ebook img

Early Stages of Oxygen Precipitation in Silicon PDF

535 Pages·1996·21.954 MB·English
Save to my drive
Quick download
Download
Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.

Preview Early Stages of Oxygen Precipitation in Silicon

Early Stages of Oxygen Precipitation ih Silicon NATO ASI Series Advanced Science Institutes Series A Series presenting the results of activities sponsored by the NA TO Science Committee, which aims at the dissemination of advanced scientific and technological knowledge, with a view to strengthening links between scientific communities. The Series is published by an international board of publishers in conjunction with the NATO Scientific Affairs Division A Ufe Sciences Plenum Publishing Corporation B Physics London and New York C Mathematical and Physical Sciences Kluwer Academic Publishers D Behavioural and Social Sciences Dordrecht, Boston and London E Applied Sciences F Computer and Systems Sciences Springer-Verlag G Ecological Sciences Berlin, Heidelberg, New York, London, H Cell Biology Paris and Tokyo I Global Environmental Change PARTNERSHIP SUB·SERIES 1. Disarmament Technologies Kluwer Academic Publishers 2. Environment Springer-Verlag / Kluwer Academic Publishers 3. High Technology Kluwer Academic Publishers 4. Science and Technology Policy Kluwer Academic Publishers 5. Computer Networking Kluwer Academic Publishers The! Partnership Sub-Series incorporales activities undertaken in collaboration with NA TO's Co()peration Partners, the countries of the CIS and Central and Eastern Europe, in Priority Areas of concern to those countries. NATo-PCQ·DATA BASE The electronic index to the NATO ASI Series provides full bibliographical references (with keywords and/or abstracts) to more than 50000 contributions from international scientists published in all sections of the NATO ASI Series. Access to the NATO-PCO-DATA BASE is possible in two ways: - via online FILE 128 (NATO-PCO-DATA BASE) hosted by ESRIN, Via Galileo Galilei, 1-00044 Frascati,ltaly. - via CD-ROM "NATO-PCO-DATA BASE" with user-friendly retrieval software in English, French and German (© WTV GmbH and DATAWARE Technologies Inc. 1989). The CD-ROM can be ordered through any member of the Board of Publishers or through NATO pea, Overijse, Belgium. Series 3. High Technology - Vol. 17 Early Stages of Oxygen Precipitation in Silicon edited by R.Jones Department of Physics, University of Exeter, Exeter, U.K. Kluwer Academic Publishers Dordrecht / Boston / London Published in cooperation with NATO Scientific Affairs Division Proceedings of the NATO Advanced Research Workshop on Early Stages of Oxygen Precipitation in Silicon Exeter, U.K. March 26-29, 1996 A C.I.P. Catalogue record for this book is available from the Library of Congress. ISBN-13: 978-94-010-6645-7 e-ISBN-13: 978-94-009-0355-5 DOl: 10.1007/978-94-009-0355-5 Published by Kluwer Academic Publishers, P.O. Box 17, 3300 AADordrecht, The Netherlands. Kluwer Academic Publishers incorporates the publishing programmes of D. Reidel, Martinus Nijhoff, Dr W. Junk and MTP Press. Sold and distributed in the U.S.A. and Canada by Kluwer Academic Publishers, 101 Philip Drive, Norwell, MA 02061, U.S.A. In all other countries, sold and distributed by Kluwer Academic Publishers Group, P.O. Box 322, 3300 AH Dordrecht, The Netherlands. Plinted on acid-free paper All Rights Reserved © 1996 Kluwer Academic Publishers No part of the material protected by this copyright notice may be reproduced or utilized in any form or by any means, electronic or mechanical, including photo copying, recording or by any information storage and retrieval system, without written permission from the copyright owner. Softcover reprint ofthe hardcover 1st edition 1996 Contents Preface ..................................................... ix Contributors ................................................. Xl Oxygen-related defects in silicon: Studies using stress-induced alignment G.D. Watkins . ............................................... . The initial stages of oxygen aggregation in silicon: Dimers, hydrogen and self interstitials R.C. Newman ............................................... 19 Infrared studies of the early stages of oxygen clustering in silicon l.L. Lindstrom and T. Hallberg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 41 Magnetic resonance investigations of thermal donors in silicon C.A.l. Ammerlaan, I.S. Zevenbergen, Yu. V. Martynov and T. Gregorkiewicz ... , 61 Magnetic resonance on heat treatment centres in silicon l.