Experiments Manual to Accompany Electronic Principles, 8th Edition

375 Pages·2015·5.063 MB·English

by  Albert P. Malvino, David J. Bates, Patrick E. Hoppe

Eighth Edition
Experiments Manual for use with
ELECTRONIC
PR INCIPLES
ALBERT MALVINO | DAVID BATES | PATRICK HOPPE
Experiments Manual
to accompany
Electronic Principles
Eighth Edition
Albert P. Malvino
David J. Bates
Patrick E. Hoppe
Gateway Technical College
EXPERIMENTS MANUAL TO ACCOMPANY ELECTRONIC PRINCIPLES, EIGHTH EDITION
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Contents
PREFACE vi
EXPERIMENT 1 VOLTAGE AND CURRENT SOURCES 1
EXPERIMENT 2 THEVENIN’S THEOREM 5
EXPERIMENT 3 TROUBLESHOOTING 11
EXPERIMENT 4 SEMICONDUCTOR DIODES 15
EXPERIMENT 5 THE DIODE CURVE 19
EXPERIMENT 6 DIODE APPROXIMATIONS 25
SYSTEM APPLICATION 1 INPUT PROTECTION 29
EXPERIMENT 7 RECTIFIER CIRCUITS 33
EXPERIMENT 8 THE CAPACITOR-INPUT FILTER 37
EXPERIMENT 9 LIMITERS AND PEAK DETECTORS 43
EXPERIMENT 10 DC CLAMPERS AND PEAK-TO-PEAK DETECTORS 47
EXPERIMENT 11 VOLTAGE DOUBLERS 53
EXPERIMENT 12 THE ZENER DIODE 57
EXPERIMENT 13 THE ZENER REGULATOR 61
SYSTEM APPLICATION 2 VOLTAGE REGULATION 65
EXPERIMENT 14 OPTOELECTRONIC DEVICES 71
EXPERIMENT 15 THE CE CONNECTION 79
EXPERIMENT 16 TRANSISTOR OPERATING REGIONS 83
EXPERIMENT 17 BASE BIAS 89
EXPERIMENT 18 LED DRIVERS 93
EXPERIMENT 19 SETTING UP A STABLE Q POINT 101
EXPERIMENT 20 BIASING PNP TRANSISTORS 105
EXPERIMENT 21 TRANSISTOR BIAS 109
EXPERIMENT 22 COUPLING AND BYPASS CAPACITORS 115
EXPERIMENT 23 THE CE AMPLIFIER 119
EXPERIMENT 24 OTHER CE AMPLIFIERS 123
EXPERIMENT 25 CASCADED CE STAGES 127
EXPERIMENT 26 CC AND CB AMPLIFIERS 131
iii
EXPERIMENT 27 EMITTER FOLLOWER APPLICATIONS 135
EXPERIMENT 28 CLASS-A AMPLIFIERS 141
EXPERIMENT 29 CLASS-B PUSH-PULL AMPLIFIERS 145
EXPERIMENT 30 AN AUDIO AMPLIFIER 151
EXPERIMENT 31 CLASS-C AMPLIFIERS 155
SYSTEM APPLICATION 3 MULTISTAGE TRANSISTOR APPLICATION 161
EXPERIMENT 32 JFET BIAS 169
EXPERIMENT 33 JFET AMPLIFIERS 177
EXPERIMENT 34 JFET APPLICATIONS 181
EXPERIMENT 35 POWER FETs 187
EXPERIMENT 36 THE SILICON CONTROLLED RECTIFIER 193
EXPERIMENT 37 FREQUENCY EFFECTS 199
SYSTEM APPLICATION 4 FREQUENCY RESPONSE OF COUPLING AND
BYPASS CAPACITORS 203
EXPERIMENT 38 THE DIFFERENTIAL AMPLIFIER 209
EXPERIMENT 39 DIFFERENTIAL-AMPLIFIER SUPPLEMENT 213
EXPERIMENT 40 INTRODUCTION TO OP-AMP CIRCUITS 217
EXPERIMENT 41 INVERTING AND NONINVERTING AMPLIFIERS 223
EXPERIMENT 42 THE OPERATIONAL AMPLIFIER 229
EXPERIMENT 43 SMALL- AND LARGE-SIGNAL OUTPUT
IMPEDANCES 233
EXPERIMENT 44 SUMMING AMPLIFIERS 239
EXPERIMENT 45 VCVS FEEDBACK 243
EXPERIMENT 46 NEGATIVE FEEDBACK 251
EXPERIMENT 47 GAIN-BANDWIDTH PRODUCT 259
EXPERIMENT 48 LINEAR IC AMPLIFIERS 263
SYSTEM APPLICATION 5 SINGLE POWER SUPPLY AUDIO
OP-AMP APPLICATION 271
EXPERIMENT 49 CURRENT BOOSTERS AND CONTROLLED
CURRENT SOURCES 277
EXPERIMENT 50 ACTIVE LOW-PASS FILTERS 285
EXPERIMENT 51 ACTIVE BUTTERWORTH FILTERS 293
EXPERIMENT 52 ACTIVE DIODE CIRCUITS AND COMPARATORS 301
EXPERIMENT 53 WAVESHAPING CIRCUITS 307
EXPERIMENT 54 THE WIEN-BRIDGE OSCILLATOR 311
EXPERIMENT 55 THE LC OSCILLATOR 315
EXPERIMENT 56 OP-AMP APPLICATIONS: SIGNAL GENERATORS 319
SYSTEM APPLICATION 6 POWER SUPPLY MONITORING CIRCUIT 325
iv
EXPERIMENT 57 THE 555 TIMER 331
EXPERIMENT 58 555 TIMER APPLICATIONS 339
EXPERIMENT 59 SHUNT REGULATORS 345
EXPERIMENT 60 SERIES REGULATORS 351
EXPERIMENT 61 THREE-TERMINAL IC REGULATORS 359
APPENDIX MAIN PARTS AND EQUIPMENT 367
v
Preface
T
he 8th edition of Experiments for Electronic Principles has been modifi ed to give both
the student and the instructor maximum fl exibility in performing the experiments while
incorporating additional troubleshooting opportunities. This laboratory manual contains 67
experiments to demonstrate the theory in Electronic Principles. Sixty-one of the experiments
