A Journal of Statistics for the Physical Chemical and Engineering Sciences Technometrics 2000: Vol 42 Index & Table of Contents

7 Pages·2000·2.6 MB·English

TECHNOMETRICS
CONTENTS OF VOLUME 42
Numbers 165-168
Articles 1, 111, 227, 329 Index to Volume 42
Book Reviews .223, 307, 425 Articles, by Author... re
Editorial Collaborators Books Reviewed, by Author
Book Reviewers
INDEX TO VOLUME 42 (2000)
Articles, by Author
Atkinson, Anthony C. (see Riani, Marco) Huzurbazar, Aparna V., “Modeling and Analysis of Engi-
Balasooriya, Uditha, Saw, Sutaip L. C., and Gadag, Veeresh, neering Systems Data Using Flowgraph Models,” 300
“Progressively Censored Reliability Sampling Plans for Jeng, Shuen-Lin, and Meeker, William Q., “Comparisons of
the Weibull Distribution,” 160 Approximate Confidence Interval Procedures for Type I
Beckman, R. J. (see McKay, M. D.) Censored Data,” 135
Bedrick, Edward J., “Checking for Lack of Fit in Linear Jiang, Wei, Tsui, Kwok-Leung, and Woodall, William H.,
Models With Parametric Variance Functions,” 227 “A New SPC Monitoring Method: The ARMA Chart,”
399
Box, G. E. P., and Hunter, J. S., “The 2' P Fractional Fac-
torial Designs Part I,” 28 Kafadar, Karen, “Forty Years of Technometrics: Past,
Carter, Walter H. (see Kuhn, Andrew M.) Present, and Future,” 2
Kennard, Robert W. (see Hoerl, Arthur E.)
Cohen, Ayala (see Shmueli, Galit)
Kuhn, Andrew M., Carter, Walter H., and Myers, Raymond
Conover, W. J. (see McKay, M. D.)
H., “Incorporating Noise Factors Into Experiments With
Cook, R. Dennis, “Detection of Influential Observation in
Censored Data,” 376
Linear Regression,” 65; Discussion of Riani, Marco, and
Kulkarni, Pandurang M., and Feiveson, Alan H., “Relia-
Atkinson, Anthony C., 395
bility of Space-Shuttle Pressure Vessels With Random
Cressie, N. (see Huang, H.-C.)
Batch Effects,” 332
Crosier, Ronald B. (see Lucas, James M.)
Lawless, Jerry, “Introduction to Two Classics in Reliability
Doganaksoy, Necip, and Schmee, Josef, “Practical Aspects
Theory,” 5
of Corrected Likelihood Ratio Confidence Intervals: A
Li, William, and Nachtsheim, Christopher J., “Model Ro-
Discussion of Jeng-Meeker and Wong-Wu,” 156
bust Factorial Designs,” 345
Fang, Kai-Tai, Lin, Dennis K. J., Winker, Peter, and Zhang,
Lin, Dennis K. J. (see Fang, Kai-Tai)
Yong, “Uniform Design: Theory and Application,” 237
Liu, Chuanhai, and Sun, Don X., “Analysis of Interval-
Feiveson, Alan H. (see Kulkarni, Pandurang M.)
