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Tatsuo Takada · Hanwen Ren · Jin Li · Weiwang Wang · Xiangrong Chen · Qingmin Li Electric Charge Accumulation in Dielectrics: Measurement and Analysis Electric Charge Accumulation in Dielectrics: Measurement and Analysis · · · Tatsuo Takada Hanwen Ren Jin Li · · Weiwang Wang Xiangrong Chen Qingmin Li Electric Charge Accumulation in Dielectrics: Measurement and Analysis Tatsuo Takada Hanwen Ren Tokyo City University North China Electric Power University Tokyo, Japan Beijing, China Jin Li Weiwang Wang Tianjin University Xi’an Jiaotong University Tianjin, China Xi’an, Shaanxi, China Xiangrong Chen Qingmin Li Zhejiang University North China Electric Power University Hangzhou, Zhejiang, China Beijing, China ISBN 978-981-19-6155-7 ISBN 978-981-19-6156-4 (eBook) https://doi.org/10.1007/978-981-19-6156-4 Jointly published with Science Press The print edition is not for sale in China (Mainland). Customers from China (Mainland) please order the print book from: Science Press. © Science Press 2022 This work is subject to copyright. All rights are solely and exclusively licensed by the Publisher, whether the whole or part of the material is concerned, specifically the rights of reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publishers, the authors, and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publishers nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publishers remain neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Singapore Pte Ltd. The registered company address is: 152 Beach Road, #21-01/04 Gateway East, Singapore 189721, Singapore Preface This text was accomplished on my 81st birthday. When I retired from the university, my research question “Where is the space charge trapped in the chemical structure of the dielectric?” was still not solved. Since charge accumulation is a research world in an atomic scale, it is difficult to answer this question directly. However, I still took on this new challenge. During my active career, I had been working on the measurement of the charge accumulated in dielectric materials. At present, the measurement targets have been expanded widely, such as the accumulated charge inside solids, the electric field inside liquids, and the charge density on the surface of solid dielectrics. Therefore, measurement technologies also contain a wide range now. Solid: Elastic pressure wave measurement technology under nanosecond pulse excitation. Liquid: Polarization phase difference measurement technology based on electro- optical Kerr effect. Solid surface: Polarization phase difference measurement technology based on electro-optical Pockels effect. These research results are summarized in the following textbooks in Japanese. Space Charge Accumulation Measurements and Its Analysis, Vol. I (in Japanese, 340 pages) Part 1 Physics of pulsed elastic wave Part 2 Principle of space charge distribution measurement Part 3 Design and assembling of space charge measurement equipment v vi Preface Space Charge Accumulation Measurements and Its Analysis, Vol. II (in Japanese, 351 pages) Part 4 Analysis of charge accumulation in dielectrics using Quantum Chemical Calculation Space Charge Accumulation Measurements and Its Analysis, Vol. III (in Japanese, 299 pages) Part 4 Analysis of charge accumulation in dielectrics using Quantum Chemical Calculation Part 5 Quantum Chemical Calculation Space Charge Accumulation Measurements and Its Analysis, Vol. IV (in Japanese, 321 pages) Part 6 Fundamentals of polarized electro-magnetic wave light and its application to electric charge measurement Part 7 Electric field distribution measurement in liquid insulation, shown in Figure Part 8 Surface charge distribution measurement on solid dielectric, shown in Figure The sentences “see Takada text …” in the following contents correspond to the above textbooks. Preface vii Professor Yasuhiro Tanaka’s laboratory, who took over the laboratory after me, has further developed these measurement technologies and shown many interesting charge accumulation phenomena that attract the attention of researchers all around the world. I tried to explain the reason for charge accumulation, but I couldn’t give a satisfactory explanation just by qualitative imagination. The advancement of research needs the connection of new technologies in different fields. Fortunately, Prof. Masafumi Yoshida of Tokyo City University specializes in Quantum Chemical Calculation, and I was immediately instructed by him. I learned with a graduate student (Yuji Hayase) how to calculate the energy level of the chemical structure of a dielectric material and the distribution of electro- static potential in a molecule by Gaussian software. 12 years have passed since then, and I have been able to understand the “space charge trap in a dielectric” by drawing a diagram based on the calculation. (1) A molecule is a bond of multiple atoms. Each atom has electronegativity, and the center of the bonded electrons moves from the atom with a low electronegativity to the neighbor atom with a high value. Therefore, some atoms are positively charged and others are negatively charged, and the atoms are bonded in the potential field. (2) The potentials of many charged atoms form a complex V(x, y, z) distribution in the molecule. (3) As the Schrödinger equation shows, the electron wave can be a unique standing wave in the potential field V(x, y, z). This intrinsic energy level can be easily viii Preface obtained by Gaussian calculation. At the same time, the information on the molecular orbital of the electron wave of each intrinsic energy level can also be obtained. (4) Electron traps and hole traps are formed in this localized V(x, y, z) distribution space. Part I in this textbook describes Q(t) measurements. Part II describes PEA measurements, and Part III describes Quantum Chemical Calculations. These achievements also cover the research results and discussions by the co-authors, and they have helped complete the English textbook. I’m very grateful for their cooperation. I dedicate this textbook to the late Prof. Ziyu Liu of Xi’an Jiaotong University, who initiated our international joint research program of the US, China, and Japan laboratories. Tokyo, Japan Tatsuo Takada Acknowledgments This book Electric Charge Accumulation in Dielectrics: Measurement and Analysis is a collaboration of the following six authors. The word count of the whole book is about 300 thousand. Professor Tatsuo Takada is responsible for completing Chaps. 1–4 in Part I and Chaps. 1–3 in Part III, the word count of which is about 160 thousand. Dr. Hanwen Ren is responsible for completing Chaps. 5 and 6 in Part I and Chaps. 1–5 in Part II, the word count of which is about 120 thousand. Dr. Jin Li has contributed to the contents of Chaps. 4 and 6 in Part I, Chap. 5 in Part II, and Chap. 3 in Part III. Dr. Weiwang Wang has contributed to the contents of Chap. 6 in Part I, and Chaps. 1–3 in Part III. Professor Xiangrong Chen has contributed to the contents of Chap. 5 in Part II. Professor Qingmin Li has contributed to the space charge research results in Part I and Part II, who is also responsible for the content revision, polishing, and editing of the whole book. Meanwhile, the book publishment is supported by grants from the National Natural Science Foundation of China (No. 51737005, 52127812, 51929701, 52177147, 52207153) and National Key Research and Development Program of China (No. 2021YFB2601404). The authors express deep gratitude for their support. ix