Applied Surface Science 1992 - 1993: Vol 62-71 Index

173 Pages·36.3 MB·English

ISSN 0169-4332
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Surface science
PAW (o)0igat-|mel-)1/0)(-10m (oe-le)0)|[=1e 8a)\ "zc(e1x )
and chemistry of surfaces and interfaces
North-Holland
APPLIED SURFACE SCIENCE
Editors: L.C. Feldman, J. Nishizawa, W.F. van der Weg Founding Editor: R.L. Park
Advisory Editorial Board:
D.E. Aspnes, Red Bank, NJ S. Hofmann, Stuttgart, Germany G.A. Somorjai, Berkeley, CA
M. Balkanski, Paris, France H. Ishiwara, Yokohama, Japan S. Ushioda, Sendai, Japan
J.C. Bean, Murray Hill, NJ D.A. King, Cambridge, UK W.H. Weinberg, Santa Barbara, CA
S. Chambers, Richmond, WA K.M. Maex, Leuven, Belgium J.M. White, Austin, TX
J. Chikawa, Hyogo, Japan J.W. Niemantsverdriet, Eindhoven, The Netherlands Xie Xide, Shanghai, China
R.B. Hall, Annandale, NJ P.R. Norton, London, Canada J.T. Yates, Pittsburgh, PA
M. Henzler, Hannover, Germany C.J. Powell, Gaithersburg, MD M.L. Yu, Yorktown Heights, NY
M. Hirose, Hiroshima, Japan E. Rimini, Catania, Italy
Scope:
Applied Surface Science is concerned with applied physics and chemistry of surfaces and interfaces and with the atomistic description of
processing, modification and characterization of surfaces, interfaces and thin films. These include growth and epitaxy, oxidation, reactivity
as well as surface modification by directed energy deposition (lasers, ion or electron beams) or other techniques (i.e. plasma etching).
Important areas in the field are electronic materials (i.e. semiconductors, organic films, ceramics) and chemical processes at surfaces
(catalysis, corrosion, reactivity).
Information for Authors:
Contributions shall be written in English and should be submitted in triplicate directly to one of the editors listed below:
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Room 1E-351 Tohoku University Department of Atomic and Interface Physics
AT&T Bell Laboratories 2-1-1 Katahira University of Utrecht
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Printed in The Netherlands
APPLIED SURFACE SCIENCE
Editorial Board
Dr. L.C. Feldman Professor Jun-ichi Nishizawa Professor W.F. van der Weg
Room 1E-351 Tohoku University Department of Atomic and
AT&T Bell Laboratories 2-1-1 Katahira Interface Physics
Murray Hill, New Jersey 07974 Aoba-ku, Sendai University of Utrecht
USA Japan 980 P.O. Box 80.000, 3508 TA Utrecht
The Netherlands
FAX: + 1-908-582 4228 FAX: + 81-22-262 3180
FAX: [phone]
E-Mail: [email protected]
Advisory Editorial Board
D.E. Aspnes S. Hofmann E. Rimini
Bell Communications Research Max-Planck-Institut Universita di Catania
Red Bank, NJ 07701, USA fir Metallforschung 1-95129 Catania, Italy
D-7000 Stuttgart 1, Germany
M. Balkanski G.A. Somorjai
Université Pierre et Marie Curie H. Ishiwara University of California
75230 Paris Cedex 05, France Tokyo Institute of Technology Berkeley, CA 94720, USA
Yokohama 227, Japan
J.C. Bean S. Ushioda
AT&T Bell Laboratories D.A. King Tohoku University
Murray Hill, NJ 07974, USA University of Cambridge Aoba-ku, Sendai 980, Japan
Cambridge CB2 1EW, UK
S. Chambers W.H. Weinberg
Pacific Northwest Laboratory K.M. Maex University of California
Richland, WA 99352, USA IMEC vzw Santa Barbara, CA 93106, USA
B-3030 Leuven, Belgium
J. Chikawa J.M. White
Himeji Institute of Technology J.W. Niemantsverdriet University of Texas at Austin