Censored Data From Fractionated Experiments Using
Furnival, George M., and Wilson, Robert W., Jr., “Regres-
Covariance Adjustment,” 353
sions by Leaps and Bounds,” 69
Lucas, James M., and Crosier, Ronald B., “Fast Initial Re-
Gadag, Veeresh (see Balasooriya, Uditha)
sponse for CUSUM Quality-Control Schemes: Give Your
Ge, Nanxiang (see Thomas, Edward V.) CUSUM a Head Start,” 102
Gunst, Richard F., “Classical Studies That Revolutionized Luceno, Alberto, and Puig-Pey, Jaime, “Evaluation of the
the Practice of Regression Analysis,” 62 Run-Length Probability Distribution for CUSUM Charts:
Henderson, Robin (see Morton-Jones, Tony) Assessing Chart Performance,” 411
Hoerl, Arthur E., and Kennard, Robert W., “Ridge Regres- Makis, Viliam (see Yang, Jiangbin)
sion: Biased Estimation for Nonorthogonal Problems,” 80
Mallows, C. L., “Some Comments on Cp,” 87
Huang, H.-C., and Cressie, N., “Deterministic/Stochastic McKay, M. D., Beckman, R. J., and Conover, W. J., “A
Wavelet Decomposition for Recovery of Signal From Comparison of Three Methods for Selecting Values of
Noisy Data,” 262 Input Variables in the Analysis of Output From a Com-
Hunter, J. S. (see Box, G. E. P.) puter Code,” 55
Hunter, J. Stuart, “Foreword: The Enduring Tradition of McKean, Joseph W., and Sheather, Simon J., “Partial Resid-
Technometrics,” | ual Plots Based on Robust Fits,” 249
TECHNOMETRICS
CONTENTS OF VOLUME 42
Numbers 165-168
Articles 1, 111, 227, 329 Index to Volume 42
Book Reviews .223, 307, 425 Articles, by Author... re
Editorial Collaborators Books Reviewed, by Author
Book Reviewers
INDEX TO VOLUME 42 (2000)
Articles, by Author
Atkinson, Anthony C. (see Riani, Marco) Huzurbazar, Aparna V., “Modeling and Analysis of Engi-
Balasooriya, Uditha, Saw, Sutaip L. C., and Gadag, Veeresh, neering Systems Data Using Flowgraph Models,” 300
“Progressively Censored Reliability Sampling Plans for Jeng, Shuen-Lin, and Meeker, William Q., “Comparisons of
the Weibull Distribution,” 160 Approximate Confidence Interval Procedures for Type I
Beckman, R. J. (see McKay, M. D.) Censored Data,” 135
Bedrick, Edward J., “Checking for Lack of Fit in Linear Jiang, Wei, Tsui, Kwok-Leung, and Woodall, William H.,
Models With Parametric Variance Functions,” 227 “A New SPC Monitoring Method: The ARMA Chart,”
399
Box, G. E. P., and Hunter, J. S., “The 2' P Fractional Fac-
torial Designs Part I,” 28 Kafadar, Karen, “Forty Years of Technometrics: Past,
Carter, Walter H. (see Kuhn, Andrew M.) Present, and Future,” 2
Kennard, Robert W. (see Hoerl, Arthur E.)
Cohen, Ayala (see Shmueli, Galit)
Kuhn, Andrew M., Carter, Walter H., and Myers, Raymond
Conover, W. J. (see McKay, M. D.)
H., “Incorporating Noise Factors Into Experiments With
Cook, R. Dennis, “Detection of Influential Observation in
Censored Data,” 376
Linear Regression,” 65; Discussion of Riani, Marco, and
Kulkarni, Pandurang M., and Feiveson, Alan H., “Relia-
Atkinson, Anthony C., 395
bility of Space-Shuttle Pressure Vessels With Random
Cressie, N. (see Huang, H.-C.)
Batch Effects,” 332
Crosier, Ronald B. (see Lucas, James M.)
Lawless, Jerry, “Introduction to Two Classics in Reliability
Doganaksoy, Necip, and Schmee, Josef, “Practical Aspects
Theory,” 5
of Corrected Likelihood Ratio Confidence Intervals: A
Li, William, and Nachtsheim, Christopher J., “Model Ro-
Discussion of Jeng-Meeker and Wong-Wu,” 156
bust Factorial Designs,” 345
Fang, Kai-Tai, Lin, Dennis K. J., Winker, Peter, and Zhang,
Lin, Dennis K. J. (see Fang, Kai-Tai)
Yong, “Uniform Design: Theory and Application,” 237
Liu, Chuanhai, and Sun, Don X., “Analysis of Interval-
Feiveson, Alan H. (see Kulkarni, Pandurang M.)
