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Bulk measurement of copper and sodium content in CuIn(0.7)Ga(0.3)Se(2) (CIGS) solar cells with nanosecond pulse length laser induced breakdown spectroscopy (LIBS) PDF

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Preview Bulk measurement of copper and sodium content in CuIn(0.7)Ga(0.3)Se(2) (CIGS) solar cells with nanosecond pulse length laser induced breakdown spectroscopy (LIBS)

Bulk measurement of copper and sodium content in CuIn Ga Se (CIGS) solar cells 0.7 0.3 2 with nanosecond pulse length laser induced breakdown spectroscopy (LIBS) Jeremy M. D. Kowalczyk and Jeffrey J. Perkins Department of Physics and Astronomy, University of Hawai‘i Ma¯noa, Honolulu, HI 96822 Alexander DeAngelis, Jess Kaneshiro, Stewart A. Mallory, Yuancheng Chang, and Nicolas Gaillard Hawai‘i Natural Energy Institute, University of Hawai‘i Ma¯noa, Honolulu, HI 96822 (Dated: December 11, 2013) In this work, we show that laser induced breakdown spectroscopy (LIBS) with a nanosecond pulse laser can be used to measure the copper and sodium content of CuIn Ga Se thin film 0.7 0.3 2 solar cells on molybdenum. This method has four significant advantages over methods currently beingemployed: themethodisinexpensive,measurementscanbetakenintimesontheorderofone 3 second, without high vacuum, and at distances up to 5 meters or more. The final two points allow 1 forin-linemonitoringofdevicefabricationinlaboratoryorindustrialenvironments. Specifically,we 0 reportalinearrelationshipbetweenthecopperandsodiumspectrallinesfromLIBSandtheatomic 2 fraction of copper and sodium measured via secondary ion mass spectroscopy (SIMS), discuss the n ablation process of this material with a nanosecond pulse laser compared to shorter pulse duration a lasers, and examine the depth resolution of nanosecond pulse LIBS. J 7 I. INTRODUCTION the spectrum (and subsequently lower signal to noise ra- ] tio (SNR)), we were unable to measure atomic lines for s gallium, indium, and selenium (though measurement of c i Laser induced breakdown spectroscopy (LIBS) has selenium is difficult for others reasons discussed in the t p long been used as a method for detection of trace depth profile discussion below). o elements1 and has more recently been shown to be an s. effective method for measuring atomic fraction of con- c stituents with depth2–4. We have shown previously that i s alinearrelationshipbetweenthesodiumpeakfromLIBS y and the mass of sodium deposited during deposition h exists5;inthisstudy,webuildonthatworkanduseLIBS II. THEORY p to measure the atomic fraction of copper and sodium in [ CIGS solar cells via calibration with secondary ion mass 1 spectroscopy(SIMS).Wespecificallyfocusedonsodium, A. LIBS spectra theory v the control of which in CIGS solar cells is critical to 3 achieve high efficiency devices6, but to date composition 1 LIBS employs a high power laser to create a plasma measurement techniques either cannot accurately quan- 3 from the material to be investigated9. As the plasma tify the sub-one atomic percent levels (for example, x- 1 cools and ions and electrons recombine, photons charac- . rayfluorescence(XRF)andenergydispersiveX-rayspec- 1 teristic of the transition energies of the elements present troscopy (EDX)) or are expensive, time consuming, re- 0 are emitted, and these spectral lines are then matched quirehighvacuum,andcannotbedoneatlargedistances 3 to those of known lines of specific elements. In the most 1 (examples include EDX, SIMS, and x-ray photo-electron simplecases,thenumberofmeasuredcountsofanatom’s : spectroscopy (XPS)). LIBS is an inexpensive and fast v spectral line is proportional to the atomic percent as has method that can be done at a large range of sample to i been shown, for example, for chromium in steels10. This