Atomic Force Microscopy for Energy Research

457 Pages·2022·51.489 MB·English

by  Cai Shen

Atomic Force Microscopy
for Energy Research
Emerging Materials and Technologies
Series Editor
Boris I. Kharissov
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Yasser Shahzad, Syed A.A. Rizvi, Abid Mehmood Yousaf, and Talib Hussain
Nanomaterials for Environmental Applications
Mohamed Abou El-Fetouh Barakat and Rajeev Kumar
Nanotechnology for Smart Concrete
Ghasan Fahim Huseien, Nur Hafizah A. Khalid, and Jahangir Mirza
Nanomaterials in the Battle against Pathogens and Disease Vectors
Kaushik Pal and Tean Zaheer
MXene-Based Photocatalysts
Fabrication and Applications
Zuzeng Qin, Tongming Su, and Hongbing Ji
Advanced Electrochemical Materials in Energy Conversion and Storage
Junbo Hou
Emerging Technologies for Textile Coloration
Mohd Yusuf and Shahid Mohammad
Emerging Pollutant Treatment in Wastewater
S.K. Nataraj
Heterogeneous Catalysis in Organic Transformations
Varun Rawat, Anirban Das, and Chandra Mohan Srivastava
2D Monoelemental Materials (Xenes) and Related Technologies
Beyond Graphene
Zongyu Huang, Xiang Qi, and Jianxin Zhong
Atomic Force Microscopy for Energy Research
Cai Shen
Self-Healing Cementitious Materials
Technologies, Evaluation Methods, and Applications
Ghasan Fahim Huseien, Iman Faridmehr, and
Mohammad Hajmohammadian Baghban
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Atomic Force Microscopy
for Energy Research
Edited by
Cai Shen
First edition published 2022
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ISBN: 978-1-032-00407-5 (hbk)
ISBN: 978-1-032-00411-2 (pbk)
ISBN: 978-1-003-17404-2 (ebk)
DOI: 10.1201/9781003174042
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Contents
Preface......................................................................................................................vii
Editor ........................................................................................................................ix
Contributors ..............................................................................................................xi
Chapter 1 Principles and Basic Modes of Atomic Force Microscopy ..................1
Anyang Cui, Menghan Deng, Yan Ye, Xiang Wang,
and Zhigao Hu
Chapter 2 Advanced Modes of Electrostatic and Kelvin Probe Force
Microscopy for Energy Applications .................................................45
Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai,
and Liam Collins
Chapter 3 Piezoresponse Force Microscopy and Electrochemical Strain
Microscopy .......................................................................................105
Qibin Zeng and Kaiyang Zeng
Chapter 4 Hybrid AFM Technique: Atomic Force Microscopy-Scanning
Electrochemical Microscopy ............................................................157
Shuang Cao and Tong Sun
Chapter 5 Scanning Microwave Impedance Microscopy .................................185
Yongliang Yang, Nicholas Antoniou, and Ravi Chintala
Chapter 6 Atomic Force Microscopy-Based Infrared Microscopy for
Chemical Nano-Imaging and Spectroscopy ....................................213
Xiaoji G. Xu
Chapter 7 Application of AFM in Lithium Batteries Research ........................241
Shuang-Yan Lang, Zhen-Zhen Shen, Jing Wan, and Rui Wen
Chapter 8 Application of AFM in Solar Cell Research ....................................285
Ahmed Touhami
v
vi Contents
Chapter 9 Application of AFM for Analyzing the Microstructure of
Ferroelectric Polymer as an Energy Material ..................................325
Dong Guo, Kai Cai, and Jingshu Xu
Chapter 10 Application of AFM in Microbial Energy Systems .........................347
Xiaochun Tian
Chapter 11 Practical Guidance of AFM Operations for Energy Research.........365
Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu,
Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan, and Hao Sun
Index ......................................................................................................................431
Preface
The invention of scanning tunneling microscopy (STM) in 1981 and atomic force
microscopy (AFM) in 1986 completely changed human’s ability to understand the
world. Since then, a variety of STM/AFM-based scanning probe microscopy tech-
nologies have emerged with exciting innovations. Over the past 10 years, AFM tech-
nology has not been as “exciting” as it was when it was first invented. As a researcher
who has used both STM and AFM technologies extensively during the past 15 years,
I once fell into deep thinking and dilemma, and even doubted whether AFM tech-
nology is still an advanced science and technology. I am glad that after a period of
careful observation, I found that there are many scientists in the world working hard
