Surface and Interface Analysis : SIA 2006: Vol 38 Index & Table of Contents

2006·8.2 MB·English

Surface and
SSuUrfR. NF AICntEe rfaceA ND AnaIl.N T2E00R6;FX A3C8E: 177A9N-A1LA7L Y8S5YI S IS BULarAe<
Author Index to Volume 38
Numbers marked in bold refer to Issues for entries belonging to Number 3 March 2006 and Number 4 April 2006.
\balle, L. 954 Baranov, A 23 Boldyryeva, H
Abbadie, A £37 Barcova, K. 13 Botha, J. R.
\be, H. 763 Barczewski, M 98! Bottino, €
\bel, M.-l 21 Bard 6 Bourgeois, S
breu, C. M 9, 851 arnier, V. 106 Bousalem, S
\bu-Ragabah, A. H 1319 aron L8¢ Bowles, C.
\eberhard, M ) 1rOZZi : Boxshall, K.
Agarwal, N Barrer Brack, N
\gudelo, A. C. 243 arrett 125 Brajpuriya, R.
\i ] ] Barrett I LS6 Brevet, A.
Akhtar, M. N 3 :
\lamarguy, D
\l-Bataineh, S. A.
\lexander, M. R.
\lexandrescu, R
\lstrup, J.
Altman, M.S
Amano, K.
An, H
\nderle, M
Anderson, N
André, ].-M
Angel
\ntolini, |
\rdizzone
Arlinghaus, H.I
Armes, S. P. Benyahia, |
Be nZe¢ kkour N
\rsentye\ 2 Berchenk N.N
\sahina, ]
Asakura, K 11 [ ia 952 ippelletti, G
\sante, J. K.O 1249 mn £, 569 arstanjen, H. D
Askin, A
\tiqullah, M
\tzei, D
\udenaert, M.
A
Auger, M.A. 2 rt ). . avretourcgq i
\uroux, 4A 234 Bexell, L 13 erofolini, G. |
\versa, P 1285 Bezdictka, | haa yuYr]
Bagolini, A 3 silek, M 6 hase, G. G.
Baixing, H 111 ilger 168 Chassagnon, R
Bajer, S [2 Bityutskaya, | 2 Chaudhari, S
Baker, M. A
Bally, M.
Bao, C / 2 Bocchi
* WILEY
interScience
Saricaeli
Interface
Pret
Author Index to Volume 38
Chen, S. Diplas, S. Frahm, R.
Chen, 1 Dluhy, R. Franquet, A.
Chen, Y. W. Domashevskaya, I Franta, D.
Chen, Z. Domenichini, B. Fresnais, J.
Chenakin, S. P. Donsanti, F. Fuhrer, K.
Cheng, Z. Dowsett, M. G. Fujii, Y.
Cheraga, H. Drube, W. Fujimoto, T.
Cherifi, S. Dumitrache, F. Fujiwara, Y.
Cheung, Z. L. Dumitriu, E. Fukushima, T.
Chiba, T. Dupin, J. C. Fukutani, K.
ChiozziniG,. Dussault, L. Funnemann, D.
Cho, M. H. Furusawa, I.
Choi, J. Eccles, A. J. Furuta, M.
Ecke, G.
Chuklanov, A. P. Furuya, K. 1527, 1568, 1628, 164
Ber, 5.
Chumnanklang, R.-A.
Ehrhardt, J. J.
Chun, H. Gabouze, N. 805, 808, 811
Eitzinger, B.
Chun, W.-J. Galati, C. 126
El Amarti, A.
Chunili, J. Galtayries, A. 186, 229
Elmers, H. J.
Chuvenkova, O. A. Gancedo, J. R
Elsener, B.
Cifredo, G. Gandubert, A. D.
Enders, O.
Cliff, B. Gao, H.
Ernst, K.-H.
Cognetti, C. Gao, L.
Espinos, J. P.
Cohen, C. Gao, P.
Etzkorn, M.
Comini, E. Gaoyang, Z.
