Synthesis Lectures on Engineering, Science, and Technology Zoubeida Hafdi Amorphous Silicon Thin-Film Transistors Operation, Modelling and Applications Synthesis Lectures on Engineering, Science, and Technology The focus of this series is general topics, and applications about, and for, engineers and scientists on a wide array of applications, methods and advances. Most titles cover subjects such as professional development, education, and study skills, as well as basic introductory undergraduate material and other topics appropriate for a broader and less technical audience. Zoubeida Hafdi Amorphous Silicon Thin-Film Transistors Operation, Modelling and Applications Zoubeida Hafdi Département du Tronc Commun en Sciences et Technologie, Faculty of Technology Batna 2 University Batna, Algeria ISSN 2690-0300 ISSN 2690-0327 (electronic) Synthesis Lectures on Engineering, Science, and Technology ISBN 978-3-031-24792-7 ISBN 978-3-031-24793-4 (eBook) https://doi.org/10.1007/978-3-031-24793-4 © The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerland AG 2023 This work is subject to copyright. All rights are solely and exclusively licensed by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors, and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, expressed or implied, with respect to the material contained herein or for any errors or omissions that may have been made. The publisher remains neutral with regard to jurisdictional claims in published maps and institutional affiliations. This Springer imprint is published by the registered company Springer Nature Switzerland AG The registered company address is: Gewerbestrasse 11, 6330 Cham, Switzerland To the memory of my Parents To Noureddine Nabti; inspiring husband, good friend and source of perpetual patience Preface Amorphous silicon material has imposed itself as a basic part of a mature technology for several years to date. Amorphous silicon technology facilitated to the highest degree the control of amorphous silicon-based thin-film transistor electronic characteristics. This improvement is due to the fabrication reproducibility and uniformity over large area of amorphous silicon components and display backplanes which acted in favor of the expand- ing of this technology. This is also owed to the low-cost fabrication and the scalability to larger-sized substrates. At the device level and in parallel to manufacturing issues, models are to be developed and implementation means are to be thought in such a way that the transistor can overcome the challenges associated to the new and nontraditional future applications, namely those related to flexible electronics. The book fits into this context. It is the essence of several years of work on thin- film transistors based on amorphous silicon from the material level to the circuit one. Effort was focused on basics for physical fundamentals, modeling and simulations as a bridge to practical applications that may extend beyond active matrices and the associated peripheral circuits. It tries, as far as possible, to help rapidly building ideas from targeted concepts by an emphasis on acquisition of basic, general and technical knowledge. It also recalls modeling and simulation as important concerns for integrated circuit design. It exposes at what extent simulation may reveal the implemented model accuracy and its aptitude to predict devices and circuits behavior before the manufacturing phase. Besides, some optimization design practices and strategies to build reliable circuits are highlighted. The book is at the same time introductory, undergraduate, graduate and continuing education textbook since it provides information at many levels beginning by basics and fundamentals at the material level to advanced information for device and circuit design. It has the objective to give the basic principles that the reader needs to know about amorphous silicon material and amorphous silicon-based transistors. It is appro- priate for undergraduate and graduate students, circuit simulators developers, integrated circuits designers and manufacturers, as well as everyone engaged in work on large area integrated circuit technologies, photovoltaics and low-cost applications and would like to have introductory concepts in amorphous silicon technology. vii viii Preface The required background falls under the theme of component and integrated cir- cuit physics, design and fabrication. This involves knowledge on advances and design of application-specific circuits, semiconductor technology and characterization, and design aids for the control of the design flows for amorphous silicon-based circuit implementation. Along with principles, the proposed book is thought to be a vehicle of simplicity as it enhances simple and expressive modeling of a-Si:H TFTs. Effort is made to make the content clear and simple enough to be understood by the reader. Model fundamentals are first detailed to allow accurate and fast device simulation and characterization, and then, some basic a-Si:H TFT applications for digital and high-voltage generation circuit design are covered. Constantine, Algeria Zoubeida Hafdi 2022 Acknowledgements The author is very thankful to the following organizations for their permission obtained for material she has previously published: Organization Journals, Proceedings… Elsevier B.V. Open access Physics Procedia IDOSI Publications World Applied Sciences Journal Institute of Electrical and Electronics IEEE Proceedings Engineers (IEEE) The Japan Society of Applied Physics Japanese Journal of Applied Physics The Society of Digital Information and International Conference on Digital Information: Wireless Communications (SDIWC) Processing, Electronics, and Wireless Communications, Proc. The author is also grateful to Doctor Nelva Nely Almanza Ortega from the Tecnológico Nacional de México/IT de Tlalnepantla for her constant support. Constantine, Algeria Zoubeida Hafdi 2022 [email protected] ix Contents 1 Introduction ......................................................... 1 References ........................................................... 8 2 Hydrogenated Amorphous Silicon Thin-Film Transistors ................ 11 2.1 Introduction .................................................... 11 2.2 Amorphous Silicon and a-Si:H TFTs .............................. 12 2.3 Silicon Nitride .................................................. 14 2.4 Thin-Film Transistor Structures ................................... 14 2.5 Thin-Film Transistor Materials .................................... 15 2.6 a-Si:H TFTs Performance Requirements ........................... 16 2.7 a-Si:H TFT Operation ........................................... 17 2.7.1 Subthreshold or Weak Accumulation Regime ................. 18 2.7.2 Above Threshold or High Accumulation Regime ............. 18 2.7.3 Transitional Regime ....................................... 18 2.7.4 Crystalline-Like Regime ................................... 19 References ........................................................... 19 3 Amorphous Silicon-Based MIS Structure ............................... 23 3.1 Introduction .................................................... 23 3.2 Density of States in the Amorphous Silicon ........................ 24 3.3 Band Diagram .................................................. 25 3.4 Charge Densities ................................................ 26 3.4.1 Density of Free Electrons .................................. 26 3.4.2 Charge Density in the Deep Localized States ................. 26 3.4.3 Charge Density in Tail Localized States ..................... 28 3.5 MIS Structure DC Analysis ...................................... 29 3.5.1 Assumptions and Calculation Principle ...................... 29 3.5.2 Poisson Equation ......................................... 29 3.5.3 Potential Equilibrium ...................................... 30 xi