Censored Data From Fractionated Experiments Using
Furnival, George M., and Wilson, Robert W., Jr., “Regres-
Covariance Adjustment,” 353
sions by Leaps and Bounds,” 69
Lucas, James M., and Crosier, Ronald B., “Fast Initial Re-
Gadag, Veeresh (see Balasooriya, Uditha)
sponse for CUSUM Quality-Control Schemes: Give Your
Ge, Nanxiang (see Thomas, Edward V.) CUSUM a Head Start,” 102
Gunst, Richard F., “Classical Studies That Revolutionized Luceno, Alberto, and Puig-Pey, Jaime, “Evaluation of the
the Practice of Regression Analysis,” 62 Run-Length Probability Distribution for CUSUM Charts:
Henderson, Robin (see Morton-Jones, Tony) Assessing Chart Performance,” 411
Hoerl, Arthur E., and Kennard, Robert W., “Ridge Regres- Makis, Viliam (see Yang, Jiangbin)
sion: Biased Estimation for Nonorthogonal Problems,” 80
Mallows, C. L., “Some Comments on Cp,” 87
Huang, H.-C., and Cressie, N., “Deterministic/Stochastic McKay, M. D., Beckman, R. J., and Conover, W. J., “A
Wavelet Decomposition for Recovery of Signal From Comparison of Three Methods for Selecting Values of
Noisy Data,” 262 Input Variables in the Analysis of Output From a Com-
Hunter, J. S. (see Box, G. E. P.) puter Code,” 55
Hunter, J. Stuart, “Foreword: The Enduring Tradition of McKean, Joseph W., and Sheather, Simon J., “Partial Resid-
Technometrics,” | ual Plots Based on Robust Fits,” 249
INDEX TO VOLUME 42
Mee, Robert W., and Peralta, Marta, “Semifolding 2*~” De- Sheather, Simon J. (see McKean, Joseph W.)
signs,” 122 Shmueli, Galit, and Cohen, Ayala, “Run-Related Probability
Meeker, William Q. (see Jeng, Shuen-Lin) Functions Applied to Sampling Inspection,” 188
Mitchell, Toby J., “An Algorithm for the Construction of Smyth, Gordon K., “Employing Symmetry Constraints for
*D-Optimal’ Experimental Designs,” 48 Improved Frequency Estimation by Eigenanalysis Meth-
Morris, Max D., “A Class of Three-Level Experimental De- ods,” 277
signs for Response Surface Modeling,” 111; “Three Tech- Steiner, Stefan H., “Statistical Process Control Using Two
nometrics Experimental Design Classics,” 26 Measurement Systems,” 178
Morton-Jones, Tony, and Henderson, Robin, “Generalized Stephens, Michael A. (see Puig, Pedro)
Least Squares With Ignored Errors in Variables,” 366 Sun, Don X. (see Liu, Chuanhai)
Myers, Raymond H. (see Kuhn, Andrew M.) Thomas, Edward V., and Ge, Nanxiang, “Development of
Nachtsheim, Christopher J. (see Li, William) Robust Multivariate Calibration Models,” 168
Nelson, Wayne, “Theory and Applications of Hazard Plot- Tsui, Kwok-Leung (see Jiang, Wei)
ting for Censored Failure Data,” 12 Vardeman, Stephen B., “Introduction to Two Classics in
Peralta, Marta (see Mee, Robert W.) Statistical Process Control,” 95
Proschan, Frank, “Theoretical Explanation of Observed De- Wilson, Robert W., Jr. (see Furnival, George M.)
creasing Failure Rate,” 7 Winker, Peter (see Fang, Kai-Tai)
Puig, Pedro, and Stephens, Michael A., “Tests of Fit for the Wong, A. C. M., and Wu, J., “Practical Small-Sample
Laplace Distribution, With Applications,” 417 Asymptotics for Distributions Used in Life-Data Anal-
Puig-Pey, Jaime (see Luceno, Alberto) ysis,” 149
Riani, Marco, and Atkinson, Anthony C., “Robust Diagnos- Woodall, William H. (see Jiang, Wei)
tic Data Analysis: Transformations in Regression,” 384 Wu, J. (see Wong, A. C. M.)
