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Anomalous temperature dependence of photoelectron charge and spin mobilities in p+-GaAs PDF

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Anomalous temperature dependence of photoelectron charge and spin mobilities in p+-GaAs. F. Cadiz,∗ D. Paget, and A.C.H. Rowe Physique de la mati`ere condens´ee, Ecole Polytechnique, CNRS, 91128 Palaiseau, France E. Peytavit and S. Arscott Institut d’Electronique, de Micro´electronique et de Nanotechnologie (IEMN), University of Lille, 5 CNRS, Avenue Poincar´e, Cit´e Scientifique, 59652 Villeneuve d’Ascq, France 1 (Dated: June9, 2015) 0 2 Theeffectofanelectricfieldonthespatialchargeandspinprofilesofphotoelectronsinp+-GaAs is studied as a function of lattice and electron temperature. The charge and spin mobilities of n photoelectrons are equal in all conditions and exhibit the well known increase as the temperature a islowered. Itisshownthatthisisrelated mainlytotheelectron statisticsratherthanthemajority J holestatistics. Thisfindingsuggeststhatcurrenttheoreticalmodelsbasedondegeneracyofmajority 8 carriers cannot fully explain theobserved temperaturedependenceof minority carrier mobility. 2 ] Understanding the mechanisms which limit the mi- ensures that recombination at the interface is negligible. l al nority carrier charge mobility µe and spin mobility µs AsshowninFig. 1(a),aHallbarisphotolithographically h in semiconductors is necessary for the correct design of etched into the active layer so that the lattice tempera- - bipolar charge and spin devices. The limiting mecha- ture (T ) dependence ofthe majorityhole concentration s L e nisms are revealed in studies of the temperature depen- and mobility can be measured as shown in Fig. 1(b). m dence of the average momentum relaxation time hτ i= The density of ionized acceptors is only weakly temper- m µ m∗/q where q is the absolute value of the electronic ature dependent for this doping level since the impurity . e at charge and m∗ is the effective mass. Here τm =τm(ε)= band andthe valence band are mergedinto a continuum m a(T)εp is dependent on the electron’s kinetic energy, ε, of states [5, 6]. The hole mobility at room temperature, - and the notation hτmi indicates an average over all elec- µh =202cm2V−1s−1, as well as its ∼TL1/2 temperature d trons. The exponent p depends on the process which dependencebelow100Kareingoodagreementwithpre- n limits the mobility [1] and this energy dependence re- vious reports on similarly doped GaAs [6, 9, 10]. o sults in a temperature dependence of τ given, in the c m nondegenerate case, by Spin-polarized photoelectrons were generated by a [ tightly-focussed circularly-polarizedCW laser excitation 1 (1/e half width of 0.6 µm, energy 1.58 eV) in a setup v τ ∝a(T).T−p (1) described elsewhere [11]. A maximum excitation power m 5 of 0.01 mW produces a non degenerate photoelectron 05 where kB is Boltzmann’s constant and T is the temper- concentration of ∼ 5×1014 cm−3 in the steady state. 2 ature. Te was monitored from the high energy tail of the spa- 0 The electron mobility in p-type GaAs features a com- tially homogenous luminescence spectrum, which is ob- . pletely different temperature dependence than that of tained using a multimode optical fiber placed in the im- 6 majority electrons in n-GaAs for a similar doping level age plane. As shown in Fig. 2(a), taken at a low elec- 0 5 [2–4]. A number of possible reasons for this have been tric field of E = 200 V/cm, Te significantly differs from 1 discussed in the literature, including carrier freezeout at T . Furthermore, Fig. 2(b) shows that without caus- L : highholeconcentrations[5,6],screeningofionizedimpu- ing intervalley transitions [12, 13], T can be increased v e rities [7] and increasing hole