focus on specifi c topics covered in the textbook. These 61 experiments help the student
better understand the individual topics presented throughout the textbook. The additional
six System Applications are system-based experiments that tie together related topics cov-
ered within the textbook. The early applications tie together related topics using single-
stage systems. The later applications present the student with the opportunity to work with
multiple-stage systems. The system application-based experiments stand on their own and
may be completed without doing the preceding experiments. However, they do tie together
the preceding system applications. Each experiment begins with a short discussion. Then,
under Required Reading, the entry provides the sections of the textbook that should be read
before attempting to do the experiment. In the Procedure section, one or more circuits will
be built and tested. Troubleshooting and Critical Thinking sections explore more advanced
areas. Questions at the end of each experiment are a fi nal test of what was learned during
the experiment.
Optional sections are included in many experiments. They are to be used at the discretion
of the instructor. Applications sections demonstrate how to use transducers such as buzzers,
LEDs, microphones, motors, photoresistors, phototransistors, and speakers. Additional Work
sections include advanced experiments.
The Instructor Resources section of McGraw-Hill’s Connect has Multisim-constructed
circuits available for download for each of the experiments. Multisim provides the students
with an opportunity to gain valuable troubleshooting experience without the potential to
damage test equipment or electronic parts. At the end of each experiment, the data tables
include columns for data obtained from calculations, measurements using Multisim, and
from hands-on measurements. Instructors can assign students to fi rst perform the required
circuit calculations, then test the circuit using simulation software, and then build the circuit
using actual components. As alternatives, the students can take circuit measurements using
only actual components or only circuit simulation. This enables the instructor to offer the
laboratory portion of the course using either online or blended formats.
Students will fi nd the experiments in this lab manual to be instructive and interesting. The
experiments verify and expand the theory presented in Electronic Principles. They make it
come alive. When the experiments have been completed, students will have that rounded
grasp of theory that can come only from practical experimentation.
Albert P. Malvino
David J. Bates
Patrick E. Hoppe
*To access the Instructor Resources through Connect, contact your McGraw-Hill Representative to obtain a
password. If you do not know your representative, go to www.mhhe.com/rep, to fi nd your representative.
Once you have your password, log in at connect.mheducation.com. Click on the course for which you are using
Electronic Principles. If you have not added a course, click “Add Course,” and select “Engineering Technology”
from the drop-down menu. Select Electronic Principles, 8e and click “Next.” Once you have added the course, click
on the “Library” link, and then click “Instructor Resources.”
vi
11
EExxppeerriimmeenntt
Voltage and
Current Sources
A
n ideal or perfect voltage source produces an output voltage that is independent of the
load resistance. A real voltage source, however, has a small internal resistance that produces
an IR drop. As long as this internal resistance is much smaller than the load resistance,
almost all the source voltage appears across the load. A stiff voltage source is one whose
internal resistance is less than 1/100 of the load resistance. With a stiff voltage source, at
least 99 percent of the source voltage appears across the load resistor.