in their respective fields and who give up. Just as I was soliciting for writing this
book, I received warm response and support from scientists. It is a great inspiration
and an overwhelming experience for me to see that those young scientists propel the
diversity of AFM.
Compared to books that describe the application of AFM for the study of biology,
little information can be found regarding books that describe the application of AFM
for energy research. This is because biological systems are more about imaging; in
the first place, AFM is an ideal tool like confocal microscopy for people to use it to
image samples, whether in the atmosphere or in the liquid environment. The grow-
ing application of AFM for energy materials study has been witnessed mostly in the
last decade. Nowadays, we are experiencing more severe global climate changes,
making it necessary to more actively explore new energy materials. In the process
of exploring new energy materials, humans find that only after fully understanding
the surface/interface characteristics of materials, especially in the nanometer scale,
they can design materials with better performance. In addition to simple imaging
of samples, AFM has advanced models that can measure the microscopic electrical
and mechanical characteristics of samples. Combined with the spectroscopy technol-
ogy developed in recent years, AFM can achieve comprehensive characterization of
sample morphology and physical and chemical characteristics that provide power-
ful real-time, direct evidence, revealing details and phenomena that were previously
unobserved by other techniques. It should be noted that the application of AFM in
the field of energy has made AFM leap from the characterization of the basic mor-
phology of samples to the characterization of material physicochemical properties
that can form complementary evidence with the characterization results of macro
scale and strongly support the research in modern materials science.
The aim of this book is to describe the basic principles of AFM as well as the
advanced modes that are powerful tools for the study of energy materials. The
main contents include Chapter 1 Principles and Basic Modes of Atomic Force
Microscopy; Chapter 2 Advanced Modes of Electrostatic and Kelvin Probe Force
Microscopy for Energy Applications; Chapter 3 Piezoresponse Force Microscopy
and Electrochemical Strain Microscopy; Chapter 4 Hybrid AFM Technique: Atomic
Force Microscopy – Scanning Electrochemical Microscopy; Chapter 5 Scanning
Microwave Impedance Microscopy; Chapter 6 Atomic Force Microscopy-based
vii
viii Preface
Infrared Microscopy for Chemical Nano-imaging and Spectroscopy; Chapter 7
Application of AFM in Lithium Batteries Research; Chapter 8 Application of AFM in
Solar Cell Research; Chapter 9 Application of AFM for Analyzing the Microstructure
of Ferroelectric Polymer as an Energy Material; Chapter 10 Application of AFM in
Microbial Energy Systems; and Chapter 11 Practical Guidance of AFM Operations
for Energy Research.
These topics cover the most recent advances in AFM as well as its applications.
It would be impossible to include every aspect of energy materials in this book, for
example the study of catalysis by AFM is an important and emerging research field;
application of AFM in oil recovery is another interesting topic that is worth to be
highlighted. However, due to the limited time and space, these interesting topics are
not discussed in this book. However, I am sure these topics will become the spot-
lights in the near future.
I would like to thank Prof. Manfred Buck and Prof. Flemming Besenbacher for
introducing me to the fantastic world of scanning probe microscopy. I would like to
thank all contributors for their support to publish this book. Many colleagues and
friends provided me support during my career, which are much appreciated. Finally,
I would like to express my gratitude to my family especially my wife Ling-Zhi for her
tremendous understanding and encouragement in the past decade.
Cai Shen
Editor
Cai Shen earned a PhD in chemistry from the University
of St Andrews, UK, in 2008. Sequentially, he continued his
research at the University of Maryland, Heidelberg
University and Aarhus University before he joined Ningbo
Institute of Materials Technology and Engineering,
Chinese Academy of Sciences as an Associate Professor in
2013. He was promoted to Professor in 2021. He joined the
University of Nottingham Ningbo China in 2022. He has
published 100 papers in peer-reviewed journals. He is on
the editorial boards of a number of international journals, including Journal of
Microscopy. His current research interests are lithium-ion batteries and applications
of atomic force microscopy for the study of energy materials and biology.
ix