X instrument distances (from centimeters to meters) with- technique damages an area of the target on the order of r out the need for vacuum and is able to detect and quan- the spot size of the laser. a tify copper and sodium atomic percentages. We know of three other studies have been done on CIGS with LIBS. In general, the nature of the matrix of other materi- Pilkington showed that LIBS could produce meaningful als in which a particular element resides will influence depthprofilesofconstituentsofCIGS7. Leeshowedalin- the ratio of the atomic percent of that element to the earrelationshipbetweenGaconcentrationandtheGa/In intensity of its corresponding lines (the so called ’matrix andGa/Curatios8. Kimshowedthatsodiumproducesa effect’)11. Ithasbeenshownthatinsomecasesthisratio strong LIBS signal4. Here we calibrate LIBS to quantify can be constant even over broad compositional ranges12. copper and sodium content over a range of different cop- In this study, the concentration range of interest of all per and sodium concentrations at a sample to detector constituents is narrow, so we assumed and confirmed in distance of 5.2 meters. Due to the limited bandwidth of our results a linear relationship between the relative in- thespectrometeravailabletous(383nmto900nm),and tensityoftheatomiclinesofcopperandsodiumandtheir lower efficiency of our LIBS setup in the blue/UV end of atomic concentrations. 2 B. LIBS plasma formation and ablation into the lattice phonon modes and diffuses into the ma- terialbeforethethresholdenergydensityforvaporization can be reached. When this occurs, the material is first In semiconductors like CIGS there are few conduction melted, then the melted material is vaporized. This se- band electrons and the initial laser radiation for LIBS quence results in mixing of material at different depths leadstoeithersingleormulti-photonbandtobandtran- sitions instead of direct heating of the material9. After and a rough edge to the ablation crater14. The nanosec- ond pulses used in this work are much longer than the generationofconductionbandelectrons,thelatticeheats lattice ion relaxation time and result in a rough ablation duetocouplingofthegeneratedelectron-holepairstothe edge as will be discussed in the results section. lattice. The photon absorption cross section is roughly 17 orders of magnitude greater for photons with energy above the band gap energy compared to below13, lead- III. EXPERIMENTAL ing to a higher density of deposited energy with photon energy above the band gap. The band gap of the CIGS materialscreatedattheHawai‘iNaturalEnergyInstitute A. CIGS PV cell fabrication and used for this study has been measured to be ∼ 1.2 eV, corroborated by the significant photon to electron- For this work a total of 18 PV cells were fabricated hole pair conversion evident from the quantum efficiency on 3 substrates in the following stack: a 1”x1” thin tita- (QE)curvesinfigure1atwavelengthsshorterthan1100 niumsubstrate,1µmofmolybdenumdepositedviamag- nm (energy greater than 1.13 eV). The laser wavelength netron sputtering, 10 mg of NaF deposited via evapora- used for LIBS in this study was 1064 nm (photon energy tion,1.8µmofCIGSdepositedviaa3-stageevaporation of 1.17 eV), enabling laser energy to be densely coupled process15, 100 nm of CdS n-type buffer layer deposited into the CIGS material. via chemical bath deposition, 80 nm of ZnO, 100 nm of indium tin oxide (ITO), and Ni/Ag grids for charge collection. The complete cells are pictured on the left QE Curve in figure 2. During the CIGS deposition, the evapora- 90 tion sources for copper and sodium were intentionally 80 positioned to provide a significant gradient of evaporant %) 70 cy ( 60 across the substrates to be analyzed. This non-optimal n fabrication process resulted in functional solar cells