A current source is different. It produces an output current that is independent of the
load resistance. One way to build a current source is to use a source resistance that is much
larger than the load resistance. An ideal current source has an infi nite source resistance. A
real current source has an extremely high source resistance. A stiff current source is one
whose internal resistance is at least 100 times greater than the load resistance. With a stiff
current source, at least 99 percent of the source current passes through the load resistor.
In this experiment, the conditions necessary to achieve a stiff voltage source and current
source will be investigated. This experiment will also provide an opportunity to troubleshoot
and design both voltage and current sources.
GOOD TO KNOW
Even new components can be out of tolerance. It is a good habit to measure
the value of the resistors before use.
Required Reading Before measuring any voltage or current, the approxi-
mate value should be known so that the test equipment
Chapter 1 (Secs. 1-3 and 1-4) of Electronic Principles, can be set to the proper range. Examine Fig. 1-1 and
8th ed. estimate and record the load voltage for each value
of R listed in Table 1-1. It is important to be able to
1
Equipment
estimate these rough values and to be able to calculate
exact values.
1 power supply: adjustable to 10 V
6 ½-W resistors: 10 V, 47 V, 100 V, 470 V, 1 kV,
10 kV R A
1
1 DMM (digital multimeter)
+ +
V R
Procedure 10 V1 10 kVL VL
– –
VOLTAGE SOURCES
B
1. The circuit left of the AB terminals in Fig. 1-1 repre-
sents a voltage source and its internal resistance R . Figure 1-1
1
1
R TROUBLESHOOTING
1
1 kV A
5. Build the circuit of Fig. 1-1 with an R of 470 V.
1
+ Connect a jumper wire between A and B. Measure
V
1 R the voltage across the load resistor and record V in
10 V L L
–
Table 1-3. Record any observations next to Table 1-3.
6. Remove the jumper and open the load resistor by lift-
B
ing one leg of the resistor from the breadboard. Mea-
sure the load voltage between the AB terminals and
Figure 1-2
record in Table 1-3. Record any observations next to
Table 1-3.
2. Sketch the circuit in Fig. 1-1. Measure and record the
value of each of the resistors used in this experiment.
Build the circuit in Fig. 1-1 using the values of R given CRITICAL THINKING
1
in Table 1-1. Measure and adjust the source voltage
7. Select an internal resistance R for the circuit of
to 10 V. For each R value, measure and record V in 1
1 L Fig. 1-1 to get a stiff voltage source for all load resis-
Table 1-1.
tances greater than 10 kV. Build the circuit of Fig. 1-1
using the selected design value of R . Measure the load
1
CURRENT SOURCE voltage. Record the value of R and the load voltage in
1
Table 1-4. Record any observations next to Table 1-4.
3. The circuit left of the AB terminals in Fig. 1-2 acts like
8. Select an internal resistance R for the circuit of
a current source under certain conditions. Estimate 1
Fig. 1-2 to get a stiff current source for all load re-
and record the load current for each value of load re-
sistances less than 100 V. Build the circuit with the
sistance shown in Table 1-2.
selected design value of R and a load resistance of
4. Sketch the circuit in Fig. 1-2. Build the circuit of 1
100 V. Measure the load current. Record the value
Fig. 1-2 using the R values given in Table 1-2. Measure
L of R and the load current in Table 1-4. Record any
and adjust the source voltage to 10 V. For each R 1
L observations next to Table 1-4.
value, measure and record I in Table 1-2.
L
GOOD TO KNOW
The key to troubleshooting a circuit is to under-
stand how the circuit should work and recognize
which component(s) are causing the error through
careful measurement and observation.
2
NAME DATE
Experiment 1
Lab Partner(s) ______________________________________________________________________________________
PARTS USED CALCULATIONS
Nominal Value Measured Value
10 V
47 V
100 V
470 V
1 kV
10 kV
SCHEMATIC TABLE 1-1. VOLTAGE SOURCE
R Estimated V Measured V
1 L L
Multisim Actual
0 V
10 V
100 V
470 V
SCHEMATIC TABLE 1-2. CURRENT SOURCE
R Estimated I Measured I
L L L
Multisim Actual
0 V
10 V
100 V
470 V
TABLE 1-3. TROUBLESHOOTING OBSERVATIONS
Measured I
L
Multisim Actual
Trouble
Shorted Load
Open Load
TABLE 1-4. CRITICAL THINKING OBSERVATIONS
R Measured Quantity
1
Source
Type Multisim Actual
Voltage
Current
3