degeneracy as temperature by applying higher electric fields. The lines in Fig. i X is lowered [8]. The correct determination of p, and thus 2(b) are predictions based on a simple balance equation r the role and importance of each of these phenomena, re- 3/2k [T (E)−T (0)] = qv Eτ for the power delivered B e e d E a mains uncertain since it is not clear whether the lattice, totheelectrongasbytheelectricfield. Here,T (0)isthe e hole or electron temperature should be used in Eq. 1. electronic temperature at zero electric field, v =µ E is d e Hereweexperimentallymeasurepina3µmthick,car- thedriftvelocityandτ theenergyrelaxationtime. The E bon doped p-GaAs active layer (NA = 1018 cm−3) and data is well explained by an energy independent energy demonstratethecrucialroleofthephotoelectrontemper- relaxationtime ofτ =1.2 ps and τ =1.5ps for initial E E ature,Te inEq. 1. Theinterfacebetweentheactivelayer electron temperatures of Te(0) = 40 K and Te(0) = 92 and the S.I. GaAs substrate is a 50 nm thick GaInP epi- K, respectively. These values are an order of magnitude layerthatconfinesphotoelectronstothe activelayerand larger than values measured at 300 K [12], consistent with a significant decrease of the energy relaxation rate at lower temperatures due to less efficient phonon scat- tering. Note that under similar electric fields, resistivity ∗ [email protected] measurements in the dark show that the hole tempera- 2 FIG.1. (a) SEMimage ofthep-GaAshallbarusedtostudy both minority and majority carrier transport. Also shown is a 3D representation of a measured electron density profile FIG.2. (a)Normalizedluminescencespectrafordifferentlat- when an electric field is applied. (b) Concentration of ion- tice temperatures. Fits of the high energy tail of the spectra ized acceptors and majority hole mobility as a function of (shown by thicker lines) are used to estimate the electronic lattice temperature, as found from resistivity and Hall effect temperature. (b)Measuredelectronictemperatureasafunc- measurements. tion of applied electric field for different values of the elec- tron temperature at zero electric field. The increase of Te a function of E is well explained by simple energy balance ture (T ) remains unchanged and that T ≈ T . This is considerations which assume an energy-independent energy- h h L not surprising since the photogenerated hole concentra- relaxation time of 1.5 ps (dotted line) and 1.2 ps (solid line) for each case. tion is much smaller than N . A The minority carrier mobility µ is determined by e imaging the spatial dependence of the luminescence, whichisproportionaltotheelectronconcentrationn[11]. sity profile yields an estimate for µ . At T = 300 K, e L Fig. 3 shows sections ofthese imagesalong the direction µ = 1560 cm2V−1s−1, in excellent agreement with the e of the electric field for T = 15 K (see movie attached theoretical value of 1643 cm2V−1s−1 at similar doping L as an ancillary file). Drift of the electrons in the applied predicted by Bennett [15] and with the existing experi- electric field leads to a significant change of the profiles mentaldata[2,9,10,16]. Thespinmobilityµ wasmea- s which are well approximatedby the 2-dimensional diffu- sured using a similar approach by placing a circularly- sion result [3] polarized excitation and a quarter wave plate followed by a linear polarizer at the reception, thus yielding the n(x)∝eµeτeExK0 (µeτeE)2+4Deτe x , (2) pisrothfielecoofntcheentsrpaitniocnonofceenletcratrtoionnssof=spni+n−±,nw−i,thwhaeqreuann±- 2D τ "p e e # tization axis along the direction of light excitation [11]. The equation for s is similar to Eq. 2 where D and τ where D and τ are the electron diffusion constant and e e e e arereplacedbytheirspincounterpartsD andτ . Using lifetime, respectively, and K0 is a modified Bessel func- s s the predetermined value of the spin lifetime, τ [14], an tion of the second kind. In a nondegenerate electron s estimation of µ is possible. gas the Einstein relation, D = [k T /q]µ , is valid so s e B e e that the only fitting parameter in Eq. 2 is the µ τ The results aresummarizedinFig. 