Thin Solid Films 1992: Vol 214 Index

4 Pages·1992·1.3 MB·English

Thin Solid Films, 214 (1992) 265
Author Index of Volume 214
Achenbach, J. D., 25 lizuka, Y., 104 Racine, G., 110
Akiyama, T., 104 Ikonen, M., 243 Rafaja, D., 169
Aleshin, V. A., 78 Im, H. B., 194, 207 Ristic, Lj., 261
Andersson, K. E., 213 Ishizaki, K., 99 Roos, A., 213
Ashrit, P. V., 219
Jaffrezic-Renault, N., 11 Scaglione, S., 188
Bader, G., 219 Jeanneret, S., 110 Scharff, W., 35
Baik, Y.-J., 123 Jurusik, J., 117 Schmidt, G., 35
Bangert, H., 68 Schreiber, H., 84
Baumvol, I. J. R., 6 Karlsson, S. L., 132 Schreiner, W. H., 6
Benaissa, K., 219 Kazama, H., 104 Shen, X., 235
Bernéde, J. C., 200 Kennedy, R. J., 223 Soares, M. R., 6
Bertran, E., 74 Kim, D. W., 229 Soymie, I., 188
Blatter, A., 63 Kim, H. S., 207 Surowiak, Z., 78
Brickner, W., 84 Kim, J. O., 25 Sviridov, E. V., 78
Burbank, K. A., 254 Kim, S. H., 229
Kim, S. J., 194 ;
Cai, Y., 235 Kindl, D., 92 nig “is
Cho, C. H., 229 Kovanda, J., 92 Touskova 7 9?
Chou, T. C., 48 Kusior, E., 1 Trottier, C. M.. 254
Fg J. S., 229 Truong, V. -V., 219
ui, H., 238 L :
emmetyinen, H., 243
Czapla, A., | Lousa, A., 74 Ullm J.. 35
Czekaj, D., 78 Luo, W., 235 elaine lie
De Rooij, N. F., 110 Valvoda, V., 169
Dionisio, P. H., 6 MMaaanraeif,, NA..,, 201100 Vinzelberg, H., 84
M.S.
Donley, M. S., 156 Vourimaa, E., 243
Dudkevich, V. P., 78 MMaarrigeo,l inA,. AM.. , M.2,0 0 78 Vuorinen, S., 132
nDuveauelt, J.. L., 1c10e Matsushige, K., 99 Vutova, K., 144
y 9 Ve dey McDevitt, N. T., 156
Wahlstrém, M. K., 213
Mizuma, Y., 58
Eun, K. Y., 123 Mladenov, G., 144 Wang, H. F., 68
Wang, W., 238
Moon, J. T., 207
Flori, D., 188 Morsli, M., 200 Wen, L., 68
FFuljoiwyearssu,, DH..,, 26110 4 Mutsukura, N., 58 Wirz, Ch., 63
Nakano, Y., 104 Xue, Q., 164
Gagnaire, A., 110
Nemoto, Y., 150
Girouard, F. E., 219
Gordon, R. G., 175 Nieh, T. G., 48 Yamashina, T., 150
Gregory, O. J., 254 No, K. S., 229 Yang, D., 164
GrieBmann, H., 84 ‘ Yang, N., 235
Ozer, N., 17 Yang, X., 68
Hauert, R., 63
Heinrich, A., 84 Pascual, E., 74 Zabinski, J. S., 156
Hino, T., 150 Pengxun, Y., 44 Zeng, Y., 235
Hirohata, Y., 150 Perrot, H., 110 Zhang, N., 4
Hollinger, G., 110 Perry, A. J., 169 Zhang, X., 164
Horiuchi, T., 99 Piegari, A., 188 Zhang, Z., 235
Hua, Z., 235 Pouzet, J., 200 Zhao, X., 238
Hughes, H. G., 261 Proscia, J., 175 Zhou, E., 238
Thin Solid Films, 214 (1992) 266-268 266
Subject Index of Volume 214
Alloys influence of preparation conditions on the surface roughness of
dielectric stability of oxides formed on NiCrAlY-coated sub- SiC thin films coated on 304 stainless steel, 150
strates, 253 X-ray residual stress measurement in TiN, ZrN and HfN films
Aluminium oxide using the Seemann-Bohlin method, 169
gradient-index optical filter from non-stoichiometric aluminium Computer simulation
oxide films, | modelling of physical processes in ion lithography, 144
phase transformation in chemically vapour-deposited k-alu- two-dimensional finite element method simulation of Vickers
mina, 132 indentation of hardness measurements on TiN-coated
Amorphous materials steel, 68
diamond-like amorphous carbon films prepared by r.f. sputter- Copper
ing in argon, 35 preparation and properties of selenized CulnSe, thin films, 194
in situ phosphorus doped alpha silicon films for micromechani-
cal structures, 261
Deposition processes
Anisotropy laser optical coatings produced by ion beam assisted deposi-
line focus acoustic microscopy to measure anisotropic acoustic
tion, 188
properties of thin films, 25
Depth profiling
Arsenic depositing In,O, films as conductive buffer layers for high-
transmission electron microscopy investigation of the post-nu- temperature YBa,Cu,O,_ , superconducting thin films on
cleation growth structure of amorphous cadmium arsenide
silicon, 235
thin films, 117
Diamond
Auger electron spectroscopy diamond-like amorphous carbon films prepared by r.f. sputter-
study of carbon film on the surface of N+B ion implanted
ing in argon, 35
layer, 164
texture formation of diamond film synthesized in the C-H-—O
system, 123
Boron Dielectric properties
gaseous boronizing with solid boron-yielding agents, 44
dielectric stability of oxides formed on NiCrAlY-
