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DOCUMENT RESUME CE 058 861 ED 336 522 Davis, Diane, Ed. AUTHOR Electronics. Criterion-Referenced Test (CRT) Item TITLE Bank. Missouri Univ., Columbia. Instructional Materials INSTITUTION Lab. Missouri State Dept. of Elementary and Secondary SPONS AGENCY Education, Jefferson City. Div. of Vocational and Adult Education. PUB DATE 91 NOTE 241p. Instructional Materials Laboratory, University of AVAILABLE FROM Missouri, 2316 Industrial Drive, Columbia, MO 65202 (order no. 70-5000-E: $32.35). Tests/Evaluation Instrumens (160) PUB TYPE MF01 Pius Postage. PC Not Available from EDRS. EDRS PRICE *Competence; Competency Based Education; *Criterion DESCRIPTORS Referenced Tests; Electrical Systems; *Electric Circuits; Electricity; *Flectronics; Electronic Technicians; High Schools; Item Banks; Occupational Safety and Health; Postsecondary Education; State Curriculum Guides; *Test Items; vocational Education *Missouri IDENTIFIERS ABSTRACT Mis document contains 519 criterion-referenced multiple choice and true or false test items for a course in elJctronics. The test item bank is designed to work with both the VocLtional Instructional Management System (VIMS) and the Vocational stem (VAMS) in Missouri. The items are Administrative Management 7: grouped into 15 units covet:ng the following topics: electrInic safety; fundamentals of electronics; AC power supply; semiconductor devices; amplifiers; frequency generation; receivers and transmitters; test equipment; microprocessor and computer systems; optical e1ectroh.-..7s; digital logic application; electromechanical devices and controlle:s; circuit construction techniques; logical steps of troubleshooting; and leadership. The 28 references used in constructing the test item bank are listed, and electronic diagrams needed for the test questions are provided. The following information is provided for each test item: unique item number; duty area an0 task number (Missouri competency profile); letter of correct answer; source; date; learning domain (cognitive, affective, psychomotor); writer(s)/reviewer(s); and accompanying artwork. (KC) *****************!!!************0:************************************** Reproductions supplied by EDRS are ths best that can be made * * from the original document. * * *********************************************************************** 70-5000-E Criterien-Referenced Test Items for S DEPARTMENT OF EDUCATION ELECTRONICS ImerCvernent Ohtce ot Ei:lutabonat INdruercn and INFORMA'ION E DIX ATIONAL RESOURCES CENTER FI,I1Ct reproduced es VINs ciecurnant has Veen orginItat.0.1 ter.e..ect from the DeNrSCIr. Or onprnatensi maoe to rnotore M,n0r changes ?vibe helm tetra:lumen chaott 0Prn,OnliVided,r, thrlidocu Prunus Ohrdn, nOt neressa", 'eP""" Oth"" .1.111M ment GERI posdron 0, 001.0Y 0.11.1MI olm... 4mmmim. amomommi Pimilmumm 04.1.1mormm. .....m.mm REPRODUCE THIS MIMMInlimmlm "PERMISSION TO MICROFICHE ONLY MATERIAL IN BY HAS BEEN GRANTED MUM R OURCES TO THE EDUCATIONAL RICr INFORMATION CENTER ( INSTRUCTIONAL MATERIALS LABORATORY MISSOURI UNIVERSITY OF MISSOURI-COLUMBIA COLUMBIA, 2 BEST COPY AVAILABLE Criterion-Referenced Test (CRT) Items for ELECTRONICS Diane Davis, editor/project coordinator Instructional Materials Laboratory 8 London Hall University of Missouri-Columbia Columbia, MO 65211 Catalog No. 70-5000-E 1991 The activity which is the subject of this report was supported in whole or in part by funds from the Department of Elementary and Secondary Education, Division of Vocational and Adult Education. However, the opinions expressed herein do not necessarily reflect the position or policies of the Missouri Department of Elementary and Secondary Education or the Division of Vocational and Adult Education, and no official endorsement should be inferred. FOREWORD et Rapid advances in technology are placing heavy demands on both teachers and students in vocational education. These Criterion-Referenced Test items for Electronics are designed to help meet those demands. M test writers face one basic challenge: to produce test Items that accurately measure what they are ntended to measure. This challenge was kept firmly in mind