Roberts, S. W., “Control Chart Tests Based on Geometric Yang, Jiangbin, and Makis, Viliam, “Dynamic Response of
Moving Averages,” 97 Residuals to External Deviations in a Controlled Produc-
Saw, Sutaip L. C. (see Balasooriya, Uditha) tion Process,” 290
Schmee, Josef (see Doganaksoy, Necip) Zhang, Yong (see Fang, Kai-Tai)
BOOKS REVIEWED, BY AUTHOR
Abdi, Hervé, Valentin, Dominique, and Edelman, Betty, Barnett, Vic, Comparative Statistical Inference, 442
Neural Networks, 432 Barnett, Vic, Stein, Alfred, and Turkman, K. Feridun (edi-
Adler, R., Feldman, R., and Taqqu, M. (editors), A Practical tors), Statistical Aspects of Health and the Environment,
Guide to Heavy Tails, 218 4, 443
Barrentine, Larry B., An Introduction to Design of Experi-
Allison, Paul D., Logistic Regression Using the SAS System,
ments: A Simplified Approach, 309
323
Bennett, Jay (editor), Statistics in Sports, 224
Amsden, Davida M. (see Amsden, Robert T.)
Benteftifa, M. Hafed (see Kurz, Ludwik)
Amsden, Robert T., Butler, Howard E., and Amsden, Davida
Berthold, Michael, and Hand, David J. (editors), /ntelligent
M., SPC Simplified: Practical Steps to Quality, 310
Data Analysis, 442
Anderson, David R. (see Burnham, Kenneth P.)
Bethlehem, Jelke (see Couper, Mick P.)
Anderson, T. W., and Finn, Jeremy D., The New Statistical Bohning, Dankmar, Computer-Assisted Analysis of Mixtures
Analysis of Data, 205 and Applications, 442
Armitage, P., and Colton, T. (editors), Encyclopedia of Bio- Bosq, D., Nonparametric Statistics for Stochastic Processes,
statistics, Six Volumes, 2a22 429
Armstrong, Margaret, Basic Linear Geostatistics, 437 Brandt, Siegmund, Data Analysis: Statistical and Computa-
Atkinson, A. C., Pronzato, L., and Wynn, H. P. (editors), tional Methods for Scientists and Engineers, 312
Brémaud, P., Markov Chains: Gibbs Fields, Monte Carlo
MODA 5—Advances in Model-Oriented Data Analysis
Simulation, and Queues, 438
and Experimental Design, 222
Breyfogle, Forrest W. III, Implementing Six Sigma: Smarter
Aven, Terje, and Jensen, Uwe, Stochastic Models in Relia-
Solutions Using Statistical Methods, 309
bility, 314
Brown, Helen, and Prescott, Robin, Applied Mixed Models
Baker, Reginald P. (see Couper, Mick P.)
in Medicine, 442
Balakrishnan, N., and Rao, C. R. (editors), Handbook
Burlew, Michele M., SAS Macro Programming Made Easy,
of Statistics 16: Order Statistics—Theory and Meth- 221
ods, 445; Handbook of Statistics 17: Order Statistics— Burnham, Kenneth P., and Anderson, David R., Model Se-
Applications, 445 lection and Inference, 319
Banks, David L. (see Kotz, Samuel) Burrill, Claude W. (see Ledolter, Johannes)
Banks, Jerry (editor), Handbook of Simulation, Bushman, Brad J. (see Wang, Morgan C.)
TECHNOMETRICS, NOVEMBER 2000, VOL. 42, NO. 4
450 INDEX TO VOLUME 42
Butler, Howard E. (see Amsden, Robert T.) Gelman, Andrew (see Gatsonis, Constantine)
Buydens, L. M. C. (see Massart, D. L.) Gentle, James E., Random Number Generation and Monte
Carlin, Bradley (see Gatsonis, Constantine) Carlo Methods, 431
Carriquiry, Alicia (see Gatsonis, Constantine) Gettinby, George (see Gardiner, William P.)
