Objective, preparation, analysis techniques and equipment. 11. 1.6. Scope of the
End of Range defects and their evolution upon annealing. 51. 3.4.3
Surface modification and alloying by laser, ion and electron beams, Editors J.M..
Poate
Damage formation and annealing studies of low energy ion implants in silicon using medium ... PDF
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Objective, preparation, analysis techniques and equipment. 11. 1.6. Scope of the
End of Range defects and their evolution upon annealing. 51. 3.4.3
Surface modification and alloying by laser, ion and electron beams, Editors J.M..
Poate
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