Evans, P. J.
Costil, S. Gautier, J.
Craenenbroeck, J. V. Fadeyev, S. V. Gedeon, O.
Craig, J. H. Gely, M.
Fairley, N.
Cristobal, M. J. Gérardin, P.
Faiz, M.
Cserny, I. Gergely, G.
Fanchenko, S.
Cui, Z. Fanciulli, M Gervasoni, J. L.
Curulli, A. Fantauzzi, M. Gibson, P. N.
Cusma, A. Fares, B. Giessibl, F. J.
Farle, M Girardeau, T.
Daimon, H. Giubertoni, D.
Fedoseenkov, D.
Dambach, S. Fejfar, A Gladkikh, A.
Damlencourt, J.-F. Feng, C. L. Gleiter, H.
Dapor, M. Feng, X. Gobbato, L.
Dastoor, P. C. Ferraris, G. Goncalves, R. P.
David, B. Ferreira, E. A. Gonin, M.
De Caro, T. Fettig, H. Gonzalez, J. M.
De Gryse, R. Fierro, G. Gonzalez-Elipe, A. R.
de Rooij, M. B. Filatova, E. O. Goodwin, A. J.
De Salvo, B. Filip, J. Goossens, V.
de Vries, E.G Filippi, M. Goto, K.
Debiemme-Chouvy, C. Finsy, R. Gottardi, G.
Decker, F. Fischer, A. Gough, J. E.
Deladi, E. L. Fischer-Durand, N. Graat, P>C: J.
Delmotte, F. Fitian, | Gracia, F.
Deng, K. Fletcher, J. S Grandin, H. M.
Deng, Z Flitsch, S. L. Grassini, S.
Depla, D. Foelske, A. Grechkina, M. V.
DeRose, ]. A. Ford, M. J. Grehk, T. M.
Deslouis, C. Forster, C. Griesser, H. J.
Dhlamini, M.S Forster, E. Gr6tzschel, Ii N
Di Luccio, T. Fort, T. Groult, H.
Dietrich, C. Fortas, G Grzemba, B.
Ding, Z. Fotea, C. Guerbous, L.
Ding, Z. J. , 657, 668, 1618 Fox-Rabinovich, G. Guichenuy, M.
Dinjus, E. 194 Fracassi, F. Guillaume, D.
Copyright © 2006 John Wiley & Sons, Ltd. Surf. Interface Anal. 2006; 38: 1779-1785
DOI: 10.1002/sia
Saree:
Interface
PUL NetE
Author Index to Volume 38
Guimon, C Huan, Q. Kam, Y. K.
Guo, F. Hubert, R. Kamiya, Y.
Guo, F.-Z. Hubin, A Kanazawa, I.
Guo, P. S. Hiive, J. Kandasamy, S.
Guo, X. Hwang,C . J. Kang, H. J.
Gurban, S. Kanzari, A.
Guzman de la Mata, B?. Ibach, H. Karpuzov, D
Ibris, N. Kashkarov, V.
Haake, U. Ichimura, K. Katahira, K.
Haarlammert, T. Ichimura, S. Kataura, H.
Habicht, W. Ignatova, V. A Kato, T.
Haier, J. igusa, H. Kato, Y.
Haines, S. R. keda, M. Katou, K.
Haitao, S. keyama, M. Katta, P.
Halter, M. mhoff, I Kawaguchi, M.
Han, M. nari, G. N. Kawashita, M.
Han, S. Ingebrandt, S. Kern, P.
Han, ngo, G. M. Kernig, B.
Haneda, H. Inoue, M. Khan, J. H.
Hansen, K. V. shikawa, Y Kharitonov, S.
Hao, X.-P. shizaki, Y. Khasanov, U.
Hartschuh, A. skhakova, S.S nm m, D.-G.
Hashimoto, M wal, K. im, J.-W
Hashizume, T. [wanami, T m, K.N.
Hassanien, A. [yasu, T. mura, Y.
Haufsler, P. inoshita, T.
