Experiments Manual for Use with Digital Electronics: Principles and Applications

418 Pages·8·28.427 MB·English

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www.mhhe.com eighth edition
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Experiments Manual for Use with
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Experiments Manual for Use with
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Experiments Manual for Use with Digital Electronics: Principles and Applications,
Eighth Edition
Roger Tokheim
Published by McGraw-Hill, a business unit of The McGraw-Hill Companies, Inc., 1221
Avenue of the Americas, New York, NY10020. Copyright © 2014 by The McGraw-Hill
Companies, Inc. All rights reserved. Printed in the United States of America. Previous
editions © 2008, 2003, and 1999.
The contents, or parts thereof, may be reproduced in print form solely for classroom
usewith Digital Electronics: Principles and Applications, Eighth Edition, provided such
reproductions bear copyright notice, but may not be reproduced in any other form or
forany other purpose without the prior written consent of The McGraw-Hill Companies,
Inc., including, but not limited to, in any network or other electronic storage or
transmission, or broadcast for distance learning.
1 2 3 4 5 6 7 8 9 0 QPD/QPD 1 0 9 8 7 6 5 4 3
ISBN: 978-0-07-752080-9
MHID: 0-07-752080-7
www.mhhe.com
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Contents
Editor’s Foreword . . . . . . . . . . . . . . . . . . . . . . . . .viii Chapter 4 Combining Logic Gates 71
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .ix
Test: Combining Logic Gates . . . . . . . . . . . . . . . . .71
Safety . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .xi
4-1 Lab Experiment: Developing a
Chapter 1 Digital Electronics 1 Logic Circuit . . . . . . . . . . . . . . . . . . . . . . .77
4-2 Lab Experiment: Simplifying
Test: Digital Electronics . . . . . . . . . . . . . . . . . . . . . .1 Logic Circuits . . . . . . . . . . . . . . . . . . . . . . .79
1-1 Lab Experiment: Clock Circuit . . . . . . . . . .3 4-3 Multisim Experiment: Logic
1-2 Lab Experiment: One-Shot Multivibrator Simplification . . . . . . . . . . . . . . . . . . . . . . .83
and Debounced Switch . . . . . . . . . . . . . . . . .7 4-4 Lab Experiment: Data Selectors . . . . . . . .87
4-5 Design Problem: Solving Gating
Chapter 2 Numbers We Use in Digital
Problems with Data Selectors . . . . . . . . . .91
Electronics 11
4-6 Design Problem: Using CMOS to Solve
aFive-Variable Logic Problem . . . . . . . . .93
Test: Numbers We Use in Digital Electronics . . . .11
4-7 Design Problem: ADecoder
2-1 Lab Experiment: Using an Encoder . . . . .13
Using a PLD . . . . . . . . . . . . . . . . . . . . . . . .97
2-2 Lab Experiment: Using a Decoder . . . . . .19
4-8 BASIC Stamp Experiment: Binary-to-Seven-
2-3 Lab Experiment: Using a CMOS Binary
Segment Display Decoder . . . . . . . . . . . .105
Counter . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
2-4 Multisim Experiment: Encoding Decimal
Chapter 5 IC Specifications and Simple
toBinary . . . . . . . . . . . . . . . . . . . . . . . . . . .23
Interfacing 113
Chapter 3 Logic Gates 27
Test: IC Specifications and Simple Interfacing . . .113
5-l Lab Experiment: Interfacing Switches
Test: Logic Gates . . . . . . . . . . . . . . . . . . . . . . . . . . .27
withTTL . . . . . . . . . . . . . . . . . . . . . . . . . .121
3-1 Lab Experiment: AND Gates . . . . . . . . . . .31
5-2 Lab Experiment: Interfacing LEDs
3-2 Lab Experiment: OR Gates . . . . . . . . . . . .35
with TTL and CMOS . . . . . . . . . . . . . . . .125
