Table Of Content

SIA olirface and Interface Analysis Volume 25 (i)W ILEY Ue Surface and Interface Analysis (Surf. Interface Anal.) AN INTERNATIONAL JOURNAL DEVOTED TO THE DEVELOPMENT AND APPLICATION OF TECHNIQUES FOR THE ANALYSIS OF SURFACES, INTERFACES AND THIN FILMS EDITOR-IN-CHIEF NORTH AMERICAN EDITOR David Briggs John T. Grant Siacon Consultants Lid, 21 Woodfarm Road, Research Institute, University of Dayton, 300 College Park, Dayton, Malvern Wells, Worcs WR14 4PL, UK Ohio 45469-0168, USA Tel/Fax: UK 1684 563446 Fax: USA 513 258 8075 (Papers from Europe only) (Papers from all countries other than Europe) ADVISORY BOARD C. J. Powell H. Fuchs National Institute of Standards and Technology, Gaithersburg, Universitat Munster Physikalisches Institut, Munster, Germany Maryland, USA J. E. Fulghum M. Prutton Kent State University, Kent, USA University of York, UK D. M. Hercules M. P. Seah Vanderbilt University, Tennessee, USA National Physical Laboratory, Teddington, UK S. Hofmann P. M. A. Sherwood National Research Institute for Metals, Japan Kansas State University, Kansas, USA R. Shimizu A. Jablonski Osaka University, Japan Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, Poland F. A. Stevie Lucent Technologies, Orlando, Florida, USA R. Lamb University of New South Wales, Sydney, Australia S. Tougaard Department of Physics, Odense University, Denmark H. J. Mathieu Ecole Polytechnique Federale de Lausanne, Switzerland Tran Minh Duc Institute de Physique Nucléaire, Villeurbanne, France N. S. McIntyre University of Western Ontario, London, J. C. Vickerman Ontario, Canada Centre for Surface and Materials Analysis, UMIST, Manchester, UK Visit the Wiley Home Page In the United States you will find us at: http://www.wiley.com and in Europe at: http://www. wiley.co.uk SURFACE AND INTERFACE ANALYSIS, VOL. 25, iii (1997) Contents of Volume 25 NUMBER 1 JANUARY 1997 Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS A. A. GALUSKA Refined Approach to PCA-assisted Auger Depth Profile Analysis A. SCHOPKE AND S. KELLING Comparison of the Auger Photoelectron Coincidence Spectroscopy (APECS) Spectra of Ag and InP with Cu and GaAs S. M. THURGATE AND C. P. LUND True Auger Electron Spectra Measured with a Novel Cylindrical Mirror Analyzer (Au, Ag and Cu) Y. TAKEICHI AND K. GOTO Calculations of Electron Inelastic Mean Free Paths (IMFPs). VI. Analysis of the Gries Inelastic Scattering Model and Predictive IMFP Equation S. TANUMA, C. J. POWELL AND D. R. PENN Viscoelastic Relaxation and Sputter-depth Profiling of Amorphous Materials G. CARTER Short Communications Influence of Tacticity on Polymer Surfaces Studied by ToF-SIMS X. VANDEN EYNDE, L. T. WENG AND P. BERTRAND X-ray-induced Metal Reduction in Polymer Hosts F. VREUGDENHIL, B. HAGENHOFF AND P. C. ZALM NUMBER 2 FEBRUARY 1997 Preface J. T. GRANT Using XPS to Investigate Fiber/Matrix Chemical Interactions in Carbon-fiber-reinforced Composites C. L. WEITZSACKER, M. XIE AND L. T. DRZAL Surface Spectroscopic Studies of Factors Influencing Xanthate Adsorption on Coal Pyrite Surfaces J. P. BALTRUS AND J. R. DIEHL Electron Transmission Through Thin Organized Organic Films A. KADYSHEVITCH AND R. NAAMAN Gas Sensing Characteristics of Ultrathin TiO,_, Films Investigated with XPS, TPD and In Situ Resistance Measurements R. M. WALTON, J. L. GLAND AND J. W. SCHWANK Isotopic Characterization of NO Adsorption, Dissociation