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Thin Solid Films 1998: Vol 317 Table of Contents PDF

7 Pages·1998·1.3 MB·English
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Preview Thin Solid Films 1998: Vol 317 Table of Contents

. ELSEVIER Contents Fundamentals of thin film growth Modelling of thin films vi: semiempirical method G. Bozzolo and J. Ferrante ar mechanics simulation of the diamond nucleati | wi i lik n (OO1) and (111) surtaces UO Zhan » W l Wan Estevea and | Bertran ind nel | epitaxial sputte eC] ited iperlattices studied by molecular dynamic M.H. Carlber rita and E.P. Miinget on (001) WTe, and { € rT etween 350 and 700K Marinkoy ind A. Prodan Ge, layers grow! V ¢ rowth method S. Zaima and Y. Yasuda microstructural changes of embedded silver pi Heilmann and J. Werner Fundamental structure forming phenomena of polycrystalline films and the structure zone models P.B. Barna and M. Adamik vestigationo f the t crystallisationo f Al /a-Ge bilaye yy electrical conductivity measurement 1. Koy armat. A. Sulvok and G. Radnécz mtinuous and semicontinuc D. Novotny and J. Pavlik Surtace melting of aluminum F. de Landa Castillo Alvarado, J.H. Rutkowski, A. Urbaniak charezyk and L. Wojtczak Effects of atomic hydrogen on growth behavior of Si films b i irce molecular beam epitaxy Y. Yasuda, T. Matsuyama, K. Sato, M. Kondo, H. th Growth and characterization of AlAs Sb and InAs .Sb » fils aAs and InAs substrates S. Németh, B. Grieteannds G. Borghs Study of Ni—Al interface formation 4. Arranz and C. Palacio Atomic force microscope study of the early stages and mica C. Morant. L. Soriano. J.F. Trigo and J.M. Sa Columnar structures in polycrystalline thin films developed by M. Adamik. P.B. Barna and |. Tomov Fractal behaviour of the surface of in situ heat treated metal 1. Mojzes. B. Kovacs, M. Schuszter, |. Kun, L. Mate, | nd | avid TEM study of Ag,Se developed by the reaction of polycrys and selenium G. Safran, O. Geszti, G. Radnoczi and P.B. Barna AES and EELS study of aluminium oxide thin films R. Kapsa, |. Stara, D. Zeze, B. Gruzza and V. Matolii Simulation of epitaxial growth of CeO, on YSZ(100) and SrTiO ce position R. Aguiar, F. Sanchez, C. Ferrater, M. Aguialndé M. Var rhin film characterisation and deposition techniques In-situ analysis of partick mntamination | agnetror G.S. Selwyn, C.A. Weiss, F. Sequeda and C. Hua Preparation of TiN. thin films1 u SIT I a wuupled 1 lr. Tanaka and K. Kawabat Preparation a structure of AlW tl \. Tonejyc, M. Milu I the amorpnot f thin film silic duced by PECVD \. Macaric i s, A. Bicl it Fortunat f SiO_N plasma-enhanced che il vapor deposit 1 M. Hernande dc magnetron sputter depositior Job and W.R. Fahrner tress in thin laye imminga, Th.H. dé AES, AFM and TEM Modelling conductioni ONUNUOUS | lf Morris ind | RHEED study of Nb thin film K. MaSek ind V. Matolir Electromigration in gold thin film M. Aguilar Ellipsometrical studies on the Au /Si({111) system K. Miimmiler and P. Wissmann Structure and elastic properties of thin alloyed gold films M.G. Beghi, C.E. Bottani, L.G uzman, T. Lafford, N. Laidar Electrical property on copper thin film with chromium under-layer H. Nakai, K. Fudaba, K. Shinzawa and M. Hashimot > changes of short range ordering in amorphous silicon—carbon all D. Gracin adi¢é, M. Ivanda, Z. Andreié and B. Pratek Spectroellipsometry and electron spectroscopy of porous Si thin films on | ibstrates