with e m Effici 4500 mbuotdaeslltowpeerdfofromraancraenbgeetwofeecnop7paerndan9dpseordceiunmt ecffiocniteennctys ntu 30 with which our LIBS signals could be calibrated. a u 20 Q 10 0 300 400 500 600 700 800 900 1000 1100 Wavelength (nm) FIG.1: Typicalquantumefficiencycurveforthedevicesused in this study. This curves show the conversion efficiencies of photons at a particular wavelength to photocurrent pro- duction. Note the significant quantum efficiency for photon wavelengthslessthan1100nm(energygreaterthan1.13eV) which confirms that the band gap is below the YAG laser photon energy of 1.17 eV. FIG. 2: Image of one substrate with 6 devices (labeled d1 through d6) before LIBS (left) and after LIBS (right). Note If the pulse duration is short compared to the lattice the five craters formed from the five measurements taken on ion relaxation time (on the order of 100 fs to 1 ps), the device 3 (d3). Five such devices spanning 3 substrates were initially excited electron-hole pairs do not have time to used for this study. couple to the lattice before all of the pulse energy is deposited14. Since the interaction cross section of pho- tonswiththelatticeissmallcomparedtothatofphotons to the electron-hole excitation, this leads to a dense de- B. LIBS setup positionofenergyinthematerialthatistypicallygreater thanitsheatvaporization,resultinginsublimationofthe Figure 3 shows a schematic of the LIBS measurement material, no mixing of the material at different depths, setup. The samples were interrogated in air with a 1064 and an abrupt edge to the ablation crater. nm Nd:YAG Continuum Surelite II laser at 100 mJ per Conversely, if the laser pulse duration is longer than pulse with a 600 µm spot (fluence of 35 J/cm2) with an the picosecond time scale, significant energy is coupled integrationtimeof1second(notewedidnothaveaccess 3 toanICCDcameraforthisstudy,sotheintegrationtime Five spots on each device were analyzed using LIBS was long leading to higher noise levels and the need for (see figure 2) and the remaining area of the device was higherpowerpulsestoincreasetheSNR).Thisrelatively analyzed with SIMS. Twenty five 100 mJ pulses were high laser pulse energy was chosen to yield an SNR ra- usedtocollectspectradownto∼3.4µm(measuredwith tio of 10:1 for all measurements. A near-infrared (NIR) a Tencor Alpha-Step profilometer) from the top of each dichroicbeam-splitterwasusedtoassurecollinearitybe- device . The background in the LIBS spectra (due to tweenthelaserandtelescopeopticalaxes. Theresultant Bremsstrahlung radiation, stray light, and detector dark radiation was fiber coupled to an Ocean Optics LIBS counts) was removed to improve the SNR. 2500+ Spectrometer with a usable bandwidth of 500 nm to900nm. Theresultsweredigitallyrecorded. Thecur- rent experiment is designed for detection at a distance IV. RESULTS AND DISCUSSION of 5.2 m from the samples to emulate an in-line device fabrication setup. A. Analysis of LIBS craters Profiles of the LIBS craters are presented in figure 4. These show a relatively flat floor to the craters in some cases, butaroughfloorinothers. Weassumetherough- ness is due to the long (nanosecond) pulses leading to melting, evaporation, and ultimate resolidification of the meltedmaterialundertheinfluenceofchaoticforcesfrom theplasmaintoirregularshapes. Theunevenablationfor each pulse leaves the utility of nanosecond LIBS inques- tions for fine depth analysis, but has little effect on the bulk analysis done here since the variations in the crater floors are small compared to the overall depth analyzed. 