Ako-gun, Hyogo 678-12, Japan Eindhoven University Austin, TX 78712, USA
of Technology
R.B. Hall NL-5600 MB Eindhoven Xie Xide
Exxon Research and Engineering The Netherlands Fudan University
Annandale, NJ 08801, USA Shanghai, China
P.R. Norton
M. Henzler University of Western Ontario J.T. Yates, Jr.
Universitat Hannover London, Ontario N6A 5B7, Canada University of Pittsburgh
D-3000 Hannover 1, Germany Pittsburgh, PA 15260, USA
C.J. Powell
M. Hirose National Institute of Standards M.L. Yu
Hiroshima University and Technology IBM T.J. Watson Research Center
Higashi-Hiroshima 724, Japan Gaithersburg, MD 20899, USA Yorktown Heights, NY 10598, USA
applied
Surface science
A JOURNAL DEVOTED TO APPLIED PHYSICS
AND CHEMISTRY OF SURFACES AND INTERFACES
Editors:
L.C. Feldman, Murray Hill, NJ, USA
J. Nishizawa, Sendai, Japan
W.F. van der Weg, Utrecht, The Netherlands
Master Index to Volumes 62-71
NORTH-HOLLAND
© 1993 Elsevier Science Publishers B.V. All rights reserved
No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means, electronic,
mechanical, photocopying, recording or otherwise, without the written permission of the Publisher, Elsevier Science Publishers
B.V., Copyright & Permissions Department, P.O. Box 521, 1000 AM Amsterdam, The Netherlands.
Special regulations for authors — Upon acceptance of an article by the journal, the author(s) will be asked to transfer copyright of
the article to the Publisher. This transfer will ensure the widest possible dissemination of information.
Special regulations for readers in the USA — This journal has been registered with the Copyright Clearance Center, Inc. Consent is
given for copying of articles for personal or internal use, or for the personal use of specific clients. This consent is given on the
condition that the copier pays through the Center the per-copy fee stated in the code on the first page of each article for copying
beyond that permitted by Sections 107 or 108 of the US Copyright Law. The appropriate fee should be forwarded with a copy of
the first page of the article to the Copyright Clearance Center, Inc., 21 Congress Street, Salem, MA 01970, USA. If no code
appears in an article, the author has not given broad consent to copy and permission to copy must be obtained directly from the
author. All articles published prior to 1981 may be copied for a per-copy fee of US$ 2.25, also payable through the Center. (N.B.
For review journals this fee is US$ 0.20 per copy per page.) This consent does not extend to other kinds of copying, such as for
general distribution, resale, advertising and promotion purposes, or for creating new collective works. Special written permission
must be obtained from the Publisher for such copying.
No responsibility is assumed by the Publisher for any injury and/or damage to persons or property as a matter of products liability,
negligence or otherwise, or from any use or operation of any methods, products, instructions or ideas contained in the material
herein.
Although all advertising material is expected to conform to ethical standards, inclusion in this publication does not constitute a
guarantee or endorsement of the quality or value of such product or of the claims made of it by its manufacturer.
This volume is printed on acid-free paper.
PRINTED IN THE NETHERLANDS
MASTER INDEX
Volumes 62-71
Author index
Subject index
List of terms used in the subject index

Author index to volumes 62-71
Abraham, P., see Benyattou, T. 63 (1993) 197 Allan, G., see Lannoo, M. 65 /66 (19936)7 6
Abraham, P., Y. Monteil, M. Sacilotti, T. Allinger, Th. and J.A. Schaefer, Hydro-
Benyattou, M.A. Garcia, S. Moneger, carbon-based etching of InP 65 /66 (19936)1 4
A. Tabata, R. Landers, J. Morais and Alonso, M., see Chassé, Th. 64 (1993) 329
M. Pitaval, Optical studies of InP /In- Alsina, F., see Peyre, H. 63 (1993) 177
AIlAs/InP interface recombinations 65/66 (1993) 777 Alterovitz, S.A., see Yao, H. 63 (1993) 52
Abstreiter, G., see Geiler, H.D. 63 (1993) 260 Alunovic, M., see Voss, A. 69 (1993) 174
Ache, H.J., see Goschnick, J. 70/71 (1993) 63 Alvarez, J., A.L. Vazquez de Parga, J.J.
Adamchuk, V.K., see Shikin, A.M. 68 (19934)8 1 Hinarejos, J. De la Figuera, E.G.