4. The chargeand e e product. An independent time resolved photolumines- spinmobilitiesasafunctionofT forafixedelectricfield L cence characterization of the sample was made in or- of200V/cmareshowninFig. 4(a). Itisfirstfoundthat der to measure τ as a function of electron temperature µ and µ equal within experimental error at all tem- e e s [14], so that a fit of Eq. 2 to the luminesence inten- peratures,thus verifyingpredictions fora nondegenerate 3 matic increase of mobility, with both electron and spin mobilities being described by a T−4.3 power law. e FIG. 3. The top panel shows the charge density profiles at TL = 15 K for selected values of the electric field. Dotted lines are fits obtained with Eq. 2 that give the µeτe product forthechargedistribution. Thebottompanelshowsthesame profilesatdifferentlattice(andelectronic)temperatureswhen an electric field of 200 V/cm is applied. FIG. 4. (a) The measured electron (solid circles) and spin (open circles) mobilities for an electric field of 200 V/cm as a function of TL. Also shown (open squares) is the variation of Te. (b) The fixed field, variable TL mobility data plotted electrongasintheabsenceofspin-dependentmomentum against Te shows a 1/Te variation at high temperatures, a relaxationmechanisms[17]. ForTL >100K,µe variesas variation which is also found by varyingTe using theelectric Tl−0.78 close to the 1/TL behaviour previously reported field only (i.e. fixed TL, variable field). The solid triangles in this temperature range [2]. This exponent is reduced correspond to TL ≈ 30−40 K and an electricl field varying to -0.25 for T < 100 K. Fig. 4(a) also shows a linear between 200−1300 V/cm. The solid and open squares cor- L variationofTe withTL above100Kfollowedbyaweaker respond to TL = 15 K and a variable electric field (50−800 variation at lower lattice temperatures. V/cm). At low Te a dramatic increase of the mobility is ob- The fixed field, variable T mobility data are again served, with a 1/Te4.3 dependence. The inset of the bottom L panel shows the expected dependence of rH (Eq. 3) on the plotted in Fig. 4(b) (full and open circles), this time as index p in Eq. 1. a function of T . Above 100 K, a clear 1/T dependence e e is again observed, similar to that reported elsewhere [2]. In order to determine separately the temperature de- This suggests that what really determines minority car- pendences of the two factors in Eq. 1, p can be mea- rier mobility is their own statistics, imposed by the light sured using photoconductivity and photoHall measure- excitation energy and power, rather than that of major- ments. Using a defocused laser excitation to ensure that ity carriers. This hypothesis can be tested by measuring thephotoelectronconcentrationishomogeneousoverthe the T dependence of the mobilities when T is varied e e Hall bar, the ratio r = µH/µ of the Hall mobility µH by changing the electric field (see Fig. 2(b)) while T is H e e e L to the drift mobility of minority electrons can be found. held constant. In this fixed T , variable field measure- L p can then be determined using [18] ment, the hole statistics do not change since T = T . h L The results of this measurement are also shown in Fig. 4(b), the solidtriangles correspondingto T ≈35K and Γ(5/2+2p)Γ(5/2) L r = (3) the solid squares corresponding to TL = 15 K. For 100 H [Γ(5/2+p)]2 K < T < 200 K the mobility dependence is well fitted e by a T−1.3 law, close to that obtained in the fixed