coated substrates, 253
Cadmium
transmission electron microscopy investigation of the post-nu-
Elastic properties
cleation growth structure of amorphous cadmium arsenide
phase transformation and mechanical properties of thin MoSi,
thin films, 117
films produced by sputter deposition, 48
Cadmium sulphide
Electrical properties
preparation and fundamental properties of CdS—CdTe hetero-
electrical and optical properties of LiNbO, 219
junctions, 92
preparation and fundamental properties of CdS—CdTe hetero-
Cadmium telluride
junctions, 92
effects of cell width on the photovoltaic properties of sintered
properties of fluorine doped tin oxide films produced by atmo-
Cd,_ . Zn, S/CdTe solar cells, 207
spheric pressure chemical vapor deposition from te-
preparation and fundamental properties of Cds—CdTe hetero-
tramethyltin, bromotrifluoromehtane and oxygen, 175
junctions, 92
Electronic devices
Carbon
grafting of oxidized silicon nitride insulator for the preparation
diamond-like amorphous carbon films prepared by r.f. sputter-
of ion-sensitive field effect transistor monolayer mem-
ing in argon, 35
branes, 110
mechanical properties of hydrogenated hard carbon films, 58
modelling of physical processes in ion lithography, 144
study of carbon film on the surface of N+B ion implanted
Ellipsometry
layer, 164
ellipsometric characterization of surface oxidation in polycrys-
Chemical vapour deposition
talline Zn,P, thin films, 74
effects of deposition temperature and annealing process on the
Evaporation
superconducting properties of YBa,Cu,O,_ , thin films
Fourier transform IR study on structural evaluation of evapo-
prepared by metal organic chemical vapor deposition, 229
rated organic thin films. Part 1. Changes in molecular |
phase transformation in chemically vapour-deposited k-alu-
orientation of n-paraffins by heat treatment, 99
mina, 132
properties of fluorine doped tin oxide films produced by atmo-
spheric pressure chemical vapor deposition from te- Fourier transform infrared spectroscopy
Fourier transform IR study on structural evaluation of evapo-
tramethyltin, bromotrifluoromethane and oxygen, 175
rated organic thin films. Part 1. Changes in molecular
texture formation of diamond film synthesized in the C-H-O
orientation on n-paraffins by heat treatment, 99
system, 123
Chromium
degradation of CrSi(W)-—O resistive films, 84 Growth mechanism
Coatings transmission electron microscopy investigation of the post-nu- |
dislocations and hardness of hard coatings, 4 cleation growth structure of amorphous cadmium arsenide
high stability titanium nitride based solar control films, 213 thin films, 117
267
Hardness Niobium
dislocations and hardness of hard coatings, 4 electrical and optical properties of LiNbO,, 219
phase transformation and mechanical properties of thin MoSi, Nitrides
films produced by sputter deposition, 48 X-ray residual stress measurement in TiN, ZrN and HfN films
two-dimensional finite element method simulation of Vickers using the Seemann-Bohlin method, 169
indentation of hardness measurements on TiN-coated
steel, 68 Optical coatings
Heterostructures gradient-index optical filter from non-stoichiometric aluminium
preparation and fundamental properties of CdS—CdTe hetero- oxide films, 1
junctions, 92 laser optical coatings produced by ion beam assisted deposi-
tion, 188
Indium Optical properties
preparation and properties of selenized CulnSe, thin films, 194 gradient-index optical filter from non-stoichiometric aluminium
Indium oxide oxide films, |
depositing In,O, films as conductive buffer layers for high- high stability titanium nitride based solar control films, 213
temperature YBa,Cu,O,_ , superconducting thin films on photoinduced charge transfer in rhodamine B/anthracene
silicon, 235 mixed Langmuir-Blodgett multilayers, 243
Inorganic compounds preparation and fundamental properties of CdS—CdTe hetero-
gaseous boronizing with solid boron-yielding agents, 44 junctions, 92
Ion bombardment reproducibility of the coloration processes in TiO, films, 17
laser optical coatings produced by ion beam assisted deposi- Optical spectroscopy
tion, 188 photoinduced charge transfer in rhodamine B/anthracene
