vink (4) wherein the lattice species are represented by the symbol SV. Here the subscript represents the normal occupancy in a perfect crystal of the site in question, and the principal symbol represents the species actually occupying the site. The superscript represents the charge of the species relative to normal site occupancy with a prime denoting a negative, a dot positive and a cross, zero charge. When defects diffuse under isothermal, field-free conditions, they must on the average move in groups which conserve both electrical charge and sites. These groups FUNDAMENTALS AND APPLICATIONS OF TERNARY DIFFUSION satisfy the definition of "relative building units" formulated by Schottky (5) and by Kroger et al. (6) in their description of point defect equilibria. The usefulness of this concept in treating diffusion in ionic solids has since been demonstrated (7, 8). Kirkaldy and Young (1) have adapted that treatment to the case of an elemental semiconductor containing multiple vacancy charge states, as well as impurities. They have also discussed procedures for introducing the diffusion kinetics via absolute rate theory, and this will be expanded in the present context of diffusing building units. Finally, the effect of donor-acceptor pair formation on the observed diffusion behaviour is analyzed. Although the treatment is quite general, the specific case of silicon is used as an example. The Relative Building Units For A Doubly-Doped Semiconductor This section summarizes the results of the irreversible thermodynamic entropy source method for identifying the building units Ui (1). In this method, the linear dependencies contained in the set of fluxes appearing in the entropy source term are eliminated using the flux constraints due to site and charge conservation. For silicon containing a donor, D, an acceptor. A, and vacancies which can be positively or negatively charged, as well as neutral, there exist 18 distinguishable pairs of species fluxes not involving the donor. Elimination of these flux pairs reveals the building units containing D, in serial order (i = 1-13): Dsi-Vsi + 2«} {Dsi-Vsi + 2h- } ÍDsi-Asi + 2e'} {Ds,-A3^-2h- } Only 13 of 18 distinguishable units result because all six units involving V reduce to {Dg¿-Vg¿}. It should be noted that these units reflect the simplest forms of correlation, as any linear combination of the units would obviously satisfy all thermodynamic and conservative requirements. The relative building units involving D g. necessarily reflect the flux constraints which via the entropy source expression impose the requirements that movement of D be balanced by an opposite movement of another lattice species, and that any net charge flow thereby arising be neutralised. Thus four principal correlations are seen to exist; countercurrent donor-vacancy movement, counter- current donor-solvent movement, countercurrent donor-acceptor movement and cocurrent donor acceptor movement. The relative importance of these various possible correlations will be determined by the probabilities of finding the required species in adjacent positions within the solid (i.e., of locating the required relative building unit). Thus the most likely of the various possible donor-vacancy exchange mechanisms will be determined by the vacancy ionization equilibria. All correlations involving the simultaneous movement of two constituents require the presence of a vacancy. If the vacancy is explicit in the corresponding relative building unit, then net vacancy transport occurs. If the unit contains no vacancy, then the vacancies function only as intermediaries. It follows then that donor-solvent countercurrent diffusion can occur with and without net vacancy movement. The favoured mechanism will depend on the relative FUNDAMENTALS AND APPLICATIONS OF TERNARY DIFFUSION abundance of V'^. and Vg¿. Cocurrent donor-acceptor diffusion can also occur both with and without'a vacancy ñux. Given that the probability of finding a Si'^si species approaches unity, the unit {Dg, +Ag^ —2Siy adjacent to an additional Vsi is more probable than {D c: +A «.-2V*g.} alone. The zero vacancy flux situation therefore seems more probable. Countercurrent donor-acceptor diffusion cannot involve a net vacancy flux but must involve an electronic current. The relative importance of cocurrent and countercurrent donor-vacancy correlations will depend on kinetic factors and on the relative availability of neutral vacancies and free carriers. Applying the same procedures to an analysis of the diffusion of acceptors A' it is found that the relative building units U'. involved are in line serial order (i = 1-13) ÍAsi-Vg,-2e}{Ag^-Vg^+2h- } {^Si - Si^i " e'} {A' - Si^^ + h- } {Ag^ - 2Si^^ + VgJ (2) ÍAsi-Dg^-2e'} {Ag,-Dg^+2h- } K^'^Si -2V^iHAg, + Dg^-2Si^^} The mechanism by which D can move is via the relative building units listed in Eq. 1. A linear combination of the fluxes arising therefrom represents a complete and exhaustive accounting for diffusion of D , viz., 13 JD = - Σ ^i^níu.} (3) i = l where q(Ui) is the electrochemical potential of building unit Ui of standard form η. =μ. + ζ. Ρψ (4) where μι is the chemical potential, zi is the number of electronic charges with due regard to sign, F is the Faraday and ψ is the electrochemical potential. As usual ψ vanishes in the transformations. Substituting for q(Ui) from Eq. 1 one obtains after rearrangement JD = - Σ 'i ^^D - «12 + ·ΐ3 - \ o- \l> ^^·A + «7 + 'β + ^^9 + 21 ,3) Vp^. (5) i = l and the cross-terms in the diffusion matrix are seen to be explicitly identified. Similarly it is found for diffusion of A' , 13 <f A = - + ^3 - \o - "^D - Σ ^ + + ^8 + + 2X^3) Vpg. (6) i=l Further simplification results if the solid solution is Henrian, for then in terms of concentration mj in moles/unit volume νμ. = RT Vm./m. (7) and, for low vacancy concentrations, FUhTOAMENTALS AND APPLICATONS OF TERNARY DIFFUSION (8) Substitution of (7) and (8) into (5) and (6) followed by rearrangement yields J. RT I mj, " D [LAD f^AA I^ASil (9) RT D •"A ' where the Ly are defined as the coefficients in Eqns. (5) and (6). To proceed further, the as-yet unidentified coefficients €[ and λ{ must be evaluated. To this end we must turn to a kinetic description of the process. We may anticipate, however, that because the units UIQ to U13 of Eq. 1 involve precisely the same lattice and free carrier species as the analogous units U'lo to U'ls of Eq. 2, the kinetics of the species interchange processes will be the same, and hence li = Ai , i = 10,11,12,13 (10) In consequence of this eventuality, the synunetry expected of the L-matrix is arrived at. Defect Diffusion Kinetics The diffusion of point defects can be calculated by the methods of absolute rate theory (9) when proper account is taken of local electrostatic field effects (10). The method has been presented elsewhere (11). For the interchange of lattices species i and vacancies between a^acent sites separated by a distance d J = - V. K. a. a V{n. - η } (11) RT IV IV I V ^ h ^v' Here Ν is the volume concentration of lattice sites, viv is a frequency term, and Kiv is the equilibrium constant relating the activity of the transition-state complex to those of the reactants (ai and ay). This expression is used to evaluate the rates of the several pair-wise interchanges which constitute the movement of a complete relative building unit. Applying Eqn. (11) to the diffusion of Uio, for example, we find Nd^ (12) RT (13) RT In addition, it is possible to write for the overall process from initial to final state JiO = - vK^aj^a^a^afvWD ) - η(Α ) + 2n(e )} (15) The quantity vKc is evaluated from the quasi-steady-state condition FUNDAMENTALS AND APPLICATONS OF TERNARY DIFFUSION J=J<»> = jib)^j(c) and the combined activity product corresponding to the four reactions of Eqs. 12-14 (16) It is then found that a^xV{n(D)-ri(A') + 2n(e')} (17) where new concentration variables are defined by (18) ^A = ^AW^AV^' "^e^W^ The coefficient ho is thus evaluated. Values found in this way for all the li, λι are listed in the Appendix. It is seen here explicitly that i= 1,2...9 (19) 1. = λ. , i = 10,...13 and the L-matrix is symmetric. The relative importance of the different diffusion mechanisms depends upon the concentrations of the individual species involved which in turn depend on the equilibrium constants for the formation reactions (1, 12). Even though all relative building units, when they move, represent diffusion without a net current, several of them contain a net charge, e.^., {Dgi—Vg.}. Movement of these units obviously involves two equal and opposite electrical currents. However, the existence of sufficient units to provide a diffusive flux necessarily implies a space charge unless local compensating, oppositely charged defects are present. This, in turn, implies that the probability of finding the required species in adjacent positions within the solid (i.e. of locating the required relative building unit) is low. In other words, because thev possess mobile free carriers, semiconductors cannot support large space charges and tnerefore the concentration of uncompensated building units is necessarily low. Accordingly, diffusion contributions from the following units are taken to be negligible: ^1' U,,, U,,, U,, U,. U,, U,,, U,, The contributions of the remaining units are now used to evaluate the coefficients in the diffusion equations (9). It is convenient to recast these as RT ^DD - ^DSi ^DA - ^DSi (20) :ÍA RT ^AD " ^ASi ^AA - ^ASi '"si "Si Noting from definitions (18) that for Henrian behaviour Vm./m. = Vm./m. (21) 11 11 and substituting for the Lij from term-by-term comparison with Eqns. (5) and (6) then if only charge-neutral relative building units are considered, we obtain (dropping the primes for clarity) FUNDAMENTALS AND APPLICATONS OF TERNARY DIFFUSION (22) ^A= -I^AD^"^D-I^AA^"^A 2m 2m, DP m^ + mj^a^x m^ + m^^ m^, + nijj D, 2m^ DA + 2 Nd" D 2m. mj^m^mj^ (23) AD + 2 a Nd m^ + m^ mg.mj^(mj^ + m^a^x) D 2m. 2m^ AA V' Nd'2 mj^ + m^a^ m^+ m^, + m^ Note that the m's in Eqs. 22 as defined incorporate factors of form vK. Consequences of Defect Pairing Point defects may be able to interact strongly with one another (1-3,13) forming complexes which are relatively inunobile within tJie host lattice. An example of this additional kind of local equilibriiun is pair formation between two oppositely charged donors and acceptors in a semiconductor represented by the chemical equation D -H A' = DA (24) for which we may write the mass law, assuming ideal or Henrian solution behaviour (25) ^DA^^D- ^A' - ^ In this case the concentrations of species actually free to move, XD and XA', differ from the analytically measured concentrations of these components, Xi and X2, i.e. (26) ^D - ^1 ~ ^DA ^A' " ^2 ~ ^DA Since diffusion experiments on solids invariably rely on analytical measurements of total component concentration, the diffusion equations must be couched in these terms. It is necessary, therefore, to describe the thermodynamics of the solution in terms of total component concentrations. Whilst the free species D and A', if dilute, will be Henrian, it is most improbable tiiat the solute components Xi and X2 can be so regarded. This is an immediate consequence of the fact that Xi, X2 are not direct measures of XD and XA' because of the formation of pairs. Consequently activities referred to the pure solutes are expected to deviate markedly from their values in the absence of pair formation. One particular solution model is now proposed and its consequences for the diffusion equations explored. If the two solutes have negligible solubility for the solvent and each other, then the phase boundaries of the solution may be defined, at constant temperature and constant activity lines (Fig. 1). YjX^ = l and ¥3X2=1 (27)

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