Table Of Content

u} ELSEVIER Analytica Chimica Acta 297 (1994) 469-471 Author Index Adam, A., see Bryant, C.H. 317 M. Adams, F., see Berghmans, P. 27 Application of factor analysis in electron spectroscopic Amstutz, M., see Textor, M. 15 depth profiling on copper oxide 187 Appriou, P., see Groschner, M. 369 Ashino, T. Chae, W.G., see Rhee, D. 377 —, Takada, K. and Hirokawa, K. Combs, R.J., see Bangalore, A.S. 387 Determination of trace amounts of selenium and tellurium Culjak, I. in high-purity iron by electrothermal atomic absorption —, Mlakar, M. and Branica, M. spectrometry after reductive coprecipitation with palla- Synergetic adsorption of the copper—phenanthroline-tri- dium using ascorbic acid 443 butylphosphate complex at a mercury drop electrode 427 Dardenne, P., see Bouveresse, E. 405 Bangalore, A.S. Dessenne, O., see Jenett, H. 285 —, Small, G.W., Combs, R.J., Knapp, R.B. and Kroutil, Dowsett, M.G. R.T. — and Barlow, R.D. Automated detection of methanol vapour by open path Characterization of sharp interfaces and delta doped lay- Fourier transform infrared spectrometry 387 ers in semiconductors using secondary ion mass spectrom- Barlow, R.D., see Dowsett, M.G. 253 etry 253 Berghmans, P. Dozy, E.M., see Niederlander, H.A.G. 349 —, Injuk, J., Van Grieken, R. and Adams, F. Microanalysis of atmospheric particles and fibres by elec- Galan, L., see Morant, C. 179 tron energy loss spectroscopy, electron spectroscopic imag- Garcia-Mesa, J.A. ing and scanning proton microscopy 27 —, Luque de Castrol, M.D. and Valcarcel, M. Blaise, G., see Le Gressus, C. 139 Fibre optic-based detection of the entire sample plug as a Bock, W. straightforward approach to kinetic measurements in —, Gnaser, H. and Oechsner, H. flow-injection systems 313 Secondary-neutral and secondary-ion mass spectrometry Garten, R.P.H. analysis ot TiN-based hard coatings: an assessment of — and Werner, H.W. quantification procedures 277 Trends in applications and strategies in the analysis of thin Bouveresse, E. films, interfaces and surfaces 3 —, Massart, D.L. and Dardenne, P. Garten, R.P.H., see Bubert, H. 187 Calibration transfer across near-infrared spectrometric in- Gnaser, H., see Bock, W. 277 struments using Shenk’s algorithm: effects of different Gooijer, C., see Niederlander, H.A.G. 349 standardisation samples 405 Grallath, E., see Bubert, H. 187 Branica, M., see Culjak, I. 427 Groschner, M. Bruley, J. — and Appriou, P. —, Tanaka, I., Kleebe, H.-J. and Rithle, M. Three-column system for preconcentration and speciation Chemistry of grain boundaries in calcia doped silicon determination of trace metals in natural waters 369 nitride studied by spatially resolved electron energy-loss Grunze, M., see Holldack, K. 125 spectroscopy 97 Bryant, C.H. Hercules, D.M., see Zimmerman, P.A. 301 —, Adam, A., Taylor, D.R. and Rowe, R.C. Hirokawa, K., see Ashino, T. 443 A review of expert systems for chromatography 317 Holldack, K. Bubert, H. — and Grunze, M. —, Korte, M., Garten, R.P.H., Grallath, E. and Wielunski, Recent advances in x-ray photoelectron microscopy 125 470 Author Index / Analytica Chimica Acta 297 (1994) 469-471 Injuk, J., see Berghmans, P. 27 Rhee, D. —, Markovich, R., Chae, W.G., Qiu, X. and Pidgeon, C. Jenett, H. Chromatographic surfaces prepared from lyso phos- —, Luczak, M. and Dessenne, O. phatidylcholine ligands 377 Plasma secondary-neutral and secondary-ion mass spec- Roose, N., see Seibt, E.W. 153 trometry investigations on ceramic /copper powder pellets Rowe, R.C., see Bryant, C.H. 317 285 Rubio, S., see Sicilia, D. 453 Ridenauer, F.G. Karpen, W., see Walther, H.G. 87 Spatially multidimensional secondary ion mass spectrome- Kleebe, H.