modelling of physical processes in ion lithography, 144 mrxed Langmuir-—Blodgett multilayers, 243
Ion implantation preparation and characterization of Langmuir—Blodgett films
study of carbon film on the surface of N+B ion implanted of porphyrins without long alkyl chains, 238
layer, 164 Organic substances
Iron Fourier transform IR study on structural evaluation of evapo-
gaseous boronizing with solid boron-yielding agents, 44 rated organic thin films. Part 1. Changes in molecular
orientation of n-paraffins by heat treatment, 99
Langmuir-— Blodgett films Oxidation
photoinduced charge transfer in rhodamine B/anthracene ellipsometric characterization of surface oxidation in polycrys-
mixed Langmuir—Blodgett multilayers, 243 talline Zn,P, thin films, 74
preparation and characterization of Langmuir-—Blodgett films gaseous boronizing with solid boron-yielding agents, 44
of porphyrins without long alkyl chains, 238 grafting of oxidised silicon nitride insulator for the preparation
Laser ablation of ion-sensitive field effect transistor monolayer mem-
new laser ablation geometry for the production of smooth thin branes, 110
single-layer YBa,Cu,O,_, and multilayer Oxides
YBa,Cu,0,_ , PrBa,Cu,0,_ , films, 223 depositing In203 films as conductive buffer layers for high-tem-
Lead perature YBa2Cu307-x superconducting thin films on sili-
structure and the piezoelectric properties of thin con, 235
Pb(Zrp5 3T ig.4s Wo.01 Cdo.o1 )O3 films, 78 dielectric stability of oxides formed on NiCrAlY-coated sub-
Lead oxide strates, 253
chemical and tribological characterization of PoO- MoS, films effects of deposition temperature and annealing porcess on the
grown by pulsed laser deposition, 156 superconducting properties of YBa,Cu,O,_., thin films
Lithium prepared by metal organic chemical vapor deposition, 229
electrical and optical properties of LiNbO,, 219 electrical and optical properties of LiNbO,, 219
new laser ablation geometry for the production of smooth thin
Mossbauer spectroscopy single-layer YBa,Cu,O,_, and multilayer YBa,Cu,O_,. /
influence of the sputtering parameters on the composition and PrBa,Cu,O,_ , films, 223
crystallinity of tin oxide, 6 structure and the piezoelectric properties of thin
Molybdenum Pb(Z5r3 Toip. 4s Wo.01 Cdo.01)O3 films, 78
|
chemical and tribological characterization of PhO—MoS, films
|
| grown by pulsed laser deposition, 156 Phase transformation
influence of tellurium on the properties of MoSe,_ Te, tex- phase transformation in chemically vapour-deposited k-alu-
tured thin films, 200 mina, 132
phase transformation and mechanical properties of thin MoSi, phase transformation and mechanical properties of thin MoSi2
films produced by sputter deposition, 48 films produced by sputter deposition, 48
Monolayers Phosphorous
preparation and characterization of Langmuir—Blodgett films ellipsometric characterization of surface oxidation in polycrys-
of porphyrins without long alkyl chains, 238 talline Zn,P, thin films, 74
Multilayers Photovoltage
high stability titanium nitride based solar control films, 213 effects of cell width on the photovoltaic properties of sintered
photoinduced charge transfer in rhodamine B/anthracene Cd,._ Zn , S/CdTe solar cells, 207
mixed Langmuir-—Blodgett multilayers, 243 Physical vapour deposition
preparation and characterization of Langmuir—Blodgett films diamond-like amorphous carbon films prepared by r.f. sputter-
of porphyrins without long alkyl chains, 238 ing in argon, 35
influence of preparation conditions on the surface roughness of Surface phonons
SiC thin films coated on 304 stainless steel, 150 line focus acoustic microscopy to measure anisotropic acoustic
influence of the sputtering parameters on the composition and properties of thin films, 25
crystallinity of tin oxide, 6 Surface roughness
Piezoelectric effect influence of preparation conditions on the surface roughness of
structure and the piezoelectric properties of thin SiC thin films coated on 304 stainless steel, 150
Pb( Zr 53 Tig.4s Wo.01 Cdo.01 )O3 films, 78
Tellurium
Resistivity
influence of tellurium on the properties of MoSe,_ , Te, tex-
degradation of CrSi(W)-—0 resistive films, 84
tured thin films, 200
