Electron Beam-Specimen Interactions and Simulation Methods in Microscopy PDF
Preview Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
Electron Beam-Specimen Interactions and Simulation Methods in Microscopy CurrentandfuturetitlesintheRoyalMicroscopical Society—JohnWileySeries Published PrinciplesandPracticeofVariablePressure/EnvironmentalScanning ElectronMicroscopy(VP-ESEM) DebbieStokes Aberration-CorrectedAnalyticalElectronMicroscopy EditedbyRikBrydson Diagnostic Electron Microscopy—A Practical Guide to Interpretation andTechnique EditedbyJohnW.Stirling,AlanCurry&BrianEyden LowVoltageElectronMicroscopy—PrinciplesandApplications EditedbyDavidC.Bell&NatashaErdman StandardandSuper-ResolutionBioimagingDataAnalysis:APrimer EditedbyAnnWheelerandRicardoHenriques Electron Beam-Specimen Interactions and Simulation Methods in Microscopy BudhikaG.Mendis Forthcoming UnderstandingPracticalLightMicroscopy JeremySanderson AtlasofImagesandSpectraforElectronMicroscopists EditedbyUrselBangert FocusedIonBeamInstrumentation:TechniquesandApplications DudleyFinch&AlexanderBuxbaum Electron Beam-Specimen Interactions and Simulation Methods in Microscopy Budhika G. Mendis Department of Physics Durham University, UK Published in association with the Royal Microscopical Society Series Editor: Susan Brooks Thiseditionfirstpublished2018 ©2018JohnWiley&SonsLtd Allrightsreserved.Nopartofthispublicationmaybereproduced,storedinaretrievalsystem,or transmitted,inanyformorbyanymeans,electronic,mechanical,photocopying,recordingorotherwise, exceptaspermittedbylaw.Adviceonhowtoobtainpermissiontoreusematerialfromthistitleisavailable athttp://www.wiley.com/go/permissions. TherightofBudhikaG.Mendistobeidentifiedastheauthorofthisworkhasbeenassertedinaccordance withlaw. RegisteredOffice(s) JohnWiley&Sons,Inc.,111RiverStreet,Hoboken,NJ07030,USA JohnWiley&SonsLtd,TheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UK EditorialOffice TheAtrium,SouthernGate,Chichester,WestSussex,PO198SQ,UK Fordetailsofourglobaleditorialoffices,customerservices,andmoreinformationaboutWileyproducts visitusatwww.wiley.com. 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LibraryofCongressCataloging-in-PublicationDataappliedfor Hardback:9781118456095 Coverdesign:Wiley Coverimage:g=brightfieldimageofoverlappingstackingfaultsinaCu-Sialloy.Theshear(R)atthe stackingfaultplanecausesaphaseshift2Πg⋅Rofthediffractedbeam,resultingintheblack-white interferencecontrast.Ifsufficientnumberoffaultsoverlapsuchthatthenetg⋅Risaninteger,thecontrastis suppressed.FromMendis,B.G,Jones,I.P.andSmallman,R.E.(2004),JournalofElectronMicroscopy53, 311.ReproducedwithpermissionofOxfordUniversityPress. Setin10.5/13ptSabonLTStdbySPiGlobal,Chennai,India 10 9 8 7 6 5 4 3 2 1 Contents Preface ix 1 Introduction 1 1.1 OrganisationandScopeoftheBook 3 References 8 2 TheMonteCarloMethod 9 2.1 PhysicalBackgroundandImplementation 11 2.1.1 ElasticScatteringByanAtomicNucleus 11 2.1.2 InelasticScatteringbyAtomicElectrons 18 2.1.3 ImplementationoftheMonteCarloAlgorithm 23 2.2 SomeApplicationsoftheMonteCarloMethod 27 2.2.1 SpatialResolutionandBackscatteredImaging 27 2.2.2 CharacteristicX-RayGeneration 34 2.2.3 CathodoluminescenceandElectronBeamInduced CurrentMicroscopy 37 2.3 FurtherTopicsinMonteCarloSimulations 40 2.3.1 ClassicalorQuantumPhysics? 40 2.3.2 Spin–OrbitCouplingandtheMott Cross-Section 43 2.3.3 DielectricModelofStoppingPowerand SecondaryElectronEmission 46 2.4 Summary 49 References 50 3 MultisliceMethod 53 3.1 MathematicalTreatmentoftheMultisliceMethod 56 3.1.1 SpecimenTransmissionFunction 59 vi CONTENTS 3.1.2 FresnelPropagatorFunction 66 3.1.3 ObjectiveLensContrastTransferFunctionand PartialCoherence 71 3.1.4 ImplementationoftheMultisliceAlgorithm 76 3.2 ApplicationsofMultisliceSimulations 78 3.2.1 HREMImagingandElectronCrystallography 78 3.2.2 CBEDandSTEMApplications:FrozenPhonon Model 87 3.3 FurtherTopicsinMultisliceSimulation 93 3.3.1 AccuracyofMultisliceAlgorithms 93 3.3.2 IstheFrozenPhononModelPhysically Realistic? 97 3.4 Summary 102 References 102 4 BlochWaves 105 4.1 BasicPrinciples 106 4.1.1 MathematicalBackground 106 4.1.2 ApplicationtoTwo-BeamTheory 111 4.1.3 PhenomenologicalModellingofThermalDiffuse Scattering 116 4.1.4 BlochStatesinZone-AxisOrientations 124 4.2 ApplicationsofBlochWaveTheory 132 4.2.1 HREMImaging 132 4.2.2 HAADFImaging 134 4.2.3 BlochWaveScatteringByElasticStrainFields 144 4.3 FurtherTopicsinBlochWaves 149 4.3.1 DopantAtomImaginginSTEM 149 4.3.2 ElectronChannellingandItsUses 156 4.4 Summary 160 References 161 5 SingleElectronInelasticScattering 165 5.1 FundamentalsofInelasticScattering 166 5.1.1 ElectronExcitationinaSingleAtombyaPlane Wave 166 5.1.2 MixedDynamicFormFactor 180 CONTENTS vii 5.1.3 YoshiokaEquationsandInelasticScattering withinaCrystal 189 5.1.4 CoherenceinInelasticScattering 195 5.2 FineStructureofTheElectronEnergyLossSignal 201 5.2.1 OriginofFineStructure 201 5.2.2 CoreHoleEffects 206 5.2.3 MagneticCircularDichroism 209 5.3 Summary 211 References 212 6 ElectrodynamicTheoryofInelasticScattering 215 6.1 BulkandSurfaceEnergyLoss 216 6.1.1 EnergyLossinan‘Infinite‘Solid 216 6.1.2 PhononSpectroscopy 226 6.1.3 InterfaceandSurfaceContributions 232 6.2 RadiativePhenomena 244 6.2.1 CerenkovRadiationandBandGap Measurement 244 6.2.2 TransitionRadiation 249 6.3 SimulatingLowEnergyLossEELSSpectra 253 6.3.1 DiscreteDipoleApproximation(DDA) 253 6.3.2 BoundaryElementMethod(BEM) 254 6.4 Summary 259 References 259 AppendixA TheFirstBornApproximationandAtomScattering Factor 263 AppendixB Potentialforan‘Infinite’PerfectCrystal 267 AppendixC TheTransitionMatrixElementintheOneElectron Approximation 269 AppendixD BulkEnergyLossintheRetardedRegime 271 Index 275
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