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Damage formation and annealing studies of low energy ion implants in silicon using medium ... PDF

211 Pages·2006·4.85 MB·English
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Objective, preparation, analysis techniques and equipment. 11. 1.6. Scope of the End of Range defects and their evolution upon annealing. 51. 3.4.3 Surface modification and alloying by laser, ion and electron beams, Editors J.M.. Poate
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Most books are stored in the elastic cloud where traffic is expensive. For this reason, we have a limit on daily download.