and Coadsorption with CO on Pt(100): an Infrared Reflection-Absorption Study N. P. MAGTOTO AND H. H. RICHARDSON Analysis by Surface-Sensitive Second Harmonic Generation of Si(111)7 x 7 Exposed to High Purity Ozone Jet for Oxide Film Formation K. NAKAMURA, A. KUROKAWA AND S. ICHIMURA Regular Papers Carbon Incorporation during the Dielectric Breakdown Process of Silicon Oxide O. NAJMI, I. MONTERO, L. GALAN AND J. M. ALBELLA X-ray Photoelectron Spectroscopy Depth Profiling of Aluminium Nitride Thin Films K. S. A. BUTCHER, T. L. TANSLEY AND X. LI VOLUME CONTENTS Surface Analysis of Stationary Phases for Solid-phase Extraction, using ESCA and SIMS in Combination with Multivariate Analysis A. OHRLUND, L. HJERTSON AND S. P. JACOBSSON Ion Beam Modification of InSe Surfaces G. BROJERDI, G. TYULIEV, D. FARGUES, M. EDDRIEF AND M. BALKANSKI Emission-depth Dependence of the Signal Photoelectron Energy Spectrum I. S. TILININ, A. JABLONSKI AND S. TOUGAARD Quantitative Analysis of Palladium Oxide by Means of the Palladium M,;N,N,, Transition E. H. VOOGT, A. J. M. MENS, O. L. J. GJZEMAN AND J. W. GEUS NUMBER 3 MARCH 1997 REVIEW PAPER Universality Classes of Inelastic Electron Scattering Cross-sections S. TOUGAARD Depth Profiling by Combined SIMS-ESDMS Analysis: a New Surface Analytical Technique S. SEKI, H. SUMIYA, K. MUTO AND H. TAMURA Changes in the Chemical State and Composition of the Clean Surface of K,Cr,O, and K,Cr,0, due to Air Exposure and Argon Ion Bombardment S. SUZUKI, M. OKU AND Y. WASEDA Cs* Ion Beam Damage of Poly(vinyl chloride) and Poly(methy! methacrylate) Studied by High Mass Resolution ToF-SIMS D. BRIGGS AND I. W. FLETCHER Platinum-Segregation to the (111) Surface of Ordered Pt,)Fe,.: LEIS Results and Model Simulations C. CREEMERS AND P. DEURINCK Depth Profile Analysis of Multilayer Ni-Fe Alloy Coatings by Glow Discharge Optical Emission Spectroscopy (GDOES) and Energy Dispersive X-ray (EDX) Linescan—a Comparative Study M. IVES, D. B. LEWIS AND C. LEHMBERG Simulation of Energy Distribution for Scanning X-ray Probe H. IWAI, R. OIWA, P. E. LARSON AND M. KUDO Round Robin on Spectrometer Transmission Calibration for AES in the Common Data Processing System M. YOSHITAKE AND K. YOSHIHARA Neutron Depth Profiling with the New NIST Cold Neutron Source G. P. LAMAZE, H. CHEN-MAYER, J. K. LANGLAND AND R. G. DOWNING NUMBER 4 APRIL 1997 Chromate Conversion Coatings on 2024 Al Alloy A. E. HUGHES, R. J. TAYLOR AND B. R. W. HINTON Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces E. PAPARAZZO Surface vs. Bulk Chemistry of Pyrolytic Carbon Blacks by SIMS and Raman Spectroscopy H. DARMSTADT, L. SUMMCHEN, U. ROLAND, C. ROY, S. KALIAGUINE AND A. ADNOT Accurate RBS Measurements of the Indium Content of InGaAs Thin Films C. JEYNES, Z. H. JAFRI, R. P. WEBB, A. C. KIMBER AND M. J. ASHWIN Secondary Ion Mass Spectrometry of Polymers: a ToF SIMS Study of Monodispersed PMMA Standards A. M. LEESON, M. R. ALEXANDER, R. D. SHORT, D. BRIGGS AND M. J. HEARN VOLUME CONTENTS Trajectory Weighting: a Fast Monte Carlo Method for Calculating Large Numbers of XPS/AES Spectra P. F. A. ALKEMADE High Depth Resolution SIMS Analysis with Low-energy Grazing O," Beams Z.