3-3 Lab Experiment: Inverters . . . . . . . . . . . . .39
5-3 Lab Experiment: Interfacing TTL
3-4 Lab Experiment: NAND and
andCMOS Integrated Circuits . . . . . . . . .129
NOR Gates . . . . . . . . . . . . . . . . . . . . . . . . .41
5-4 Lab Experiment: Interfacing CMOS
3-5 Lab Experiment: XOR and
withBuzzers, Relays, and Motors . . . . . .131
XNOR Gates . . . . . . . . . . . . . . . . . . . . . . .45
5-5 Lab Experiment: Using an Optoisolator
3-6 Lab Experiment: Using the
inInterfacing . . . . . . . . . . . . . . . . . . . . . .133
NAND Gate . . . . . . . . . . . . . . . . . . . . . . . .49
5-6 Lab Experiment: Interfacing with
3-7 Design Problem: Gates with More
a Stepper Motor . . . . . . . . . . . . . . . . . . . .135
Than Two Inputs . . . . . . . . . . . . . . . . . . . .51
5-7 Lab Experiment: Using a Hall-Effect
3-8 Design Problem: Converting Gates
Switch . . . . . . . . . . . . . . . . . . . . . . . . . . . .141
to Other Logic Functions . . . . . . . . . . . . . .55
5-8 Lab Experiment: Interfacing with
3-9 Troubleshooting Problem:
a Servo Motor . . . . . . . . . . . . . . . . . . . . . .147
Testing Logic Levels in a CMOS
5-9 Design Problem: Control a Stepper Motor
TimerCircuit . . . . . . . . . . . . . . . . . . . . . . .59
from a Keypad . . . . . . . . . . . . . . . . . . . . .151
3-10 BASIC Stamp Experiment: Programming
5-10 BASIC Stamp Experiment: Driving a
Logic Functions . . . . . . . . . . . . . . . . . . . . .65
ServoMotor . . . . . . . . . . . . . . . . . . . . . . .157
Contents v
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Chapter 6 Encoding, Decoding, and 9-3 Lab Experiment: The Universal
Seven-Segment Displays 163 Shift Register . . . . . . . . . . . . . . . . . . . . . .267
9-4 Lab Experiment: ACMOS 8-Bit
Test: Encoding, Decoding, and
Shift Register . . . . . . . . . . . . . . . . . . . . . .273
Seven-Segment Displays . . . . . . . . . . . . . . . . . . . .163
9-5 Lab Experiment: Digital Roulette
6-l Lab Experiment: Seven-Segment
Wheel Circuit . . . . . . . . . . . . . . . . . . . . . .275
LED Displays . . . . . . . . . . . . . . . . . . . . . .167
6-2 Lab Experiment: Code Translators . . . . .169
Chapter 10 Arithmetic Circuits 277
6-3 Lab Experiment: Driving the
LCD Display . . . . . . . . . . . . . . . . . . . . . .175 Test: Arithmetic Circuits . . . . . . . . . . . . . . . . . . . .277
6-4 Lab Experiment: Using CMOS to 10-1 Lab Experiment: Half and Full
Drive VF Displays . . . . . . . . . . . . . . . . . .179 Adders . . . . . . . . . . . . . . . . . . . . . . . . . . . .281
6-5 Troubleshooting Problem: 10-2 Lab Experiment: 3-Bit Parallel
Decoder/Display Circuit . . . . . . . . . . . . . .185 Adder . . . . . . . . . . . . . . . . . . . . . . . . . . . .283
6-6 Multisim Experiment: Decoding 10-3 Lab Experiment: Using the 7483 TTL IC
8-Bit Binary to Hexadecimal . . . . . . . . . .189 Adder . . . . . . . . . . . . . . . . . . . . . . . . . . . .285
10-4 Design Problem: 2s Complement
Chapter 7 Flip-Flops 193 Adder/Subtractor . . . . . . . . . . . . . . . . . . .289
10-5 Troubleshooting Problem:
Test: Flip-Flops . . . . . . . . . . . . . . . . . . . . . . . . . . .193
Full-Adder Circuit . . . . . . . . . . . . . . . . . .293
7-1 Lab Experiment: R-S Flip-Flops . . . . . . .197
7-2 Lab Experiment: D Flip-Flops . . . . . . . . .199
Chapter 11 Memories 295
7-3 Lab Experiment: J-K Flip-Flops . . . . . . .203
7-4 Lab Experiment: Using a Latch . . . . . . . .207 Test: Memories . . . . . . . . . . . . . . . . . . . . . . . . . . .295
7-5 Lab Experiment: The Schmitt Trigger . . . .211 11-1 Lab Experiment: Random-Access
7-6 Lab Experiment: ALatched Encoder- Memory . . . . . . . . . . . . . . . . . . . . . . . . . .299