-M. Spaeth ................................................ 83 Effect of hydrogen on oxygen-related defect reactions in silicon at elevated temperatures v.P. Markevich, 1.F. Medvedeva and L.I. Murin ....................... 103 Passivation of thermal donors by atomic hydrogen l. Weber and D.l. Bohne ....................................... 123 Oxygen-carbon, oxygen-nitrogen and oxygen-dimer defects in silicon c.P. Ewels, R. Jones and S. Oberg ................................ 141 The role of trivalent oxygen in electrically active complexes P. Detik ................................................... 163 Hydrogen-oxygen interactions in silicon S.K. Estreicher, Y.K. Park and P.A. Fedders 179 Oxygen diffusion in silicon: The influence of hydrogen M. Ramamoorthy and S. T. Pantelides . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197 vi Generation of thermal donors, nitrogen-oxygen complexes and hydrogen-oxygen complexes in silicon M. Suezawa ................................................. 207 The electronic structure of the oxygen donor in silicon from piezospectroscopy M. Stavola ................................................. 223 Low temperature diffusion and agglomeration of oxygen in silicon U. Gosele, E. Schroer, P. Werner and T. Y. Tan ........................ 243 Roles of structural defects and contaminants in oxygen precipitation in silicon K. Sumino .................................................. 263 Various forms of isolated oxygen in semiconductors B. Pajot ................................................... 283 Oxygen-related luminescence centres created in Czochralski silicon E. C. Lightowlers and G. Davies .................................. 303 The nitrogen-pair oxygen defect in silicon F. Berg Rasmussen, S. Oberg, R. Jones, C. Ewels, J. Goss, J. Miro and P. Deak ................................................... 319 Thermal double donors in silicon: A new insight into the problem L.J. Murin and V.P. Markevich ................................... 329 Interaction of positrons with vacancy-oxygen complexes and oxygen clusters in silicon M. Fujinami ................................................ 337 Fomlation of thermal donors in Czochralski grown silicon under hydrostatic pressure up to 1G Pa V. V. Emtsev, B.A. Andreev, A. Misiuk and K. Schmalz ................... 345 Complexes of oxygen and group II impurities in silicon E. McGlynn, M.O. Henry, S.E. Daly and K.G. McGuigan . ................ 355 Copper and oxygen precipitation during thermal oxidation of silicon: A TEM and EBIC study A. Correia, D. Ballutaud and A. Boutry-Forveille ...................... 363 Computer simulated distribution of defects formed during Cz-Si crystal growth K. Kawakami, H. Harada, T. Iwasaki and R. Habu ..................... 371 A small angle neutron scattering study of oxygen precipitation in silicon R.i. Stewart, S. Messoloras and S. Rycroft ........................... 381 vii Atomic composition, structure and vibrational excitation of substitutional carbon-oxygen complexes in silicon H. Yamada-Kaneta, Y. Shirakawa and C. Kaneta ....................... 389 Influence of isovalent doping on the processes of thermal donors formation in silicon L.I. Khirunenko, V.I. Shakhovtsov, V. V. Shumov and V.I. Yashnik ........... 397 Some properties of oxygen-related radiation induced defects in silicon and germanium L.I. Khirunenko, V.I. Shakhovtsov, V. V. Shumov and V.I. Yashnik ........... 403 Defect profiling of oxygen-related defects using a slow positron beam AP. Knights, R.D. Goldberg, U. Myler and P.J. Simpson ................. 411 Shallow N-O donors in silicon A Gali, J. Miro and P. Deak .................................... 419 The C-Si-O-Si(oC) four-member ring and the Si-GI5 centre L.c. Snyder, R. Wu and P. Deak .................................. 427 Kinetics of oxygen loss and thermal donor formation in silicon: The rapid diffusion of oxygen clusters S.A. McQuaid and R.C. Newman . ................................. 433 Molecular dynamics study of oxygen defects in silicon P.J. Gronberg, J. von Boehm and R.M. Nieminen ...................... 441 A kinetic model for precipitation of oxygen in silicon S. Senkader and G. Hobler ...................................... 447 Oxygen gettering and thermal donor formation at post-implantation annealing of silicon AG. Ulyashin, Yu.A Bumai, AI. Ivanov, V.s. Varichenko, N.M. Kazychits, A.M. Zaitsev and WR. Fahrner ................................... 