-X. JIANG, P. F. A. ALKEMADE, E. ALGRA AND S. RADELAAR Short Communications Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO, Catalysts V. M. JIMENEZ, G. LASSSALETTA, A. FERNANDEZ J. P. ESPINOS AND A. R. GONZALES-ELIPE Effects of Sample Cooling on Depth Profiling of Na in SiO, Thin Films J. J. VAIO NUMBER 5 MAY 1997 A Study of the Chemical Composition and Microstructure of Ion Beam Deposited CN, Films Including a XPS C 1s Peak Simulation M. A. BAKER AND P. HAMMER XPS, XANES and ToF-SIMS Characterization of Reactively Magnetron-sputtered Carbon Nitride Films S. LOPEZ, H. M. DUNLOP, M. BENMALEK, G. TOURILLON, M.-S. WONG AND W. D. SPROUL Elastic Properties Study of Si/Ge Superiattices by Brillouin Light Scattering Spectroscopy A. DE BERNABE AND C. PRIETO Calculated Elemental Sputter Yield Correction Factor in Quantitative Auger Electron Spectroscopy—a Poor Approximation J. B. MALHERBE AND R. Q. ODENDAAL Automatic and Interactive Correlation Partitioning Compared: Application to TiN/Ti/SiO, S. A. HAIGH, P. G. KENNY, R. H. ROBERTS, I. R. BARKSHIRE, M. PRUTTON, D. K. SKINNER, P. PEARSON AND K. STRIBLEY Monte Carlo Calculations of the Depth Distribution Function in Multilayered Structures A. R. JACKSON, M. M. EL GOMATI, J. A. D. MATTHEW AND P. J. CUMPSON Scanning Auger Electron Spectroscopy Study of Junctions Between Solid Electrolytes A. DUBBE AND Y. SADAOKA Surface Composition of the CoPd Alloys Studied by Electron Spectroscopies M. KRAWCZYK, L. ZOMMER, B. LESIAK AND A. JABLONSKI Plasma Sprayed Coatings as Treatments for Aluminum, Titanium and Steel Adherends G. D. DAVIES, G. B. GROFF AND R. A. ZATORSKI First Results from the ESCA Microscopy Beamline on ELETTRA L. CASALIS, L. GREGORATTI, M. KISKINOVA, G. MARGARITONDO, F. M. BRAZ FERNANDES, R. J. SILVA, G. R. MORRISON AND A. W. POTTS NUMBER 6 JUNE 1997 Nanometer-scale Elasticity Measurements on Organic Monolayers Using Scanning Force Microscopy W. KIRIDENA, V. JAIN, P. K. KUO AND G.-y. LIU Charging Phenomena and Charge Compensation in AES on Metal Oxides and Silica H. GUO, W. MAUS-FRIEDRICHS AND V. KEMPTER SIMS Analyses of I1I-V Semiconductor Quantum Well and Superlattice Heterostructures C. GERARDI Quantitative XPS: Influence of Elastic Electron Scattering in Quantification by Peak Shape Analysis S. TOUGAARD AND A. JABLONSKI VOLUME CONTENTS X-Ray Photoelectron Spectroscopic Studies of Carbon Fiber Surfaces. 21. Comparison of Carbon Fibres Electrochemically Oxidized in Acid using Achromic and Monochromatic XPS H. VISWANATHAN, M. A. ROOKE AND P. M. A. SHERWOOD Force Modulation AFM Microscopy of Elastomer Blends: Morphology, Fillers and Cross-linking A. A. GALUSKA, R. R. POULTER AND K. O. MCELRATH Elastic Scattering Corrections in AES and XPS. Il. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments P. J. CUMPSON AND M. P. SEAH Elastic Scattering Corrections in AES and XPS. III. Behaviour of Electron Transport Mean Free Path in Solids for Kinetic Energies in the Range 100 eV < E < 400 eV P. J. CUMPSON Profiling Shallow As Implants with Low Energy Cs Bombardment on a Modified Cameca IMS-4f J. BENNETT AES Depth Profiling of Semiconducting Epitaxial Layers with Thicknesses in the Nanometer Range Using an Ion Beam Bevelling Technique M. PROCOP, A. KLEIN, I. RECHENBERG AND D. KRUGER Effectiveness and Limits of the Deconvolution of SIMS Depth Profiles of Boron in Silicon B. GAUTIER, J. C. DUPUY, R. PROST AND G. PRUDON Forthcoming Events 479; Recently Accepted Papers 480 NUMBERS 7 & 8 JUNE-JULY 1997 Preface G. FRIEDBACHER, H. FUCHS AND H.