Carter, A. D. S., Mechanical Reliability and Design, 207 Ghosh, Subir (editor), Asymptotics, Nonparametrics, Time
Casella, George (see Robert, Christian P.) Series, 325; Multivariate Analysis, Design of Experi-
CETAMA (see Neuilly, Michele) ments, and Survey Sampling, 325
Chakravarty, Sumantra (see Gnendenko, Boris) Ghosh, S., and Rao, C. R. (editors), Handbook of Statistics
Chance, Beth L. (see Rossman, Allan J.) 13: Design and Analysis of Experiments, 219
Cheng, Chi-Lun, and Van Ness, John W., Statistical Regres- Giles, David E. A. (see Ullah, Aman)
sion With Measurement Error, 427 Gnedenko, Boris, Pavlov, Igor, and Ushakov, Igor (Sum-
Chilés, Jean-Paul, and Delfiner, Pierre, Geostatistics, 444 antra Chakravarty, editor), Statistical Reliability Engi-
Chow, Shein-Chung, and Liu, Jen-Pei (editors), Design and neering, 315
Analysis of Animal Studies in Pharmaceutical Develop- Good, Phillip I., Resampling Methods: A Practical Guide to
ment, 223 Data Analysis, 311
Clark, Cynthia Z. F. (see Couper, Mick P.) Goovaerts, Pierre, Geostatistics for Natural Resources Eval-
Colton, T. (see Armitage, P.) uation, 437
Conover, W. J., Practical Nonparametric Statistics, 317 Grahn, Hans (see Geladi, Paul)
Cook, R. Dennis, and Weisberg, Sanford, Applied Regres- Hamilton, Lawrence C., Statistics With STATA 5, 441
sion Including Computing and Graphics, 426 Hand, David J. (see Berthold, Michael)
Couper, Mick P., Baker, Reginald P., Bethlehem, Jelke, Harrington, H. James, Hoffherr, Glen D., and Reid, Robert
Clark, Cynthia Z. F., Martin, Jean, Nicholls, William L. P., Jr., Statistical Analysis Simplified, 205
II, and O’Reilly, James M., Computer Assisted Survey In- Hedayat, A. S., Sloane, N. J. A., and Stufken, John, Orthog-
formation Collection, 224 onal Arrays: Theory and Applications, 440
Cowan, Glen, Statistical Data Analysis, 311 Heldt, John J., Quality Sampling and Reliability: New Uses
Davison, A. C., and Hinkley, D. V., Bootstrap Methods and for the Poisson Distribution, 314
Their Application, 216 Herrman, Douglas J. (see Sirken, Monroe G.)
De Jong, S. (see Massart, D. L.) Hicks, Charles R.., and Turner, Kenneth V., Jr., Fundamental
Dean, Angela, and Voss, Daniel, Design and Analysis of Concepts in the Design of Experiments, 325
Experiments, 308 Hinkley, D. V. (see Davison, A. C.)
Delfiner, Pierre (see Chiles, Jean-Paul) Hochberg, Yosef (see Westfall, Peter H.)
Diebold, Francis X., Elements of Forecasting, 318 Hoftherr, Glen D. (see Harrington, H. James)
Edelman, Betty (see Abdi, Herve) Hohn, Michael Edward, Geostatistics and Petroleum Geol-
Efromovich, Sam, Nonparametric Curve Estimation: Meth- ORY, 444
ods, Theory, and Applications, 429 Hollander, Myles, and Wolfe, Douglas A., Nonparametric
Eubank, Randall L., Nonparametric Regression and Spline Statistical Methods, 217
Smoothing, 318 Icenogle, Marjorie L. (see Zimmerman, Steven M.)