2.0 111111 ppppppuuuuuullllllsssssseeeeee 555555 ppppppuuuuuullllllsssssseeeeeessssss 111111000000 ppppppuuuuuullllllsssssseeeeeessssss 1.0 m) 0.0 depth (µ -1.0 -2.0 -3.0 -4.0 2.0 111111555555 ppppppuuuuuullllllsssssseeeeeessssss 222222000000 ppppppuuuuuullllllsssssseeeeeessssss 222222555555 ppppppuuuuuullllllsssssseeeeeessssss 1.0 depth (m)µ --021...000 -3.0 -4.0 -1.0 -0.5 0.0 0.5 1.0 -1.0 -0.5 0.0 0.5 1.0 -1.0 -0.5 0.0 0.5 1.0 x (mm) x (mm) x (mm) FIG.4: ProfilesofthecratersfromLIBSasafunctionofpulse number. Here x is the distance transverse to the incoming FIG. 3: Schematic of the LIBS measurement setup. Laser laser beam. Note the roughness induced by the long pulse travels through the beamsplitter, is focused on the sample length of the laser. by a lens, and causes plasma formation of the sample. The sampleemitsphotonswhichtraveldowntothebeamsplitter andarereflectedintothetelescopeforcollectionbythespec- trometer. A computer controls the spectrometer integration window and laser pulse timing. B. LIBS peak identification An optically transparent fused silica window with a In order to correlate the spectra obtained from LIBS 1064nmtransmissionofgreaterthan90percentwasused to the presence of particular atoms, strong lines without to allow transmission of the laser and resulting break- overlap to other lines in the material that were within down radiation. For purposes of system detection cal- the bandwidth of the spectrometer were chosen from the ibration, a calibrated tungsten filament thermal source NIST Atomic Spectra Database16 as shown in table I. wasusedtodeterminethesystemefficiencyasafunction Note that with a spectrometer sensitive to the appropri- of wavelength. ate spectral range, strong lines for indium, gallium (at 4 410and417nmrespectively8),andtincouldberecorded Linear fit of LIBS/SIMS pairs for copper allowing LIBS analysis of all constituents of the device except selenium. 17 data y(x)=8.02*x+1.78, R2=0.989 S 16 M SI 15 TABLE I: Strong spectral lines and their corresponding ele- m o ments used for LIBS analysis. % fr 14 wavelength (nm) element mic 13 o 510.55 Cu At 12 550.65 Mo 11 589.00 Na 1.2 1.3 1.4 1.5 1.6 1.7 1.8 625.81 Ti Normalized counts*1000 at 510.55nm from LIBS 636.23 Zn FIG. 5: Linear fit of atomic fraction of copper from SIMS 643.85 Cd analysisversusnormalizedphotoncountsfromLIBSat510.55 nm. Five LIBS measurements were taken and averaged for each data point. The error bars represent plus and minus one standard deviation. Note that the atomic percentage of copper in the CIGS layer is typically 25%, but here we have takenanaverageovertheentiredevicethroughthemolybde- num layer making the values on the y-axis lower. C. Copper and sodium calibration curves As can be seen from figure 4 multiple pulses were re- Linear fit of LIBS/SIMS pairs for sodium quired to obtain spectra for the entire device and there- 100 data foretouseLIBStomeasureitscontents. However,dueto S 90 y(x)=523*x-122, R2=0.968 saturation of the spectrometer, multiple spectra needed SIM 80 to be taken at each spot. In order to obtain an accurate m 70 o calibrationoftheLIBSspectratotheatomicpercent,all 0 fr 60 of the spectra originating from the ablated material (3.4 00 1 50 µmofdevicematerialfromthe25pulses)inaparticular %* c 40 spot were added together and the sum was normalized mi to the total number of spectrometer counts. This proce- Ato 30 dure yields a normalized spectrum representative of the 20 bulk of the device for a particular spot. LIBS signals 0.26 0.28 0.3 0.32 0.34 0.36 0.38 taken from the 5 spots on each of 5 devices (see figure Normalized counts*1000 at 589.00nm from LIBS 2) were averaged and the standard deviation was calcu- lated. SIMS analysis was done on each of the five de- FIG. 6: Linear fit of atomic fraction of sodium from SIMS analysisversusnormalizedspectrometercountsfromLIBSat vicesandtheatomicpercentwasaveragedoverthesame 589.00nm. FiveLIBSmeasurementsweretakenandaveraged 3.4 µm of ablated material as the LIBS analysis. The foreachdatapoint. Theerrorbarsrepresentplusandminus SIMS