Haug, R. J. Jablonski, A. irschner, ].
Haumesser, P.-H. aegerman, W. shimoto, H.
He, A. aeggi, C. KRAAsKk RinAoAvaA,R BM
He, D. ammy, R. ita, K.
He, K. anovec, ] ‘tek, P.
He, X. Jaroenworaluck, A. ein,
Heintz, O. Jean-Jacques, P. ein, L.
Hellw eg, S. enko, M. lementova, M.
Henda, K. erome, | AR AiuRtsAenA, ATR. AA
Hertel, R. Jeurgens, L. P. H Kobayashi, J.
Heun, S. ia, J.-F Kobayashi, K.
Hinder, S. J. Jian, S Kobayashi, Y.
Hirota, K. iang, L. Koéka, J
Hoffmann, P. Jiangrong, Y. Kojima, |
Hohl, M. in, H Kolb, H.-A.
Holgado, I. P in, X. f Komori, F.
Holliger, P. ing, G. Kompocholis, ...
Holloway, P. H. Jiraskova, Y. Kondou, K.
Homma, Y. iricek, P Kondrat, A. B.
Honda, S. Johansson, B. Koo, J.-M.
Honda, T. ones, C. Kosachan, N.
Hong, J. H. onnard, P. Koshikawa, T.
Hong, X. 00,5 -W i Kosinski, A.
Hoque, E. ergensen, M.
Koslowski, B.
Horita, T. ergensen, 5 Kostourou, K.
Hornikova, J. Joy, D. C Kotz, R
Hotta, T. Ozwik, A. Kovaé, J.
Hou, S. ung, S.-B.2 Kovalev, A.
Houssiau, L. uqing, C Kovér, L.
Hrabovska, K. Koyanagi, M.
Hsu, J. C. Y. Kaciulis, S. Krainyukova, N. V.
Hsu, Y. H. Kaganer, E. Krawczyk, M.
Hu, J. Kakimoto, K. Krebs, F. C.
Copyright © 2006 John Wiley & Sons, Ltd
Surface and
Interface
EYEE
Author Index to Volume 38
Kriegeskotte, C. Liu, A.-Z. 3:166 Matrab, T.
Kromker, B. Liu, H. 1028 Matsumura, Y.
Kroon, R. E. Lng, T. 1019 Matsushita, T.
Kruse, N Lam ¥. ]. 1658 Matsutani, T.
Kumamoto, T. Liu, Z. 1078 Matthews, A.
Kupkova, M Lo Jacono, M. 224 Matthieu, H.
Kurokawa, A. Locatelli, A. 1554, 1622 Matui, F.
Kurth, M Locky er, N. P. 1393 Maurice, V.
Kushev, S. B. Long, N. 699 Maury, H.
Kutzner, J. Longo, A. McArthur, S. L.
Kwei, C. M. Lépez, R. Medakovic, D
Lopez Ibanez, R Meixner, A. J.
Laera, S. Loring, J. Melnik, V.
Lagrini, A Losada, R. Mentes, T. O.
Laidani, N. Lowe, C. Menyhard, M.
Lamb, R. N. Lozano, J. 1357 Menzel, D.
Lambert, J. Lui, J. 1010, 1096 Merche, D.
ee
Lattanzi, P. 548 Mertens, M.
Lau, W. M. | 1068 Michel, R.
Lau, Y.-T.R | 1311 Michler, J.
Laurent, H. I 996 Mikhailov, A.
Lavacchi, A. Lucas, S. 1654 Minati, L.
Leang, P. S. | ui, K. M. 957 Ming, N.-B.
Lécaudé, N I ukin, A. N. 828 Minoda, H.
Lee, E. I unacek, ] 413 Mirenghi, L.
Lee, G. uitzenkirchen-Hecht, D. 33( ), 686, 715 Mirji, S. A.
Lee, H.-I. Lyapin, A 45 Mitsuishi, K.
Lee, W.-B. Lysaght, P. S. Mittemeijer, E. J.