Decoder Using CMOS/LCD . . . . . . . . . .213 11-2 Lab Experiment: Read-Only
Memory . . . . . . . . . . . . . . . . . . . . . . . . . .303
Chapter 8 Counters 217
11-3 Lab Experiment: Digital Potentiometer—
Using EEPROM . . . . . . . . . . . . . . . . . . . .307
Test: Counters . . . . . . . . . . . . . . . . . . . . . . . . . . . .217
8-1 Lab Experiment: Ripple Counters . . . . . .225
Chapter 12 Digital Systems 311
8-2 Lab Experiment: TTL IC Ripple
Counters . . . . . . . . . . . . . . . . . . . . . . . . . .229
Test: Digital Systems . . . . . . . . . . . . . . . . . . . . . . .311
8-3 Lab Experiment: TTL IC Synchronous
12-l Lab Experiment: Digital Dice . . . . . . . . .313
Up/Down Counters . . . . . . . . . . . . . . . . . .233
12-2 Lab Experiment: Digital Stopwatch
8-4 Lab Experiment: Cascading Counters . . .235
System . . . . . . . . . . . . . . . . . . . . . . . . . . .315
8-5 Lab Experiment: Using Counters for
12-3 Lab Experiment: Multiplexed
Frequency Division . . . . . . . . . . . . . . . . .237
Displays . . . . . . . . . . . . . . . . . . . . . . . . . .319
8-6 Lab Experiment: CMOS IC Counters . . .241
12-4 Troubleshooting Problem: Counter
8-7 Lab Experiment: An Optical Encoder
withMultiplexed Displays . . . . . . . . . . . .323
Driving a Counter . . . . . . . . . . . . . . . . . . .245
12-5 Lab Experiment: LCD Timer
8-8 Lab Experiment: Hi-Low Guessing
with Alarm . . . . . . . . . . . . . . . . . . . . . . . .327
Game . . . . . . . . . . . . . . . . . . . . . . . . . . . . .249
8-9 Lab Experiment: An Experimental Chapter 13 Computer Systems 333
Tachometer . . . . . . . . . . . . . . . . . . . . . . . .251
Test: Computer Systems . . . . . . . . . . . . . . . . . . . .333
8-10 Design Problem: A0-to-99 Counter
13-1 Lab Experiment: Microcomputer Memory
with LCD Decimal Output . . . . . . . . . . . .255
Address Decoding . . . . . . . . . . . . . . . . . .337
Chapter 9 Shift Registers 257 13-2 Lab Experiment: Data Transmission . . . .341
13-3 BASIC Stamp Experiment: Simple Input
Test: Shift Registers . . . . . . . . . . . . . . . . . . . . . . .257
andOutput . . . . . . . . . . . . . . . . . . . . . . . .343
9-1 Lab Experiment: Serial-Load Shift
13-4 BASIC Stamp Experiment: Photo Input
Register . . . . . . . . . . . . . . . . . . . . . . . . . . .263
andServo Motor Output . . . . . . . . . . . . .347
9-2 Lab Experiment: Parallel-Load Shift
Register . . . . . . . . . . . . . . . . . . . . . . . . . . .265
vi Contents
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Chapter 14 Connecting with Analog 14-5 Circuit Simulation: Digital Voltmeter . . .373
Devices 355 14-6 Lab Experiment: Using the CMOS
ADC0804 A/D Converter IC . . . . . . . . . .375
Test: Connecting with Analog Devices . . . . . . . . . . . . .355
14-7 Lab Experiment: Digital Light Meter . . .379
14-1 Lab Experiment: Voltage Gain of
14-8 Lab Experiment: Digitizing
an Operational Amplifier . . . . . . . . . . . . .361
Temperature . . . . . . . . . . . . . . . . . . . . . . .383
14-2 Lab Experiment: D/AConverter . . . . . . .365
14-3 Circuit Simulation: D/AConverter . . . . .367
Appendix A Pin Diagrams . . . . . . . . . . . . . . . . .387
14-4 Lab Experiment: An Elementary
Appendix B Parts and Equipment List . . . . . . .403
DigitalVoltmeter . . . . . . . . . . . . . . . . . . .369
Contents vii
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Editor’s Foreword
The McGraw-Hill Education Trade and Technology and implemented based on classroom testing and feed-
list has been designed to provide entry-level compe- back from students and instructors using the series.