bulk average atomic percent (y coordinate) and onestandarddeviation. Notethisisameasurementoftheto- LIBS bulk average peak height (x coordinate) data pairs talamountofsodiuminthestackincludingthemolybdenum forthecopperandsodiumareplottedalongwithalinear layer which contains significant amounts of sodium. least squares fit in figures 5 and 6. The fits for both cop- per and sodium are good with values for R2 =0.989 and R2 =0.968, respectively, showing that indeed that LIBS D. Depth profile discussion producesareliablesignalproportionaltotheatomicfrac- tion of copper and sodium in this concentration regime. Note that the matrix of other materials that the copper Recently there have been a number of studies2,3,7,17 of and sodium reside in changes with each pulse (as shown LIBSasadepthprofilingmethod. Theyhavefoundthat in figure 8) so some pulses may have a different matrix generally picosecond or femtosecond pulses are required effect induced change in ratio of LIBS counts to atomic to achieve sublimation and uniform ablation instead of percent as a function of depth that we did not explore. the melting/evaporation and non-uniform ablation seen This possible variation is washed out by averaging of all with the nanosecond pulses used in this study. Due to of the 25 pulses and is reduced by the melting and mix- the mixing of layers with depth during melting and the ing that homogenizes the sample. Despite this variation, subsequently non-uniform surface created for the next a linear calibration of copper and sodium content in the ablating pulse, the abrupt interfaces between layers seen entire stack was achieved with nanosecond LIBS. in SIMS analysis in figure 7 are not observed in the cor- 5 responding LIBS analysis in figure 8. first couple of pulses and decreases linearly. This is most likely due to the ratio of CIGS to molybdenum in the melted material decreasing with depth (corroborated by Depth profile from SIMS the increasing molybdenum signal in this range). Ad- 100 0.18 ditionally, the molybdenum peak appears surprisingly 0.16 early in the laser pulses (around pulse 3). This can S 0.14 M be explained by the deep probing of the first few laser S SI M 0.12 m pulses around the edge of the crater evident in figure omic% from SI 10 MNCCZTnaodui 000...00168 m atomic% fro 4CipfiauIe.GlsseSFbsreloitammwyeperetrhnaisicsptmiupcleahslleetnsef.odormTdaehunnirasoinlnmyg,saitwskheeoesftlhLaseesIlBeoerrnSizpiuewumlitsthehianatnnCatdnhIoGerseSeescnomotliindrade-- At u 1 0.04 odi terials as there is significant evaporation of selenium in S the melted material. At the deposition temperature for 0.02 the CIGS devices of 600 oC, selenium evaporation is sig- 0 nificant enough to require a constant vapor pressure of 0 0.5 1 1.5 2 2.5 3 3.5 4 selenium in the deposition chamber in order to maintain Depth (um) stoichiometry. Assuming the CIGS layer totally melts and its melting point is near that of copper (1085 oC), a FIG.7: SIMSanalysisofthemediansodiumandcoppercon- tent device. One can clearly see the different device layers liquefiedpoolofCIGSwillevaporatesignificantselenium from the signal of their constituent elements. The ZnO is with each pulse (and subsequent melting), making accu- evidentfromthezincsignalnearthesurface. Below,thecad- rate measurement of selenium concentration impossible mium from the CdS layer is visible. Next the CIGS layer is with the technique used here. indicatedbythepresenceofcopper. Finallythemolybdenum The SIMS analysis in figure 7 shows that there is sig- and titanium substrates are indicated by increased signal for nificantcopperandsodiuminthemolybdenumlayerand those elements. figure8showsthatthemolybdenumlayerisprobedlong beforetheentireCIGSlayerhasbeenablatedinourLIBS analysis. This means that our measurement of copper Depth profile from LIBS andsodiumisthetotalamountintheCIGSplusmolyb- 120 denumbackcontactstack,notjustintheCIGSabsorber Cu Na layer. 