Evans, James R., and Olson, David L., Introduction to Sim- lonescu, D. C., and Limnios, N. (editors), Statistical and
ulation and Risk Analysis, 220 Probabilistic Models in Reliability, 325
Farebrother, Richard William, Fitting Linear Relationships: Jensen, Uwe (see Aven, Terje)
A History of the Calculus of Observations 1750-1900, Johnson, Dallas E., Applied Multivariate Methods for Data
abe
3 Analysis, 211
Feldman, R. (see Adler, R.) Kales, Paul, Reliability for Technology, Engineering, and
Fine, Terrence L., Feedforward Neural Network Methodol- Management, 207
ogy, 432 Kass, Robert E. (see Gatsonis, Constantine)
Finn, Jeremy D. (see Anderson, T. W.) Kay, J. W., and Titterington, D. M. (editors), Statistics and
Gad, Shayne C., Statistics and Experimental Design for Tox- Neural Networks, 443
i ologists, 443 Khattree, Ravindra, and Naik, Dayanand N., Applied Mul-
Gamerman, Dani, Markov Chain Monte Carlo, 216 tivariate Statistics With SAS Software, 324
Gardiner, William P., and Gettinby, George, Experimen- Khuri, André I., Mathew, Thomas, and Sinha, Bimal K.,
tal Design Techniques in Statistical Practice: A Practical Statistical Tests for Mixed Linear Models, £14
Software-based Approach, 209 Koller, Glenn, Risk Assessment and Decision Making in
Gatsonis, Constantine, Kass, Robert E., Carlin, Bradley, Business and Industry: A Practical Guide, 217
Carriquiry, Alicia, Gelman, Andrew, Verdinelli, Isabella, Kotz, Samuel, and Lovelace, Cynthia R., Process Capability
and West, Mike (editors), Case Studies in Bayesian Statis- Indices in Theory and Practice, 206
tics, Vol. IV, 327 Kotz, Samuel, Read, Campbell B., and Banks, David L. (ed-
Geladi, Paul, and Grahn, Hans, Multivariate Image Analysis, itors), Encyclopedia of Statistical Sciences, Update Vol-
211 ume 3, 325
TECHNOMETRICS, NOVEMBER 2000, VOL. 42, NO. 4
INDEX TO VOLUME 42
Krzanowski, Wojtek J., An Introduction to Statistical Mod- Pronzato, L. (see Atkinson, A. C.)
elling, 435 Pyzdek, Thomas, The Complete Guide to Six Sigma, 441
Kurz, Ludwik, and Benteftifa, M. Hafed, Analysis of Vari- Rao, C. R. (see Balakrishnan, N.; Ghosh, S.; Maddala, G. S.)
ance in Statistical Image Processing, 212 Read, Campbell B. (see Kotz, Samuel)
Lange, Kenneth, Numerical Analysis for Statisticians, 322 Reid, Robert P., Jr. (see Harrington, H. James)
Le, Chap T., Applied Categorial Analysis, 214 Robert, Christian P., and Casella, George, Monte Carlo Sta-
Ledolter, Johannes, and Burrill, Claude W., Statistical Qual- tistical Methods, 430
ity Control: Strategies and Tools for Continual Improve- Rom, Dror (see Westfall, Peter H.)
ment, 433 Rossman, Allan J., and Chance, Beth L., Workshop Statis-
Lehmann, E. L., Elements of Large-Sample Theory, 224 tics: Discovery With Data and Minitab, 438
Lemeshow, S. (see Levy, P.) Rovers, Frank A. (see McBean, Edward A.)
Levin, Irwin P., Relating Statistics and Experimental De- Rudestam, Kjell Erik (see Newton, Rae R.)
sign, 308 Savage, Sam L., /nsight.xla, 221
Levine, David M. (see Sincich, Terry) Schafer, J. L., Analysis of Incomplete Multivariate
Levy, P., and Lemeshow, S., Sampling of Populations, 326 Data, 213
Lewi, P. J. (see Massart, D. L.) Schechter, Susan (see Sirken, Monroe G.)
Lewis, Gareth A., Mathieu, Didier, and Phan-Tan-Luu, Schwarz, Norbert (see Sirken, Monroe G.)