by all those who participated in the development of the bank. The items in the bank are based upon competencies found on the Missouri Electronics Competency Profile. Much care was taken to ensure that the test items will accurately measure a student's knowledge in regard to these competencies. Every effort was made to ensure the items are presented In a fair and unbiased matter. The items in this book are designed to work with both the Vocational Instructional Management System (VIMS) and VAMS. The test item bank will allow instructors and administrators to manage testing and evaluation activities in the most efficient way possible. Instructors pulling items from this bank for individual tests should still evaluate the new test to see that one question does not live away the answer to another question. For word processing and test-item generation purposes, an ASCII disk of the item bank has been Included with this printed copy. This test bank should be viewed as a beginning. It is hoped that future revisions and additions will build the bank into an even more powerful and reliable evaluation and management tool. Judith Moore, supervisor Industrial Education Department of Elementary and Secondary Education Charles °Chuck° Weibel, director Industrial Education Department of Elementary and Secondary Education ACKNOWLEDGMENTS represent a continuing commitment to Missouri's These Criterion-Referenced Test (CRT) items for Electronics The bank is keyed to the Electronics Competency Vocational Instructional Management System (V1MS). In the state. The cycle of curriculum development Profile developed by industry and education professionals includes the following steps: Development of the competency profile 1. Instructional analysis 2. existing curriculum materials to the Search for existing materials andjor a crosswalk of 3. competency profile Development of the curriculum guide 4. Field-test of the curriculum guide 5. Development of mediated curriculum (videos) 6. Development of the test-Item bank 7. information available to students, development of the test- To ensure that test items are firmly based on cycle. item bank is the final component in the development members. These teachers contributed as writers and advisory committee Ron Boyer, Jefferson College Barry Charter, Crowder College Don Mallory, Cass County AVTS C. Paul Miller, Monett AVTS Mark Murphy, Davis H. Hart Mexico AVTS Ralph Tandy" Museiman, Kirksville AVTS Don Waters, Carthage AVM following educators. These CRTs were technically reviewed andfor field-tested by the Charles Oviatt, educational consultant, Vienna, Mo. Ron Boyer, Jefferson College Don Mallory, Cass County AVTS Mark Murphy, Davis H. Hart Mexico AVTS Ralph Tandy" Muse Imam Kirksville AVTS Don Waters, Carthage AVTS this project's development. Support and contributions of IML staff members were instrumental to Harley SchlichtIng, director Amon Herd, associate director Phyllis Miller and Dan Stapleton, assistant directors Fiona Gammon ley, graphic artist II word processor HI Lori Ho iv REFERENCES USED FOR ELECTRONICS CRTs Adamson. Thomas A. glectgankSamm. Adamson Albany, NY: Delmar Publishers Inc., 1988. State of Alabama. Comoanioa Document for the Cuniculua_litogawi fjz Ala. nerAygujo. Montgomery, AL: Department of Education. 1983. Scott, Foresman fith ed. Glenview, IL: Hewitt, Paul G. Conceptual _Physics, Conceptual Physics and Company, 1989. Gerrish, Howard H. and William E. Dugger. glgatdcily..and Electronics. South E&E Holland, IL: The Goodheart-Willcox Company, Inc., 1989. Sterling, Donald J., Jr. Technicianie Juide to Fiber Optics. Albany, NY: Delmar Fiber Optics Publishers Inc., 1987. Floyd, Thomas L Principles of Electric Circuits. Columbus. OH: The Charles Floyd E.C. E. Merrill Publishing Company, 1988. Floyd, Thomas L Electronic Devices. 2nd ed. Columbus, OH: The Charles Floyd E.D. E. Merrill Publishing Company, 1988. Floyd, Thomas L Diaital Fundamentals. 3rd ed. Columbus, OH: The Charles Floyd D.F. E. Merrill Publishing Company, 1986. Frenzel, Louis E., Jr. Communication Electronics. New York: McGraw-Hill Book Frenzel Crinpany Inc., 1989. Hewlett-Packard. Feeling Comfortable with Logic Analyzers. 