-J. GUNTERODT Scanning Near-field Magneto-optic Microscopy: Quantitative Measurements of Local Faraday Effects G. EGGERS, A. ROSENBERGER, N. HELD AND P. FUMAGALLI Fractal Dimension of Thin-film Surfaces Obtained by Fourier Spectral Analysis W. ZAHN AND A. ZOSCH Application of a Near-field Optical Microscope to Investigate the Fluorescence Energy Transfer Between Chromophores Embedded in Langmuir-Blodgett Films R. BRUNNER, A. BIETSCH, O. HOLLRICHER, O. MARTI AND A. LAMBACHER Spectroscopic Contrast by Color Photon Scanning Tunnelling Microscopy H. BRUCKL, J. KINSKI AND N. SOTNIK Focusing of Laser Radiation in the Near-field of a Tip (FOLANT) for Applications in Nanostructuring K. DICKMANN, J. JERSCH AND F. DEMMING Detection and Momentum Spectrometry of Single Microparticles by Scanning Force Microscopy Sensors R. WURSTER The Scanning Near-field Optical Microscope: a Method for Investigating Chromosomes W. WIEGRABE, S. MONAJEMBASHI, H. DITTMAR, K.-O. GREULICH, S. HAFNER, M. HILDEBRANDT, M. KITTLER, B. LOCHNER AND E. UNGER Scanning Force Microscopy and Geometrical Analysis of Two-Dimensional Collagen Network Formation M. MERTIG, U. THIELE, J. BRADT, G. LEIBIGER, W. POMPE AND H. WENDROCK AFM < Characterization of Ta-based Diffusion Barriers for Use in Future Semiconductor Metallization D. FISCHER, O. MEISSNER, B. BENDJUS, J. SCHREIBER, M. STAVREV AND C. WENZEL VOLUME CONTENTS Study of Polycrystalline and Amorphous LPCVD Silicon Films by Atomic Force Microscopy A. PLESCHINGER, J. LUTZ, F. KUCHAR, H. NOLL AND M. PIPPAN A Novel Method for Time-resolved Characterization of Micromagnetic Stray Fields with Scanning Probe Microscopy J. BANGERT, S. KASIM, W. MERTIN AND E. KUBALEK Morphology and Jn Situ Deformation of Polyamide Films Investigated with Scanning Force Microscopy D. DRECHSLER, A. KARBACH AND H. FUCHS Investigation of Electrical Double Layers on SiO, Surfaces by Means of Force Vs. Distance Measurements G. HUTTL, D. BEYER AND E. MULLER Multi-method Analysis of the Metal/Electrolyte Interface: Scanning Force Microscopy (SFM), Quartz Microbalance Measurements (QMB), Fourier Transform Infrared Spectroscopy (FTIR) and Grazing Incidence X-ray Diffractometry (GIXD) at a Polycrystalline Copper Electrode W. KAUTEK, M. GEUB, M. SAHRE, P. ZHAO AND S. MIRWALD Comparative Morphology Study of Indentations in Quasicrystalline AIPdMn and Single-crystalline NiAI Investigated by Atomic Force Microscopy B. WOLF, C. DEUS AND P. PAUFLER Scanning Acoustic Force Microscope Investigations of Surface Acoustic Waves T. HESJEDAL, E. CHILLA AND H-J. FROHLICH Waveguide Effect on the Image Formation Process in Near-field Photocurrent Spectroscopy of Semiconductor Laser Diodes A. RICHTER, CH. LIENAU AND J. W. TOMM Near-field Optical Spectroscopy of Single GaAs Quantum Wires A. RICHTER, M. SUPTITZ, CH. LIENAU, T. ELSAESSER, M. RAMSTEINER, R. NOTZEL AND K. H. PLOOG AFM and STM Characterization of TiO,— Ultrafiltration Membranes D. BEYER, H. RICHTER AND G. TOMANDL STM-induced Annealing and Nanoextrusion in nm-Period Multilayers A. A. GORBUNOV, J. RICHTER, W. POMPE, A. SEWING AND J. THOMAS 3D Calibration of a Scanning Force Microscope with Internal Laser Interferometers M. BIENIAS, S. GAO, K. HASCHE, R. SEEMANN AND K. THIELE Observation of Coulomb Blockade Effects in AFM-Machined Tunnel-Junctions H. BRUCKL, R. RANK, H. VINZELBERG, I. MONCH, L. KRETZ AND G. REISS Nucleic Acid Organizations Visualized by Scanning Force Microscopy C. BOHLEY, D. MATERN, G. BISCHOFF, W.