Electrical Overstress (EOS): Devices, Circuits and Systems

370 Pages·2013·10.918 MB·English

by  Steven H. Voldman

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Overstress (EOS)
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DEVICES, CIRCUITS AND SYSTEMS
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STEVEN H. VOLDMAN, IEEE Fellow, Vermont, USA
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Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components v
and systems as technologies scale from micro- to nano-electronics. This book teaches the fundamentals of e
electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS
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phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system s
design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, t
and system level EOS protection networks, followed by examples in specific technologies, circuits, and r
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chips. The book is unique in covering EOS manufacturing issues from on-chip design and electronic design
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automation to factory-level EOS program management in today’s modern world.
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Look inside for extensive coverage on:
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Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA),
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to physical models for EOS phenomena
EOS sources in today’s semiconductor manufacturing environment, and EOS program management, S
handling and EOS auditing processing to avoid EOS failures )
EOS failures in both semiconductor devices, circuits and systems
Discussion of how to distinguish between EOS events and electrostatic discharge (ESD) events,
such as the human body model (HBM), charged device model (CDM), cable discharge events (CDM),
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charged board events (CBE), to system level IEC 61000-4-2 test events NE
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EOS protection on-chip design practices and how they differ from ESD protection networks and solutions
Discussion of EOS system level concerns in printed circuit boards (PCB) and manufacturing equipment SYICE
Examples of EOS issues in state-of-the-art digital, analog and power technologies, including CMOS, SS
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LDMOS, and BCD E C
EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is MIR Overstress (EOS)
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distinct from ESD EDA systems C
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EOS testing and qualification techniques I
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Practical off-chip ESD protection and system level solutions to provide more robust systems S

Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books
on ESD protection. It is an essential reference and a useful insight into the issues that confront modern DEVICES, CIRCUITS AND SYSTEMS
technology as we enter the nano-electronic era.
STEVEN H. VOLDMAN

ELECTRICAL OVERSTRESS (EOS)
ESD Series
By Steven H. Voldman
ElectricalOverstress(EOS):Devices,CircuitsandSystems
ISBN:9781118511886
September2013
ESDBasics:FromSemiconductorManufacturingtoProductUse
ISBN:9780470979716
October2012
ESD:DesignandSynthesis
ISBN:9780470685716
March2011
ESD:FailureMechanismsandModels
ISBN:9780470511374
July2009
Latchup
ISBN:9780470016428
December2007
ESD:RFTechnologyandCircuits
ISBN:9780470847558
September2006
ESD:CircuitsandDevices
ISBN:9780470847541
November2005
ESD:PhysicsandDevices
ISBN:9780470847534
September2004
Upcomingtitles:
ESD:TestandCharacterization
TheESDHandbook
ESD:AnalogCircuitsandDesign
ELECTRICAL OVERSTRESS (EOS)
Devices, Circuits and Systems
Steven H. Voldman
IEEE Fellow, Vermont, USA
This edition first published 2014
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Voldman,StevenH.
Electricaloverstress(EOS):devices,circuits,andsystems/StevenVoldman.
pagescm
Includesbibliographicalreferencesandindex.
ISBN978-1-118-51188-6(hardback)
1. Semiconductors—Failures. 2. Semiconductors—Protection. 3. Transients(Electricity) 4. Overvoltage.
I. Title.
TK7871.852.V6482013
621.3815—dc23
2013022183
AcataloguerecordforthisbookisavailablefromtheBritishLibrary.
ISBN:978-1-118-51188-6
Setin10/12ptTimesbyThomsonDigital,Noida,India.
1 2014
ToMyMother’sSister
MyAunt
Saundra “Sunny”Braitman

Contents
AbouttheAuthor xvii
Preface xix
Acknowledgements xxiii
1 FundamentalsofElectricalOverstress 1
1.1 ElectricalOverstress 2
1.1.1 TheCostofElectricalOverstress 2
1.1.2 ProductFieldReturns–ThePercentagethatisElectrical
Overstress 2
1.1.3 ProductFieldReturns–NoDefectFoundversusElectrical
Overstress 4
1.1.4 ProductFailures–FailuresinIntegratedCircuits 4
1.1.5 ClassificationofElectricalOverstressEvents 4
1.1.6 ElectricalOver-Current 6
1.1.7 ElectricalOver-Voltage 6
1.1.8 ElectricalOver-Power 7
1.2 De-MystifyingElectricalOverstress 7
1.2.1 ElectricalOverstressEvents 8
1.3 SourcesofElectricalOverstress 8
1.3.1 SourcesofElectricalOverstressinManufacturing
Environment 8
1.3.2 SourcesofElectricalOverstressinProduction
Environments 10
1.4 MisconceptionsofElectricalOverstress 10
1.5 MinimizationofElectricalOverstressSources 11
1.6 MitigationofElectricalOverstress 11
1.7 SignsofElectricalOverstressDamage 12
1.7.1 SignsofElectricalOverstressDamage–TheElectrical
Signature 12
viii CONTENTS
1.7.2 SignsofElectricalOverstressDamage–TheVisual
Signature 13
1.8 ElectricalOverstressandElectrostaticDischarge 14
1.8.1 ComparisonofHighandLowCurrentEOSversusESDEvents 15
1.8.2 ElectricalOverstressandElectrostaticDischargeDifferences 15
1.8.3 ElectricalOverstressandElectrostaticDischargeSimilarities 17
1.8.4 ComparisonofEOSversusESDWaveforms 18
1.8.5 ComparisonofEOSversusESDEventFailureDamage 19
1.9 ElectromagneticInterference 20
1.9.1 ElectricalOverstressInducedElectromagneticInterference 20
1.10 ElectromagneticCompatibility 21
1.11 ThermalOver-Stress 21
1.11.1 ElectricalOverstressandThermalOverstress 22
1.11.2 TemperatureDependentElectricalOverstress 22
1.11.3 ElectricalOverstressandMeltingTemperature 23
1.12 ReliabilityTechnologyScaling 23
1.12.1 ReliabilityTechnologyScalingandtheReliabilityBathtub
Curve 23
1.12.2 TheShrinkingReliabilityDesignBox 24
1.12.3 TheShrinkingElectrostaticDischargeDesignBox 25
1.12.4 ApplicationVoltage,TriggerVoltage,andAbsolute
MaximumVoltage 25
1.13 SafeOperatingArea 26
1.13.1 ElectricalSafeOperatingArea 26
1.13.2 ThermalSafeOperatingArea 27
1.13.3 TransientSafeOperatingArea 28
1.14 SummaryandClosingComments 28
References 29
2 FundamentalsofEOSModels 36
2.1 ThermalTimeConstants 36
2.1.1 TheThermalDiffusionTime 37
2.1.2 TheAdiabaticRegimeTimeConstant 38
2.1.3 TheThermalDiffusionRegimeTimeConstant 38
2.1.4 TheSteadyStateRegimeTimeConstant 39
2.2 PulseEventTimeConstants 39
2.2.1 TheESDHBMPulseTimeConstant 39
2.2.2 TheESDMMPulseTimeConstant 39
2.2.3 TheESDChargedDeviceModelPulseTimeConstant 40
2.2.4 TheESDPulseTimeConstant–TransmissionLinePulse 40
2.2.5 TheESDPulseTimeConstant–VeryFastTransmission
LinePulse 41
2.2.6 TheIEC61000-4-2PulseTimeConstant 41
2.2.7 TheCableDischargeEventPulseTimeConstant 42