455 Carbon-hydrogen-oxygen related centre responsible for the I-line luminescence system J.E. Gower, E. C. Lightowlers, G. Davies and A.N. Safonov ................ 463 Luminescence investigations of the interaction of oxygen with dislocations in Cz Si V. Higgs ................................................... 469 viii An isochronal annealing study of the kinetics of VO and V0 defects in neutron 2 irradiated Si CA. Londos, N V. Sarlis and L.G. Fytros ............................ 477 Unifonn stress effect on nucleation of oxygen precipitates in Czochralski grown silicon A. Misiuk .................................................. 485 On the impact of grown-in silicon oxide precipitate nuclei on silicon gate oxide integrity 1. Vanhellemont, G. Kissinger, K. Kenis, M. Depas, D. Gra/, U. Lambert and P. Wagner ................................................. 493 Low temperature annealing studies of the divacancy in p-type silicon M.-A. Trauwaert, 1. Vanhellemont, A.-M. van Bavel, P. Clauws, A. Stesmans, H.E. Maes and G. Langouche .................................... 501 Anomalous distribution of oxygen precipitates in a silicon wafer after annealing H. Ono, T. Ikarashi, S. Kimura, A. Tanikawa and K. Terashima ............ 509 Oxygen precipitation in MCZ silicon: Behaviour and dependence on the origin of raw material and growth conditions T.M. Tkacheva, G.N Petrov, K.L. Enisherlova and NA. Iasamanov .......... 517 Index ..................................................... 527 Preface It was fOlllld as long ago as 1954 that heating oxygen rich silicon to around 450°C produced electrical active defects - the so called thermal donors. The inference was that the donors were created by some defect produced by the aggregation of oxygen. Since then, there has been an enor mous amount of work carried out to elucidate the detailed mechanism by which they, and other defects, are generated. This task has been made all the more relevant as silicon is one of the most important technological ma terials in everyday use and oxygen is its most common impurity. However, even after forty years, the details of the processes by which the donors and other defects are generated are still obscure. The difficulty of the problem is made more apparent when it is realised that there is only one oxygen atom in about ten thousand silicon atoms and so it is difficult to devise experiments to 'see' what happens during the early stages of oxygen precipitation when complexes of two, three or four 0xygen atoms are formed. However, new important new findings have emerged from experiments such as the careful monitoring of the changes in the infra red lattice absorption spectra over long durations, the observation of the growth of new bands which are correlated with electronic infra-red data, and high resolution ENDOR studies. In addition, progress has been made in the improved control of samples containing oxygen, carbon, nitrogen and hydrogen. In parallel with these developments, there have been great advances in modelling techniques. A large amount of modelling had already been carried out and the central role of an overcoordinated oxygen atom in donors had already been emphasised. Recent progress in first principles methods has, above all else, given greater confidence in predictive theory, and it is thus natural that the subject has excited the interest of so many theoreticians. The time seemed ripe for a workshop to bring together leading work ers in the field. A key aim of the workshop was to promote collaboration between experimental and modelling groups. The workshop was made possible by funding both from NATO and the University of Exeter and both organisations are thanked for their support. I also thank my co-organisers Peter Deak and Stefan Estreicher for support and encouragement. The bulk of the daily administrative work fell locally on the shoulders of Chris Ewels, Jon Goss, Paul Leary, Chris Latham, Paul Rawlins and Sailesh Patel, all of whom worked very hard to ensure the workshop was a success. They were keen to ensure that details of itineraries, the abstracts for the talks and posters and the excursions were available on the internet. This proved to be very useful for those young enough - or with enough time - to browse these pages, but the responses made it clear that ix

See more

The list of books you might like

Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.