field, The result is r = 0.95 ± 0.25 at T = 15 K and e H L variable T case (circles). For T < 50 K there is a dra- r = 0.8±0.25 at T = 300 K, in agreement with the L e H L 4 valuesclosetounityobtainedformajorityelectronsinn- and of their screening by valence holes. For T = 10 K h GaAs[19]. Usingthesevaluesandthegraphicalrepresen- the maximum amplitude of the potential fluctuations is tation of Eq. 3 in the inset of Fig. 4(b), p is found to lie oftheorderof40meV[21]andwhilesomeattemptshave betweenapproximately-0.5and0.5,inqualitativeagree- beenmadetoincludetheeffectsofscreeningontransport ment with the predictions of the Brooks-Herring model [8, 20, 22], a complete description including the effect of [20] for screened collisions by charged impurities. The disorder is still out of reach. This work shows that in small value of p implies that the measured temperature developing these models, accounting for the hole distri- dependences are mainly those of the prefactor a(T) in bution alone [8] cannot describe the observed tempera- Eq. 1. ture dependence of the minority electron mobility since The origin of the T dependence of the minority elec- significant variations are measured even when the hole e tron mobility is at present not understood. At the dop- temperature is constant. The inclusion of minority car- ing levels considered here it is probable that the mobil- rierstatistics intheoreticalmodels is thereforenecessary ity is determined by scattering off potential fluctuations tobetterunderstandminoritycarriermobilitiesindoped caused by the random distribution of ionized acceptors semiconductors. [1] R. A. Smith, Semiconductors (Cambridge University [13] N. Okamoto, H. Kurebayashi, T. Trypiniotis, I. Farrer, Press, Cambridge, 1978). D. A. Ritchie, E. Saitoh, J. Sinova, J. Masek, T. Jung- [2] K.Beyzavi, K.Lee, D.M.Kim,M.I.Nathan,K.Wren- wirth, and C. H. W. Barnes, Nature Materials 13, 932 ner,andS.L.Wright,Appl.Phys.Lett58,1268 (1991). (2014). [3] D.Luber,F.Bradley,N.Haegel,M.Talmadge, M.Cole- [14] F.Cadiz,P.Barate,D.Paget,D.Grebenkov,J.P.Korb, man,andT.Boone,Appl.Phys.Lett88,163509(2006). A. C. H. Rowe, T. Amand, S. Arscott, and E. Peytavit, [4] F. Schultes,T. Christian, R. Jones-Albertus, E. Pickett, J. Appl.Phys. 116, 023711 (2014). K. Alberi, B. Fluegel, T. Liu, P. Misra, A. Sukiasyan, [15] H. S. Bennett,J. Appl.Phys.92, 4475 (2002). H.Yuen,et al., Appl. Phys.Lett 103, 242106 (2013). [16] R. K. Ahrenkiel, D. J. Duniavy, D. Greenberg, H. C. [5] S.Kim,C.Son,S.Chung,Y.Park,E.Kim,andS.Min, Schlupmann, Hamaker, and H. F. MacMillan, Appl. Thin Solid Films 310, 63 (1997). Phys. Lett 51, 776 (1987). [6] M. L. Lovejoy, M. R. Melloch, and M. S. Lundstrom, [17] Y. Qi, Z. G. Yu, and M. E. Flatte, Phys. Rev. Lett 96, Appl.Phys.Lett 67, 1101 (1995). 026602 (2006). [7] W. Walukiewicz, J. Lagowki, L. Jastrzebski, and [18] R. S. Popovic, Hall effect devices (Institute of Physics H.Gatos, J. Appl.Phys.50, 5040 (1979). Publishing, Bristol, 2004). [8] T.Kaneto,K.Kim,andM.Littlejohn,Phys.Rev.B47, [19] D.Look,C.E.Stutz,J.R.Sizelove,andK.R.Evans,J. 16257 (1993). Appl. Phys.80, 1913 (1996). [9] C. M. Colomb, S. A. Stockman, S. Varadarajan, and [20] D. Chattopadhyay and H. J. Queisser, Rev. Mod. Phys. G. E. Stillman, Appl.Phys.Lett 60, 65 (1992). 53, 745 (1981). [10] E. S. Harmon, M. L. Lovejoy, and M. R. Melloch, Appl. [21] A.L.Efros, Y.S.Halpern,andB.I.Shklovsky,Proceed- Phys.Lett 63, 536 (1993). ings ofthe International Conference on Physicsof Semi- [11] I. Favorskiy, D. Vu, E. Peytavit, S. Arscott, D. Paget, conductors, Warsaw 1972 (Polish Scientific publishers, and A. C. H.Rowe, Rev.Sci. Instr.81, 103902 (2010). Warsaw, 1972). [12] T. Furuta, H. Taniyama, and M. Tomizawa, J. Appl. [22] D. N. 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