Lee, Y. Miyake, S.
Lee, Y. S. Ma, G.-B. Miyakoshi, T.
Legens, C. Ma, Y. Miyanaga, T.
Lehrmann, J. Mackova, A. Mochizuki, H.
Lei, L. Maekawa, A. Mogensen, M.
Lei, S.-B. Mahmoudi, B. Mohai, M.
Lei, Y Makkee, M. Moller, J.
Leinen, D. Maltman, B. Moller, W.
Leintschnig, G. Man, K. L. Moman, A.
Leisten, F. Mangeney, C. Monclus, M. A.
Lejéek, P. Manseri, A. Moon, D. W.
Leone,| Mansilla, C. Morales, F. M.
Lesiak, B. Manso, M. MorettiG,.
Lewis, A. L. Marco, J. F. Morita, K.
Leyland, A. Marco de Lucas, Morita, S.-I.
Li, D.-W. Marcus, P. Morjan, I.
ia Ks: Marie, H. Moslemzadeh, N.
Li, H. Marin, G. B. Moula, Md. G.
Li, H.-M. Markert, C. Moulijn, J. A.
ia}. Markowski, L. Mrzel, A.
Li, K. 1328 Marlier, R. Muir, B. W.
Lz, EB. 1223 Martin, F. Miiller, M.
Li, M. 990, 1010 Martin, J. Miiller, O. 1 ( )9/ )
La. 1010 Martinez, E. Miiller, S. 1158
Liberatore, M. 815, 847 Martinez, H. Munnik, F. 4:182
Lilienkamp, G. Martorana, A. Mutin, P. H. 740
Lin, X. Mashlan, M.
Lincot, D. Masri, P. Nagata, A. 1646
Lindstr6ém, R. Mateo, M. P. Nagata, S. 1573
Lipinsky, D. Mates, T. Nagatomi, T. 1594, 1598
Lippitz, A. Mathieu, H. J. Nagel, M.-D. 186
Copyright 2006 John Wiley & Sons, Ltd Surf. Interface Anal. 2006; 38: 1779-1785
DOT: 10.1002/sia
Surface and
cartes
PEIENS
Author Index to Volume 38
Naka, A. Oshita, J. 1650 Powell, C. J.
Nakagawa, T. Oswald, S. Praéek, B.
Nakaguchi, A. Otani, S. Pradier, C.-M.
Nakamura, K. OQuadah, Y. Prestianni, A.
Nakanishi, Y. Ouchabane, M. Prieto, P.
Nakano, M. Ou-Yang, Z.-C. Prince, K. BS.
Nakao, S. Owari, M. 305,
Nakayama, K. Qian, H.
Nakayama, S. Oyama, S. 1 Qin, M
Nakayama, T. Qu, G.
Nascente, P. A. P. -adelettiG,. Quiais-Marthon, S.
Nath, K. G. -alomares, F. J Quintelier, J.
Navarra, G. Palumbo, F.
Nefedov, A an, | RakhmanovG,.
Nelis, T. an, M.-H Xamchaie l, og R.
Nepustilova, R. Pan, W Ramos-Barrado, J. R.
Neg, K.-M. -andolfi, L. Ramsier, R. D.
Ng, N. anyathanmaporn, T. ao, J.C.
Ni, S. Paparazzo, E Xasulev, U. K.
Nicolas, G. ark, M. Ravet, M.-F.
Nihei, Y. Parry, K. L. Xawsterne, R. I
Nikiforov, : -arschau, M. Rebholz, C.
Nishinaka,
atscheider, | Xeiche, R
Nishioka, Y. Paul, A. Xeina, S
Nixon, K. L. -auly, N. Renault, O
Noél, S. Pavlidou, E. Xeniers, F.
Noguchi, H. -avlovska, A. Renna, L.
Nojima, M. Pavlik,J Roberts, D. E.
Payen, E. Xocha-Filho, R. C.
Nonaka, H. Pena, G. Roche, C
Norrman, K. eng, C. Rodriguez, A.