-V. MEISTER, S. KARGOV, S. LINDAU, J. BARTHEL AND S. HOFFMANN Computer Simulation of the AFM/LFM Imaging Process: Hexagonal versus Honeycomb Structure on Graphite U. VON TOUSSAINT, TH. SCHIMMEL AND J. KUPPERS Forthcoming Events 627; Recently Accepted Papers 628 NUMBER 9 AUGUST 1997 Study of the Chemical Bonding and Microstructure of Ion Beam-deposited CN, Films Including an XPS C 1s Peak Simulation M. A. BAKER AND P. HAMMER Evaluation of X-ray-excited Valence Band Measurements for the Determination of the Surface Composition of Model Thermoplastic Olefins P. J. SCHMITZ, J. W. HOLUBKA AND S. SRINIVASAN Vii VOLUME CONTENTS A Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film N. SUZUKI, K-I. IIMURA, S. SATOH, Y. SAITO, T. KATO AND A. TANAKA Surface Analysis of a Hydrothermally Treated H-ZSM-S5 Zeolite S. MARSCHMEYER AND H. PAPP TPD, XPS and ESR Studies of the Surface Processes Involved in the Oxidation of n-pentane on a (VO),P,0, System M. LOPEZ GRANADOS, J. M. CORONADO, J. L. G. FIERRO, F. CAVANI, F. GIUNTOLI AND F. TRIFIRO Effect of Photoetching on Porous Silicon Morphology R. GUERRERO-LEMUS, J. D. MORENO, R. J. MARTIN-PALMA, J. M. MARTINEZ-DUART, P. HERRERO, M. L. MARCOS, J. GONZALEZ-VELASCO AND P. GOMEZ Escape Probability of Signal Auger and Photoelectrons from Ultrathin Overlayers I. S. TILININ, J. ZEMEK AND S. HUCEK The Excitation Depth Distribution Function for Auger Electrons Created by Electron Impact A. JABLONSKI AND S. TOUGAARD Determination of the Ion Sputtering-induced In-depth Distribution by Means of Elastic Peak Electron Spectroscopy A. KONKOL AND M. MENYHARD Calibration of the Probing Depth by Total Electron Yield of EXAFS Spectra in Oxide Overlayers (Ta,0s, TiO, ZrO.) V. M. JIMENEZ, A. CABALLERO, A. FERNANDEZ, J. C. SANCHEZ-LOPEZ, A. R. GONZALEZ-ELIPE, J. F. TRIGO AND J. M. SANZ Structure of a Langmuir Film Based on the Construction of a System Response Function for the Analysis of Second Harmonic Signals N. L. GARLAND, S. G. LAMBRAKOS, W. R. BARGER, JR AND P. P. TRZASKOMA-PAULETTE Quantitative Study of Methyl Methacrylate-Poly(Ethylene Glycol) Methacrylate Copolymer Films using High Mass Resolution ToF-SIMS D. BRIGGS AND M. C. DAVIES Forthcoming Events 735; Recently Accepted Papers 736 NUMBER 10 SEPTEMBER 1997 SIMS Detection in the 10” Atoms cm~* Range H. GNASER Incorporation of Surface Topography in the XPS Analysis of Curved or Rough Samples Covered by Thin Multilayers R. C. CHATELIER, H. A. W. ST JOHN, T. R. GENGENBACH, P. KINGSHOTT AND H. J. GRIESSER XPS Study of the Segregation of Minor Elements at the Surface of a Commercial Copper-10wt.% Nickel Alloy R. DANOIX-SOUCHET AND A. D’HUYSSER Scanning Near Field Optical Microscope Designed for Operation in Liquids M. MERTESDORF, M. SCHONHOFF, F. LOHR AND S. KIRSTEIN Comparison of FEG-STEM and AES Measurements of Equilibrium Segregation of Phosphorus in 9% Cr Ferritic Steels I. A. VATTER AND J. M. TITCHMARSH VOLUME CONTENTS Energy Calibration of X-ray Photoelectron Spectrometers. II. Issues in Peak Location and Comparison of Methods C. J. POWELL Topographic Correction of 3D SIMS Images M. L. WAGTER, A. H. CLARKE, K. F. TAYLOR, P. A. W. VAN DER HEIDE AND N. S. MCINTYRE ToF-SIMS Determination of Molecular Weights from Polymeric Surfaces and Microscopic Phases A. A. GALUSKA Detection of Nylon-6,6 Cyclic Monomers on Polymer Surfaces using Static SIMS M. C. BURRELL, H. S.