-J., see Bruley, J. 97 try analysis 197 Knapp, R.B., see Bangalore, A.S. 387 Rihle, M., see Bruley, J. 97 Korte, M., see Bubert, H. 187 Kroutil, R.T., see Bangalore, A.S. 387 Sanz, J.M., see Morant, C. 179 Seibt, E.W. Le Gressus, C. —, Zalar, A. and Roose, N. — and Blaise, G. Electron radiation-induced effects in Auger electron spec- Correlation of insulator properties with electron spectro- troscopic characterization of high-T, superconductors 153 scopic observations 139 Sicilia, D. Lejéek, P. —, Rubio, S. and Pérez-Bendito, D. Characterization of grain boundary segregation in an Fe-Si Micellar effects on reaction kinetics. Part II. Study of the alloy 165 action of dodecyltrimethylammonium bromide on the re- Li, J.-Z. actions between Pyrogallol Red and chromium(VI), vana- —, Pang, X.-Y. and Yu, R.-Q. dium(V) and titanium(IV) 453 Substituted cobalt phthalocyanine complexes as carriers Small, G.W., see Bangalore, A.S. 387 for nitrite-sensitive electrodes 437 Somorjai, G.A., see Weiss, W. 109 Lopez Molinero, A. Starke, U., see Weiss, W. 109 Possibilities for graphic representation of multifactor sim- Stingeder, G. plex optimisation 417 Optimization of secondary ion mass spectrometry for Luczak, M., see Jenett, H. 285 quantitative trace analysis 231 Luque de Castrol, M.D., see Garcia-Mesa, J.A. 313 Takada, K., see Ashino, T. 443 Markovich, R., see Rhee, D. 377 Tanaka, I., see Bruley, J. 97 Massart, D.L., see Bouveresse, E. 405 Taylor, D.R., see Bryant, C.H. 317 Mlakar, M., see Culjak, 1. 427 Textor, M. Morant, C. — and Amstutz, M. —, Galan, L. and Sanz, J.M. Surface analysis of thin films and interfaces in commercial X-ray photoelectron spectroscopic study of the oxidation aluminium products 15 of polycrystalline rhenium by exposure to O, and low energy OF ions 179 Valcdrcel, M., see Garcia-Mesa, J.A. 313 Van den Berg, J. Niederlander, H.A.G. —, Van Oijen, J. and Werner, H.W. —, Nuijens, M.J., Dozy, E.M., Gooijer, C. and Velthorst, Non-destructive analysis of materials and devices by means N.H. of scanning acoustic microscopy 73 Dioxetane chemiluminescence detection in liquid chro- Van Grieken, R., see Berghmans, P. 27 matography based on photosensitized on-line generation Van IJzendoorn, L.J. of singlet molecular oxygen; a thorough examination of High energy ion scattering and recoil spectrometry in experimental parameters and application to polychlori- applied materials science 55 nated biphenyls 349 Van Oijen, J., see Van den Berg, J. 73 Nuijens, M.J., see Niederlander, H.A.G. 349 Velthorst, N.H., see Niederlander, H.A.G. 349 Viefhaus, H. Oechsner, H., see Bock, W. 277 Surface analytical studies on metal surface and interface phenomena 43 Pang, X.-Y., see Li, J.-Z. 437 Pérez-Bendito, D., see Sicilia, D. 453 Walther, H.G. Pidgeon, C., see Rhee, D. 377 — and Karpen, W. Characterization of interfaces by photothermal methods Qiu, X., see Rhee, D. 377 87 Author Index / Analytica Chimica Acta 297 (1994) 469-471 Weiss, W. Yu, R.-Q., see Li, J.-Z. 437 —, Starke, U. and Somorjai, G.A. Low energy electrons (LEED, STM and HREELS) in the Zalar, A., see Seibt, E.W. 153 microanalytical characterization of complex surface struc- Zimmerman, P.A. tures 109 — and Hercules, D.M. Werner, H.W., see Garten, R.P.H. 3 Time-of-flight secondary ion mass spectrometry of poly(al- Werner, H.W., see Van den Berg, J. 73 kyl acrylates): comparison with poly(alkyl methacrylates) Wielunski, M., see Bubert, H. 187 301