Addonizio, M.L., see Conte, G. 70/71 (1993) 660 Michel, C. Ocal and R. Miranda,
70/71 (1993) 664
Adriaenssens, G.J., see Demichelis, F. Structural phase transition during
Afonso, C.N., F. Vega, J. Gonzalo and C. heteroepitaxial growth of iron sili-
Zaldo, Lithium niobate films grown cides on Si(111) 70/71 (1993) 578
69 (19931)4 9
by excimer laser deposition Aman, C. and L. Holmlid, Desorption
Afonso, C.N., see Téth, Z. 69 (19933)3 0 and emission of potassium Rydberg
Afonso, C.N., see Vega, F. 69 (19934)0 3 atoms and clusters from iron oxide
Aguiar, R., see Sanchez, F. 69 (19932)2 1 catalyst surfaces 62 (1992) 201
70/71 (1993) 94
Aguiar, R., see Sanchez, F. Aman, C. and L. Holmlid, Field ioniza-
67 (1993) 36
Aizawa, T., see Ishizawa, Y. tion of Rydberg alkali states outside
Aizenberg, G.E., P.L. Swart and B.M. iron oxide catalyst surfaces: peaked
Lacquet, Optical characterization of angular distributions of ions 64 (1993) 71
semiconductors containing inhomoge- Amato, G., see Demichelis, F. 70/71 (1993) 664
neous layers 63 (19932)4 9 Ameziane, E.L., see Ijdiyaou, Y. 70/71 (1993) 447
Akahane, T., see Yasui, K. 65/66 (1993) 265 Anderson, T.J., see Fang, J. 70/71 (1993) 701
Akimoto, M., see Okada, K. 65/66 (1993) 758 Andersson, T.G., see Linnarsson, M.K. 70/71 (1993) 40
Akimoto, M., see Ishikawa, K. 70/71 (1993) 691 Andrade, R.F.S., see De Castilho, C.M.C. 67 (1993) 97
Alameh, R., see Borensztein, Y. 65/66 (1993) 735 Andrén, H.-O., see Hu, Q.-H. 67 (1993) 419
Alaoui, M., see Ringeisen, F. 62 (1992) 167 Andreu, J., see Maass, F. 70/71 (1993) 768
Albella, J.M., see Najmi, O. 70/71 (1993) 217 Andritschky, M., see Meng, L. 65 /66 (19932)3 5
Albella, J.M., see Jiménez, C. 70/71 (1993) 475 Andijar, J.L., see Lopez, F. 70/71 (1993) 680
Albers, T., M. Neumann, D. Lipinsky Andijar, J.L., see Campmany, J. 70/71 (1993) 695
and A. Benninghoven, XPS and Angermann, H.-H. and G. Ho6rz, Influ-
SIMS/SNMS measurements on thin ence of sulfur on surface carbon
70/71 (1993) 49
metal oxide layers monolayer formation and graphite
Alfonsetti, R., L. Lozzi, M. Passacan- growth on nickel 70/71 (1993) 163
tando, P. Picozzi and S. Santucci, XPS Anyele, H.T., A.A. Cafolla and C.C.
studies on SiO, thin films 70/71 (1993) 222 Matthai, A study of the electronic
Aliouchouche, A., J. Boulmer, B. Bour- structure and Schottky barriers at re-
guignon, J.-P. Budin, D. Débarre and constructed Sn/Si interfaces 70/71 (1993) 433
A. Desmur, Laser etching of silicon Anzai, M., see Wada, T. 65 /66 (19933)7 6
by chlorine: effect of post-desorption Arabezyk, W., F. Storbeck and HJ.
collisions and chlorine in-diffusion on Miissig, Electron spectroscopy studies
the laser desorption yield 69 (1993) 52 on carbon segregation from a mono-
65/66 (1993) 94
Alkemade, P.F.A., K. Werner, S. Rade- crystalline a-Fe(111) specimen
laar and W.G. Sloof, A fast method Arabczyk, W., Reinterpretation of the
for the simulation of XPS and AES adsorption kinetics data measured by
spectra 70/71 (1993) 24 AES and XPS 68 (1993) 369
Allan, G., see Proot, J.P. 65 /66 (19934)2 3 Arakawa, I., see Hoshino, A. 70/71 (1993) 308
Author index to volumes 62-71
Arbab, M., see Colaianni, M.L. 68 (1993) 467 electron spectroscope studies of Ge
Arena, A., G. Galli, R. Giorgi, A.M. on Ir 67 (1993) 43
Mezzasalma, S. Patane and G. Saitta, Ashkenazi, A., see Zolotoyabko, E. 63 (1993) 126
Optical properties of (AgI),-(Ag,O0- Ashkenazi, A., Y. Komem and I. Lerner,
2B,0;),_, glasses 65/66 (1993) 302 Microstructural and composition-
Arena, C., L. Tarricone, F. Genova and al characterization of TiW/ AI-
65/66 (1993) 746
G. Morello, Temperature depen- (0.8%Si) /T iW/ PtSi/(100)Si
dence analysis of the optical transmis- Atkinson, A. and P.T. Moseley, Thin film
65 /66 (19932)1 2
sion spectra in InGaAs/InP multi electroceramics
quantum well structures 63 (1993) 202 Aubreton, J., see Champeaux, C. 69 (19931)6 9
Arenholz, E., J. Heitz, M. Wagner, D. Aubreton, J., see Champeaux, C. 69 (19933)3 5
69 (19933)5 9
Bauerle, H. Hibst and A. Hagemeyer, Aubreton, J., see Germain, C.