Nouiri, A. Peng, L.-M. Romanyuk, A.
Novak, M. eng, R.-W. Romer, S
Novoa, X. R. Perego, M Xomero, R.
Novotny, L. -érez, M.C. Roos, W. D.
Noy, A. Pérez-Casero, R. Rosalbino, F.
Nozawa, K. Pérez-Garcia, S. A. ROSSI, A.
Ntwaeaborwa, O. M. Perissi, I. Rossi, F.
Nyborg, L. Perrigaud, | Roule, A.
-ersson, P. Xoulliay, M.
O'Hare, L.-A. -etrissans, M. Ruan, S. L.
O'Neill, L. -ezoldt, J. Russell, J. J.
Odawara, A. *ham, N. T. Rutten, F. J. M.
Offenhdausser, A. -ignataro, S. Xyabtsev, S. V.
Oh, C.F. Pigram, P. J. Ry oken, H.
Oh, K. T. Pinon, V.
Oh, S. K. Pinson, J. Sagisaka, K.
Ohlidal, I. Pintado, J. M Saidumarov, I.
Ohno, T. Pistofidis, N Saito, T.
Oishi, Y. Pizurova, N. Sakaguchi, I.
Okazaki, M. Plyuto, I. V. Sakai, N.
Oliveira, N. T. C. Plyuto, Y. V. Sakamoto, N.
Olla, M. Poelman, H. Sakamoto, T.
Oltra, R. Pokluda, J. Salma, K.
Opachko, I. I. Polychroniadis, E. K. Salmain, M.
Oran, U. Poncin-Epaillard, F. Salvi, A. M.
Oreopoulos, J. Poon, W. C. K. Sam, S.
Orinak, A. Popescu-Pogrion, N. Samyn, P.
Orinadkova, R. Popov ic, Se Sanchez, O.
Copyright © 2006 John Wiley & Sons, Ltd Surf. Interface Anal. 2006; 38: 1779-1785
DOI: 10.1002/sia
Sarlcaeli’
icartes
PUNE
Author Index to Volume 38
Sangiorgi, S Slomkowski, S. Tanaka, K
Sanz,J . M. Sloot, W. G. Tanaka, M.
Saoula, N Smith,E . I Tanaka, R.
Sato, M So, | Tang, W. X.
Sato, T. Sobczak, J. W ang, Z.
Sato, ¥ Sokolovsky, M anuma, S.
Sauerwein, W Song ,M. apter, L.
Savchenko, N Song, 5 arasov, I. S.
Sberveglieri, G Song, W. eranishi, Y.
ndurra, A Song, Y erblanche, C. J
arel, G Sonoda, 1 erblans, J. J
heithauer, L Soontornworajit, B. erryn, H
G.G Speranza, G etelbaum, D
Starlinger, S hapliyal, R.
Stauden, 1
lhI y1 ipper Stavlid, N. hissen, A
*hienker, | Steenhaut, O hissen, H
‘hmid, A. K Steiger, | hommen, V.
*hneeweiss, O. Steiner, R homsen, L.
schénhense, G Stergioudis, G Thurgate, S. M
thoukens, G Stevens, R irnovan, M
liziani, R
Stoch, ]
Stojilovic, N T6kési, K.
Stolojan, \ okesi K
Streckova, M Tokumoto, H
okumoto, M
‘kiguchi, | Strehblow, H.-H
olstogouzov,
re Strohm, A
olstogouzov,
Strvhal, Z
Setou, M Sucpiel horskell , \ Y omita, M
Shanmi luK1N , DS oennessen, |
opaloglu Yazici, D.
Sharanda, I Ii
Shard, A. G Sumitomo, K Oth \
Sharma, A Sun, | Oth, |
Tougaard, S
Shaw, J. I X
raverso, P
Shchukare\ Zz
reichler, R
Shchurov a Sunsaneeyametha, W
riani, G.
Shen, ¢ Supothina, S
lrinchi, A
She n, D -H DUO, &
ripathi, S.