tencies in a wide range of occupations in the electri- Every effort has been made to offer the best possible
cal and electronics fields. It consists of coordinated learning materials. These include animated PowerPoint
instructional materials designed especially for career- presentations, circuit files for simulation, a test gener-
oriented students. Atextbook, an experiments manual, ator with correlated test banks, dedicated websites for
and online resources support each major subject area both students and instructors, and basic instrumenta-
covered in the series. All of these focus on theory, prac- tion labs. All of these are well coordinated and have
tice, applications, and experiences necessary for those been prepared by the author.
preparing to enter technical careers. The widespread acceptance of Experiments Manual
There are two fundamental considerations in the for Use with Digital Electronicsand the positive feed-
preparation of a text like Experiments Manual for Use back from users confirm the basic soundness in con-
with Digital Electronics:the needs for the learner and tent and design of all the components as well as their
the needs of the employer. This text meets those needs effectiveness as teaching and learning tools.
in expert fashion. The authors and editors have drawn Instructors will find the texts and manuals in each of
upon their broad teaching and technical experiences to the subject areas logically structured, well paced, and
accurately interpret and meet the needs of the student. developed around a framework of modern objectives.
The needs of business and industry have been identi- Students will find the materials to be readable, lucidly
fied through personal interviews, industry publica- illustrated, and interesting. They will also find a gen-
tions, government occupational trend reports, and re- erous amount of self-study materials, review items,
ports by industry associations. and examples to help them determine their own
The processes used to produce and refine the series progress.
have been ongoing. Technological change is rapid,
andthe content has been revised to focus on current
trends. Refinements in pedagogy have been defined Charles A. Schuler, Project Editor
Basic Skills in Electricity and Electronics
Charles A. Schuler, Project Editor
New Editions in This Series
Electricity: Principles and Applications, Eighth Edition, Richard J. Fowler
Electronics: Principles and Applications, Eighth Edition, Charles A. Schuler
viii Editor’s Foreword
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Preface
The Experiments Manual for Use with Digital • BASIC Stamp 2 materials available from Parallax,
Electronics,eighth edition, is designed to provide prac- Inc. (www.parallax.com)
tical, hands-on experience with digital components, • A CD-ROM with Multisim circuit files/activities
digital techniques, and digital circuits. The Experiments and a primer for those who are unfamiliar with the
Manual is closely correlated with its companion text- software; Multisim circuit simulation software
book, Digital Electronics: Principles and Applications, available from National Instruments (www.ni.com/
eighth edition. Entry-level knowledge and skills for a multisim/)
wide range of occupations is the goal of this experi-
• An Online Learning Center (www.mhhe.com/
ments manual and textbook combination.
tokheim8e) containing PowerPoint presentations
on breadboarding, soldering, circuit interrupters,
Learning Features
AFCI, and GFCI and four Hewlett-Packard simu-
• Hardware lab experiments
lated labs on instrumentation
• Circuit simulations using Multisim software
• Programmable digital devices including expanded About the Author
microcontroller experiments using the BASIC Over several decades, Roger L. Tokheim has published
Stamp 2 modules many textbooks and lab manuals in the areas of digital
• Hardware design problems electronics and microprocessors. His books have been
translated into nine languages. He taught technical sub-
• Hardware troubleshooting problems
jects including electronics for more than 35years in
• Software troubleshooting problems
public schools.
• More complete Multisim circuit simulation files
• Chapter Tests
Resources
• Parts/display boards/trainers available from
Dynalogic Concepts (1-800-246-4907)
Preface ix