67 (19933)4 2
Laser-induced surface modification Auger, P., see Pareige, P.
and structure formation of polymers 69 (1993) 16 Auger, P., see Danoix, F. 67 (19933)4 8
Aristov, V.Yu., see Le Lay, G. 70/71 (1993) 502 Auret, F.D., see Myburg, G. 70/71 (1993) 511
Armigliato, A., see Vanhellemont, J. 63 (1993) 45 Auret, F.D., see Barnard, W.O. 70/71 (1993) 515
Armigliato, A., see Vanhellemont, J. 63 (1993) 119 Autric, M., see Montagne, J.E. 69 (19931)0 8
69 (1993) 79
Armstrong, S.R., R.D. Hoare, I.M. Povey, Auvert, G., see Boughaba, S.
M.E. Pemble, A. Stafford, A.G. Tay- Avila, R.E., see Pilleux, M.E. 65/66 (1993) 283
70/71 (1993) 447
lor and D.R. Klug, Reflectance Azizan, M., see Ijdiyaou, Y.
anisotropy from (001) GaAs surfaces
during pseudo-ALE growth of GaAs 69 (1993) 46 Baazi, T., E.J. Knystautas and M. Fiset,
Arnaud, Y.P., Surface coordination num- Abrasive wear of nitrogen-implanted
ber and surface redox couples on cat- boron-coated Ti-6Al-4V and tem-
alyst oxides, a new approach of the perature effect on microhardness and
64 (19931)3 3
interpretation of activity and selectiv- sliding friction coefficient
70/71 (1993) 742
ity. I. Interpretation of oxygen ther- Baba, S., see Kinbara, A.
mal desorption spectra 62 (1992) 21 Babonneau, F., see Ingo, G.M. 70/71 (1993) 230
Arnaud, Y.P., Surface coordination num- Babu, S.S., K. Hono and T. Sakurai, AP-
ber and surface redox couples on cat- FIM studies on martensite tempering
alyst oxides, a new approach of the of Fe—C-Si-Mn low alloy steel 67 (1992) 321
interpretation of activity and selectiv- Babu, S.S., K. Hono, R. Okano and T.
ity. II. Experimental and theoretical Sakurai, APFIM studies of some alu-
bases 62 (1992) 37 minum alloys 67 (1993) 361
Arnaud, Y.P., Surface coordination num- Babu, S.S., see Hono, K. 67 (1993) 391
ber and surface redox couples on cat- Badaev, Yu.B., see Morozenko, E.S. 68 (19934)9 1
alyst oxides, a new approach of the Badan, V.E., see Vladimirov, V.V. 65/66 (1993) 1
interpretation of activity and selectiv- Badawi, K.F., A. Naudon and P. Gou-
ity. III. Interpretation of chemical and deau, Residual stress determination
catalytic oxidation reactions on some by X-ray diffraction in tungsten thin
oxides 62 (1992) 47 films 65/66 (1993) 99
Arnott, D.R., A.R. Wilson, A.N. Rider, Badoz, P.A., see Bomchil, G. 65/66 (1993) 394
L.T. Lambrianidis and N.G. Farr, Badzian, A., see Lamaze, G.P. 65/66 (1993) 587
Studies of the degradation of metal- Badzian, T., see Lamaze, G.P. 65/66 (1993) 587
adhesive interfaces with surface anal- Bahners, T., W. Kesting and E. Scholl-
ysis techniques 70/71 (1993) 109 meyer, Designing surface properties
Arvia, A.J., see Egli, W.A. 68 (1993) 583 of textile fibers by UV-laser irradia-
Arvia, A.J., see Vazquez, L. 70/71 (1993) 413 tion 69 (1993) 12
Ascarelli, P. and S. Fontana, Dissimilar Bai, C., T. Hashizume, D. Jeon and T.
grit-size dependence of the diamond Sakurai, Field ion-scanning tunneling
nucleation density on substrate sur- microscope investigation of sodium
face pretreatments 64 (19933)0 7 adsorption on the GaAs(110)1 x 1
Asensi, J.M., see Lopez, F. 70/71 (1993) 68 surface 67 (1993) 252
Asensi, J.M., see Maass, F. 70/71 (1993) 768 Baillieu, F., see Bourouina, T. 65 /66 (1993) 536
Ashfold, M.N.R., see May, P.W. 68 (19932)9 9 Bak, K. and L. Hilaire, Quantitative XPS
Ashino, M., M. Tomitori and O. Nishika- analysis of the oxidation state of
wa, Atom-probe and field emission cerium in Pt-CeO,/AlI,O, catalysts 70/71 (1993) 191