Shi, D. Suzuki
sakiropoulos, P
Shi, Q.-F Suzuki, S
Tseng, H.-H
Shim, H. M Suzuki, I
Tsilimis,G
Shimizu, H Suzuki, Y
Tsipas, D
Shimizu, R. S\ orcik \
[suchiya, B.
Shimizu, T Swaraj, S
Tsukamoto, N
Shimma, S Swart, H. ¢
fa. Xo.
Shimojo, M
Tung,C . J.
Shimoyama Tafto, | Turishchev, S. \
Shirai, Y. Tajani, A
Shiratori, 1 Takagi, D. Ueda, M
Shorokhov \ akai, Y. Ujvari, T.
Short, R. D. akaoka,G . H Ulijn, R. V.
Shpak, A. P akeguchi, M Unger, E.
Shu, D.-J.
Unger, W.E.S
Silies, M. akeuchi, T Uschmann, I.
Silversmit, G. alib, R. A. Usmanov, D. T
Simcock, M. N. Tamenori, ¥ Utsumi, K.
Simon, G. P. Tan, R.
Simons, D. S. Tan, X. Valand, T.
3yOberg, S. Tanahashi, K. Valentini, F.
2006 John Wiley & Son 2006; 38
DOI: 10.1002
Surface and
Interface
PUES
Van Dyck, S
Van Gils, S
van Riessen, G. A
Vandencasteele, N
\ andendael |
Vanzetti, |
Varga, D
Vasylyev, M
Veldhius, S
Venezia, A. M
Vereecken |
Vering, G
Vickerman
Vinokurovy
Wang
Wang, Y
Warocquier-(
Watanabe, H
Watazu, A
Watts, B
Watts, J
Wazeer
W el z
arlene
Interface
SURFACE AND INTERFACE ANALYSIS EVEN ESE
Surf. Interface Anal. 2006; 38: 1786-1792
Keyword Index to Volume 38
Numbers marked in bold refer to Issues for entries belonging to Number 3 March 2006 and Number 4 April 2006.
ab initio methods 1158 analytical transmission electron band structure
aberration correction 57 microscope LS batteries’ voltages
absorption } angle-resolved XPS 126, 727 benzotriazole
absorption coefficient 1670 angular distribution 676, 1618 binary CuSn alloy
acid / base surface characteristics annealing 59 biocompatibility
acid—base properties ) anodic oxidation 417, 686 biocompatible alloys
acrylic acid 22 anodic oxides 4:182, 410 biocompatible polymer
activation energy) 219, 4 anti-microbial 1519 bioengineering
activity 2 antibacterial coating arZ biomaterials
adhesion 4:16: 4 antisense oligo-DNA biomembranes
adhesive 3 APCI biopolymer binder
adsorbed hydrogen application 3 biosensors
adsorbed proteins ) \quaporin ! biospectrometry
adsorption 158, 186, 305, 990, 1117 archaeological ceramics 36+ biotemplate
argon plasma treatment block length
adsorption isotherm 114¢ aromatic isothiocyanate Rhy BNCT
adsorption microcalorimetry ARXPS 437, 579, 590, 604, 859, bonding
adsorption thermodynamic atmospheric 15 boron
parameters atmospheric-pressure thermo- boron carbide
advances desorption surface-ionization bovine serum albumin (BSA)
AXES 39, 3:178, 296, 357, 620, spectroscopy branched poly(ethylenimine)
atom probe 75 bromopropyltrimethoxysilane
AES depth profiling 300, 392, 7 atomic force microscope (AFM) 990 BTSI
AFM », 478 atomic force microscopy 679, 828 bulk excitations
604, 7 », 740, 842, 3, 1004, 975, 1090, 1343, 1413, 1419, 1459, 1696
1010, 1090, 1218, 1266 328, 1 atomic layer deposition 740 Ce
ageing and laser irradiation oz atomic-scale measurement 1611 cadmium sulfide
aggregation | atrazine Dy; cantilevers
air—water interface [ ATRP ; carbon
AISI 3041 Zoo attenuation model carbon coating
AISI 430 ; Au ; carbon contamination
Al Au film 7 carbon nanotubes (CNTs)
ALD } 692 \u surface segregation 883, 981, 1073, 1117, 1285, 14
alkali halides Au surfaces Au carbon surfaces
alkali ion insertion ) Auger catalysis
alkali metals 78, auger depth profiling 784 catalytic surface reaction
alkaline medium \uger electron coincidence CCC and CVV Auger transitions
alkaline peroxide mechanical spectroscopy 691 cell
pulp 132 Auger electron spectroscopy (AES) 88, cell adhesion