Roger, Pharmaceutical Experimental Design, 222 Selvin, Steve, Modern Applied Biostatistical Methods Using
Limnios, N. (see lonescu, D. C.) S-Plus, 221
Liu, Jen-Pei (see Chow, Shein-Chung) Sennott, Linn I., Stochastic Dynamic Programming and the
Control of Queueing Systems, 321
Lloyd, Chris J., Statistical Analysis of Categorical Data, 313
Seshadri, V., The Inverse Gaussian Distribution, 436
Loader, Clive, Local Regression and Likelihood, 428
Shafer, Glenn, The Art of Causal Conjecture, 321
Lohr, Sharon L., Sampling: Design and Analysis, 223
Shoukri, M. M., and Pause, C. A., Statistical Methods for
Lovelace, Cynthia R. (see Kotz, Samuel)
Health Sciences, 326
Maddala, G. S.., and Rao, C. R. (editors), Handbook of
Sincich, Terry, Levine, David M., and Stephan, David, Prac-
Statistics 15: Robust Inference, 443
tical Statistics by Example Using Microsoft Excel, 322
Martin, Jean (see Couper, Mick P.)
Sinha, Bimal K. (see Khuri, André I.)
Massart, D. L., Vandeginste, B. G. M., Buydens, L. M. C.,
Sirken, Monroe G., Herrman, Douglas J., Schechter, Su-
De Jong, S., Lewi, P. J., and Smeyers-Verbeke, J., Hand-
san, Schwarz, Norbert, Tanur, Judith M., and Tourangeau,
book of Chemometrics and Qualimetrics, Part B, 218
Roger (editors), Cognition and Survey Recognition, 326
Mathew, Thomas (see Khuri, André I.)
Sloane, N. J. A. (see Hedayat, A. S.)
Mathieu, Didier (see Lewis, Gareth A.)
Smeyers- Verbeke, J. (see Massart, D. L.)
McBean, Edward A., and Rovers, Frank A., Statistical Pro-
Smith, Gerald F., Quality Problem Solving, 211
cedures for Analysis of Environmental Monitoring Data
Smith, Gerald M., Statistical Process Control and Quality
and Risk Assessment, 220
Improvement, 209
McQuarrie, Allan D. R., and Tsai, Chih-Ling, Regression
Sprent, Peter, Data Driven Statistical Methods, 218
and Time Series Model Selection, 214
Stein, Alfred (see Barnett, Vic)
Metcalfe, Andrew V., Statistics in Civil Engineering, 210
Stein, Michael L., Interpolation of Spatial Data: Some The-
Montgomery, Douglas C., Design and Analysis of Experi-
ory for Kriging, 436
ments, 208 Stephan, David (see Sincich, Terry)
Naik, Dayanand N. (see Khattree, Ravindra) Stufken, John (see Hedayat, A. S.)
Nelson, Roger B., An Introduction to Copulas, 317
Tanur, Judith M. (see Sirken, Monroe G.)
Neuilly, Michele, and CETAMA, Modelling and Estimation Taqqu, M. (see Adler, R.)
of Measurement Errors, 427 Terrell, George R., Mathematical Statistics, a Unified Intro-
Newton, Rae R., and Rudestam, Kjell Erik, Your Statistical duction, 319
Consultant, 312 Thuraisingham, Bhavani, Data Mining, 327
Nicholls, William L. II (see Couper, Mick P.) Titterington, D. M. (see Kay, J. W.)
Olea, Ricardo A., Geostatistics for Engineers and Earth Sci- Tobias, Randall D. (see Westfall, Peter H.)
entists, 444 Tourangeau, Roger (see Sirken, Monroe G.)
Olson, David L. (see Evans, James R.) Tsai, Chih-Ling (see McQuarrie, Allan D. R.)
O’Reilly, James M. (see Couper, Mick P.) Turkman, K. Feridun (see Barnett, Vic)
Pause, C. A. (see Shoukri, M. M.) Turner, Kenneth V., Jr. (see Hicks, Charles R.)
Pavlov, Igor (see Gnedenko, Boris) Ullah, Aman, and Giles, David E. A., Handbook of Applied
Phan-Tan-Luu, Roger (see Lewis, Gareth A.) Economic Statistics, 223
Polhemus, Neil W., Statistical Analysis Using STAT- Ushakov, Igor (see Gnedenko, Boris)
GRAPHICS Plus, Volume 2: Quality Control and Exper- Valentin, Dominique (see Abdi, Herve)
imental Designs, 323 Van Ness, John W. (see Cheng, Chi-Lun)
Prescott, Robin (see Brown, Helen) Vandeginste, B. G. M. (see Massart, D. L.)