C. Robert, L. Bideux, B. Gruzza, M. Cadoret, T. Lohner, M. Frie sony! and G. Gergely Oxidation processes in hydrogenated amorphous silicon nitride films depe y ArF laser-induced CVD at low temperatures N. Banerji, J. Serra, P. Gonzalez, S. Chiussi, E. Parada, B. Le vd érez-Amor ructural and electrical characterisations of rapid thermal annealed thu n oxide films on silicon Y.M a 100 and W.K. Choi ation of the optical constants of thermally-evaporated uniform filn f binary chalcogenide glasses using only their reflectior Marquez 4\.M. Bernal-Oliva, j.J. Ruiz-Pés ind R. Jiménez-Garay Structure and photoinduced change As—S—Te bulk glasses and am ayers Mir. Viéek. K eyezchieb, T. Wagner, M. Frumar, Mil. Vicek, A lourek and P.J.S. Ewen transmis 1 ectron microscopy and electron diffraction of thin | yethylene films N Pr pe . Mirror electron microscopy investigations of thin polyethylene film ted ugh voltage Heydenreich, N. Popescu-Pogrion and M High-resolution s¢ dary 1 mass spectrometry depth profiling o rerconducting thin films N.J. Montg ry L. MacManus-Driscoll, D.S. McPhail ter Moeckly and K. Char Yttria-stabilized zirconia obtained by MOCVD: applications G. Garcia, A. Fi as, J. Casado, J. Llibre, M. Mokchah, G. Petot-Er s and Calderet Modulated differential scanning calorimetry experiments on film and bulk (A FF er, S.O. Kasap and M. Vicek Multilayers and magnetic films | pitaxial metal lr. Kad lastic behaviour of Si/Ge superlattices determined by Brillouin lis A. de Bernabé, R. Jiménez, M. Garcia-Hernandez and C. Pret Multilayer coatings by continuous detonation system spray technique P. Gavin, J.M. Bronte, J. Garcia and J.A. 1 Growth and microstructure of sputtered Ag /Cu multilayer Zs. Czigany, |. Kovacs and G. Radnoczi Relaxation mechanism of InGaAs single and graded layer T.¢ Rojas S.I Molina A. Sacedon I Valtuenia I Investigation of ion beam mixing effects in Ta/Pd bilayers deposited or N. Bibi¢é, M. Milosavijevic, D. PeruSko and C. Jeynes Microstructural modification in Co/Cu multilayers prepared by low ene n-assisted deposition N.D. Telling, M.D. Crapper, D.R. Lovett, S.J. Guilfoy! Preparation of a new tetragonal copper oxynitride phase by reactive magnetron sputtering 4. von Richthofen, R. Domnick, R. Cremer and D. Neuschiitz Magnetic vortices and pinning in thin films and superlattice J.1. Martin, M. Vélez. E.M. Gonzalez and J.L. Vicent Control of crystallographic and magnetic texture in dc-magnetron sputtered ¢ on flexible PET substrate H. te Lintelo and P. Lippens putterin coatings |l orque nNons r ind G.B Sn development upermnal S. Veprek ent progress | C. Martinson Phase transformation in sputtered Ti SS illoy J. Musil, V JeZe M. Benda and J Vik Microstructural modification « f TiN deposited M. Zlatanovi Popovic, Z. Bogdanoy Synthesis of iron tungsten alloy on mild steel Y. Isshiki K. Mizumoto and M Hashimot Improvement of tribological properties by ion implantatior 1.1. Ofiate, | Alons« and A. Garcia Depth-profiling via X-Ray photoemission and Auget alloy N. Laidani, ¢ Dorigoni A. Miotello, L. Callan Tribological properties of calcium fluoride-based solid lubricant coatings at high temperatures Y. Pauleau, P. Juliet and R Influence ‘ plasma nitriding on mechanical and tribological propert tf steel with subsequent PVD surface B. Skoric, D. Kaka’ and IBAD SIN unnelling Microsc & Interfaces

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