alkene and alkyne hydrosilation 3:178, cell membrane
allylamine 3 401,448 498 518 797, 1594, 1598 cell surface
AIN 24 \uger parameter 36, cell-deformability
alumina film Auger-parameter shift cell-sorting
alumina support AN AuNi alloys cellular material
aluminium 2172, 272, 40¢ austenitic steel ceria-supported lanthana
aluminized steel sheet 9 azobenzene cerium
aluminum alloys 48 cerium oxide
aluminum doped zinc oxide 3 background determination 3 cesium
amine backscattered electrons chain dimension 1223
aminosilane :168 bacterial cell surface chain transfer agent 1319
ammonia bacterial surface acid-base characteristics 1068
amorphous alloy properties charging up 429
amorphous carbon nitride ] bamboo fibers chemical composition 1336
amorphous metal oxide electrode band alignment chemical depth profiling 4:182
amorphous thin films band gap chemical force microscopy 1429
amorphous-—crystalline interface band offset chemical state plot 922
WILEY ;
. InterScience
Copyright © 2006 John Wiley & Sons, Ltd =
Surface and
Interface
EVENEt
Keyword Index to Volume 38
chemical vapour deposition GX electrochemical reactivity
chemisorption CVD elec trochemical in situ cell
chemithermomechanical pulp CVV Auger line shape electrochemistry
chemographic method cyclic voltammetry electrodeposition
chirality cyclohexanol conversion electroless Ni
chloride ions cytocompatibility electroless nickel/immersion gold
chloropropyltrimethoxysil. (ENIG)
1romium electron backscattering
D-SIMS
igarette damage pr electron backscattering pattern
ircular pattern (EBSP)
damaging factor
ircularly polarized light decay length electron beam
assification electron beam induced deposition
deconvolution
athrates 1568
defects
uster degradation electron channeling pattern
uster ion beam degradation of organosilane (ECP)
cluster ions monolayer electron detector
Co and Fe films electron effective attenuation length
delamination
CCOO ,o xidation C 1e l] ay-line detector electron emission
lelta layers
coadsorption electron emitter
coating electron energy loss spectroscopy
depth profile
cobalt alloy electron field emission
depth profiling
coincidence detection 19? 296 590 electron holography
coincidence photoelectron electron inelastic mean free
depth resolution
lineshape path 6
desktop
collager electron microscopy 552
desorption
CoMofP catalysts electron momentum spectroscopy
desorption induced by electronic
competitive adsorption electron spectrometers
transitions
composite electron spectroscopies
dewetting
composition profile tron spectroscopy
diazonium salts
compositional contrast tron transport
computational materials science dibloc k-copoly mer tron-beam-induced deposition
diffusion and migration
conformation EBID)
diffusion barrier
continuous slowing down tron-probe microanalysis
direct current bias
approximation tronic structure
direct identification
convolution electrospinning
distribution functions
copolymer elemental mapping
DLC
copper ellipsometry 489
DNA
copper metal particles enargite
DNA film
copper silicide energy filter
DNA immobilization
copper/zinc oxide/alumina energy loss function
DR-FTIR spectroscopy
catalysts energy transfer
duralumin
Core-complex enhanced infrared absorption
dynamic force spectroscopy
core-hole effects environmental particles
core-shell enzyme
core-shell particles EDS EPES
corrosion EDX epitaxial growth
243,248,252 EELFS epitaxial nucleation
coupling A effect EQCM
covalent attachment elastic electron scattering e quilibrium phase diagrams