TECHNOMETRICS, NOVEMBER 2000, VOL. 42, NO. 4
452 INDEX TO VOLUME 42
Verdinelli, Isabella (see Gatsonis, Constantine) Wheeler, Donald J., Beyond Capability Confusion, 204
Vidakovic, Brani, Statistical Modeling by Wavelets, 316 Wolfe, Douglas A. (see Hollander, Myles)
Voss, Daniel (see Dean, Angela)
Wolfinger, Russell D. (see Westfall, Peter H.)
Wackernagel, Hans, Multivariate Geostatistics, 220
Wolstenholme, Linda C., Reliability Modelling, 434
Wang, Morgan C., and Bushman, Brad J., Integrating Re-
Woodward, Mark, Epidemiology: Study Design and Data
sults, 324
Analysis, 327
Weisberg, Sanford (see Cook, R. Dennis)
West, Mike (see Gatsonis, Constantine) Wynn, H. P. (see Atkinson, A. C.)
Westfall, Peter H., Tobias, Randall D., Rom, Dror, Wolfin- Zelterman, D., Models for Discrete Data, 313
ger, Russell D., and Hochberg, Yosef, Multiple Compar- Zimmerman, Steven M., and Icenogle, Marjorie L., Statis-
isons and Multiple Tests, 323 tical Quality Control Using Excel, 221
BOOK REVIEWERS
Amidan, Brett, 308 Hoffman, Lorrie L., 433 Qian, Lianfen, 429
Bajorski, Peter, 210 Huang, Peng, 314 Qiu, Peihua, 211
Bakir, Saad T., 318 Huzurbazar, S., and I[pina, Ramirez, José G., 312
Basu, Asit P., 436 Lynne, 440 Ramsey, Philip H., 217
Booth, David E., 213 Ipina, Lynne (see Huzur- Rao, M. B., 432
Borkowf, Craig B., 431 bazar, S.) Rao, M. Bhaskara (see Mu-
Brugger, Richard M., 314 Johnston, Gordon, 207 divarthy, Surekha)
Burr, Tom, 427 Kettaneh, Nouna, 316 Rayens, Bill, 317
Caby, Errol, 214 Kianifard, Farid, 313 Robertson, Roy, 435
Carpenter, Mark, 205 Kim, Hoon, 430 Rumpf, David L., 312
Chaubey, Yogendra P., 311 Kuo, Lynn, 216 Rutledge, Jim, 309
Coburn, Timothy C., 437 Kushary, Debashis, 216 Sarkar, Pradipta, 318
Conklin, Joseph, 205 Magoun, A. Dale, 218 Sartori, David, 209
Cutler, Adele, 432 Maitra, Ranjan, and Sen, Ananda, 315
Dasgupta, Nairanjana, 441 Mathew, Thomas, 212 Shea, Gerald, 217
Deng, Lih- Yuan, 440 Mathew, Thomas (see Stanard, Christopher, 310
Frey, Michael, 321 Maitra, Ranjan) Stephenson, Hal W., 211
Fricker, Ronald D., Jr., 209 Mazumdar, Mainak, 321 Tobias, Paul A., 207
Gardner, Martha M., 309 McComb, Mark A., 218 Von Tress, Mark, 214
George, Larry, 319 Mudivarthy, Surekha, and Vukovinsky, Kimberly, 204
Gray, J. Brian, 426 Rao, M. Bhaskara, 319 Woodard, Roger, 436
Grice, John V., 208 Myers, Donald E., 437 Ye, Kenny Q., 214
Groggel, David J., 317 Nelson, Peter R., 308 Zelterman, Daniel, 322
Gupta, Sudhir, 427 Nemeth, Margaret A., 211 Ziegel, Eric R., 218, 322,
Hapeman, David E., 313 Odencrantz, John, 429, 438 44]
Hill, Jeanne S., 434 Owen, W. Jason, 311 Zimmer, Lora, 206
Pan, Guohua, 428
TECHNOMETRICS, NOVEMBER 2000, VOL. 42, NO. 4