-I. CHAO, T. P. MEERMAN AND G. S. PETERSON Chemical Analysis of Ternary Ti Oxides using Soft X-ray Absorption Spectroscopy L. SORIANO, M. ABBATE, A. FERNANDEZ, A. R. GONZALEZ-ELIPE AND J. M. SANZ XPS Studies of Oxide Growth and Segregation in Aluminium -Silicon Alloys C. R. WERRETT, D. R. PYKE AND A. K. BHATTACHARYA A Novel Approach for the Determination of the Actual Incidence Angle in a Magnetic-sector SIMS Instrument Z.-X. JIANG AND P. F. A. ALKEMADE Spectral Noise Distortion in Photoelectron Spectroscopy by Acquiring Data with Multidetector Systems S. MAHL, M. NEUMANN, V. SCHLETT AND A. BAALMANN XPS, XANES and ToF-SIMS Characterization of Reactively Magnetron-sputtered Carbon Nitride Films S. LOPEZ, H. M. DUNLOP, M. BENMALEK, M. S. WONG AND W. D. SPROUL Forthcoming Events 836 NUMBER 11 OCTOBER 1997 An XPS and AFM Study of Polypyrrole Coating on Mild Steel K. IDLA, A. TALO, H. E.-M. NIEMI, O. FORSEN AND S. YLASAARI The Scanning Kelvin Microscope with Voltage Modulation: a New Principle to Image Discrete Surface Potentials H. D. LIESS, R. MAECKEL AND J. REN The Development of Standards for Surface Analysis by ISO Technical Committee 201 on Surfact Chemical Analysis C. J. POWELL AND R. SHIMIZU Simulation Study on Regeneration of Depth Profiles from Angle-resolved XPS Data C.-U. RO ToF-SIMS Quantification of Polystyrene Spectra Based on Principal Component Analysis (PCA) X. VAN DEN EYNDE AND P. BERTRAND Surface and Layer State of Thin Au-Al Layers After High-energy Ion Irradiation Measured by RBS, Scanning Ion Microprobe and SEM A. MARKWITZ AND G. DEMORTIER Characterization of the Interfaces Formed During the Silicidation Process of Ti Films on Si at Low and High Temperatures J. PEREZ-RIGUEIRO, P. HERRERO, C. JIMENEZ, R. PEREZ-CASERO AND J. M. MARTINEZ-DUART Differential Charging in XPS. Part II. A Comparison of Charging in Thin Polymer Overlayers on Conducting and Non-conducting Substrates B. J. TIELSCH AND J. E. FULGHUM VOLUME CONTENTS NUMBER 12 NOVEMBER 1997 Characterization of Silane-modified ZrO, Powder Surfaces M. P. TURNER, E. DUGUET AND C. LABRUGERE Correction for the Effects of Adventitious Carbon Overlayers in Quantitative XPS Analysis S. EVANS The Adsorption of Organosilanes on Iron and Aluminium Oxide Surfaces J. QUINTON, L. THOMSEN AND P. DASTOOR Quantitative Secondary Ion Mass Spectrometry Analysis of the Native Oxide on Silicon Wafers H. YAMAZAKI AND M. TAKAHASHI Application of XPS and Factor Analysis for Non-conducting Materials S. OSWALD AND S. BAUNACK SIMS Image Analysis of D,O Migration in ZrO, Thin Films A. H. CLARKE AND N. S. MCINTYRE Short Communication Viscoelastic Buckling and Plastic Flow—Deterministic Mechanisms for Ripple Initiation on Ion Bombarded Amorphous Solids G. CARTER NUMBER 13 DECEMBER 1997 A Combination of SFM and TOF-SIMS Imaging for Observing Local Inhomogenieties in Morphology and Composition: Aged Calcite Surfaces S. L. STIPP, A. J. KULIK, K. FRANZREB, W. BENOIT AND H. J. MATHIEU High-sensitivity SIMS Analysis of Carbon in GaN Films by Molecular Ion Detection C. TAKAKUWA-HONGO AND M. TOMITA An XPS and EPMA Study of Size-fractionated Ambient Aerosol Particles Collected in Urban and Industrial Areas J. TOTH, I. BESZEDA, Cs CSERHATI AND F. MEDVE The Evaluation of Surface Contamination of Titanium Dental Implants by LV-SEM: Comparison with XPS Measurements M. MORRA AND C. CASSINELLI Author Index 989; Keyword Index 992