Tin oxide
Selenide
influence of the sputtering parameters on the composition and
preparation and properties of selenized CulnSe, thin films, 194
crystallinity of tin oxide, 6
Selenium
properties of fluorine doped tin oxide films produced by atmo-
influence of tellurium on the properties of MoSe,_ , Te, tex-
spheric pressure chemical vapor deposition from te-
tured thin films, 200
tramethyltin, bromotrifluoromethane and oxygen, 175
Sensors
Titanium
in situ phosphorus doped alpha silicon films for micromechani-
structure and the piezoelectric properties of thin
cal structures, 260
Silicides Pb( Zr 53 Tig.4s Wo.01 Cdo.o1) O3 films, 78
Titanium dioxide
degradation of CrSi(W)-—O resistive films, 84
reproducibility of the coloration processes in TiO, films, 17
phase transformation and mechanical properties of thin MoSi,
Titanium nitride
films produced by sputter deposition, 48
high stability titanium nitride based solar control films, 213
Silicon
two-dimensional finite element method simulation of Vickers
in situ phosphorous doped alpha silicon films for microme-
indentation of hardness measurements on TiN-coated
chanical structures, 260
steel, 68
Silicon carbide
Transmission electron microscopy
influence of preparation conditions on the surface roughness of
transmission electron microscopy investigation of the post-nu-
SiC thin films coated on 304 stainless steel, 150
cleation growth structure of amorphous cadmium arsenide
Silicon nitride
thin films, 117
grafting of oxidized silicon nitride insulator for the preparation
Tribology
of ion-sensitive field effect transistor monolayer mem-
chemical and tribological characterization of PhO—MoS, films
branes, 110
grown by pulsed laser deposition, 156
Solar cells
mechanical properties of hydrogenated hard carbon films, 58
effects of cell width on the photovoltaic properties of sintered
Cd,_ , Zn, S/CdTe solar cells, 207
Sputtering
X-ray diffraction
preparation and properties of selenized CulnSe, thin films, 194
effects of deposition temperature and annealing process on
Stress
the superconducting properties of YBa,Cu,O,_ , thin
mechanical properties of hydrogenated hard carbon films, 58
films prepared by metal organic chemical vapor deposi-
X-ray residual stress measurement in TiN, ZrN and HfN films
tion, 229
using the Seemann-Bohlin method, 169
gaseous boronizing with solid boron-yielding agents, 44
Structural properties
influence of tellurium on the properties of MoSe,_ ,.Te, tex-
texture formation of diamond film synthesized in the C-H-—O
tured thin films, 200
system, 123
influence of the sputtering parameters on the composition and
Sulphides
crystallinity of tin oxide, 6
chemical and tribological characterization of PhO—MoS, films
X-ray residual stress measurement in TiN, ZrN and HfN films
grown by pulsed laser deposition, 156
using the Seemann-Bohlin method, 169
Superconductivity
X-ray photoelectron spectroscopy
depositing In,O, films as conductive buffer layers for high-
chemical and tribological characterization of PbO-MoS, films
temperature YBa,Cu,O,_ ., superconducting thin films on
grown by pulsed laser deposition, 156
silicon, 235
grafting of oxidized silicon nitride insulator for the preparation
effects of deposition temperature and annealing process on the
of ion-sensitive field effect transistor monolayer mem-
superconducting properties of YBa,Cu,O,_ , thin films
branes, 110
prepared by metal organic chemical vapor deposition,
reproducibility of the coloration processes in TiO, films, 17
229
study of carbon film on the surface of N+B ion implanted
new laser ablation geometry for the production of smooth thin
layer, 164
single-layer YBa,Cu,O,_, and multilayer YBa,Cu,0O,_ ,/
PrBa,Cu,0O,_ , films, 223
Surface morphology Zinc
properties of fluorine doped tin oxide films produced by atmo- ellipsometric characterization of surface oxidation in polycrys-
spheric pressure chemical vapor deposition from te- talline Zn,P, thin films, 74
tramethyltin, bromotrifluoromethane and oxygen, 175 Zirconium
texture formation of diamond film synthesized in the C-H—O structure and the piezoelectric properties of thin
system, 123 Pb(Zrp 53 Tip.45 Wo.01 Cdo 01 )O3 films, 78