CPMAS NMkR spectroscopy elastic peak electron spectroscopy I RDA
Cr La line (EPES) 88, 615. 644 E SCA
critical surface tension ‘lastic properties etching rate
cross section differential in energy ‘lastically backscattered electrons ethylene
loss evacuated glass panel
crystal grain size lectrical double layer evanescent-wave micr¢ SCOP)
crystalline-amorphous interfaces ectrical properties EXAFS
crystallization electrical resistivity expert system
Cu electrical transport extended Landau approach
Cu(In;_,Ga, )Se2 (CIGS) electrocatalyst extractive
CuO electrochemical impedance extrinsic loss
Cu,O spectroscopy
Cu-9%Al(111) electrochemical method factor analysis
curved substrate electrochemical phenomena fast atom beam
cutting tool life electrochemical properties fast Fourier transform
Copyright © 2006 John Wiley & Sons, Ltd
Sarr
Interface
PUNEt t
grain size 1687 In/Si(111)
graphite 3:166, 300, 352, 595 In—485Sn solder
grazing incident X-ray reflectivity nductively coupled plasma-optical
growth kinetics emission spectroscopy 1768
growth mechanism nelastic and elastic electron
growth theory scattering
inelastic electron scattering
2H-NbSe> nelastic interaction
inelastic mean free path (IMFP) 88, 61
1-recoil effect
nelastic scattering 632, ¢
lafnium
emi 1afnium sputtering deposition nelastic scattering of electrons
heat-treatment nfrared
infrared reflection-absorption
1eteroepitaxy
heterogeneous reactions of dissociation spectroscopy (IRRAS)
nfrared spectra
infrared spectroscopy
heterojunction
nk
reteropolyanion
nstrumentation
heterostructures
nsulator
| rexagonal (1 |) structure
fluorescence hexagonal boron nitride intercalation
fluorescence imaging intercalation reactions
1examethyldigermane
fluorinated polymer interconnects
1examethyldisilane
i segment 1fO> interdiffusion
fluorine tin oxide interface
uigh depth resolution
fluorocarbon interface control
vigh energy ion scattering (HEIS)
focused ion beam nergyT UT resol|u tion interfacial characteristics
force calibration interfacial reaction
force constant interference
force measurements intermetallic compound
action
force spectroscopy intermolecular interaction L(
forward focusing International Organization for
X-ray photoelectron
forwarc 1 scattering g peak Standardization 3:1
FOUR-STM-Tip Manipulation spt ect; roscopy intrinsic loss
Measurement System hhiicgth -k cdiiep]l ectrics nverse gas chromatography
‘harmonics
(4TMMS) ion beam
four-termina! ion beam analysis
fracture energy ion beam etching
fragmentation me ion detector
friction ion emission
friction 1dration layers ion etching
FTIR h\vadrr ocart “-h ons ion imaging
drocarbons groups
fuel cel ion implantation
drochloric acid
ion irradiation
\Wdrodesulfurization
ion migration
1drogen bond
ion-induced ferroelectric emission
vdrogen concentration
ion-sputtering
ydrogen gas emission
ionic liquid
1 drogen isotopes replacement ionization
yenated amorphous carbon iron
iron nitride
ron nitride compound
iron oxides
y-irradiation
imaging technique rradiation
Gibbs fr IMFP irradiation damage
glancing immersion RRAS
: 5;
gyiialnancciinngg incCiICd RSI
nN lase angle immunoassays island decay
glow-discharge optical emissi ] Impurities SO
spectroscopy |i n somerization
glues SPR
gold situ observation [UVSTA workshop
grool]d 1 oxidlaat ion stat>te | situ optical monitoring IV-VI semiconductor compounds 518
grafting in situ X-ray photoelectron
grain analysis spectroscopy jissO
2006; 38: 1786-1792
DOI: 10.1002/sia