2nd ed. Palo Alto, H-P CA: Hewlett-Packard Inc., 1988. Hazen, Mark E. Experiencing Electricity and Electronics. Electron Flow Version. Hazen New York: Saunders College Publishing. 1989 Fry, Jim. Semiconductor Devices. Benton Harbor, MI: Heath Company, 1985. Heathkii Slack, Don, et. al. Electronics. University of Missouri-Columbia: Instructional rivIL Materials Laboratory. 1989-90. New York: McGraw- Ins-Meas Gilmore, Charles M. Instruments and Measurements. Hill Book Company. Inc., 1980. Englewood Cliffs, NJ: Kleitz, William. Diaital Electronics. A Practical Aooroach. Weitz Prentice-Hall, Inc., 1987. MaMno, Albert Paul. Electronic Principles. 4th ed. New York: McGraw-Hill Ma Ivino Book Company, Inc., 1969. Brown, A. O., Ill. Advaptel Microcomputer Service Technoloay. Stillwater, OK: MAVCC Mid-America Curriculum Consortium, 1985. Robertson. L Paul. Basic Pegtronics 1. Stillwater, OK: Mid-America Vocational MAVCC BE1 Curriculum Consortium, Inc., 1982. Stillwater. OK: Willison, Neal A., and James K. Shelton. Basic Electronics 2. MAVCC BE2 Mid-America Vocational Cuniculum Consortium, Inc., 1981. Franklin, Will, and Bill Morrison Mind Training Photonic Semiconductors. Mind Systems . Systems, 1985. Sedalia, MO: The Media Center. State Fair Videos. EleZronlcs_ Modules. SFCC videos Community College, 1989. Shrader, Robert L Electronic Communication. New York: McGraw-Hill Book Shrader Company Inc., 1985. Exploring Energy', Soirces/ApplicationsjAltematives. Smith, Howard Bud. Smith South Holland, IL: The Goodheart-Willcox Company. Inc.. 1985. Commerce, TX: Microcomputer Aoctitcations Test Bank. Educational Texas Development and Training Center, East Texas State University, 1990. Fundamentals of Electronic Communications Eystern*. Tomasi, Wayne. Tomasi Englewood Cliffs, NJ: Prentice-Hall. Inc., 1988. TTL Data Book. Mountain View, CA: Fairchild, 1978. TTL Data Book Decatur. GA: State of Illinois. Vocational- Computer Eaulpment Repair. V-TECS Technical Education Consortium of States, 1986. University of Missouri- Goodrick, Bill. Missouri VICA Curriculum Guide. VICA Columbia: Instructional Materials Laboratory, 1986. TABLE OF CONTENTS Page # Duty and task Electronic Safety A. Identify various types, purposes and operation of fire extinguishers 1. Identify electrical hazards 2. iderqfy and practice shop safety 3. Identify and practice safe soldering methods 4. Demonstrate safe and proper use of hand tools 5. identify hazard of RF radiation devices 6. Demonstrate safe and proper use of AC line operated equipment; i.e., isolation transformers, grounding, GFI 7. Fundamentals of Electronics S. Describe atomic structure and its relationship to electricity 1. Describe the basic physics of semiconductor materials 2. Describe the relationship between electrical and magnetic properties 3. Describe the electrical and magnetic properties of a magnet 4. Describe the photoelectric effect 5. Describe the thermocouple effect 6. Describe the electrical effect of friction 7 Describe the concept of resistance, voltage and current and how they relate to each other 8. Describe the concept of capacitance, voltage and current and how they relate to each other 9. Describe the concept of inductance. voltage and current and how they relate to each other 10. Solve AC network problems utilizing appropriate theorems and laws 11. identify and test resistors 12. Identify and test capacitors 13. Identify and test inductors 14. Calculate series and parallel; res stove, capacitive and inductive networks 15. vi identify and replace parts and components on printed Circuit boards and chassis 16. Interpret symbols and schematic diagrams 17. Calculate RC time constant circuits 1$. Describe and identify filter networks 19. Test and evaluate filter performance 20. 47 AC Power Supply C. Describe types of transformers 1. Determine transformer requirements 2. Determine rectifier (diode) specifications for specific installations 3. Select components for complete power supply 4. Identify and describe uSe of series regulators 5. Identify and describe use of shunt regulators 6. Identify and describe use of switching regulators 7. Install power supply components 8. Test power supply and correct defects 9. 