100 Mo 0 Zn 00 80 Cd 0 Ti 1 s* V. CONCLUSION nt 60 u o c ed 40 We have shown that a bulk compositional analysis of aliz thecopperandsodiumcontentinacompleteCIGSsolar orm 20 cell is possible with LIBS; calibration curves were ob- N tained showing that the atomic percentage is linearly 0 proportional to the peak heights of the corresponding -20 element in the compositional range for functional CIGS 0 5 10 15 20 25 devices. Additionally, while we have shown nanosecond Pulse number LIBS is not a viable method for precise depth profiling ofthismaterialatthefluenceusedinthisstudy. Thevi- FIG. 8: Intensity (normalized to the total spectrometer ability of LIBS for bulk analysis of CIGS solar cells and counts) of atomic lines in table I as a function of pulse num- other thin film technology demonstrated here can lead ber. to significant cost and time savings when compared to methods currently in use. However, the LIBS depth analysis does have the ex- pected qualitative features. Spectra from only the first three pulses contain zinc and cadmium peaks, as ex- pected from the ZnO and CdS layers in the top 300 nm VI. ACKNOWLEDGMENTS ofthedevice. Thecopperpeakslowlydecreasesuntilthe entire CIGS layer has been ablated by pulse 25. Finally, Fabrication of the solar cells used in this study was the molybdenum and sodium peaks both decrease as the funded by the United States Air Force Research Labo- titaniumsignalisincreasingatpulse25whereSIMSanal- ratory Space Vehicles Directorate as part of the Rapidly ysisindicatedthemolybdenum/titaniuminterfacetobe. Deployable Solar Electricity and Fuel Sources program. There are some interesting features of the LIBS depth Special thanks goes to Shiv Sharma and David Bates at analysis in figure 8. The copper peak is greatest in the the Hawai‘i Institute for Geophysics for generously pro- 6 viding time on their LIBS setup, background removal of for granting one of the authors (JMDK) the Doris and theLIBSdata,andtheirinputandfeedback. Finally,we RobertPulleyAwardwhichwasusedtopayfortheSIMS wouldliketothanktheHonoluluchapteroftheAchieve- analysis. mentRewardsforCollegeScientists(ARCS)Foundation 1 Laser-induced breakdown spectroscopy (LIBS): fundamen- Buckley, Appl. Spectrosc. 64, 154 (2010). talsandapplication,editedbyA.W.Miziolek,V.Palleschi, 11 S. M. Clegg et al., Spectrochim. Acta, Part B 64, 79 andI.Schechter(CambridgeUniversityPress,Cambridge, (2009). UK, 2006). 12 J.Perkinsetal.,40thLunarandPlanetaryScienceConfer- 2 J.M.VadilloandJ.J.Laserna,J.Anal.At.Spectrom.12, ence (Lunar and Planetary Institute, Houston, TX, USA, 859 (1997). 2009). 3 D. R. Anderson, C. W. McLeod, T. English, and A. T. 13 Laser Ablation, edited by J. C. Miller (Springer-Verlag, Smith, Appl. Spectrosc. 49, 691 (1995). Heidelberg, Germany, 1994). 4 C. K. Kim et al., Appl. Opt. 51, B93 (2012). 14 B.N.Chichkovet al.,Appl.Phys.A:Mater.Sci.Process. 5 J. M. D. Kowalczyk et al., 35th IEEE Photovoltaic Spe- 63, 109 (1996). cialists Conference (IEEE, Piscataway, NJ, USA, 2010), 15 M. Contreras et al., Conference Record of the 24th IEEE pp. 001742–001744. Photovoltaics Specialists Conference (IEEE, Piscataway, 6 D.Braungeretal.,ThinSolidFilms361-362,161(2000). NJ, USA, 1994), Vol. 1, pp. 68–75. 7 R. D. Pilkington et al., In Proceedings of Photon 06 (IOP 16 NIST Atomic Spectra Database, Publishing Ltd., Bristol, UK, 2006). http://physics.nist.gov/asd, 2011. 8 S. H. Lee et al., Appl. Opt. 51, B115 (2012). 17 D. G. Papazoglou, V. Papadakis, and D. Anglos, J. Anal. 9 J. D. Winefordner et al., J. Anal. At. Spectrom. 19, 1061 At. Spectrom. 19, 483 (2004). (2004). 10 C. B. Stipe, B. D. Hensley, J. L. Boersema, and S. G.

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