63 Semiconductor Device* D. Identify schematic design symbols for semiconductor devices 1. Describe the operation of junction diodes 2. Describe the operation of bipolar transistors 3. Construct circuits using bipolar transistors 4. Describe the basic operation of a JFET 5. Describe the basic operation of a MOSFET 6. Describe the basic operation of a tiff 7. Describe the basic operation of a PUT 8. Describe the basic operation of a DAC 9. Describe the basic operation of a SCR 10. Describe the basic operation of a TR1AC 11. Describe the basic operation of a VDR 12. Test diodes 13. Test transistors 14. Test thyristors 15. Select transistors for specific purposes using specification sheets and substitution guides 16. Demonstrate the proper replacement techniques for semiconductor device* 17. Amplifiers 89 E. Describe the operation of a bipolar amplifier 1. Describe the operation of a FET amplifier 2. Describe the operation of an operational amplifier 3. Test and repair bipolar amplifier 4. Test and repair FET amplifier 5. Test and repair operationtl amplifier 6. Describe amplifier coupling techniques 7. Measure frequency response of amplifiers 8. Frequency Generation 103 F. Describe the basic operation of oscillators t. Describe the basic operation of a crystal oscillator 2. Describe operation of phase lock loop (PLL) 3. Describe operation of waveform generators 4. Test and repair oscillators 5 Test and repair phase lock loop (PL.1.4 6. Test and repair waveform generators 7. vii Receivers and Transmitters 115 G. Identify and describe the stages of a radio receiver. AM/Fk4 1. Identify and describe the stages of a radio transmitter. AM/FM 2. Describe the basic operation of microwave and satellite transmitter/receiver systems 3. Describe the operation of trangmitter/receiver antennas 4. Test Equipment 121 H. operation and demonstrate tha use of an oscilloscope Describe the 1. operation and demonstrate the use of multimeters; i.e.. VOM. EVM or DVM Describe the 2. operation and demonstrate the use of signal generators; i.e., audio, RF or function Describe the 3. operation and demonstrate the use ef a frequency counter Describe the 4. Signature. Data. LOGS. SpeCtrUM Of Components functiOn and application of analyzers; i.e.. Describe the 5. operation and demonstrate the use of logic probes Describe the 6. operation and demonstrate the use of dig.tal breakout boxes Describe the 7. operation and demonstrate the use of analog breakout boxes Describe the 8. Microprocessor and Computer Systems 135 I. Identify and describe computer architecture 1. Identify the levels of computer languages 2. Describe the purpose of operating systems 3. Analyze simple programs using computer instruction sets 4. Write simple computer programs S. Dabug software 6. Describe interfacing techniques 7. Explain control and data transfer techniques to and from peripheral devices 8. Troubleshoot hardware problems 9. Optical Electronics J 151 Describe physical aspects of light 1. Identify types of photodetectors and emitters 2. Construct a circuit using a photodetector and emitter 3. Describe optically coupled electronic systems 4. Describe optoelectronic methods of communication 5. Test and repair optical displays 6. Describe operating principals of lasers and masers 7. Describe operation principles of optical encoders 8. Digital Logic Application K. 167 Identify and convert number systems and codes for binary, hex, octal and BCD 1. Identify and describe the operation of basic logic gates 2. Develop truth tables defining circuit design 3. Test and repair logic circuits 4. List advantages and disadvantages of SSI, MSI, LSI arid VLSI S. Describe the characteristics ot ROM's and RA's 6. Construct combination logic circuits for a given application 7. Describe digital counter operating modes and their function 8. Construct counter and controller circuits for sequential logic applications 9. Describe the advantages of test instruments that use digital techniques 10. Use data sheets 11. Describe the operation of A/D and D/A converters 12. Electromechanical Devices and Controllers 191 Test and repair a DC motor 1. Test and repair an AC motor (single and polyphase) 2. Test and repair a stepper motor 3.